FEATURES
Four 14-Bit DACs in One Package
Voltage Outputs
Separate Offset Adjust for Each Output
Reference Range of 5 V
Maximum Output Voltage Range of 10 V
Clear Function to User-Defined Code
44-Pin MQFP Package
APPLICATIONS
Process Control
Automatic Test Equipment
General Purpose Instrumentation
Quad 14-Bit DAC
AD7836
GENERAL DESCRIPTION
The AD7836 contains four 14-bit DACs on one monolithic
chip. It has output voltages with a full-scale range of ±10 V
from reference voltages of ±5 V.
The AD7836 accepts 14-bit parallel loaded data from the external bus into one of the input latches under the control of the
WR, CS and DAC channel address pins, A0–A2.
The DAC outputs are updated individually, on reception of new
data. In addition, the SEL input can be used to apply the user
programmed value in DAC Register E to all DACs, thus setting
all DAC output voltages to the same level. The contents of the
DAC data registers are not affected by the SEL input.
Each DAC output is buffered with a gain of two amplifier into
which an external DAC offset voltage can be inserted via the
DUTGNDx pins.
The AD7836 is available in a 44-lead MQFP package.
FUNCTIONAL BLOCK DIAGRAM
DB13
DB0
WR
(+)A
REF
X1X1
DAC A
DAC D
X1X1
(+)D V
REF
V
REF
REF
(–)A V
(–)D V
(+)B V
REF
X1
DAC B
DAC B
X1X1
(+)C V
REF
REF
REF
(–)B
V
A
X1
(–)C
CLR
R
R
R
R
R
R
R
R
OUT
DUTGND A
V
B
OUT
DUTGND B
C
V
OUT
DUTGND C
V
D
OUT
DUTGND D
MUX
MUX
MUX
MUX
SELAGNDDGND
V
V
V
CCVSSVDD
AD7836
14
INPUT
BUFFER
CS
A0
A1
A2
ADDRESS
DECODE
1414
DATA
14
DATA
DATA
DATA
DATA
REG
A
REG
B
REG
C
REG
D
REG
E
14
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
(VCC = +5 V 5%; VDD = +15 V 5%; VSS = –15 V 5%; AGND = DGND = DUTGND
AD7836–SPECIFICATIONS
= 0 V; RL = 5 k and CL = 50 pF to GND, T
ParameterAUnitsTest Conditions/Comments
ACCURACY
Resolution14Bits
Relative Accuracy±2LSB max
Differential Nonlinearity±0.9LSB maxGuaranteed Monotonic Over Temperature
Full-Scale Error±8LSB maxV
Zero-Scale Error±8LSB maxV
Gain Error±2mV typV
Gain Temperature Coefficient
DC Crosstalk
2
2
20ppm FSR/°C typ
40ppm FSR/°C max
50µV maxSee Terminology. RL = 5 kΩ
(+) = +5 V, V
REF
(+) = +5 V, V
REF
(+) = +5 V, V
REF
REFERENCE INPUTS
DC Input Resistance100MΩ typ
Input Current±1µA maxPer Input. Typically ±20 nA
(+) Range0/+5V min/max
V
REF
V
(–) Range–5/0V min/max
REF
[V
REF
(+) – V
(–)]2/10V min/maxFor Specified Performance. Can Go as Low as 0 V,
REF
but Performance Not Guaranteed
OUTPUT CHARACTERISTICS
Output Voltage Swing±10V min2 × (V
REF
(–)+[V
Short Circuit Current25mA max
Resistive Load5kΩ minTo 0 V
Capacitive Load50pF maxTo 0 V
DIGITAL INPUTS
, Input High Voltage2.4V min
V
INH
, Input Low Voltage0.8V max
V
INL
, Input Current±10µA maxTotal for All Pins
I
INH
CIN, Input Capacitance10pF max
POWER REQUIREMENTS
V
CC
V
DD
V
SS
5.0V nom±5% for Specified Performance
15.0V nom±5% for Specified Performance
–15.0V nom±5% for Specified Performance
Power Supply Sensitivity
∆Full Scale/∆V
∆Full Scale/∆V
I
CC
I
DD
I
SS
DD
SS
110dB typ
100dB typ
0.5mA maxV
8mA maxV
= VCC, V
INH
= 2.4 V min, V
INH
14mA maxOutputs Unloaded. Typically 7 mA
14mA maxOutputs Unloaded. Typically 7 mA
1
= T
to T
A
MIN
(–) = –5 V. Typically within ±1 LSB
REF
(–) = –5 V. Typically within ±1 LSB
REF
(–) = –5 V
REF
(+)-V
REF
INL
REF
= DGND. Dynamic Current
= 0.8 V max
INL
, unless otherwise noted)
MAX
(–)]•D) – V
DUTDGN
(These characteristics are included for Design Guidance and are not
AC PERFORMANCE CHARACTERISTICS
ParameterAUnitsTest Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time16µs typFull-Scale Change to ±1/2 LSB. DAC Latch Contents Alternately
Digital-to-Analog Glitch Impulse150nV-s typMeasured with V
DC Output Impedance0.3Ω maxSee Terminology
Channel-to-Channel Isolation115dB typSee Terminology
DAC-to-DAC Crosstalk10nV-s typSee Terminology
Digital Crosstalk10nV-s typFeedthrough to DAC Output Under Test Due to Change in Digital
Digital Feedthrough0.2nV-s typEffect of Input Bus Activity on DAC Output Under Test
Output Noise Spectral Density
@ 1 kHz40nV/√Hz typAll 1s Loaded to DAC. V
NOTES
1
Temperature range for A Version: –40°C to +85°C
2
Guaranteed by design.
Specifications subject to change without notice.
subject to production testing.)
Loaded with All 0s and All 1s
REF
Alternately Loaded with 1FFF Hex and 2000 Hex. Not Dependent
on Load Conditions
Input Code to Another Converter
–2–
(+) = +5 V, V
(+) = V
REF
(–) = –5 V. DAC Latch
REF
(–) = 0 V
REF
REV. A
TIMING SPECIFICATIONS
1
(VCC = +5 V 5%; VDD = +15 V 5%; VSS = –15 V 5%; AGND = DGND = 0 V)
AD7836
ParameterLimit at T
t
1
t
2
t
3
t
4
t
5
t
6
t
7
t
8
t
9
t
10
NOTES
1
All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
2
Rise and fall times should be no longer than 50 ns.
Specifications subject to change without notice.
15ns minA0, A1, A2 to WR Setup Time
0ns minA0, A1, A2 to WR Hold Time
0ns minCS to WR Setup Time
0ns minWR to CS Hold Time
44ns minWR Pulsewidth
15ns minData Setup Time
4.5ns minData Hold Time
44ns minWR Pulse Interval
16µs typSettling Time
300ns maxCLR Pulse Activation Time
A0, A1, A2
CS
WR
DATA
MIN, TMAX
t
3
t
1
t
5
t
6
UnitsDescription
t
2
t
4
t
8
t
7
t
9
V
OUT
t
CLR
V
OUT
10
Figure 1. Timing Diagram
REV. A
–3–
AD7836
ABSOLUTE MAXIMUM RATINGS
(TA = +25°C unless otherwise noted)
VCC to DGND . . . . . . . . . . . . . . .–0.3 V, +7 V or V
Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in
the operational section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch-up.
Linearity
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7836 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
–4–
REV. A
Loading...
+ 8 hidden pages
You need points to download manuals.
1 point = 1 manual.
You can buy points or you can get point for every manual you upload.