The 2SK2482 is N-Channel MOS Field Effect Transistor designed
for high voltage switching applications.
2SK2482
PACKAGE DIMENSIONS
(in millimeter)
FEATURES
• Low On-Resistance
RDS (on) = 4.0 Ω (VGS = 10 V, ID = 3.0 A)
• Low Ciss Ciss = 900 pF TYP.
• High Avalanche Capability Ratings
ABSOLUTE MAXIMUM RATINGS (TA = 25 ˚C)
Drain to Source Voltage
Gate to Source VoltageVGSS±30V
Drain Current (DC)I
Drain Current (pulse)*ID (pulse)±12A
Total Power Dissipation (Tc = 25 ˚C)PT1100W
Total Power Dissipation (T
Channel TemperatureTch150˚C
Storage TemperatureTstg –55 to +150 ˚C
Single Avalanche Current**I
Single Avalanche Energy**EAS73.5mJ
* PW ≤ 10 µs, Duty Cycle ≤ 1 %
** Starting T
ch = 25 ˚C, RG = 25 Ω, VGS = 20 V → 0
A = 25 ˚C)PT23.0W
VDSS900V
D (DC)±5.0A
AS5.0A
15.7 MAX.
1.06.0
123
19 MIN.20.0±0.2
3.0±0.2
5.455.45
4
1.0±0.2
MP-88
3.2±0.2
4.5±0.2
1. Gate
2. Drain
3. Source
4. Fin (Drain)
4.7 MAX.
1.5
7.0
2.8±0.10.6±0.12.2±0.2
Document No. D10274EJ1V0DS00 (1st edition)
Date Published August 1995 P
Printed in Japan
CHARACTERISTICSYMBOLMIN.TYP.MAX.TEST CONDITIONS
Drain to Source On-ResistanceRDS (on)3.24.0VGS = 10 V, ID = 3.0 A
Gate to Source Cutoff VoltageVGS (off)2.53.5VDS = 10 V, ID = 1 mA
Forward Transfer Admittance| yfs |1.0VDS = 20 V, ID = 3.0 A
Drain Leakage CurrentIDSS100VDS = VDSS, VGS = 0
Gate to Source Leakage CurrentIGSS±100VGS = ±30 V, VDS = 0
Input CapacitanceCiss900VDS = 10 V
Output CapacitanceCoss130VGS = 0
Reverse Transfer CapacitanceCrss25f = 1 MHz
Turn-On Delay Timetd (on)17ID = 3.0 A
Rise Timetr8VGS = 10 V
Turn-Off Delay Timetd (off)60VDD = 150 V
Fall Timetf10RG = 10 Ω
Total Gate ChargeQG30ID = 5.0 A
Gate to Source ChargeQGS5VDD = 450 V
Gate to Drain ChargeQGD13VGS = 10 V
Body Diode Forward VoltageVF (S-D)1.0IF = 5.0 A, VGS = 0
Reverse Recovery Timetrr780IF = 5.0 A, VGS = 0
Reverse Recovery ChargeQrr4.2
UNIT
Ω
V
S
µ
A
nA
pF
pF
pF
ns
ns
ns
ns
nC
nC
nC
V
ns
µ
C
di/dt = 50 A/µs
Test Circuit 1 Avalanche Capability
D.U.T.
R
G
= 25 Ω
PG
VGS = 20 - 0 V
50 Ω
BV
DSS
I
AS
I
D
V
DD
V
DS
Starting T
L
DD
V
ch
Test Circuit 2 Switching Time
D.U.T.
R
PG.
V
GS
0
t
t = 1 us
Duty Cycle ≤ 1 %
G
= 10 Ω
R
G
V
V
GS
Wave Form
I
D
Wave Form
GS
10 %
0
I
D
90 %
10 %
0
t
d (on)trtd (off)tf
t
on
90 %
GS (on)
V
90 %
I
D
10 %
t
off
R
L
V
DD
Test Circuit 3 Gate Charge
D.U.T.
I
G
= 2 mA
PG.
50
Ω
The application circuits and their parameters are for references only and are not intended for use in actual design-in's.
R
L
V
DD
2
Page 3
TYPICAL CHARACTERISTICS (TA = 25 ˚C)
2SK2482
DERATING FACTOR OF FORWARD BIAS
SAFE OPERATING AREA
100
80
60
40
20
dT - Percentage of Rated Power - %
0
20406080 100 120 140 160
T
C
- Case Temperature - ˚C
FORWARD BIAS SAFE OPERATING AREA
100
10
= 10 V)
GS
I
D(DC)
Power Dissipation Limited
Limited (at V
DS(on)
1
- Drain Current - A
D
I
R
I
D(pulse)
10 ms
PW = 100 s
1 ms
TOTAL POWER DISSIPATION vs.
CASE TEMPERATURE
140
120
100
80
60
40
- Total Power Dissipation - W
T
20
P
0
406080 100 120 140 160
20
T
C
- Case Temperature - ˚C
DRAIN CURRENT vs.
DRAIN TO SOURCE VOLTAGE
Pulsed
10
µ
VGS = 20 V
10 V
8 V
5
- Drain Current - A
D
I
6 V
TC = 25 ˚C
Single Pulse
0.1
1
101001000
V
DS
- Drain to Source Voltage - V
FORWARD TRANSFER CHARACTERISTICS
100
TA = –25 ˚C
25 ˚C
10
75 ˚C
125 ˚C
1.0
- Drain Current - A
D
I
0.1
0
51015
V
GS
- Gate to Source Voltage - V
Pulsed
VDS = 10 V
0
10
V
DS
- Drain to Source Voltage - V
20
30
40
3
Page 4
1 000
2SK2482
TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH
100
10
1
0.1
- Transient Thermal Resistance - ˚C/W
0.01
th(t)
r
0.001
10
µ
100
FORWARD TRANSFER ADMITTANCE vs.
DRAIN CURRENT
100
10
TA = –25 ˚C
25 ˚C
75 ˚C
125 ˚C
1.0
R
th(ch-a)
R
th(ch-c)
= 1.25 (˚C/W)
1 m10 m100 m1101001 000
µ
PW - Pulse Width - s
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
GATE TO SOURCE VOLTAGE
V
DS
= 20 V
Pulsed
10
ID = 5 A
5
2.5 A
1 A
= 41.7 (˚C/W)
Single Pulse
c
= 25 ˚C
T
Pulsed
| - Forward Transfer Admittance - S
fs
0.1
| y
0.01
0.1
D
- Drain Current - A
I
DRAIN TO SOURCE ON-STATE
RESISTANCE vs. DRAIN CURRENT
8
7
6
5
4
3
2
1
- Drain to Source On-State Resistance - Ω
DS(on)
R
0
0.1
1.0
D
- Drain Current - A
I
10100
1.010
Pulsed
GS
=10 V
V
- Drain to Source On-State Resistance - Ω
DS(on)
R
0
10
GS
- Gate to Source Voltage - V
V
GATE TO SOURCE CUTOFF VOLTAGE vs.
CHANNEL TEMPERATURE
5
- Gate to Source Cutoff Voltage - V
GS(off)
0
V
–50
050100150
ch
- Channel Temperature - ˚C
T
2030
VDS = 10 V
D
= 1 mA
I
4
Page 5
2SK2482
DRAIN TO SOURCE ON-STATE RESISTANCE vs.
CHANNEL TEMPERATURE
5
0
–50
RDS(on) - Drain to Source On-State Resistance - Ω
0
ch - Channel Temperature - ˚C
T
50
100150
CAPACITANCE vs. DRAIN TO
SOURCE VOLTAGE
10 000
1 000
100
V
GS = 10 V
D = 3 A
I
VGS = 0
f = 1 MHz
Ciss
SOURCE TO DRAIN DIODE
FORWARD VOLTAGE
100
10
1
VGS = 10 V
0.1
ISD - Diode Forward Current - A
0
0.5
SD - Source to Drain Voltage - V
V
SWITCHING CHARACTERISTICS
1 000
100
10
VGS = 0 V
1.0
td(on)
tr
td(off)
tf
Pulsed
1.5
Ciss, Coss, Crss - Capacitance - pF
10
1.0
101001000
DS - Drain to Source Voltage - V
V
REVERSE RECOVERY TIME vs.
DRAIN CURRENT
10 000
1 000
100
trr - Reverse Recovery time - ns
10
0.1
1.010100
D - Drain Current - A
I
Crss
di/dt = 50 A/ s
GS = 0
V
Coss
V
DD = 150 V
GS = 10 V
td(on), tr, td(off), tf - Switching Time - ns
1.0
0.1
1.010100
D - Drain Current - A
I
V
G = 10 Ω
R
DYNAMIC INPUT/OUTPUT CHARACTERISTICS
µ
16
ID = 5.0 A
14
12
10
8
VDD = 450 V
300 V
150 V
6
4
VGS - Gate to Source Voltage - V
2
0
0
8 1624324 122028
g - Gate Charge - nC
Q
5
Page 6
2SK2482
SINGLE AVALANCHE CURRENT vs.
INDUCTIVE LOAD
100
10
IAS = 5 A
1.0
VDD = 150 V
IAS - Single Avalanche Current - A
VGS = 20 V → 0
0.1
RG = 25 Ω
100
µ
1 m10 m100 m
L - Inductive Load - H
E
AS
= 73.5 mJ
SINGLE AVALANCHE ENERGY
DERATING FACTOR
160
140
120
100
80
60
40
Energy Derating Factor - %
20
0
5075100125150
25
Starting T
ch - Starting Channel Temperature - ˚C
VDD = 150 V
R
G
= 25 Ω
V
GS
= 20 V → 0
≥
I
AS
5.0 A
6
Page 7
2SK2482
REFERENCE
Document NameDocument No.
NEC semiconductor device reliability/quality control system.TEI-1202
Quality grade on NEC semiconductor devices.IEI-1209
Semiconductor device mounting technology manual.IEI-1207
Semiconductor device package manual.IEI-1213
Guide to quality assurance for semiconductor devices.MEI-1202
Semiconductor selection guide.MF-1134
Power MOS FET features and application switching power supply.TEA-1034
Application circuits using Power MOS FET.TEA-1035
Safe operating area of Power MOS FET.TEA-1037
7
Page 8
2SK2482
[MEMO]
No part of this document may be copied or reproduced in any form or by any means without the prior written
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this
document.
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual
property rights of third parties by or arising from use of a device described herein or any other liability arising
from use of such device. No license, either express, implied or otherwise, is granted under any patents,
copyrights or other intellectual property rights of NEC Corporation or others.
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or
property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety
measures in its design, such as redundancy, fire-containment, and anti-failure features.
NEC devices are classified into the following three quality grades:
“Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on
a customer designated “quality assurance program“ for a specific application. The recommended applications
of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each
device before using it in a particular application.
Standard: Computers, office equipment, communications equipment, test and measurement equipment,
audio and visual equipment, home electronic appliances, machine tools, personal electronic
equipment and industrial robots
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed
for life support)
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life
support systems or medical equipment for life support, etc.
The quality grade of NEC devices in “Standard“ unless otherwise specified in NEC's Data Sheets or Data Books.
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,
they should contact NEC Sales Representative in advance.
Anti-radioactive design is not implemented in this product.
M4 94.11
8
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