Very low voltage noise: 1 nV/√Hz maximum @ 100 Hz
Excellent current gain match: 0.5%
Low offset voltage (V
Outstanding offset voltage drift: 0.03 μV/°C
High gain bandwidth product: 200 MHz
GENERAL DESCRIPTION
The SSM2212 is a dual, NPN-matched transistor pair that is
specifically designed to meet the requirements of ultralow noise
audio systems.
With its extremely low input base spreading resistance (rbb' is
typically 28 Ω) and high current gain (h
at I
= 1 mA), the SSM2212 can achieve outstanding signal-to-
C
noise ratios. The high current gain results in superior
performance compared to systems incorporating commercially
available monolithic amplifiers.
Excellent matching of the current gain (Δh
low V
of less than 10 μV typical make the SSM2212 ideal for
OS
symmetrically balanced designs, which reduce high-order
amplifier harmonic distortion.
): 200 μV maximum
OS
typically exceeds 600
FE
) to about 0.5% and
FE
NPN Transistor
SSM2212
PIN CONFIGURATION
1
C
1
2
B
1
3
E
1
NIC
4
SSM2212
NIC = NO INTERNAL CONNECTION
Figure 1. 8-Lead SOIC_N
Stability of the matching parameters is guaranteed by protection
diodes across the base-emitter junction. These diodes prevent
degradation of beta and matching characteristics due to reverse
biasing of the base-emitter junction.
The SSM2212 is also an ideal choice for accurate and reliable
current biasing and mirroring circuits. Furthermore, because a
current mirror’s accuracy degrades exponentially with mismatches
of V
between transistor pairs, the low VOS of the SSM2212
BE
does not need offset trimming in most circuit applications.
The SSM2212 performance and characteristics are guaranteed
over the extended temperature range of −40°C to +85°C.
8
C
2
7
B
2
6
E
2
NIC
5
09043-001
B
Rev.
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Parameter Symbol Text Conditions/Comments Min Typ Max Unit
DC AND AC CHARACTERISTICS
Current Gain1 h
I
−40°C ≤ TA ≤ +85°C 300
I
−40°C ≤ TA ≤ +85°C 200
Current Gain Match2 ΔhFE 10 μA ≤ IC ≤ 1 mA 0.5 5 %
Noise Voltage Density3 e
f
f
f
f
Low Frequency Noise (0.1 Hz to 10 Hz) eN p-p IC = 1 mA 0.4 μV p-p
Offset Voltage VOS V
−40°C ≤ TA ≤ +85°C 220 μV
Offset Voltage Change vs. VCB ΔVOS/ΔVCB 0 V ≤ VCB ≤ V
Offset Voltage Change vs. IC ΔVOS/ΔIC 1 μA ≤ IC ≤ 1 mA5, VCB = 0 V 5 70 μV
Offset Voltage Drift ΔVOS/ΔT −40°C ≤ TA ≤ +85°C 0.08 1 μV/°C
−40°C ≤ TA ≤ +85°C, V
Breakdown Voltage BV
Gain Bandwidth Product fT I
Collector-to-Base Leakage Current I
−40°C ≤ TA ≤ +85°C 3 nA
Collector-to-Collector Leakage Current ICC V
−40°C ≤ TA ≤ +85°C 4 nA
Collector-to-Emitter Leakage Current I
−40°C ≤ TA ≤ +85°C 4 nA
Input Bias Current IB I
−40°C ≤ TA ≤ +85°C 50 nA
Input Offset Current IOS I
−40°C ≤ TA ≤ +85°C 13 nA
Input Offset Current Drift ΔIOS/ΔT IC = 10 μA6, −40°C ≤ TA ≤ +85°C 40 150 pA/°C
Collector Saturation Voltage V
Output Capacitance COB V
Bulk Resistance RBE 10 μA ≤ IC ≤ 10 mA6 0.3 1.6 Ω
Collector-to-Collector Capacitance CCC V
1
Current gain is guaranteed with collector-to-base voltage (VCB) swept from 0 V to V
2
Current gain match (ΔhFE) is defined as follows: ΔhFE = (100(ΔIB)(h
3
Noise voltage density is guaranteed, but not 100% tested.
4
This is the maximum change in VOS as VCB is swept from 0 V to 40 V.
5
Measured at IC = 10 μA and guaranteed by design over the specified range of IC.
6
Guaranteed by design.
7
ICC and I
are verified by measurement of I
CES
CBO
.
FE
= 1 mA 300 605
C
= 10 μA 200 550
C
I
N
40 V
CEO
V
CBO
V
CES
I
CE (SAT)
FE min
= 1 mA, VCB = 0 V
C
= 10 Hz 1.6 2 nV/√Hz
O
= 100 Hz 0.9 1 nV/√Hz
O
= 1 kHz 0.85 1 nV/√Hz
O
= 10 kHz 0.85 1 nV/√Hz
O
= 0 V, IC = 1 mA 10 200 μV
CB
4
,1 μA ≤ IC ≤ 1 mA5 10 50 μV
MAX
trimmed to 0 V 0.03 0.3 μV/°C
OS
= 100 mA, VCE = 10 V 200 MHz
C
= V
CB
CC
CE
= 10 μA 50 nA
C
= 10 μA 6.2 nA
C
= 1 mA, IB = 100 μA 0.05 0.2 V
C
CB
CC
)/IC).
25 500 pA
MAX
6, 7
= V
= V
MAX
, VBE = 0 V
MAX
6, 7
35 500 pA
35 500 pA
= 15 V, IE = 0 μA 23 pF
= 0 V 35 pF
at the indicated collector currents.
MAX
Rev. B | Page 3 of 12
SSM2212
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
Breakdown Voltage of
Collector-to-Base Voltage (BV
Breakdown Voltage of
Collector-to-Emitter Voltage (BV
Breakdown Voltage of
Collector-to-Collector Voltage (BV
Breakdown Voltage of
Emitter-to-Emitter Voltage (BV
Collector Current (IC) 20 mA
Emitter Current (IE) 20 mA
Storage Temperature Range −65°C to +150°C
Operating Temperature Range −40°C to +85°C
Junction Temperature Range −65°C to +150°C
Lead Temperature (Soldering, 60 sec) 300°C
CBO
)
)
CEO
CC
)
EE
40 V
40 V
40 V
)
40 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages.
Table 3. Thermal Resistance
Package Type θJA θ
8-Lead SOIC (R-8) 120 45 °C/W
Unit
JC
ESD CAUTION
Rev. B | Page 4 of 12
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