NSC DAC0830MWC, DAC0830LCN Datasheet

DAC0830/DAC0832 8-Bit µP Compatible, Double-Buffered D to A Converters
General Description
The DAC0830 is an advanced CMOS/Si-Cr 8-bit multiplying DAC designed to interface directly with the 8080, 8048, 8085, Z80
®
, andother popular microprocessors.Adeposited silicon-chromium R-2R resistor ladder network divides the reference current and provides the circuit with excellent tem­perature tracking characteristics (0.05%of Full Scale Range maximum linearity error over temperature). The circuit uses CMOS current switches and control logic to achieve low power consumption and low output leakage current errors. Special circuitry provides TTL logic input voltage level com­patibility.
Double buffering allows these DACs to output a voltage cor­responding to one digital word while holding the next digital word. This permits the simultaneous updating of any number of DACs.
The DAC0830 series are the 8-bit members of a family of microprocessor-compatible DACs (MICRO-DAC
).
Features
n Double-buffered, single-buffered or flow-through digital
data inputs
n Easy interchange and pin-compatible with 12-bit
DAC1230 series
n Direct interface to all popular microprocessors n Linearity specified with zero and full scale adjust
only—NOT BEST STRAIGHT LINE FIT.
n Works with
±
10V reference-full 4-quadrant multiplication
n Can be used in the voltage switching mode n Logic inputs which meet TTL voltage level specs (1.4V
logic threshold)
n Operates “STAND ALONE” (without µP) if desired n Available in 20-pin small-outline or molded chip carrier
package
Key Specifications
n Current settling time: 1 µs n Resolution: 8 bits n Linearity: 8, 9, or 10 bits (guaranteed over temp.) n Gain Tempco: 0.0002%FS/˚C n Low power dissipation: 20 mW n Single power supply: 5 to 15 V
DC
Typical Application
BI-FET™and MICRO-DAC™are trademarks of National Semiconductor Corporation. Z80
®
is a registered trademark of Zilog Corporation.
DS005608-1
May 1999
DAC0830/DAC0832 8-Bit µP Compatible, Double-Buffered D to A Converters
© 1999 National Semiconductor Corporation DS005608 www.national.com
Connection Diagrams (Top Views)
Dual-In-Line and
Small-Outline Packages
DS005608-21
Molded Chip Carrier Package
DS005608-22
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Absolute Maximum Ratings (Notes 1, 2)
If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/ Distributors for availability and specifications.
Supply Voltage (V
CC
)17V
DC
Voltage at Any Digital Input VCCto GND Voltage at V
REF
Input
±
25V Storage Temperature Range −65˚C to +150˚C Package Dissipation
at T
A
=
25˚C (Note 3) 500 mW
DC Voltage Applied to
I
OUT1
or I
OUT2
(Note 4) −100 mV to V
CC
ESD Susceptability (Note 4) 800V
Lead Temperature (Soldering, 10 sec.)
Dual-In-Line Package (plastic) 260˚C Dual-In-Line Package (ceramic) 300˚C Surface Mount Package
Vapor Phase (60 sec.) 215˚C Infrared (15 sec.) 220˚C
Operating Conditions
Temperature Range T
MIN≤TA≤TMAX
Part numbers with “LCN” suffix 0˚C to +70˚C Part numbers with “LCWM” suffix 0˚C to +70˚C Part numbers with “LCV” suffix 0˚C to +70˚C Part numbers with “LCJ” suffix −40˚C to +85˚C Part numbers with “LJ” suffix −55˚C to +125˚C
Voltage at Any Digital Input V
CC
to GND
Electrical Characteristics
V
REF
=
10.000 V
DC
unless otherwise noted. Boldface limits apply over temperature, T
MIN≤TA≤TMAX
. For all other limits
T
A
=
25˚C.
Parameter Conditions
See
Note
V
CC
=
4.75 V
DC
V
CC
=
15.75 V
DC
V
CC
=
5V
DC
±
5
%
V
CC
=
12 V
DC
±
5
%
to 15 V
DC
±
5
%
Limit
Units
Typ
(Note 12)
Tested
Limit
(Note 5)
Design
Limit
(Note 6)
CONVERTER CHARACTERISTICS
Resolution 88 8 bits Linearity Error Max Zero and full scale adjusted 4, 8
−10VV
REF
+10V
DAC0830LJ & LCJ 0.05 0.05
%
FSR
DAC0832LJ & LCJ 0.2 0.2
%
FSR
DAC0830LCN, LCWM & LCV
0.05 0.05
%
FSR
DAC0831LCN 0.1 0.1
%
FSR
DAC0832LCN, LCWM & LCV
0.2 0.2
%
FSR
Differential Nonlinearity Zero and full scale adjusted 4, 8
Max −10VV
REF
+10V
DAC0830LJ & LCJ 0.1 0.1
%
FSR
DAC0832LJ & LCJ 0.4 0.4
%
FSR
DAC0830LCN, LCWM & LCV
0.1 0.1
%
FSR
DAC0831LCN 0.2 0.2
%
FSR
DAC0832LCN, LCWM & LCV
0.4 0.4
%
FSR
Monotonicity −10VV
REF
LJ & LCJ 4 88bits
+10V LCN, LCWM & LCV 8 8 bits
Gain Error Max Using Internal R
fb
7
±
0.2
±
1
±
1
%
FS
−10VV
REF
+10V
Gain Error Tempco Max Using internal R
fb
0.0002 0.0006
%
FS/˚C
Power Supply Rejection All digital inputs latched high
V
CC
=
14.5V to 15.5V 0.0002 0.0025
%
11.5V to 12.5V 0.0006 FSR/V
4.5V to 5.5V 0.013 0.015 Reference Max 15 20 20 k Input Min 15 10 10 k Output Feedthrough Error V
REF
=
20 Vp-p, f=100 kHz
All data inputs latched low
3 mVp-p
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Electrical Characteristics (Continued)
V
REF
=
10.000 V
DC
unless otherwise noted. Boldface limits apply over temperature, T
MIN≤TA≤TMAX
. For all other limits
T
A
=
25˚C.
Parameter Conditions
See
Note
V
CC
=
4.75 V
DC
V
CC
=
15.75 V
DC
V
CC
=
5V
DC
±
5
%
V
CC
=
12 V
DC
±
5
%
to 15 V
DC
±
5
%
Limit Units
Typ
(Note 12)
Tested
Limit
(Note 5)
Design
Limit
(Note 6)
CONVERTER CHARACTERISTICS
Output Leakage Current Max
I
OUT1
All data inputs LJ & LCJ 10 100 100 nA
latched low LCN, LCWM & LCV 50 100
I
OUT2
All data inputs LJ & LCJ 100 100 nA latched high LCN, LCWM & LCV 50 100
Output I
OUT1
All data inputs 45 pF
Capacitance I
OUT2
latched low 115
I
OUT1
All data inputs 130 pF
I
OUT2
latched high 30
DIGITAL AND DC CHARACTERISTICS
Digital Input Max Logic Low LJ: 4.75V 0.6 Voltages LJ: 15.75V 0.8
LCJ: 4.75V 0.7 V
DC
LCJ: 15.75V 0.8 LCN, LCWM, LCV 0.95 0.8
Min Logic High LJ & LCJ 2.0 2.0 V
DC
LCN, LCWM, LCV 1.9 2.0
Digital Input Max Digital inputs
<
0.8V
Currents LJ & LCJ −50 −200 −200 µA
LCN, LCWM, LCV −160 −200 µA
Digital inputs
>
2.0V LJ & LCJ 0.1 +10 +10 µA LCN, LCWM, LCV +8 +10
Supply Current Max LJ & LCJ 1.2 3.5 3.5 mA
Drain LCN, LCWM, LCV 1.7 2.0
Electrical Characteristics
V
REF
=
10.000 V
DC
unless otherwise noted. Boldface limits apply over temperature, T
MIN≤TA≤TMAX
. For all other limits
T
A
=
25˚C.
Symbol Parameter Conditions
See
Note
V
CC
=
15.75 V
DC
V
CC
=
12 V
DC
±
5
%
to 15 V
DC
±
5
%
V
CC
=
4.75 V
DC
V
CC
=
5
V
DC
±
5
%
Limit
Units
Typ
(Note 12)
Tested
Limit
(Note 5)
Design Limit
(Note 6)
Typ
(Note 12)
Tested
Limit
(Note 5)
Design
Limit
(Note 6)
AC CHARACTERISTICS
t
s
Current Setting V
IL
=
0V, V
IH
=
5V 1.0 1.0 µs
Time
t
W
Write and XFER V
IL
=
0V, V
IH
=
5V 11 100 250 375 600
Pulse Width Min 9 320 320 900 900
t
DS
Data Setup Time V
IL
=
0V, V
IH
=
5V 9 100 250 375 600
Min 320 320 900 900
t
DH
Data Hold Time V
IL
=
0V, V
IH
=
5V 9 30 50 ns
Min 30 50
t
CS
Control Setup Time V
IL
=
0V, V
IH
=
5V 9 110 250 600 900
Min 320 320 1100 1100
t
CH
Control Hold Time V
IL
=
0V, V
IH
=
5V 9 0 0 10 00
Min 00
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when operating the device beyond its specified operating conditions.
Note 2: All voltages are measured with respect to GND, unless otherwise specified.
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Electrical Characteristics (Continued)
Note 3: The maximum power dissipation must be derated at elevated temperatures and is dictated by T
JMAX
, θJA, and the ambient temperature, TA. The maximum
allowable power dissipation at any temperature is P
D
=
(T
JMAX−TA
)/θJAor the number given in the Absolute Maximum Ratings, whichever is lower. For this device,
T
JMAX
=
125˚C (plastic) or 150˚C (ceramic), and the typical junction-to-ambient thermal resistance of the J package when board mounted is 80˚C/W.For the N pack-
age, this number increases to 100˚C/W and for the V package this number is 120˚C/W. Note 4: For current switching applications, both I
OUT1
and I
OUT2
must go to ground or the “Virtual Ground” of an operational amplifier. The linearity error is degraded
by approximately V
OS
÷
V
REF
. For example, if V
REF
=
10Vthena1mVoffset, V
OS
,onI
OUT1
or I
OUT2
will introduce an additional 0.01%linearity error.
Note 5: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level). Note 6: Guaranteed, but not 100%production tested. These limits are not used to calculate outgoing quality levels. Note 7: Guaranteed at V
REF
=
±
10 VDCand V
REF
=
±
1VDC.
Note 8: The unit “FSR” stands for “Full Scale Range.” “Linearity Error” and “Power Supply Rejection” specs are based on this unit to eliminate dependence on a par­ticular V
REF
value and to indicate the true performance of the part. The “Linearity Error” specification of the DAC0830 is “0.05%of FSR (MAX)”. This guarantees that
after performing a zero and full scale adjustment (see Sections 2.5 and 2.6), the plot of the 256 analog voltage outputs will each be within 0.05%xV
REF
of a straight
line which passes through zero and full scale.
Note 9: Boldface tested limits apply to the LJ and LCJ suffix parts only. Note 10: A 100nA leakage current with R
fb
=
20k and V
REF
=
10V corresponds to a zero error of (100x10
−9
x20x103)x100/10 which is 0.02%of FS.
Note 11: The entire write pulse must occur within the valid data interval for the specified t
W,tDS,tDH
, and tSto apply.
Note 12: Typicals are at 25˚C and represent most likely parametric norm. Note 13: Human body model, 100 pF discharged through a 1.5 kresistor.
Switching Waveform
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Definition of Package Pinouts
Control Signals (All control signals level actuated) CS:
Chip Select (active low). The CS in combination
with ILE will enable WR1.
ILE: InputLatch Enable (active high). The ILE in combi-
nation with CS enables WR
1
.
WR1: Write1. The active low WR1is used to load the digi-
tal input data bits (DI) into the input latch. The data in the input latch is latched when WR
1
is high. To update the input latch–CS and WR1must be low while ILE is high.
WR
2
: Write2 (active low). This signal, in combination with
XFER, causes the 8-bit data which is available in the input latch to transfer to the DAC register.
XFER:
Transfercontrol signal (active low). The XFER will
enable WR2.
Other Pin Functions DI
0
-DI7: Digital Inputs. DI0is the least significant bit (LSB)
and DI
7
is the most significant bit (MSB).
I
OUT1
: DAC Current Output 1. I
OUT1
is a maximum for a digital code of all 1’s in the DAC register, and is zero for all 0’s in DAC register.
I
OUT2
: DAC Current Output 2. I
OUT2
is a constant minus I
OUT1
,orI
OUT1+IOUT2
=
constant (I full scale for
a fixed reference voltage).
R
fb
: Feedback Resistor. The feedback resistor is pro-
vided on the IC chip for use as the shunt feedback resistor for the external op amp which is used to provide an output voltage for the DAC. This on­chip resistor should always be used (not an exter­nal resistor) since it matches the resistors which are used in the on-chip R-2R ladder and tracks these resistors over temperature.
V
REF
: Reference Voltage Input. This input connects an
external precision voltage source to the internal R-2R ladder. V
REF
can be selected over the range of +10 to −10V. This is also the analog voltage in­put for a 4-quadrant multiplying DAC application.
V
CC
: Digital Supply Voltage. This is the power supply
pin for the part. V
CC
can be from +5 to +15VDC.
Operation is optimum for +15V
DC
GND: The pin 10 voltage must be at the same ground
potential as I
OUT1
and I
OUT2
for current switching
applications. Any difference of potential (V
OS
pin
10) will result in a linearity change of
For example, if V
REF
= 10V and pin 10 is 9mV offset from
I
OUT1
and I
OUT2
the linearity change will be 0.03%.
Pin 3 can be offset
±
100mV with no linearity change, but the
logic input threshold will shift.
Linearity Error
Definition of Terms
Resolution: Resolution is directly related to the number of
switches or bits within the DAC. For example, the DAC0830 has 2
8
or 256 steps and therefore has 8-bit resolution.
Linearity Error: Linearity Error is the maximum deviation from a
straight line passing through the endpoints of the
DAC transfer characteristic
. It is measured after adjusting for zero and full-scale. Linearity error is a parameter intrinsic to the device and cannot be externally adjusted.
National’s linearity “end point test” (a) and the “best straight line” test (b,c) used by other suppliers are illustrated above. The “end point test’’ greatly simplifies the adjustment proce­dure by eliminating the need for multiple iterations of check­ing the linearity and then adjusting full scale until the linearity is met. The “end point test’’ guarantees that linearity is met after a single full scale adjust. (One adjustment vs. multiple
iterations of the adjustment.) The “end point test’’ uses a standard zero and F.S. adjustment procedure and is a much more stringent test for DAC linearity.
Power Supply Sensitivity: Power supply sensitivity is a measure of the effect of power supply changes on the DAC full-scale output.
Settling Time: Settling time is the time required from a code transition until the DAC output reaches within
±
1
⁄2LSB of the final output value. Full-scale settling time requires a zero to full-scale or full-scale to zero output change.
Full Scale Error: Full scale error is a measure of the output error between an ideal DAC and the actual device output. Ideally, for the DAC0830 series, full scale is V
REF
−1LSB.
For V
REF
=
10V and unipolar operation, V
FULL-SCALE
= 10,0000V–39mV 9.961V. Full-scale error is adjustable to zero.
DS005608-23
a) End point test after
zero and fs adj.
DS005608-24
b) Best straight line
DS005608-25
c) Shifting fs adj. to pass
best straight line test
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Definition of Terms (Continued)
Differential Nonlinearity: The difference between any two
consecutive codes in the transfer curve from the theoretical 1 LSB to differential nonlinearity.
Typical Performance Characteristics
DS005608-4
FIGURE 1. DAC0830 Functional Diagram
Digital Input Threshold vs. Temperature
DS005608-26
Digital Input Threshold vs. V
CC
DS005608-27
Gain and Linearity Error Variation vs. Temperature
DS005608-28
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Typical Performance Characteristics (Continued)
DAC0830 Series Application Hints
These DAC’s are the industry’s first microprocessor compat­ible, double-buffered 8-bit multiplying D to A converters. Double-buffering allows the utmost application flexibility from a digital control point of view. This 20-pin device is also pin for pin compatible (with one exception) with the DAC1230, a 12-bit MICRO-DAC. In the event that a system’s analog out­put resolution and accuracy must be upgraded, substituting the DAC1230 can be easily accomplished. By tying address bit A
0
to the ILE pin, a two-byte µP write instruction (double precision) which automatically increments the address for the second byte write (starting with A
0
=
“1”) can be used. This allows either an 8-bit or the 12-bit part to be used with no hardware or software changes. For the simplest 8-bit ap­plication, this pin should be tied to V
CC
(also see other uses
in section 1.1). Analog signal control versatility is provided by a precision
R-2R ladder network which allows full 4-quadrant multiplica­tion of a wide range bipolar reference voltage by an applied digital word.
1.0 DIGITAL CONSIDERATIONS
The timing requirements and logic level convention of the register control signals have been designed to minimize or eliminate external interfacing logic when applied to most popular microprocessors and development systems. It is easy to think of these converters as 8-bit “write-only” memory locations that provide an analog output quantity.All inputs to these DAC’s meet TTL voltage level specs and can also be driven directly with high voltage CMOS logic in non-microprocessor based systems. To prevent damage to the chip from static discharge, all unused digital inputs should be tied to V
CC
or ground. If any of the digital inputs are inadvertantly left floating, the DAC interprets the pin as a logic “1”.
1.1 Double-Buffered Operation
Updating the analog output of these DAC’s in a double-buffered manner is basically a two step or double write operation. In a microprocessor system two unique sys­tem addresses must be decoded, one for the input latch con­trolled by the CS pin and a second for the DAC latch which is controlled by the XFER line. If more than one DAC is being driven,
Figure 2
, the CS line of each DAC would typically be decoded individually, but all of the converters could share a common XFER address to allow simultaneous updating of any number of DAC’s. The timing for this operation is shown,
Figure 3
.
It is important to note that the analog outputs that will change after a simultaneous transfer are those from the DAC’s whose input register had been modified prior to the XFER command.
Gain and Linearity Error Variation vs. Supply Voltage
DS005608-29
Write Pulse Width
DS005608-30
Data Hold Time
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