ANALOG DEVICES OP27 Service Manual

Low Noise, Precision

–

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FEATURES

Low noise: 80 nV p-p (0.1 Hz to 10 Hz), 3 nV/√Hz
Low drift: 0.2 μV/°C
High speed: 2.8 V/μs slew rate, 8 MHz gain bandwidth
Low V
Excellent CMRR: 126 dB at VCM of ±11 V
High open-loop gain: 1.8 million
Fits OP07, 5534A sockets
Available in die form

GENERAL DESCRIPTION

The OP27 precision operational amplifier combines the low
offset and drift of the OP07 with both high speed and low noise.
Of
the OP27 ideal for precision instrumentation applications.
Exceptionally low noise, e
noise corner frequency of 2.7 Hz, and high gain (1.8 million),
allow accurate high-gain amplification of low-level signals.
A gain-bandwidth product of 8 MHz and a 2.8 V/μs slew rate
provide excellent dynamic accuracy in high speed, data­acquisition systems.

A low input bias current of ±10 nA is achieved by use of a bias
current cancellation circuit. Over the military temperature
range, this circuit typically holds I
and 15 nA, respectively.

The output stage has good load driving capability. A guaranteed
swin
OP27 an excellent choice for professional audio applications.

: 10 μV

OS

fsets down to 25 μV and maximum drift of 0.6 μV/°C make

= 3.5 nV/√Hz, at 10 Hz, a low 1/f

n

and IOS to ±20 nA

B

g of ±10 V into 600 Ω and low output distortion make the

(Continued on Page 3)

Operational Amplifier

OP27

PIN CONFIGURATIONS

BAL

BAL 1

IN 2

+IN 3

OP27

4V– (CASE)

NC = NO CONNECT

Figure 1. 8-Lead TO-99 (J-Suffix)

OS

TRIM

–IN

+IN

1

OP27

2

3

4

NC = NO CONNECT

V

Figure 2. 8-Lead CERDIP – Glass Hermetic Seal (Z-Suffix),

8-Lead

PDIP (P-Suffix),

8-Lead SO (S-Suffix)

V+

OUT

NC

00317-001

8

V

TRIM

OS

7

V+

6

OUT

5

NCV–

00317-002

FUNCTIONAL BLOCK DIAGRAM

.

Q2B

R4

1

R2

Q2AQ1A Q1B

Q11 Q12

R3

Q6

NONINVERTING

INPUT (+)

INVERTING

INPUT (–)

1

R1 AND R2 ARE PERMANENTLY
ADJUSTED AT WAFER TEST FOR
MINIMUM OFFSET VOLTAGE

Rev. F

Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.

Q3

18

VOS ADJ.

1

R1

V+

C2

Q21

Q23

Q27 Q28

R23 R24

R5

Q24

Q22

C1

R9

R12

C3 C4

Q20 Q19

Q26

Q46

OUTPUT

Q45

V–

Figure 3.

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] www.analog.com
Fax: [phone] ©2006 Analog Devices, Inc. All rights reserved.

00317-003

OP27

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TABLE OF CONTENTS

Features.............................................................................................. 1

Typical Performance Characteristics..............................................8

General Description......................................................................... 1

Pin Configurations........................................................................... 1

Functional Block Diagram ..............................................................1

Revision History ...............................................................................2

Specifications..................................................................................... 4

Electrical Characteristics............................................................. 4

Typical Electrical Characteristics ...............................................6

Absolute Maximum Ratings............................................................ 7

Thermal Resistance...................................................................... 7

ESD Caution.................................................................................. 7

REVISION HISTORY

5/06—Rev. E to Rev. F

Removed References to 745 ..............................................Universal

Updated 741 to AD741......................................................Universal

Changes to Ordering Guide.......................................................... 20

12/05—Rev. D to Rev. E

E

dits to Figure 2................................................................................ 1

9/05—Rev. C to Rev. D

pdated Format..................................................................Universal

U

Changes to Table 1............................................................................ 4

Removed Die Characteristics Figure ............................................ 5

Removed Wafer Test Limits Table .................................................. 5

Changes to Table 5............................................................................ 7

Changes to Comments on Noise Section ....................................15

Changes to Ordering Guide.......................................................... 24

Application Information................................................................ 14

Offset Voltage Adjustment........................................................ 14

Noise Measurements.................................................................. 14

Unity-Gain Buffer Applications ............................................... 14

Comments On Noise................................................................. 15

Audio Applications .................................................................... 16

References.................................................................................... 18

Outline Dimensions....................................................................... 19

Ordering Guide............................................................................... 20

9/01—Rev. 0 to Rev. A

dits to Ordering Information ........................................................1

E

Edits to Pin Connections..................................................................1

Edits to Absolute Maximum Ratings ..............................................2

Edits to Package Type .......................................................................2

Edits to Electrical Characteristics .............................................. 2, 3

Edits to Wafer Test Limits ................................................................4

Deleted Typical Electrical Characteristics......................................4

Edits to Burn-In Circuit Figure.......................................................7

Edits to Application Information ....................................................8

1/03—Rev. B to Rev. C

E

dits to Pin Connections................................................................. 1

Edits to General Description........................................................... 1

Edits to Die Characteristics............................................................. 5

Edits to Absolute Maximum Ratings ............................................. 7

Updated Outline Dimensions....................................................... 16

Edits to Figure 8.............................................................................. 14

Edits to Outline Dimensions......................................................... 16

Rev. F | Page 2 of 20

OP27

www.BDTIC.com/ADI

GENERAL DESCRIPTION

(Continued from Page 1)

PSRR and CMRR exceed 120 dB. These characteristics, coupled

th long-term drift of 0.2 μV/month, allow the circuit designer

wi
to achieve performance levels previously attained only by
discrete designs.

Low cost, high volume production of OP27 is achieved by
usin

g an on-chip Zener zap-trimming network. This reliable
and stable offset trimming scheme has proven its effectiveness
over many years of production history.

The OP27 provides excellent performance in low noise,

h accuracy amplification of low level signals. Applications

hig
include stable integrators, precision summing amplifiers,
precision voltage threshold detectors, comparators, and
professional audio circuits such as tape heads and micro­phone preamplifiers.

The OP27 is a direct replacement for OP06, OP07, and OP45
a

mplifiers; AD741 types can be directly replaced by removing

he nulling potentiometer of the AD741.

t

Rev. F | Page 3 of 20

OP27

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SPECIFICATIONS

ELECTRICAL CHARACTERISTICS

VS = ±15 V, TA = 25°C, unless otherwise noted.

Table 1.

OP27A/E OP27/G
Parameter Symbol Conditions Min Typ Max Min Typ Max Unit

INPUT OFFSET VOLTAGE
LONG-TE RM VOS STABILITY2,
INPUT OFFSET CURRENT IOS 7 35 12 75 nA
INPUT BIAS CURRENT IB ±10 ±40 ±15 ±80 nA
INPUT NOISE VOLTAGE
INPUT NOISE en fO = 10 Hz 3.5 5.5 3.8 8.0 nV/√Hz

Voltage Density
f
INPUT NOISE in fO = 10 Hz 1.7 4.0 1.7 pA/√Hz

Current Density

INPUT RESISTANCE

Differential Mode

Common Mode R
INPUT VOLTAGE RANGE IVR ±11.0 ±12.3
COMMON-MODE REJECTION RATIO CMRR VCM = ±11 V 114 126
POWER SUPPLY REJECTION RATIO PSRR VS = ±4 V to ±18 V
LARGE SIGNAL VOLTAGE GAIN AVO RL ≥ 2 k Ω, VO = ±10 V 1000 1800

OUTPUT VOLTAGE SWING VO RL ≥ 2 k Ω ±12.0 ±13.8

SLEW RATE

6

GAIN BANDWIDTH PRODUCT
OPEN-LOOP OUTPUT RESISTANCE RO VO = 0, IO = 0 70 70 Ω
POWER CONSUMPTION Pd VO 90 140 100 170 mW
OFFSET ADJUSTMENT RANGE RP = 10 kΩ ±4.0

1

Input offset voltage measurements are performed approximately 0.5 seconds after application of power. A/E grades guaranteed fully warmed up.

2

Long-term input offset voltage stability refers to the average trend line of VOS vs. time over extended periods after the first 30 days of operation. Excluding the initial

hour of operation, changes in V

3

Sample tested.

4

See voltage noise test circuit (Figure 31).

5

Guaranteed by input bias current.

6

Guaranteed by design.

1

3

3, 4

3

3

5

6

during the first 30 days are typically 2.5 μV. Refer to the Typical Performance Characteristics section.

OS

VOS 10 25 30 100 μV
VOS/Time 0.2 1.0 0.4 2.0 μV/MO

e

0.1 Hz to 10 Hz 0.08 0.18 0.09 0.25 μV p-p

n p-p

f

RIN 1.3 6

INCM

SR RL ≥ 2 kΩ 1.7 2.8
GBW 5.0 8.0

= 30 Hz 3.1 4.5 3.3 5.6 nV/√Hz

O

= 1000 Hz 3.0 3.8 3.2 4.5 nV/√Hz

O

= 30 Hz

f

O

fO = 1000 Hz

≥ 600 Ω, VO = ±10 V 800 1500

R

L

≥ 600 Ω ±10.0 ±11.5

R

L

1.0 2.3

0.4 0.6

3

0.7 4

±11.0 ±12.3
100 120

1.0

pA/√Hz

0.4 0.6 pA/√Hz

MΩ

2

GΩ
V
dB

1 10 2 20 μV/V

700 1500
600 1500
±11.5 ±13.5
±10.0 ±11.5

1.7 2.8

5.0 8.0

±4.0

V/mV
V/mV
V
V
V/μs
MHz

mV

Rev. F | Page 4 of 20

OP27

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VS = ±15 V, −55°C ≤ TA ≤ 125°C, unless otherwise noted.

Table 2.

OP27A
Parameter Symbol Conditions Min Typ Max Unit

INPUT OFFSET VOLTAGE
AVERAGE INPUT OFFSET DRIFT TCV

INPUT OFFSET CURRENT IOS 15 50 nA
INPUT BIAS CURRENT IB ±20 ±60 nA
INPUT VOLTAGE RANGE IVR ±10.3 ±11.5 V
COMMON-MODE REJECTION RATIO CMRR VCM = ±10 V 108 122
POWER SUPPLY REJECTION RATIO PSRR VS = ±4.5 V to ±18 V 2 16 μV/V
LARGE SIGNAL VOLTAGE GAIN AVO RL ≥ 2 kΩ, VO = ±10 V 600 1200
OUTPUT VOLTAGE SWING VO RL ≥ 2 kΩ ±11.5 ±13.5

1

Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power. A/E grades guaranteed fully

warmed up.

2

The TCVOS performance is within the specifications unnulled or when nulled with RP = 8 kΩ to 20 kΩ. TCVOS is 100% tested for A/E grades, sample tested for G grades.

3

Guaranteed by design.

VS = ±15 V, −25°C ≤ TA ≤ 85°C for OP27J, OP27Z, 0°C ≤ TA ≤ 70°C for OP27EP, and –40°C ≤ TA ≤ 85°C for OP27GP, OP27GS, unless
otherwise noted.

Table 3.

OP27E OP27G
Parameter Symbol Conditions Min Typ Max Min Typ Max Unit

INPUT ONSET VOLTAGE VOS
AVERAGE INPUT OFFSET DRIFT TCV

INPUT OFFSET CURRENT IOS
INPUT BIAS CURRENT IB
INPUT VOLTAGE RANGE IVR ±10.5 ±11.8
COMMON-MODE REJECTION RATIO CMRR VCM = ±10 V 110 124
POWER SUPPLY REJECTION RATIO PSRR VS = ±4.5 V to ±18 V 2 15 2 32 μV/V
LARGE SIGNAL VOLTAGE GAIN AVO RL ≥ 2 kΩ, VO = ±10 V 750 1500
OUTPUT VOLTAGE SWING VO RL ≥ 2 kΩ ±11.7 ±13.6

1

The TCVOS performance is within the specifications unnulled or when nulled with RP = 8 kΩ to 20 kΩ. TCVOS is 100% tested for A/E grades, sample tested for C/G grades.

2

Guaranteed by design.

1

TCV

VOS 30 60 μV

OS

OSn

1

2

TCV

2

OS

3

OSn

0.2 0.6 μV/°C

20 50

0.2 0.6

0.2 0.6
10 50
±14 ±60

±10.5 ±11.8
96 118

450 1000
±11.0 ±13.3

55 220 μV
0 4 1.8 μV/°C
0 4 1.8 μV/°C
20 135 nA
±25 ±150 nA

dB

V/mV
V

V
dB

V/mV
V

Rev. F | Page 5 of 20

OP27

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TYPICAL ELECTRICAL CHARACTERISTICS

VS = ±15 V, TA = 25°C unless otherwise noted.

Table 4.

Parameter Symbol Conditions OP27N Typical Unit

AVERAGE INPUT OFFSET VOLTAGE DRIFT
TCV
AVERAGE INPUT OFFSET CURRENT DRIFT TCIOS 80 pA/°C
AVERAGE INPUT BIAS CURRENT DRIFT TCIB 100 pA/°C
INPUT NOISE VOLTAGE DENSITY en fO = 10 Hz 3.5 nV/√Hz
e
e

INPUT NOISE CURRENT DENSITY in fO = 10 Hz 1.7 pA/√Hz
i
i
INPUT NOISE VOLTAGE SLEW RATE e

GAIN BANDWIDTH PRODUCT GBW 8 MHz

1

Input offset voltage measurements are performed by automated test equipment approximately 0.5 seconds after application of power.

1

TCVOS or Nulled or unnulled 0.2 μV/°C

RP = 8 kΩ to 20 kΩ

OSn

fO = 30 Hz 3.1 nV/√Hz

n

fO = 1000 Hz 3.0 nV/√Hz

n

fO = 30 Hz 1.0 pA/√Hz

n

fO = 1000 Hz 0.4 pA/√Hz

n

0.1 Hz to 10 Hz 0.08 μV p-p

np-p

SR R

≥ 2 kΩ 2.8 V/μs

L

Rev. F | Page 6 of 20