DAC0830/DAC0832
8-Bit µP Compatible, Double-Buffered D to A Converters
DAC0830/DAC0832 8-Bit µP Compatible, Double-Buffered D to A Converters
General Description
The DAC0830 is an advanced CMOS/Si-Cr 8-bit multiplying
DAC designed to interface directly with the 8080, 8048,
8085, Z80
silicon-chromium R-2R resistor ladder network divides the
reference current and provides the circuit with excellent
temperature tracking characteristics (0.05% of Full Scale
Range maximum linearity error over temperature). The circuit uses CMOS current switches and control logic to
achieve low power consumption and low output leakage
current errors. Special circuitry provides TTL logic input voltage level compatibility.
Double buffering allows these DACs to output a voltage
corresponding to one digital word while holding the next
digital word. This permits the simultaneous updating of any
number of DACs.
The DAC0830 series are the 8-bit members of a family of
microprocessor-compatible DACs (MICRO-DAC
®
, andother popular microprocessors.Adeposited
™
).
Typical Application
Features
n Double-buffered, single-buffered or flow-through digital
data inputs
n Easy interchange and pin-compatible with 12-bit
DAC1230 series
n Direct interface to all popular microprocessors
n Linearity specified with zero and full scale adjust
only—NOT BEST STRAIGHT LINE FIT.
n Works with
n Can be used in the voltage switching mode
n Logic inputs which meet TTL voltage level specs (1.4V
logic threshold)
n Operates “STAND ALONE” (without µP) if desired
n Available in 20-pin small-outline or molded chip carrier
package
±
10V reference-full 4-quadrant multiplication
Key Specifications
n Current settling time: 1 µs
n Resolution: 8 bits
n Linearity: 8, 9, or 10 bits (guaranteed over temp.)
n Gain Tempco: 0.0002% FS/˚C
n Low power dissipation: 20 mW
n Single power supply: 5 to 15 V
DC
00560801
BI-FET™and MICRO-DAC™are trademarks of National Semiconductor Corporation.
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (V
Voltage at Any Digital InputVCCto GND
Voltage at V
REF
Storage Temperature Range−65˚C to +150˚C
Package Dissipation
at T
=25˚C (Note 3)500 mW
A
DC Voltage Applied to
I
or I
OUT1
OUT2
ESD Susceptability (Note 4)800V
Lead Temperature (Soldering, 10 sec.)
)17V
CC
Input
(Note 4)−100 mV to V
±
DC
25V
CC
Dual-In-Line Package (plastic)260˚C
Dual-In-Line Package (ceramic)300˚C
Surface Mount Package
Part numbers with “LCN” suffix0˚C to +70˚C
Part numbers with “LCWM” suffix0˚C to +70˚C
Part numbers with “LCV” suffix0˚C to +70˚C
Part numbers with “LCJ” suffix−40˚C to +85˚C
Part numbers with “LJ” suffix−55˚C to +125˚C
Voltage at Any Digital InputV
MIN≤TA≤TMAX
CC
to GND
Electrical Characteristics
V
=10.000 VDCunless otherwise noted. Boldface limits apply over temperature, T
REF
T
=25˚C.
A
ParameterConditions
See
Note
V
= 4.75 V
CC
VCC= 15.75 V
Typ
(Note 12)
MIN≤TA≤TMAX
DC
DC
Tested
Limit
(Note 5)
CONVERTER CHARACTERISTICS
Resolution888bits
Linearity Error MaxZero and full scale adjusted4, 8
=10.000 VDCunless otherwise noted. Boldface limits apply over temperature, T
REF
T
=25˚C.
A
DAC0830/DAC0832
ParameterConditions
See
Note
V
= 4.75 V
CC
VCC= 15.75 V
Typ
(Note 12)
MIN≤TA≤TMAX
DC
DC
Tested
Limit
(Note 5)
CONVERTER CHARACTERISTICS
Power Supply RejectionAll digital inputs latched high
=14.5V to 15.5V0.00020.0025%
V
CC
11.5V to 12.5V0.0006FSR/V
4.5V to 5.5V0.0130.015
ReferenceMax152020kΩ
InputMin151010kΩ
Output Feedthrough
Error
Output
I
Leakage
Current Max
I
OUT1
OUT2
V
=20 Vp-p, f=100 kHz
REF
All data inputs latched low
3mVp-p
All data inputs LJ & LCJ10100100nA
latched low LCN, LCWM &
50100
LCV
All data inputs LJ & LCJ100100nA
latched highLCN, LCWM &
50100
LCV
OutputI
CapacitanceI
OUT1
OUT2
I
OUT1
I
OUT2
All data inputs45pF
latched low115
All data inputs130pF
latched
30
high
DIGITAL AND DC CHARACTERISTICS
Digital InputMaxLogic LowLJ: 4.75V0.6
VoltagesLJ: 15.75V0.8
LCJ: 4.75V0.7V
LCJ: 15.75V0.8
LCN, LCWM, LCV0.950.8
MinLogic HighLJ & LCJ2.02.0V
LCN, LCWM, LCV1.92.0
Digital InputMaxDigital inputs
<
0.8V
CurrentsLJ & LCJ−50−200−200µA
LCN, LCWM, LCV−160−200µA
Digital inputs
>
2.0V
LJ & LCJ0.1+10+10µA
LCN, LCWM, LCV+8+10
Supply Current MaxLJ & LCJ1.23.53.5mA
DrainLCN, LCWM, LCV1.72.0
. For all other limits
VCC=5V
V
to 15 V
CC
DC
=12V
±
5%
±
DC
Design
Limit
(Note 6)
±
DC
5%
5%
Limit
Units
FS/˚C
DC
DC
www.national.com4
Electrical Characteristics
V
=10.000 VDCunless otherwise noted. Boldface limits apply over temperature, T
REF
T
A
=25˚C.
MIN≤TA≤TMAX
VCC=12
SymbolParameterConditions
See
Note
=15.75 V
V
CC
Typ
(Note 12)
DC
Tested
Limit
(Note 5)
±
5% to 15
V
DC
±
5%
V
DC
Design Limit
(Note 6)
V
Typ
(Note 12)
AC CHARACTERISTICS
t
s
Current SettingVIL=0V,
=5V
V
IH
1.01.0µs
Time
t
W
Write and XFERVIL=0V,
=5V
V
IH
11100250375600
Pulse Width Min9320320900900
t
DS
Data Setup TimeVIL=0V,
=5V
V
IH
100250375600
9
Min320320900900
t
DH
Data Hold TimeVIL=0V,
=5V
V
IH
9
3050
Min3050
t
CS
Control Setup
Time
VIL=0V,
=5V
V
IH
110250600900
9
Min32032011001100
t
CH
Control Hold Time VIL=0V,
=5V
V
IH
90
0
100
Min00
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.DC and AC electrical specifications do not apply when operating
the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified.
Note 3: The maximum power dissipation must be derated at elevated temperatures and is dictated by T
allowable power dissipation at any temperature is P
= 125˚C (plastic) or 150˚C (ceramic), and the typical junction-to-ambient thermal resistance of the J package when board mounted is 80˚C/W. For the N
T
JMAX
package, this number increases to 100˚C/W and for the V package this number is 120˚C/W.
Note 4: For current switching applications, both I
by approximately V
Note 5: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).
Note 6: Guaranteed, but not 100% production tested. These limits are not used to calculate outgoing quality levels.
Note 7: Guaranteed at V
Note 8: The unit “FSR” stands for “Full Scale Range.” “Linearity Error” and “Power Supply Rejection” specs are based on this unit to eliminate dependence on a
particular V
that after performing a zero and full scale adjustment (see Sections 2.5 and 2.6), the plot of the 256 analog voltage outputs will each be within 0.05%xV
straight line which passes through zero and full scale.
Note 9: Boldface tested limits apply to the LJ and LCJ suffix parts only.
Note 10: A 100nA leakage current with R
Note 11: The entire write pulse must occur within the valid data interval for the specified t
Note 12: Typicals are at 25˚C and represent most likely parametric norm.
Note 13: Human body model, 100 pF discharged through a 1.5 kΩ resistor.
OS÷VREF
value and to indicate the true performance of the part. The “Linearity Error” specification of the DAC0830 is “0.05% of FSR (MAX)”. This guarantees
REF
. For example, if V
=±10 VDCand V
REF
fb
=(T
D
and I
OUT1
=10Vthena1mVoffset, VOS,onI
REF
=±1VDC.
REF
=20k and V
REF
)/θJAor the number given in theAbsolute Maximum Ratings, whichever is lower. For this device,
JMAX−TA
must go to ground or the “Virtual Ground” of an operational amplifier.The linearity error is degraded
OUT2
=10V corresponds to a zero error of (100x10−9x20x103)x100/10 which is 0.02% of FS.
or I
OUT1
W,tDS,tDH
, θJA, and the ambient temperature, TA. The maximum
JMAX
will introduce an additional 0.01% linearity error.
OUT2
, and tSto apply.
. For all other limits
=4.75 V
CC
Tested
Limit
(Note 5)
DC
VCC=5
V
DC
±
5%
Design
Limit
(Note 6)
0
REF
DAC0830/DAC0832
Limit
Units
ns
of a
www.national.com5
Switching Waveform
DAC0830/DAC0832
00560802
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Definition of Package Pinouts
Control Signals
(All control signals level actuated)
CS:
Chip Select (active low). The CS in combination
with ILE will enable WR1.
ILE:Input Latch Enable (active high). The ILE in com-
bination with CS enables WR
WR1: Write 1. The active low WR1is used to load the
digital input data bits (DI) into the input latch. The
data in the input latch is latched when WR
To update the input latch–CS and WR1must be low
while ILE is high.
WR
: Write 2 (active low). This signal, in combination with
2
XFER, causes the 8-bit data which is available in the
input latch to transfer to the DAC register.
XFER:
Transfer control signal (active low). The XFER will
enable WR2.
Other Pin Functions
DI
-DI7: Digital Inputs. DI0is the least significant bit (LSB)
0
and DI
I
:DAC Current Output 1. I
OUT1
is the most significant bit (MSB).
7
digital code of all 1’s in the DAC register, and is
zero for all 0’s in DAC register.
I
:DAC Current Output 2. I
OUT2
I
OUT1
,orI
OUT1+IOUT2
fixed reference voltage).
R
:Feedback Resistor. The feedback resistor is pro-
fb
vided on the IC chip for use as the shunt feedback
.
1
is high.
1
is a maximum for a
OUT1
is a constant minus
OUT2
= constant (I full scale for a
resistor for the external op amp which is used to
provide an output voltage for the DAC. This on-chip
resistor should always be used (not an external
resistor) since it matches the resistors which are
used in the on-chip R-2R ladder and tracks these
resistors over temperature.
:Reference Voltage Input. This input connects an
V
REF
external precision voltage source to the internal
R-2R ladder. V
can be selected over the range
REF
of +10 to −10V.This is also theanalog voltage input
for a 4-quadrant multiplying DAC application.
V
:Digital Supply Voltage. This is the power supply
CC
pin for the part. V
Operation is optimum for +15V
can be from +5 to +15VDC.
CC
DC
GND:The pin 10 voltage must be at the same ground
potential as I
applications. Any difference of potential (V
OUT1
and I
for current switching
OUT2
pin
OS
10) will result in a linearity change of
For example, if V
I
and I
OUT1
OUT2
Pin 3 can be offset
= 10V and pin 10 is 9mV offset from
REF
the linearity change will be 0.03%.
±
100mV with no linearity change, but the
logic input threshold will shift.
DAC0830/DAC0832
Linearity Error
a) End point test afterzero and fs
00560823
adj.
b) Best straight line
Definition of Terms
Resolution: Resolution is directly related to the number of
switches or bits within the DAC. For example, the DAC0830
8
has 2
or 256 steps and therefore has 8-bit resolution.
Linearity Error: Linearity Error is the maximum deviation
from a
straight line passing through the endpoints of the
DAC transfer characteristic
zero and full-scale. Linearity error is a parameter intrinsic to
the device and cannot be externally adjusted.
National’s linearity “end point test” (a) and the “best straight
line” test (b,c) used by other suppliers are illustrated above.
The “end point test’’ greatly simplifies the adjustment procedure by eliminating the need for multiple iterations of checking the linearity and then adjusting full scale until the linearity
is met. The “end point test’’ guarantees that linearity is met
. It is measured after adjusting for
00560824
00560825
c) Shifting fs adj. to pass
best straight line test
after a single full scale adjust. (One adjustment vs. multiple
iterations of the adjustment.) The “end point test’’ uses a
standard zero and F.S. adjustment procedure and is a much
more stringent test for DAC linearity.
Power Supply Sensitivity: Power supply sensitivity is a
measure of the effect of power supply changes on the DAC
full-scale output.
Settling Time: Settling time is the time required from a code
transition until the DAC output reaches within
1
±
⁄2LSB of the
final output value. Full-scale settling time requires a zero to
full-scale or full-scale to zero output change.
Full Scale Error: Full scale error is a measure of the output
error between an ideal DAC and the actual device output.
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Definition of Terms (Continued)
Ideally, for the DAC0830 series, full scale is V
For V
10,0000V–39mV 9.961V. Full-scale error is adjustable to
zero.
Differential Nonlinearity: The difference between any two
consecutive codes in the transfer curve from the theoretical
DAC0830/DAC0832
1 LSB to differential nonlinearity.
= 10V and unipolar operation, V
REF
−1LSB.
REF
FULL-SCALE
Monotonic: If the output of a DAC increases for increasing
digital input code, then the DAC is monotonic. An 8-bit DAC
which is monotonic to 8 bits simply means that increasing
=
digital input codes will produce an increasing analog output.
Typical Performance
Characteristics
Digital Input Threshold
vs. Temperature
00560826
FIGURE 1. DAC0830 Functional Diagram
Digital Input Threshold
vs. V
CC
00560827
00560804
Gain and Linearity Error
Variation vs. Temperature
00560828
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Typical Performance Characteristics (Continued)
DAC0830/DAC0832
Gain and Linearity Error
Write Pulse Width
Variation vs. Supply Voltage
005608290056083000560831
DAC0830 Series Application Hints
These DAC’s are the industry’s first microprocessor compatible, double-buffered 8-bit multiplying D to A converters.
Double-buffering allows the utmost application flexibility from
a digital control point of view. This 20-pin device is also pin
for pin compatible (with one exception) with the DAC1230, a
12-bit MICRO-DAC. In the event that a system’s analog
output resolution and accuracy must be upgraded, substituting the DAC1230 can be easily accomplished. By tying
address bit A
(double precision) which automatically increments the address for the second byte write (starting with A
used. This allows either an 8-bit or the 12-bit part to be used
with no hardware or software changes. For the simplest 8-bit
application, this pin should be tied to V
uses in section 1.1).
Analog signal control versatility is provided by a precision
R-2R ladder network which allows full 4-quadrant multiplication of a wide range bipolar reference voltage by an applied
digital word.
1.0 DIGITAL CONSIDERATIONS
A most unique characteristic of these DAC’s is that the 8-bit
digital input byte is double-buffered. This means that the
data must transferthrough two independently controlled 8-bit
latching registers before being applied to the R-2R ladder
network to change the analog output. The addition of a
second register allows two useful control features. First, any
DAC in a system can simultaneously hold the current DAC
data in one register (DAC register) and the next data word in
the second register (input register) to allow fast updating of
the DAC output on demand. Second, and probably more
important, double-buffering allows any number of DAC’s in a
system to be updated to their new analog output levels
simultaneously via a common strobe signal.
to the ILE pin, a two-byte µP write instruction
0
=“1”) can be
0
(also see other
CC
Data Hold Time
The timing requirements and logic level convention of the
register control signals have been designed to minimize or
eliminate external interfacing logic when applied to most
popular microprocessors and development systems. It is
easy to think of these converters as 8-bit “write-only”
memory locations that provide an analog output quantity. All
inputs to these DAC’s meet TTL voltage level specs and can
also be driven directly with high voltage CMOS logic in
non-microprocessor based systems. To prevent damage to
the chip from static discharge, all unused digital inputs
should be tied to V
or ground. If any of the digital inputs
CC
are inadvertantly left floating, the DAC interprets the pin as a
logic “1”.
1.1 Double-Buffered Operation
Updating the analog output of these DAC’s in a
double-buffered manner is basically a two step or double
write operation. In a microprocessor system two unique
system addresses must be decoded, one for the input latch
controlled by the CS pin and a second for the DAC latch
which is controlled by the XFER line. If more than one DAC
is being driven,
Figure 2
, the CS line of each DAC would
typically be decoded individually, but all of the converters
could share a common XFER address to allow simultaneous
updating of any number of DAC’s. The timing for this operation is shown,
Figure 3
.
It is important to note that the analog outputs that will change
after a simultaneous transfer are those from the DAC’s
whose input register had been modified prior to the XFER
command.
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