NSC DAC0832LCJ, DAC0830LCJ Datasheet

March 2002
DAC0830/DAC0832 8-Bit µP Compatible, Double-Buffered D to A Converters
DAC0830/DAC0832 8-Bit µP Compatible, Double-Buffered D to A Converters

General Description

The DAC0830 is an advanced CMOS/Si-Cr 8-bit multiplying DAC designed to interface directly with the 8080, 8048, 8085, Z80 silicon-chromium R-2R resistor ladder network divides the reference current and provides the circuit with excellent temperature tracking characteristics (0.05% of Full Scale Range maximum linearity error over temperature). The cir­cuit uses CMOS current switches and control logic to achieve low power consumption and low output leakage current errors. Special circuitry provides TTL logic input volt­age level compatibility.
Double buffering allows these DACs to output a voltage corresponding to one digital word while holding the next digital word. This permits the simultaneous updating of any number of DACs.
The DAC0830 series are the 8-bit members of a family of microprocessor-compatible DACs (MICRO-DAC
®
, andother popular microprocessors.Adeposited
).

Typical Application

Features

n Double-buffered, single-buffered or flow-through digital
data inputs
n Easy interchange and pin-compatible with 12-bit
DAC1230 series
n Direct interface to all popular microprocessors n Linearity specified with zero and full scale adjust
only—NOT BEST STRAIGHT LINE FIT.
n Works with n Can be used in the voltage switching mode n Logic inputs which meet TTL voltage level specs (1.4V
logic threshold)
n Operates “STAND ALONE” (without µP) if desired n Available in 20-pin small-outline or molded chip carrier
package
±
10V reference-full 4-quadrant multiplication

Key Specifications

n Current settling time: 1 µs n Resolution: 8 bits n Linearity: 8, 9, or 10 bits (guaranteed over temp.) n Gain Tempco: 0.0002% FS/˚C n Low power dissipation: 20 mW n Single power supply: 5 to 15 V
DC
00560801
BI-FET™and MICRO-DAC™are trademarks of National Semiconductor Corporation.
®
Z80
is a registered trademark of Zilog Corporation.
© 2002 National Semiconductor Corporation DS005608 www.national.com

Connection Diagrams (Top Views)

DAC0830/DAC0832
Dual-In-Line and
Small-Outline Packages
00560821
Molded Chip Carrier Package
00560822
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DAC0830/DAC0832

Absolute Maximum Ratings (Notes 1,

2)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications.
Supply Voltage (V Voltage at Any Digital Input VCCto GND Voltage at V
REF
Storage Temperature Range −65˚C to +150˚C Package Dissipation
at T
=25˚C (Note 3) 500 mW
A
DC Voltage Applied to
I
or I
OUT1
OUT2
ESD Susceptability (Note 4) 800V Lead Temperature (Soldering, 10 sec.)
)17V
CC
Input
(Note 4) −100 mV to V
±
DC
25V
CC
Dual-In-Line Package (plastic) 260˚C Dual-In-Line Package (ceramic) 300˚C Surface Mount Package
Vapor Phase (60 sec.) 215˚C Infrared (15 sec.) 220˚C

Operating Conditions

Temperature Range T
Part numbers with “LCN” suffix 0˚C to +70˚C Part numbers with “LCWM” suffix 0˚C to +70˚C Part numbers with “LCV” suffix 0˚C to +70˚C Part numbers with “LCJ” suffix −40˚C to +85˚C Part numbers with “LJ” suffix −55˚C to +125˚C
Voltage at Any Digital Input V
MIN≤TA≤TMAX
CC
to GND

Electrical Characteristics

V
=10.000 VDCunless otherwise noted. Boldface limits apply over temperature, T
REF
T
=25˚C.
A
Parameter Conditions
See
Note
V
= 4.75 V
CC
VCC= 15.75 V
Typ
(Note 12)
MIN≤TA≤TMAX
DC
DC
Tested
Limit
(Note 5)
CONVERTER CHARACTERISTICS
Resolution 8 8 8 bits Linearity Error Max Zero and full scale adjusted 4, 8
REF
+10V
−10VV DAC0830LJ & LCJ 0.05 0.05 % FSR DAC0832LJ & LCJ 0.2 0.2 % FSR DAC0830LCN, LCWM &
0.05 0.05 % FSR
LCV DAC0831LCN 0.1 0.1 % FSR DAC0832LCN, LCWM &
0.2 0.2 % FSR
LCV Differential Nonlinearity Zero and full scale adjusted 4, 8
Max −10VV
REF
+10V DAC0830LJ & LCJ 0.1 0.1 % FSR DAC0832LJ & LCJ 0.4 0.4 % FSR DAC0830LCN, LCWM &
0.1 0.1 % FSR
LCV DAC0831LCN 0.2 0.2 % FSR DAC0832LCN, LCWM &
0.4 0.4 % FSR
LCV Monotonicity −10VV
+10V LCN, LCWM &
LJ & LCJ 4 88bits
REF
8 8 bits
LCV
Gain Error Max Using Internal R
−10VV
REF
+10V Gain Error Tempco Max Using internal R
fb
fb
7
±
0.2
0.0002 0.0006 %
±
1
. For all other limits
VCC=5V
V
to 15 V
CC
DC
=12V
±
5%
±
DC
Design
Limit
(Note 6)
±
1 %FS
±
DC
5%
5%
Limit Units
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Electrical Characteristics (Continued)
V
=10.000 VDCunless otherwise noted. Boldface limits apply over temperature, T
REF
T
=25˚C.
A
DAC0830/DAC0832
Parameter Conditions
See
Note
V
= 4.75 V
CC
VCC= 15.75 V
Typ
(Note 12)
MIN≤TA≤TMAX
DC
DC
Tested
Limit
(Note 5)
CONVERTER CHARACTERISTICS
Power Supply Rejection All digital inputs latched high
=14.5V to 15.5V 0.0002 0.0025 %
V
CC
11.5V to 12.5V 0.0006 FSR/V
4.5V to 5.5V 0.013 0.015 Reference Max 15 20 20 k Input Min 15 10 10 k Output Feedthrough
Error Output
I Leakage Current Max
I
OUT1
OUT2
V
=20 Vp-p, f=100 kHz
REF
All data inputs latched low
3 mVp-p
All data inputs LJ & LCJ 10 100 100 nA
latched low LCN, LCWM &
50 100
LCV All data inputs LJ & LCJ 100 100 nA latched high LCN, LCWM &
50 100
LCV
Output I Capacitance I
OUT1 OUT2
I
OUT1
I
OUT2
All data inputs 45 pF
latched low 115
All data inputs 130 pF
latched
30
high
DIGITAL AND DC CHARACTERISTICS
Digital Input Max Logic Low LJ: 4.75V 0.6 Voltages LJ: 15.75V 0.8
LCJ: 4.75V 0.7 V
LCJ: 15.75V 0.8
LCN, LCWM, LCV 0.95 0.8
Min Logic High LJ & LCJ 2.0 2.0 V
LCN, LCWM, LCV 1.9 2.0
Digital Input Max Digital inputs
<
0.8V
Currents LJ & LCJ −50 −200 −200 µA
LCN, LCWM, LCV −160 −200 µA Digital inputs
>
2.0V LJ & LCJ 0.1 +10 +10 µA LCN, LCWM, LCV +8 +10
Supply Current Max LJ & LCJ 1.2 3.5 3.5 mA
Drain LCN, LCWM, LCV 1.7 2.0
. For all other limits
VCC=5V
V
to 15 V
CC
DC
=12V
±
5%
±
DC
Design
Limit
(Note 6)
±
DC
5%
5%
Limit Units
FS/˚C
DC
DC
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Electrical Characteristics

V
=10.000 VDCunless otherwise noted. Boldface limits apply over temperature, T
REF
T
A
=25˚C.
MIN≤TA≤TMAX
VCC=12
Symbol Parameter Conditions
See
Note
=15.75 V
V
CC
Typ
(Note 12)
DC
Tested
Limit
(Note 5)
±
5% to 15
V
DC
±
5%
V
DC
Design Limit
(Note 6)
V
Typ
(Note 12)
AC CHARACTERISTICS
t
s
Current Setting VIL=0V,
=5V
V
IH
1.0 1.0 µs
Time
t
W
Write and XFER VIL=0V,
=5V
V
IH
11 100 250 375 600
Pulse Width Min 9 320 320 900 900
t
DS
Data Setup Time VIL=0V,
=5V
V
IH
100 250 375 600
9
Min 320 320 900 900
t
DH
Data Hold Time VIL=0V,
=5V
V
IH
9
30 50
Min 30 50
t
CS
Control Setup Time
VIL=0V,
=5V
V
IH
110 250 600 900
9
Min 320 320 1100 1100
t
CH
Control Hold Time VIL=0V,
=5V
V
IH
90
0
10 0
Min 00
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur.DC and AC electrical specifications do not apply when operating the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified. Note 3: The maximum power dissipation must be derated at elevated temperatures and is dictated by T
allowable power dissipation at any temperature is P
= 125˚C (plastic) or 150˚C (ceramic), and the typical junction-to-ambient thermal resistance of the J package when board mounted is 80˚C/W. For the N
T
JMAX
package, this number increases to 100˚C/W and for the V package this number is 120˚C/W. Note 4: For current switching applications, both I
by approximately V
Note 5: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level). Note 6: Guaranteed, but not 100% production tested. These limits are not used to calculate outgoing quality levels. Note 7: Guaranteed at V Note 8: The unit “FSR” stands for “Full Scale Range.” “Linearity Error” and “Power Supply Rejection” specs are based on this unit to eliminate dependence on a
particular V that after performing a zero and full scale adjustment (see Sections 2.5 and 2.6), the plot of the 256 analog voltage outputs will each be within 0.05%xV straight line which passes through zero and full scale.
Note 9: Boldface tested limits apply to the LJ and LCJ suffix parts only. Note 10: A 100nA leakage current with R Note 11: The entire write pulse must occur within the valid data interval for the specified t Note 12: Typicals are at 25˚C and represent most likely parametric norm. Note 13: Human body model, 100 pF discharged through a 1.5 kresistor.
OS÷VREF
value and to indicate the true performance of the part. The “Linearity Error” specification of the DAC0830 is “0.05% of FSR (MAX)”. This guarantees
REF
. For example, if V
=±10 VDCand V
REF
fb
=(T
D
and I
OUT1
=10Vthena1mVoffset, VOS,onI
REF
=±1VDC.
REF
=20k and V
REF
)/θJAor the number given in theAbsolute Maximum Ratings, whichever is lower. For this device,
JMAX−TA
must go to ground or the “Virtual Ground” of an operational amplifier.The linearity error is degraded
OUT2
=10V corresponds to a zero error of (100x10−9x20x103)x100/10 which is 0.02% of FS.
or I
OUT1
W,tDS,tDH
, θJA, and the ambient temperature, TA. The maximum
JMAX
will introduce an additional 0.01% linearity error.
OUT2
, and tSto apply.
. For all other limits
=4.75 V
CC
Tested
Limit
(Note 5)
DC
VCC=5
V
DC
±
5%
Design
Limit
(Note 6)
0
REF
DAC0830/DAC0832
Limit
Units
ns
of a
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Switching Waveform

DAC0830/DAC0832
00560802
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Definition of Package Pinouts

Control Signals

(All control signals level actuated)
CS:
Chip Select (active low). The CS in combination
with ILE will enable WR1.
ILE: Input Latch Enable (active high). The ILE in com-
bination with CS enables WR
WR1: Write 1. The active low WR1is used to load the
digital input data bits (DI) into the input latch. The data in the input latch is latched when WR To update the input latch–CS and WR1must be low while ILE is high.
WR
: Write 2 (active low). This signal, in combination with
2
XFER, causes the 8-bit data which is available in the input latch to transfer to the DAC register.
XFER:
Transfer control signal (active low). The XFER will
enable WR2.
Other Pin Functions DI
-DI7: Digital Inputs. DI0is the least significant bit (LSB)
0
and DI
I
: DAC Current Output 1. I
OUT1
is the most significant bit (MSB).
7
digital code of all 1’s in the DAC register, and is zero for all 0’s in DAC register.
I
: DAC Current Output 2. I
OUT2
I
OUT1
,orI
OUT1+IOUT2
fixed reference voltage).
R
: Feedback Resistor. The feedback resistor is pro-
fb
vided on the IC chip for use as the shunt feedback
.
1
is high.
1
is a maximum for a
OUT1
is a constant minus
OUT2
= constant (I full scale for a
resistor for the external op amp which is used to provide an output voltage for the DAC. This on-chip resistor should always be used (not an external resistor) since it matches the resistors which are used in the on-chip R-2R ladder and tracks these resistors over temperature.
: Reference Voltage Input. This input connects an
V
REF
external precision voltage source to the internal R-2R ladder. V
can be selected over the range
REF
of +10 to −10V.This is also theanalog voltage input for a 4-quadrant multiplying DAC application.
V
: Digital Supply Voltage. This is the power supply
CC
pin for the part. V Operation is optimum for +15V
can be from +5 to +15VDC.
CC
DC
GND: The pin 10 voltage must be at the same ground
potential as I applications. Any difference of potential (V
OUT1
and I
for current switching
OUT2
pin
OS
10) will result in a linearity change of
For example, if V I
and I
OUT1
OUT2
Pin 3 can be offset
= 10V and pin 10 is 9mV offset from
REF
the linearity change will be 0.03%.
±
100mV with no linearity change, but the
logic input threshold will shift.
DAC0830/DAC0832

Linearity Error

a) End point test afterzero and fs
00560823
adj.
b) Best straight line

Definition of Terms

Resolution: Resolution is directly related to the number of
switches or bits within the DAC. For example, the DAC0830
8
has 2
or 256 steps and therefore has 8-bit resolution.
Linearity Error: Linearity Error is the maximum deviation from a
straight line passing through the endpoints of the
DAC transfer characteristic
zero and full-scale. Linearity error is a parameter intrinsic to the device and cannot be externally adjusted.
National’s linearity “end point test” (a) and the “best straight line” test (b,c) used by other suppliers are illustrated above. The “end point test’’ greatly simplifies the adjustment proce­dure by eliminating the need for multiple iterations of check­ing the linearity and then adjusting full scale until the linearity is met. The “end point test’’ guarantees that linearity is met
. It is measured after adjusting for
00560824
00560825
c) Shifting fs adj. to pass
best straight line test
after a single full scale adjust. (One adjustment vs. multiple iterations of the adjustment.) The “end point test’’ uses a standard zero and F.S. adjustment procedure and is a much more stringent test for DAC linearity.
Settling Time: Settling time is the time required from a code transition until the DAC output reaches within
1
±
⁄2LSB of the final output value. Full-scale settling time requires a zero to full-scale or full-scale to zero output change.
Full Scale Error: Full scale error is a measure of the output error between an ideal DAC and the actual device output.
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Definition of Terms (Continued)
Ideally, for the DAC0830 series, full scale is V For V 10,0000V–39mV 9.961V. Full-scale error is adjustable to zero.
DAC0830/DAC0832
1 LSB to differential nonlinearity.
= 10V and unipolar operation, V
REF
−1LSB.
REF
FULL-SCALE
Monotonic: If the output of a DAC increases for increasing digital input code, then the DAC is monotonic. An 8-bit DAC which is monotonic to 8 bits simply means that increasing
=
digital input codes will produce an increasing analog output.

Typical Performance Characteristics

Digital Input Threshold
vs. Temperature
00560826

FIGURE 1. DAC0830 Functional Diagram

Digital Input Threshold
vs. V
CC
00560827
00560804
Gain and Linearity Error
Variation vs. Temperature
00560828
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Typical Performance Characteristics (Continued)
DAC0830/DAC0832
Gain and Linearity Error
Write Pulse Width
Variation vs. Supply Voltage
00560829 00560830 00560831

DAC0830 Series Application Hints

Analog signal control versatility is provided by a precision R-2R ladder network which allows full 4-quadrant multiplica­tion of a wide range bipolar reference voltage by an applied digital word.

1.0 DIGITAL CONSIDERATIONS

to the ILE pin, a two-byte µP write instruction
0
=“1”) can be
0
(also see other
CC
Data Hold Time
The timing requirements and logic level convention of the register control signals have been designed to minimize or eliminate external interfacing logic when applied to most popular microprocessors and development systems. It is easy to think of these converters as 8-bit “write-only” memory locations that provide an analog output quantity. All inputs to these DAC’s meet TTL voltage level specs and can also be driven directly with high voltage CMOS logic in non-microprocessor based systems. To prevent damage to the chip from static discharge, all unused digital inputs should be tied to V
or ground. If any of the digital inputs
CC
are inadvertantly left floating, the DAC interprets the pin as a logic “1”.

1.1 Double-Buffered Operation

Updating the analog output of these DAC’s in a double-buffered manner is basically a two step or double write operation. In a microprocessor system two unique system addresses must be decoded, one for the input latch controlled by the CS pin and a second for the DAC latch which is controlled by the XFER line. If more than one DAC is being driven,
Figure 2
, the CS line of each DAC would typically be decoded individually, but all of the converters could share a common XFER address to allow simultaneous updating of any number of DAC’s. The timing for this opera­tion is shown,
Figure 3
.
It is important to note that the analog outputs that will change after a simultaneous transfer are those from the DAC’s whose input register had been modified prior to the XFER command.
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