Datasheet 2SK2482 Datasheet (NEC)

Page 1
Body Diode
Source
Drain
Gate
DATA SHEET
MOS FIELD EFFECT TRANSISTOR
SWITCHING
N-CHANNEL POWER MOS FET
INDUSTRIAL USE

DESCRIPTION

The 2SK2482 is N-Channel MOS Field Effect Transistor designed
for high voltage switching applications.
2SK2482

PACKAGE DIMENSIONS

(in millimeter)

FEATURES

Low On-Resistance
RDS (on) = 4.0 (VGS = 10 V, ID = 3.0 A)
Low Ciss Ciss = 900 pF TYP.
ABSOLUTE MAXIMUM RATINGS (TA = 25 ˚C)
Drain to Source Voltage Gate to Source Voltage VGSS ±30 V Drain Current (DC) I Drain Current (pulse)* ID (pulse) ±12 A Total Power Dissipation (Tc = 25 ˚C) PT1 100 W Total Power Dissipation (T Channel Temperature Tch 150 ˚C Storage Temperature Tstg –55 to +150 ˚C Single Avalanche Current** I Single Avalanche Energy** EAS 73.5 mJ
* PW 10 µs, Duty Cycle 1 % ** Starting T
ch = 25 ˚C, RG = 25 , VGS = 20 V 0
A = 25 ˚C) PT2 3.0 W
VDSS 900 V
D (DC) ±5.0 A
AS 5.0 A
15.7 MAX.
1.06.0
123
19 MIN. 20.0±0.2
3.0±0.2
5.45 5.45
4
1.0±0.2
MP-88
3.2±0.2
4.5±0.2
1. Gate
2. Drain
3. Source
4. Fin (Drain)
4.7 MAX.
1.5
7.0
2.8±0.10.6±0.12.2±0.2
Document No. D10274EJ1V0DS00 (1st edition) Date Published August 1995 P Printed in Japan
©
1995
Page 2
ELECTRICAL CHARACTERISTICS (TA = 25 ˚C)
2SK2482
CHARACTERISTIC SYMBOL MIN. TYP. MAX. TEST CONDITIONS Drain to Source On-Resistance RDS (on) 3.2 4.0 VGS = 10 V, ID = 3.0 A Gate to Source Cutoff Voltage VGS (off) 2.5 3.5 VDS = 10 V, ID = 1 mA Forward Transfer Admittance | yfs | 1.0 VDS = 20 V, ID = 3.0 A Drain Leakage Current IDSS 100 VDS = VDSS, VGS = 0 Gate to Source Leakage Current IGSS ±100 VGS = ±30 V, VDS = 0 Input Capacitance Ciss 900 VDS = 10 V Output Capacitance Coss 130 VGS = 0 Reverse Transfer Capacitance Crss 25 f = 1 MHz Turn-On Delay Time td (on) 17 ID = 3.0 A Rise Time tr 8VGS = 10 V Turn-Off Delay Time td (off) 60 VDD = 150 V
Fall Time tf 10 RG = 10 Total Gate Charge QG 30 ID = 5.0 A
Gate to Source Charge QGS 5VDD = 450 V Gate to Drain Charge QGD 13 VGS = 10 V Body Diode Forward Voltage VF (S-D) 1.0 IF = 5.0 A, VGS = 0 Reverse Recovery Time trr 780 IF = 5.0 A, VGS = 0
Reverse Recovery Charge Qrr 4.2
UNIT
V S
µ
A
nA pF pF pF
ns ns ns
ns nC nC nC
V
ns
µ
C
di/dt = 50 A/µs
Test Circuit 1 Avalanche Capability
D.U.T.
R
G
= 25
PG
VGS = 20 - 0 V
50
BV
DSS
I
AS
I
D
V
DD
V
DS
Starting T
L
DD
V
ch
Test Circuit 2 Switching Time
D.U.T.
R
PG.
V
GS
0
t
t = 1 us Duty Cycle 1 %
G
= 10
R
G
V
V
GS
Wave Form
I
D
Wave Form
GS
10 %
0
I
D
90 %
10 %
0
t
d (on)trtd (off)tf
t
on
90 %
GS (on)
V
90 %
I
D
10 %
t
off
R
L
V
DD
Test Circuit 3 Gate Charge
D.U.T.
I
G
= 2 mA
PG.
50
The application circuits and their parameters are for references only and are not intended for use in actual design-in's.
R
L
V
DD
2
Page 3
TYPICAL CHARACTERISTICS (TA = 25 ˚C)
2SK2482
DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA
100
80
60
40
20
dT - Percentage of Rated Power - %
0
20 40 60 80 100 120 140 160
T
C
- Case Temperature - ˚C
FORWARD BIAS SAFE OPERATING AREA
100
10
= 10 V)
GS
I
D(DC)
Power Dissipation Limited
Limited (at V
DS(on)
1
- Drain Current - A
D
I
R
I
D(pulse)
10 ms
PW = 100 s
1 ms
TOTAL POWER DISSIPATION vs. CASE TEMPERATURE
140
120
100
80
60
40
- Total Power Dissipation - W
T
20
P
0
40 60 80 100 120 140 160
20
T
C
- Case Temperature - ˚C
DRAIN CURRENT vs. DRAIN TO SOURCE VOLTAGE
Pulsed
10
µ
VGS = 20 V
10 V
8 V
5
- Drain Current - A
D
I
6 V
TC = 25 ˚C Single Pulse
0.1 1
10 100 1000
V
DS
- Drain to Source Voltage - V
FORWARD TRANSFER CHARACTERISTICS
100
TA = –25 ˚C
25 ˚C
10
75 ˚C
125 ˚C
1.0
- Drain Current - A
D
I
0.1
0
51015
V
GS
- Gate to Source Voltage - V
Pulsed
VDS = 10 V
0
10
V
DS
- Drain to Source Voltage - V
20
30
40
3
Page 4
1 000
2SK2482
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
100
10
1
0.1
- Transient Thermal Resistance - ˚C/W
0.01
th(t)
r
0.001 10
µ
100
FORWARD TRANSFER ADMITTANCE vs. DRAIN CURRENT
100
10
TA = –25 ˚C
25 ˚C 75 ˚C
125 ˚C
1.0
R
th(ch-a)
R
th(ch-c)
= 1.25 (˚C/W)
1 m 10 m 100 m 1 10 100 1 000
µ
PW - Pulse Width - s
DRAIN TO SOURCE ON-STATE RESISTANCE vs. GATE TO SOURCE VOLTAGE
V
DS
= 20 V
Pulsed
10
ID = 5 A
5
2.5 A 1 A
= 41.7 (˚C/W)
Single Pulse
c
= 25 ˚C
T
Pulsed
| - Forward Transfer Admittance - S
fs
0.1
| y
0.01
0.1
D
- Drain Current - A
I
DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT
8 7
6 5
4 3 2 1
- Drain to Source On-State Resistance -
DS(on)
R
0
0.1
1.0
D
- Drain Current - A
I
10 100
1.0 10
Pulsed
GS
=10 V
V
- Drain to Source On-State Resistance -
DS(on)
R
0
10
GS
- Gate to Source Voltage - V
V
GATE TO SOURCE CUTOFF VOLTAGE vs. CHANNEL TEMPERATURE
5
- Gate to Source Cutoff Voltage - V
GS(off)
0
V
–50
0 50 100 150
ch
- Channel Temperature - ˚C
T
20 30
VDS = 10 V
D
= 1 mA
I
4
Page 5
2SK2482
DRAIN TO SOURCE ON-STATE RESISTANCE vs. CHANNEL TEMPERATURE
5
0
–50
RDS(on) - Drain to Source On-State Resistance -
0
ch - Channel Temperature - ˚C
T
50
100 150
CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE
10 000
1 000
100
V
GS = 10 V
D = 3 A
I
VGS = 0 f = 1 MHz
Ciss
SOURCE TO DRAIN DIODE FORWARD VOLTAGE
100
10
1
VGS = 10 V
0.1
ISD - Diode Forward Current - A
0
0.5
SD - Source to Drain Voltage - V
V
SWITCHING CHARACTERISTICS
1 000
100
10
VGS = 0 V
1.0
td(on) tr
td(off) tf
Pulsed
1.5
Ciss, Coss, Crss - Capacitance - pF
10
1.0
10 100 1000
DS - Drain to Source Voltage - V
V
REVERSE RECOVERY TIME vs. DRAIN CURRENT
10 000
1 000
100
trr - Reverse Recovery time - ns
10
0.1
1.0 10 100
D - Drain Current - A
I
Crss
di/dt = 50 A/ s
GS = 0
V
Coss
V
DD = 150 V GS = 10 V
td(on), tr, td(off), tf - Switching Time - ns
1.0
0.1
1.0 10 100
D - Drain Current - A
I
V
G = 10
R
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
µ
16
ID = 5.0 A
14 12 10
8
VDD = 450 V
300 V 150 V
6 4
VGS - Gate to Source Voltage - V
2 0
0
8 1624324 122028
g - Gate Charge - nC
Q
5
Page 6
2SK2482
SINGLE AVALANCHE CURRENT vs. INDUCTIVE LOAD
100
10
IAS = 5 A
1.0
VDD = 150 V
IAS - Single Avalanche Current - A
VGS = 20 V 0
0.1
RG = 25
100
µ
1 m 10 m 100 m
L - Inductive Load - H
E
AS
= 73.5 mJ
SINGLE AVALANCHE ENERGY DERATING FACTOR
160 140
120
100
80 60
40
Energy Derating Factor - %
20
0
50 75 100 125 150
25
Starting T
ch - Starting Channel Temperature - ˚C
VDD = 150 V R
G
= 25
V
GS
= 20 V 0
I
AS
5.0 A
6
Page 7
2SK2482

REFERENCE

Document Name Document No. NEC semiconductor device reliability/quality control system. TEI-1202 Quality grade on NEC semiconductor devices. IEI-1209 Semiconductor device mounting technology manual. IEI-1207 Semiconductor device package manual. IEI-1213 Guide to quality assurance for semiconductor devices. MEI-1202 Semiconductor selection guide. MF-1134 Power MOS FET features and application switching power supply. TEA-1034 Application circuits using Power MOS FET. TEA-1035 Safe operating area of Power MOS FET. TEA-1037
7
Page 8
2SK2482
[MEMO]
No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: “Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on a customer designated “quality assurance program“ for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc. The quality grade of NEC devices in “Standard“ unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact NEC Sales Representative in advance. Anti-radioactive design is not implemented in this product.
M4 94.11
8
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