: Analog Unit Input
CTLIN: CTL Amplifier Input CapacitorRESET: Reset
CTLOUT1, CTLOUT2
: CTL Amplifier OutputROTC: Chrominance Rotate Output
DFGIN: Analog Unit InputSCK1, SCK2: Serial Clock
DPGIN: Analog Unit InputSI1, SI2: Serial Input
ENV: Envelope InputSO1, SO2: Serial Output
HASW: Head Amplifier Switch OutputSTRB: Serial Strobe
HWIN: Hardware Timer External InputV
APPENDIX A. DEVELOPMENT TOOLS ····························································································· 48
APPENDIX B. SOCKET DRAWING AND RECOMMENDED FOOTPRINT ········································ 50
APPENDIX C. RELATED DOCUMENTS ···························································································· 52
*
*
*
11
µ
1. DIFFERENCES BETWEEN µPD78P4916 AND µPD784915, µPD784916A
*
Other than the memory types, their capacities, and memory-related points, the functions of the three devices are
µ
identical: the
784916A contain mask ROMs.
Table 1-1 shows the differences among these devices. Be sure to keep in mind these differences especially when
debugging and pre-producing the application system with the PROM version and then mass-producing it with the
mask-ROM version.
For the details about the CPU functions and on-chip hardware, refer to the
Manual—Hardware (U10444E).
PD78P4916 incorporates a one-time PROM that is rewritable by users, while the µPD784915 and
µ
PD784915 Subseries User’s
µ
Table 1-1. Differences among
PD784915 Subseries Devices
PD78P4916
Parameters
Internal ROMOne-time PROMMask ROMMask ROM
Internal RAM2048 bytes
Internal memory size select register (IMS)ProvidedNot providedNot provided
PinoutsPins related to PROM writing and reading are provided on the µPD78P4916.
OtherThere are differences in noise immunity, noise radiation, and some electrical
Note The internal PROM and RAM capacities of the
size select register (IMS).
Caution There are differences in noise immunity and noise radiation between the PROM and mask-ROM
versions. When pre-producing the application set with the PROM version and then massproducing it with the mask-ROM version, be sure to conduct sufficient evaluations for the set
using consumer samples (not engineering samples) of the mask-ROM version.
µ
PD78P4916
62 Kbytes
specifications, because of the differences in circuit complexity and mask
layout.
Note
Note
µ
PD78P4916 can be changed through its internal memory
µ
PD784915
48 Kbytes62 Kbytes
1280 bytes1280 bytes
µ
PD784916A
12
2. PIN FUNCTION
2.1 Normal Operation Mode
(1) Port Pins
µ
PD78P4916
Pin NameInput/Output
P00 - P07I/OReal-time8-bit input/output port (Port0)
Pin NameInput/Output
INTP0 - INTP2Input–External interrupt request input
INTP3InputREEL0IN
KEY0 - KEY4InputP91 - P95Key input signal
CLOOutputP60/STRBClock output
BUZOutputP61/SCK1Buzzer output
HWINInputP65Hardware timer external input
RESETInput–Reset input
X1Input–Crystal resonator connection for main system clock oscillation
X2–
XT1Input–Crystal resonator connection for subsystem clock oscillation
XT2–
AVDD1, AVDD2––Positive power supply for analog unit
AVSS1, AVSS2––GND for analog unit
AVREF––Reference voltage input to A/D converter
VDD––Positive power supply to digital unit
VSS––GND of digital unit
IC––Internally connected. Connect directly to V SS.
Alternate function
Description
Crystal resonator connection for clock oscillation of watch
2.2 PROM Programming Mode (VPP≥ 5 V, RESET = L)
Pin nameInput/outputFunction
VPP–Set PROM programming mode
High voltage applied at program write/verify operation
RESETInputLow level input for setting PROM programming mode
A0 - A16Address input
D0 - D7I/OData input/output
PGMInputProgram inhibit input in PROM programming mode
CEPROM enable input / programming pulse input
OERead strobe input to PROM
VDD–Positive power supply
VSSGND potential
15
µ
2.3 Pin I/O Circuits and Recommended Connection of Unused Pins
*
Table 2-1 shows the input/output circuit types of the device’s pins and the recommended connection
of the pins which are unnecessary to the user’s application. The circuit diagrams for the I/O circuits are
shown in Figure 2-1.
Table 2-1. Pin I/O Circuits and Recommended Connection of Unused Pins (1/2)
PinsI/O circuit typesDirectionRecommended connection of unused pins
P00-P075-AI/OInput mode: Connect to VDD.
P40-P47Output mode: Leave unconnected.
P50-P57
P60/STRB/CLO
P61/SCK1/BUZ
P62/SO15-A
P63/SI18-A
P645-A
P65/HWIN8-A
P66/PWM45-A
P67/PWM5
P70/ANI0-P77/ANI79InputConnect to VSS.
P805-AI/OInput mode: Connect to VDD.
P82/HASWOutput mode: Leave unconnected.
P83/ROTC
P84/PWM2
P85/PWM3
P86/PTO10
P87/PTO11
P90/ENV
P91/KEY0-P95/KEY48-A
P965-A
SI2/BUSY2-AInputConnect to VDD.
SO24OutputHigh-impedance mode: Connect to VSS via a pull-down resistor.
SCK2
ANI8-ANI117InputConnect to VSS.
RECCTL+, RECCTL–—I/OWhen ENCTL = 0 and ENREC = 0: Connect to VSS.
8-A
Otherwise: Leave unconnected.
8-AI/OInput mode: Connect to VDD.
Output mode: Leave unconnected.
PD78P4916
Remark ENCTL: Bit 1 of the amplifier control register (AMPC)
ENREC: Bit 7 of the amplifier mode register 0 (AMPM0)
16
µ
PD78P4916
Table 2-1. Pin I/O Circuits and Recommended Connection of Unused Pins (2/2)
PinsI/O circuit typesDirectionRecommended connection of unused pins
DFGIN—InputENDRUM = 0: Connect to VSS.
DPGINENDRUM = 0, or ENDRUM = 1 and SELPGSEPA = 0:
Connect to VSS.
CFGIN, CFGCPINENCAP = 0: Connect to VSS.
CSYNCINENCSYN = 0: Connect to VSS.
REEL0IN/INTP3, REEL1IN
CTLOUT1—OutputLeave unconnected.
CTLOUT2—I/OWhen ENCTL and ENCOMP = 0 and 0: Connect to VSS.
CFGAMPO—OutputLeave unconnected.
CTLIN——When ENCTL = 0: Leave unconnected.
VREFCWhen ENCTL, ENCAP, and ENCOMP = 0, 0, and 0:
CTLDLYLeave unconnected.
PWM0, PWM13OutputLeave unconnected.
PTO00-PTO02
NMI2InputConnect to VDD.
INTP0Connect to VDD or VSS.
INTP1, INTP22-AInputConnect to VDD.
AVDD1, AVDD2——Connect to VDD.
AVREF, AVSS1, AVSS2Connect to VSS.
RESET
XT1——Connect to VSS.
XT2Leave unconnected.
ICConnect directly to VSS.
2——
ENREEL = 0: Connect to VSS.
ENCTL = 1: Leave unconnected.
Leave unconnected.
RemarkENDRUM:Bit 2 of the amplifier control register (AMPC)
SELPGSEPA: Bit 2 of the amplifier mode register 0 (AMPM0)
ENCAP:Bit 3 of the amplifier control register (AMPC)
ENCSYN:Bit 5 of the amplifier control register (AMPC)
ENREEL:Bit 6 of the amplifier control register (AMPC)
ENCTL:Bit 1 of the amplifier control register (AMPC)
ENCOMP:Bit 4 of the amplifier control register (AMPC)
17
Figure 2-1. Pin I/O Circuit Diagrams (1/2)
µ
PD78P4916
Type 2
IN
Schmitt triggered input with hysteresis characteristics.
Type 2-A
V
DD
P-ch
pullup
enable
IN
Schmitt triggered input with hysteresis characteristics.
Type 3
DD
V
P-ch
Type 5-A
pullup
enable
data
output
disable
input
enable
Type 7
IN
P-ch
N-ch
V
DD
P-ch
N-ch
Comparator
V
P-ch
DD
IN/
OUT
data
OUT
N-ch
Type 4
V
DD
data
output
P-ch
N-ch
disable
Push-pull output that can also set the output to the
high-impedance state
(both P-ch and N-ch transistors are turned off.)
OUT
Type 8-A
pullup
enable
data
output
disable
V
REF
(Threshold voltage)
V
DD
P-ch
N-ch
P-ch
V
DD
IN/
OUT
18
Type 9
Figure 2-1. Pin I/O Circuit Diagrams (2/2)
µ
PD78P4916
IN
P-ch
N-ch
Comparator
V
REF
(Threshold voltage)
input enable
19
µ
PD78P4916
3. INTERNAL MEMORY CAPACITY SELECT REGISTER (IMS)
Internal memory capacity select register (IMS) specifies the effective area of on-chip memory (PROM, RAM) of
µ
PD78P4916. Setting this register is required when the capacity of the ROM or RAM in the mask version is
the
smaller than that of the
this register, bugs in application programs due to accessing an address beyond the memory capacity of the actual
chip can be avoided.
The IMS register is write-only register. To write this register, use the 8-bit manipulation instruction.
The register is initialized to FFH by RESET input (ROM: 62 Kbytes, RAM: 2048 bytes).
µ
PD78P4916. If the memory capacity of the µPD78P4916 is appropriately defined using
*
76542310
111ROM1 ROM01RAM1 RAM0IMSFFFCH
Caution The
write instruction to IMS is executed in the
or malfunctions.
Figure 3-1. Internal Memory Capacity Select Register (IMS) Format
R/WState at resetAddress
FFH
RAM1 RAM0
0
1
Other
ROM1 ROM0
1
1
Other
µ
PD78P4916 has the IMS and the µPD784915 and 784916A do not have it. However, if a
µ
PD784915 or 784916A, it does not cause conflicts
Specification of internal RAM capacity
1
1280 bytes
1
2048 bytes
Setting prohibited
Specification of internal ROM capacity
0
48 Kbytes
1
62 Kbytes
Setting prohibited
W
20
µ
PD78P4916
4. PROM PROGRAMMING
The µPD78P4916 has on-chip 62-Kbyte PROM as the program memory. The PROM programming mode is
entered by setting V
DD, IC/VPP, and RESET pins as specified. For the settings of the unused pins in this mode,
refer to the drawing of “(2) PROM Programming Mode” in the section “Pin Configuration (Top View)”.
4.1 Operation Mode
The PROM programming mode is entered by applying +5 V or +12 V to the IC/VPP pin, +5 V or +6.5 V to the VDD
pins, and low-level voltage to the RESET pin. Table 4-1 shows the operation mode specified by the CE, OE, and
PGM pins.
It is possible to read the contents of PROM by setting up read operation mode.
Table 4-1. Operation Mode of PROM Programming
Pins
Operation mode
Page data latchL+12.5 V +6.5 VHLHData input
Page writeHHLHigh impedance
Byte writeLHLData input
Program verifyLLHData output
Program inhibit×HHHigh impedance
By setting CE = L and OE = L, the device enters the read mode.
(2) Output disable mode
By setting OE = H, the device enters the output disable mode, where data output pins go to high impedance
state.
Therefore it is possible to read data from a specified device by enabling only the OE pin of the device to be
read, if two or more
(3) Standby mode
By setting CE = H, the device enters the Standby mode.
In this mode, data output pins go to high impedance state regardless of the OE pin condition.
(4) Page data latch mode
By setting CE = H, PGM = H, and OE = L at the beginning of page programming mode, the device enters the
page data latch mode.
In this mode, 4-byte data are latched in page units (consisting of 4 bytes) to internal address/data latch circuit.
µ
PD78P4916s are connected to a data bus.
(5) Page programming mode
After one-page data (consisting of 4 bytes) and their address are latched in the page data latch mode, the page
programming operation is executed by applying 0.1-ms programming pulse (active low) to the PGM pin under
CE = H, OE = H conditions. Following that operation, the programming data is verified by setting CE = L and
OE = L.
When data is not programmed by one programming pulse, the write and verify operations are repeated X times
(X ≤ 10).
(6) Byte programming mode
Applying 0.1-ms programming pulse (active low) to the PGM pin under CE = L and OE = H condition, byte
programming operation is executed. Next, the programming data is verified by setting OE = L.
When data is not programmed by one programming pulse, the write and verify operations are repeated X times
(X ≤ 10).
(7) Program verify mode
By setting CE = L, PGM = H, and OE = L, the device enters the program verify mode. Check whether data
is programmed correctly or not in this mode after write operation.
(8) Program inhibit mode
When the OE pins, V
program inhibit mode to write data to one of those devices.
Programming is executed in the page programming mode or byte programming mode as mentioned above. At
that time, data is not programmed to a device for which high level voltage is applied to the PGM pin.
PP pins, and D0-D7 pins of two or more
µ
PD78P4916s are connected in parallel, use
22
4.2 PROM Write Procedure
Figure 4-1. Flowchart in Page Programming Mode
Start
Address = G
DD
= 6.5 V, VPP = 12.5 V
V
X = 0
Latch
Address = Address + 1
Latch
Address = Address + 1
µ
PD78P4916
Address = Address + 1
Latch
Address = Address + 1
Latch
X = X+1
0.1-ms programming pulse
Verify 4 bytes
Pass
No
Pass
Address = N ?
Yes
VDD = 4.5 to 5.5 V, VPP = V
Verify all bytes
All Pass
No
X = 10?
Fail
DD
Fail
Yes
Remarks 1. G = Start address
2. N = End address of the program
Write operation end
Defective
23
Figure 4-2. Operation Timing in Page Programming Mode
Page data latchPage programmingProgram verify
µ
PD78P4916
A2 - A16
A0, A1
D0 - D7
V
PP
V
DD
CE
PGM
OE
V
PP
V
DD
VDD+1.5
V
DD
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
Address input
Address input
Hi-Z
Data inputData output
Hi-ZHi-Z
24
Figure 4-3. Flowchart in Byte Programming Mode
Start
Address = G
VDD = 6.5 V, VPP = 12.5 V
X = 0
µ
PD78P4916
Address = Address + 1
Pass
Remarks 1. G = Start address
2. N = End address of the program
X = X+1
0.1-ms programming pulse
Verify
Pass
No
Address = N ?
Yes
VDD = 4.5 to 5.5 V, VPP = V
Verify all bytes
All Pass
Write operation end
No
X = 10?
Fail
DD
Fail
Yes
Defective
25
Figure 4-4. Operation Timing in Byte Programming Mode
ProgrammingProgram verify
µ
PD78P4916
A0 - A16
D0 - D7
V
PP
V
DD
CE
PGM
OE
V
PP
V
DD
VDD+1.5
V
DD
V
IH
V
IL
V
IH
V
IL
V
IH
V
IL
Address input
Data inputData output
Hi-Z
Hi-ZHi-Z
Cautions 1. Apply voltage to V
is cut off.
2. The voltage including overshoot applied to VPP pin must be kept less than +13.5 V.
3. If a device is inserted or removed while +12.5 V is applied to V
affected in reliability.
DD before applying voltage to VPP, and cut off VDD voltage after VPP voltage
PP pin, it may be adversely
26
µ
PD78P4916
4.3 PROM Read Procedure
The contents of PROM can be read onto external data bus (D0-D7) as described below:
(1) Fix RESET pin to low and supply +5 V to VPP pin. Connect other unused pins as specified in “(2) PROM
Programming Mode” in section “Pin Configuration (Top View)."
(2) Supply +5 V to the V
(3) Input the address of the data to be read to the A0-A16 pins.
(4) Enter the read mode (CE = L, OE = L).
(5) Output data to D0-D7 pins.
The above operation timing from (2) to (5) is shown in Figure 4-5.
DD and VPP pins.
Figure 4-5. PROM Read Timing
A0 - A16
CE (Input)
OE (Input)
D0 - D7
Hi-Z
Address input
Data output
Hi-Z
4.4 Screening One-time PROM Versions
The one-time PROM version (µPD78P4916GF-3BA) cannot be completely tested by NEC for shipment because
of its structure. For screening, it is recommended to verify PROM after storing the necessary data under the following
conditions:
Storage TemperatureStorage Time
125 ˚C24 hours
27
5. ELECTRICAL SPECIFICATIONS
*
Absolute Maximum Ratings (TA = 25 ˚C)
ParameterSymbolConditionsRatingsUnit
Supply voltageVDDVDD – AVDD1≤ 0.5 V–0.5 to +7.0V
AVDD1VDD – AVDD2≤ 0.5 V–0.5 to +7.0V
AVDD2AVDD1 – AVDD2≤ 0.5 V–0.5 to +7.0V
AVSS1–0.5 to +0.5V
AVSS2–0.5 to +0.5V
Input voltageVI–0.5 to VDD+0.5V
Analog input voltageVIANVDD≥ AVDD2–0.5 to AVDD2+0.5V
(ANI0-ANI11)
Output voltageVO–0.5 to VDD+0.5V
Output current, low
Output current, high
Operating ambientTA–10 to +70˚C
temperature
Storage temperatureT stg–65 to +150˚C
IOLPer pin15mA
IOHPer pin–10mA
VDD < AVDD2–0.5 to VDD+0.5V
Total of all output pins100mA
Total of all output pins–50mA
µ
PD78P4916
Caution If any of the above parameters exceeds the absolute maximum ratings, even momentarily,
device reliability may be impaired. The absolute maximum ratings are values that may
physically damage the product. Be sure to use the product within the ratings.
Operating Conditions
Clock frequency
4 MHz ≤ fXX≤ 16 MHz–10 to +70 ˚CAll functions+4.5 to +5.5 V
32 kHz ≤ fXT≤ 35 kHzSubclock operation (CPU, watch,+2.7 to +5.5 V
ParameterSymbolConditionsMIN.TYP.MAX.Unit
CTL+, – input resistanceRICTL2510kΩ
Feedback resistanceRFCTL2050100kΩ
Bias resistanceRBCTL2050100kΩ
Minimum voltage gainGCTLMIN172022dB
Maximum voltage gainGCTLMAX7175dB
Gain switching stepSGAIN1.77dB
Common mode signal rejectionCMRDC, Voltage gain: 20 dB50dB
Comparator set voltage forVPBCTLHS
waveform regulation, high
Comparator reset voltage forVPBCTLHR
waveform regulation, high
Comparator set voltage forVPBCTLLS
waveform regulation, low
Comparator reset voltage forVPBCTLLR
waveform regulation, low
Comparator high voltage for CLT flag S
Comparator low voltage for CLT flag S
Comparator high voltage for CLT flag L
Comparator low voltage for CLT flag L
Parameter
Address setup timetAS2
CE set timetCES2
Input data setup timetDS2
Address hold timetAH2
Input data hold timetDH2
Output data hold timetDF0230ns
VPP setup timetVPS2
VDDP setup timetVDS
Initial programming pulse widthtPW0.0950.10.105ms
OE set timetOES2
OE → valid data delay timetOE1
OE pulse width during data latchtLW1
PGM set-up timetPGMS2
CE hold timetCEH2
OE hold timetOEH2
Note 1
Symbol
tAHL2
tAHV0
Note 2
ConditionsMIN.TYP.MAX.Unit
µ
µ
µ
µ
µ
µ
µ
µ
2
µ
µ
µ
µ
µ
µ
µ
s
s
s
s
s
s
s
s
s
s
s
s
s
s
s
Notes 1. Correspond to symbols of the µPD27C1001A (except tVDS).
VDS corresponds to tVCS of the
2. t
µ
PD27C1001A.
42
PROM Write Mode (Byte Programming Mode)
µ
PD78P4916
Parameter
Address setup timetAS2
CE set timetCES2
Input data setup timetDS2
Address hold timetAH2
Input data hold timetDH2
Output data hold timetDF0130ns
VPP setup timetVPS2
VDDP setup timetVDS
Initial programming pulse widthtPW0.0950.10.105ms
OE set timetOES2
OE → valid data delay timetOE150ns
Symbol
Note 1
Note 2
ConditionsMIN.TYP.MAX.Unit
2
Notes 1. Correspond to symbols of the µPD27C1001A (except tVDS).
2. t
VDS corresponds to tVCS of the
µ
PD27C1001A.
PROM Read Mode
Parameter
Address → data output timetACCCE = OE = VIL200ns
CE ↓ → data output timetCEOE = VIL200ns
OE ↓ → data output timetOECE = VIL75ns
Data hold time (from OE ↑, CE ↑)
Data hold time (
from
address)tOHCE = OE = VIL0ns
Note 2
Note 1
Symbol
tDFCE = VIL or OE = VIL060ns
ConditionsMIN.TYP.MAX.Unit
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
µ
s
Notes 1. Correspond to symbols of the µPD27C1001A.
2. t
DF is a time after either OE or CE rose to VIH first.
43
PROM Write Mode Timing (Page Programming Mode)
Page data latchPage programmingProgram verify
A2 - A16
t
AS
A0, A1
t
AHL
µ
PD78P4916
t
AHV
V
V
DDP
CE
PGM
OE
PP
D0 - D7
V
DDP
V
V
DDP
+1.5
V
DDP
V
V
V
V
V
V
DS
t
Hi-Z
t
VPS
PP
t
VDS
IH
IL
IH
IL
IH
IL
t
Data input
LW
t
DH
Hi-Z
t
t
OE
CEH
t
PGMS
t
PW
t
CES
t
DH
Data
output
t
OES
t
OEH
Hi-Z
t
AH
44
PROM Write Mode Timing (Byte Programming Mode)
ProgrammingProgram verify
A0 - A16
t
AS
V
V
DDP
CE
PGM
OE
PP
D0 - D7
V
V
DDP
VDD+1.5
V
DDP
V
V
V
V
V
V
PP
IH
IL
IH
IL
IH
IL
Data inputData output
t
t
t
t
DS
VPS
VDS
CES
t
PW
t
DH
µ
PD78P4916
t
DF
Hi-Z
t
OES
t
OE
Hi-ZHi-Z
t
AH
Cautions1. Apply voltage to V
DDP before applying voltage to VPP, and cut off VDDP voltage after VPP voltage
is cut off.
2. The voltage, including overshoot, applied to V
3. If a device is inserted or removed while +12.5 V is applied to V
affected in reliability.
PROM Read Mode Timing
A0 - A16
CE
OE
D0 - D7
Hi-Z
Notes 1. If data need to be read within t
should be t
DF is the time after either OE or CE first rose to VIH.
2. t
ACC – tOE.
PP pin must be kept less than +13.5 V.
PP pin, it may be adversely
Valid address
t
CE
Note 2
t
Note 1
t
OE
Note 1
t
ACC
t
OH
Data output
ACC, the maximum delay time of OE active level input from CE falling
DF
Hi-Z
45
6. PACKAGE DRAWING
100 PIN PLASTIC QFP (14 × 20)
µ
PD78P4916
A
B
80
81
100
F
1
G
H
M
I
P
N
NOTE
Each lead centerline is located within 0.15
mm (0.006 inch) of its true position (T.P.) at
maximum material condition.
51
50
C
D
detail of lead end
S
Q
31
30
J
K
M
L
P100GF-65-3BA1-2
ITEMMILLIMETERSINCHES
A
B
C
D
F
G
H
I
J
K
L
M
N
23.6±0.4
20.0±0.2
14.0±0.2
17.6±0.4
0.8
0.6
0.30±0.10
0.15
0.65 (T.P.)
1.8±0.2
0.8±0.2
+0.10
0.15
–0.05
0.10
0.929±0.016
+0.009
0.795
–0.008
+0.009
0.551
–0.008
0.693±0.016
0.031
0.024
+0.004
0.012
–0.005
0.006
0.026 (T.P.)
+0.008
0.071
–0.009
+0.009
0.031
–0.008
+0.004
0.006
–0.003
0.004
P2.70.106
Q
0.1±0.1
0.004±0.004
S3.0 MAX.0.119 MAX.
5°
±
5°
46
µ
PD78P4916
7. RECOMMENDED SOLDERING CONDITIONS
This device should be soldered and mounted under the following conditions.
For details about the recommended conditions, refer to the document “Semiconductor Device Mounting
Technology Manual” (C10535E). For soldering methods and conditions other than those recommended below,
contact your NEC sales representative.
Table 7-1. Surface Mounting Type Soldering Conditions
(at 200 ˚C or higher), Number of reflow processes: 2 or less
<Attention>
(1) Wait for the device temperature to come down to room temperature
after the first reflow before starting the second reflow.
(2) Do not perform flux cleaning of the soldered portion after the first reflow.
Wave soldering
Partial heatingPin temperature: 300 ˚C or below, Time: 3 seconds or less (per pin row)—
Caution Do not use different soldering methods together (except for partial heating).
Solder temperature: 260 ˚C or below, Flow time: 10 seconds or less, Number of flow
process: 1, Preheating temperature; 120 ˚C max. (package surface temperature)
WS60-00-1
47
APPENDIX A. DEVELOPMENT TOOLS
*
The following development tools are prepared for system development using the µPD78P4916.
Language Software
µ
PD78P4916
RA78K4
CC78K4
CC78K4-L
Note 1
Note 1
Note 1
Assembler package common to the 78K/IV Series
C compiler package common to the 78K/IV Series
C compiler library source file common to the 78K/IV Series
PROM Writing Tool
PG-1500PROM programmer
PA-78P4916GFProgrammer adapter connected to the PG-1500
PG-1500 Controller
Note 2
Control program for PG-1500
Debugging Tool
IE-784000-RIn-circuit emulator common to the 78K/IV Series
IE-784000-R-BKBreak board common to the 78K/IV Series
IE-784000-R-EMEmulation board common to the 78K/IV Series
IE-784915-R-EM1Emulation board for evaluation of the µPD784915 Subseries
IE-78000-R-SV3Interface adapter when using EWS as a host machine
IE-70000-98-IF-BInterface adapter when using PC-9800 series (except notebook type) as a host
machine
IE-70000-98N-IFInterface adapter and cable when using notebook type PC-9800 series as a host
machine
IE-70000-PC-IF-BInterface adapter when using IBM PC/ATTM as a host machine
EP-784915GF-REmulation probe common to the µPD784915 subseries
EV-9200GF-100Conversion socket for 100-pin plastic QFP to mount a device on a target system
SM78K4
ID78K4
DF784915
Note 3
Note 3
Note 4
System emulator for all 78K/IV series devices
Integrated debugger for IE-784000-R
Device file common to the µPD784915 subseries
Real-time OS
*
RX78K/IV
MX78K4
48
Note 4
Note 2
Real-time OS common to the 78K/IV series
OS common to the 78K/IV series
µ
PD78P4916
Notes 1. • PC-9800 series (for MS-DOSTM) based
• IBM PC/AT and compatibles (for PC DOS
TM
• HP9000 series 700
• SPARCstation
• NEWS
2. • PC-9800 series (for MS-DOS) based
• IBM PC/AT and its compatibles (for PC DOS, Windows, MS-DOS, and IBM DOS) based
3. • PC-9800 series (for Windows on MS-DOS) based
• IBM PC/AT and its compatibles (for PC DOS, Windows, MS-DOS, and IBM DOS) based
• HP9000 series 700 (for HP-UX) based
• SPARCstation (for SunOS) based
4. • PC-9800 series (for MS-DOS) based
• IBM PC/AT and compatibles (for PC DOS, Windows, MS-DOS, and IBM DOS) based
• HP9000 series 700 (for HP-UX) based
• SPARCstation (for SunOS) based
Remark The RA78K4, CC78K4, SM78K4, and ID78K4 should be used in combination with the DF784915.
TM
(NEWS-OSTM) based
(for HP-UXTM) based
TM
(for SunOSTM) based
TM
, WindowsTM, MS-DOS, and IBM DOSTM) based
*
49
APPENDIX B. SOCKET DRAWING AND RECOMMENDED FOOTPRINT
*
Figure B-1. EV-9200GF-100 Drawing
(For reference purpose only)
µ
PD78P4916
E
D
C
No.1 pin index
EV-9200GF-100
1
A
B
F
G
H
I
ITEMMILLIMETERSINCHES
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
24.6
21
15
18.6
4-C 2
0.8
12.0
22.6
25.3
6.0
16.6
19.3
8.2
8.0
2.5
2.0
0.35
φ
2.3
φ
1.5
M
NO
EV-9200GF-100-G0
J
P
0.969
0.827
0.591
0.732
4-C 0.079
0.031
0.472
0.89
0.996
0.236
0.654
076
0.323
0.315
0.098
0.079
0.014
φ
0.091
φ
0.059
R
S
Q
L
K
50
Figure B-2. Recommended EV-9200GF-100 Footprint
(For reference purpose only)
G
J
K
F
E
D
L
C
B
A
µ
PD78P4916
H
I
EV-9200GF-100-P1
ITEMMILLIMETERSINCHES
+0.001
–0.002
+0.001
–0.002
1.035
0.85
0.614
0.799
0.472
0.236
0.014
φ
0.093
φ
0.091
φ
0.062
×
0.748=0.486
+0.003
–0.002
+0.003
–0.002
+0.001
–0.001
+0.001
–0.002
+0.001
–0.002
A
B
C
D
E
F
G
H
I
J
K
L
Caution
26.3
21.6
0.65±0.02 × 29=18.85±0.05
0.65±0.02 × 19=12.35±0.05
15.6
20.3
12±0.05
6±0.05
0.35±0.02
φ
2.36±0.03
φ
2.3
φ
1.57±0.03
Dimensions of mount pad for EV-9200 and that for
0.026 × 1.142=0.742
0.026
target device (QFP) may be different in some parts.
For the recommended mount pad dimensions for
QFP, refer to "SEMICONDUCTOR DEVICE MOUNTING
TECHNOLOGY MANUAL" (C10535E).
PD784915 Subseries Special Function Register TableU10976J—
78K/IV Series User’s Manual – InstructionsU10905JU10905E
78K/IV Series Instruction TableU10594J—
78K/IV Series Instruction SetU10595J—
78K/IV Series Application Note – Software BasicsU10095J—
Development tool documents (User’s Manual)
TitleDocument No.
JapaneseEnglish
RA78K Series Assembler PackageLanguageEEU-809EEU-1399
OperationEEU-815EEU-1404
RA78K Series Structured Assembler PreprocessorEEU-817EEU-1402
CC78K Series C CompilerLanguageEEU-656EEU-1280
OperationEEU-655EEU-1284
CC78K Series Library Source FileEEU-777—
PG-1500 PROM ProgrammerEEU-651EEU-1335
PG-1500 Controller PC-9800 series – MS-DOS baseEEU-704EEU-1291
PG-1500 Controller IBM PC series – PC DOS baseEEU-5008U10540E
IE-784000-REEU-5004EEU-1534
IE-784915-R-EM1 EP-784915GF-RU10931J—
ID78K4 Integrated Debugger – ReferenceU10440JIEU-1412
µ
PD78P4916
Embedded-software documents (User’s Manual)
TitleDocument No.
JapaneseEnglish
RX78K/IV Series Real-time OSBasicsU10604J—
InstallationU10603J—
DebuggerU10364J—
Caution The contents of the documents listed above are subject to change without prior notice to users.
Be sure to use the latest edition when starting design.
52
µ
PD78P4916
Other documents
TitleDocument No.
JapaneseEnglish
Semiconductor Device Package ManualIEI-635IEI-1213
Semiconductor Device Mounting Technology ManualC10535JC10535E
Quality Grades on NEC Semiconductor DevicesIEI-620IEI-1209
NEC Semiconductor Device Reliability/Quality Control SystemIEM-5068—
Electrostatic Discharge (ESD) TestMEM-539—
Guide to Quality Assurance for Semiconductor DevicesMEI-603MEI-1202
Microcontroller-Related Product Guide - Third Party ProductsMEI-604—
Caution The contents of the documents listed above are subject to change without prior notice to users.
Be sure to use the latest edition when starting design.
*
53
[MEMO]
µ
PD78P4916
54
µ
PD78P4916
NOTES FOR CMOS DEVICES
1PRECAUTION AGAINST ESD FOR SEMICONDUCTORS
Note: Strong electric field, when exposed to a MOS device, can cause destruction of
the gate oxide and ultimately degrade the device operation. Steps must be
taken to stop generation of static electricity as much as possible, and quickly
dissipate it once, when it has occurred. Environmental control must be
adequate. When it is dry, humidifier should be used. It is recommended to avoid
using insulators that easily build static electricity. Semiconductor devices
must be stored and transported in an anti-static container, static shielding bag
or conductive material. All test and measurement tools including work bench
and floor should be grounded. The operator should be grounded using wrist
strap. Semiconductor devices must not be touched with bare hands. Similar
precautions need to be taken for PW boards with semiconductor devices on it.
2HANDLING OF UNUSED INPUT PINS FOR CMOS
Note: No connection for CMOS device inputs can be cause of malfunction. If no
connection is provided to the input pins, it is possible that an internal input level
may be generated due to noise, etc., hence causing malfunction. CMOS devices
behave differently than Bipolar or NMOS devices. Input levels of CMOS devices
must be fixed high or low by using a pull-up or pull-down circuitry. Each unused
pin should be connected to VDD or GND with a resistor, if it is considered to have
a possibility of being an output pin. All handling related to the unused pins must
be judged device by device and related specifications governing the devices.
3STATUS BEFORE INITIALIZATION OF MOS DEVICES
Note: Power-on does not necessarily define initial status of MOS device. Production
process of MOS does not define the initial operation status of the device.
Immediately after the power source is turned ON, the devices with reset function
have not yet been initialized. Hence, power-on does not guarantee out-pin
levels, I/O settings or contents of registers. Device is not initialized until the
reset signal is received. Reset operation must be executed immediately after
power-on for devices having reset function.
55
µ
PD78P4916
FIP is a trademark of NEC Corporation.
MS-DOS and Windows are trademarks of Microsoft Corporation.
IBM DOS, PC/AT, and PC DOS are trademarks of International Business Machines Corporation.
HP9000 Series 700 and HP-UX are trademarks of Hewlett-Packard Company.
SPARCstation is a trademark of SPARC International, Inc.
SunOS is a trademark of Sun Microsystems, Inc.
NEWS and NEWS-OS are trademarks of Sony Corporation.
The related documents indicated in this publication may include preliminary versions. However, preliminary
versions are not marked as such.
The export of this product from Japan is regulated by the Japanese government. To export this product may be prohibited
without governmental license, the need for which must be judged by the customer. The export or re-export of this product
from a country other than Japan may also be prohibited without a license from that country. Please call an NEC sales
representative.
The application circuits and their parameters are for reference only and are not intended for use in actual design-in's.
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
“Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on
a customer designated “quality assurance program“ for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each
device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices in “Standard“ unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact NEC Sales Representative in advance.
Anti-radioactive design is not implemented in this product.
M4 94.11
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