Analog Devices AD7834 5 b Datasheet

LC2MOS
a
FEATURES Four 14-Bit DACs in One Package
AD7835—Parallel 8-/14-Bit Loading Voltage Outputs Power-On Reset Function Max/Min Output Voltage Range of 8.192 V Maximum Output Voltage Span of 14 V Common Voltage Reference Inputs User Assigned Device Addressing Clear Function to User-Defined Voltage Surface-Mount Packages
AD7834—28-Lead SOIC and PDIP
AD7835—44-Lead MQFP and PLCC
APPLICATIONS Process Control Automatic Test Equipment General Purpose Instrumentation

GENERAL DESCRIPTION

The AD7834 and AD7835 contain four 14-bit DACs on one monolithic chip. The AD7834 and AD7835 have output voltages in the range of ±8.192 V with a maximum span of 14 V.
Quad 14-Bit DACs
AD7834/AD7835
The AD7834 is a serial input device. Data is loaded in 16-bit format from the external serial bus, MSB first after two leading 0s, into one via DIN, SCLK and FSYNC. The AD7834 has five dedicated package address pins, PA0–PA4, that can be wired to AGND or V addressed in a multipackage application.
The AD7835 can accept either 14-bit parallel loading or double­byte loading, where right-justified data is loaded in one 8-bit and one 6-bit byte. Data is loaded from the external bus into one of the input latches under the control of the WR, CS, BYSHF, and DAC channel address pins, A0–A2.
With either device, the LDAC signal can be used to update either all four DAC outputs simultaneously or individually on reception of new data. In addition, for either device, the asynchronous CLR input can be used to set all signal outputs, V to the user-defined voltage level on the Device Sense Ground pin, DSG. On power-on, before the power supplies have stabilized, internal circuitry holds the DAC output voltage levels to within ±2 V of the DSG potential. As the supplies stabilize, the DAC output levels move to the exact DSG potential (assuming CLR is exercised).
The AD7834 is available in 28-lead 0.3" SOIC and 0.6" PDIP packages, and the AD7835 is available in a 44-lead MQFP package and a 44-lead PLCC package.
to permit up to 32 AD7834s to be individually
CC
1–V
OUT
OUT
(continued on page 10)
4,

AD7834 FUNCTIONAL BLOCK DIAGRAM

PAEN
PA0
PA1
PA2
PA3
PA4
FSYNC
DIN
SCLK
AD7834
CONTROL
LOGIC
&
ADDRESS
DECODE
SERIAL-TO-
PARALLEL
CONVERTER
V
CC
AGND
VDDV
INPUT
REGISTER
1
INPUT
REGISTER
2
INPUT
REGISTER
3
INPUT
REGISTER
4
DGND
SS
DAC 1
LATCH
DAC 2
LATCH
DAC 3
LATCH
DAC 4
LATCH
LDAC
V
(–)
(+)
V
REF
REF
DAC 1
DAC 2
DAC 3
DAC 4
DSG
X1
V
1
OUT
X1
V
2
OUT
V
OUT
V
OUT
CLR
3
4
X1
X1
REV. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective companies.

AD7835 FUNCTIONAL BLOCK DIAGRAM

V
VDDV
CC
BYSHF
DB13
DB0
WR
CS
AD7835
INPUT
BUFFER
A0
ADDRESS
A1
DECODE
A2
14
AGND
INPUT
REGISTER
1
INPUT
REGISTER
2
INPUT
REGISTER
3
INPUT
REGISTER
4
DGND
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 © 2003 Analog Devices, Inc. All rights reserved.
SS
DAC 1
LATCH
DAC 2
LATCH
DAC 3
LATCH
DAC 4
LATCH
LDAC
V
(–)A
(+)A
V
V
REF
REF
DAC 1
DAC 2
DAC 3
DAC 4
(–)B
DSG A
REF
X1
V
1
OUT
X1
V
2
OUT
X1
X1
DSG B
V
(+)B
REF
V
V
CLR
OUT
OUT
3
4
(VCC = +5 V 5%; VDD = +15 V 5%; VSS = –15 V  5%;
AD7834/AD7835
AD7834/AD7835–SPECIFICATIONS
P
arameter A B S Unit Test Conditions/Comments
AGND = DGND = 0 V; T
ACCURACY
Resolution 14 14 14 Bits Relative Accuracy ±2 ±1 ±2 LSB max Differential Nonlinearity ±0.9 ±0.9 ±0.9 LSB max Guaranteed Monotonic over Temperature Full-Scale Error V
to T
T
MIN
MAX
±5 ±5 ±8 mV max Zero-Scale Error ±4 ±4 ±5 mV max V Gain Error ±0.5 ±0.5 ±0.5 mV typ V Gain Temperature Coefficient
DC Crosstalk
2
2
444ppm FSR/C typ
20 20 20 ppm FSR/C max
50 50 50 mV max See Terminology. RL = 10 kW
REFERENCE INPUTS
DC Input Resistance 30 30 30 MW typ Input Current ±1 ±1 ±1 mA max Per Input
(+) Range 0/+8.192 0/+8.192 0/+8.192 V min/max
V
REF
(–) Range –8.192/0 –8.192/0 –8.192/0 V min/max
V
REF
[V
REF
(+) – V
(–)] +5/+14 +7/+14 +5/+14 V min/max For Specified Performance. Can go as low as
REF
DEVICE SENSE GROUND INPUTS
Input Current ±2 ±2 ±2 mA max Per Input. V
DIGITAL INPUTS
, Input High Voltage 2.4 2.4 2.4 V min
V
INH
V
, Input Low Voltage 0.8 0.8 0.8 V max
INL
, Input Current ±10 ±10 ±10 mA max
I
INH
CIN, Input Capacitance 10 10 10 pF max
POWER REQUIREMENTS
V
CC
V
DD
V
SS
+5.0 +5.0 +5.0 V nom ±5% for Specified Performance
+15.0 +15.0 +15.0 V nom ±5% for Specified Performance
–15.0 –15.0 –15.0 V nom ±5% for Specified Performance Power Supply Sensitivity
DFull Scale/DV DFull Scale/DV
I
CC
DD
SS
110 110 110 dB typ
100 100 100 dB typ
0.2 0.2 0.5 mA max V
333mA max AD7834: V
666mA max AD7835: V I
DD
13 13 15 mA max AD7834: Outputs Unloaded
15 15 15 mA max AD7835: Outputs Unloaded I
SS
NOTES
1
Temperature range is as follows: A Version: –40C to +85C; B Version: –40C to +85C.
2
Guaranteed by design.
Specifications subject to change without notice.
13 13 15 mA max Outputs Unloaded
1
= T
to T
A
MIN
(+) = +7 V, V
REF
(+) = +7 V, V
REF
(+) = +7 V, V
REF
, unless otherwise noted.)
MAX
(–) = –7 V
REF
(–) = –7 V
REF
(–) = –7 V
REF
0 V, but performance not guaranteed.
= –2 V to +2 V
DSG
= VCC, V
INH
= DGND
INL
= 2.4 V min, V
INH
= 2.4 V min, V
INH
= 0.8 V max
INL
= 0.8 V max
INL
(These characteristics are included for design guidance and are not

AC PERFORMANCE CHARACTERISTICS

P
arameter A B S Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time 10 10 10 ms typ Full-Scale Change to ± 1/2 LSB. DAC latch contents
Digital-to-Analog Glitch Impulse 120 120 120 nV-s typ Measured with V
DC Output Impedance 0.5 0.5 0.5 W typ See Terminology Channel-to-Channel Isolation 100 100 100 dB typ See Terminology; applies to the AD7835 only DAC to DAC Crosstalk 25 25 25 nV-s typ See Terminology Digital Crosstalk 3 3 3 nV-s typ Feedthrough to DAC Output under test due to
Digital Feedthrough – AD7834 0.2 0.2 0.2 nV-s typ Effect of Input Bus Activity on DAC Output Under Test Digital Feedthrough – AD7835 1.0 1.0 1.0 nV-s typ Output Noise Spectral Density @ 1 kHz 40 40 40 nV/÷Hz typ All 1s Loaded to DAC. V
subject to production testing. )
alternately loaded with all 0s and all 1s
alternately loaded with all 0s and all 1s
change in digital input code to another converter.
–2–
REF
(+) = V
REF
(–) = 0 V. DAC latch
REF
(+) = V
(–) = 0 V
REF
REV. B
AD7834/AD7835
(VCC = +5 V 5%; VDD = +12 V 5%; VSS = –12 V  5%;
SPECIFICATIONS
P
arameter A B S Unit Test Conditions/Comments
AGND = DGND = 0 V; T
ACCURACY
Resolution 14 14 14 Bits Relative Accuracy ±2 ± 1 ±2 LSB max Differential Nonlinearity ±0.9 ± 0.9 ± 0.9 LSB max Guaranteed Monotonic over Temperature Full-Scale Error V
to T
T
MIN
MAX
±5 ± 5 ±8 mV max Zero-Scale Error ± 4 ± 4 ± 5 mV max V Gain Error ±0.5 ± 0.5 ±0.5 mV typ V Gain Temperature Coefficient
DC Crosstalk
2
2
444ppm FSR/C typ
20 20 20 ppm FSR/C max
50 50 50 mV max See Terminology. RL = 10 kW
REFERENCE INPUTS
DC Input Resistance 30 30 30 MW typ Input Current ±1 ± 1 ±1 mA max Per Input
(+) Range 0/+8.192 0/+8.192 0/+8.192 V min/max
V
REF
(–) Range –5/0 –5/0 –5/0 V min/max
V
REF
[V
REF
(+) – V
(–)] +5/+13.192 +7/+13.192 +5/+13.192 V min/max For Specified Performance. Can Go as Low
REF
DEVICE SENSE GROUND INPUTS
Input Current ±2 ± 2 ±2 mA max Per Input. V
DIGITAL INPUTS
V
, Input High Voltage 2.4 2.4 2.4 V min
INH
, Input Low Voltage 0.8 0.8 0.8 V max
V
INL
, Input Current ±10 ±10 ± 10 mA max
I
INH
CIN, Input Capacitance 10 10 10 pF max
POWER REQUIREMENTS
V
CC
V
DD
V
SS
+5.0 +5.0 +5.0 V nom ±5% for Specified Performance
+15.0 +15.0 +15.0 V nom ± 5% for Specified Performance
–15.0 –15.0 –15.0 V nom ±5% for Specified Performance Power Supply Sensitivity
DFull Scale/DV DFull Scale/DV
I
CC
DD
SS
110 110 110 dB typ
100 100 100 dB typ
0.2 0.2 0.5 mA max V
333mA max AD7834: V
666mA max AD7835: V I
DD
13 13 15 mA max AD7834: Outputs Unloaded
15 15 15 mA max AD7835: Outputs Unloaded I
SS
NOTES
1
Temperature range is as follows: A Version: –40C to +85C; B Version: –40C to +85C.
2
Guaranteed by design.
Specifications subject to change without notice.
13 13 15 mA max Outputs Unloaded
A
1
= T
MIN
to T
, unless otherwise noted.)
MAX
(+) = +5 V, V
REF
(+) = +5 V, V
REF
(+) = +5 V, V
REF
(–) = –5 V
REF
(–) = –5 V
REF
(–) = –5 V
REF
as 0 V, but Performance Not Guaranteed
= –2 V to +2 V
DSG
= VCC, V
INH
= DGND
INL
= 2.4 V min, V
INH
= 2.4 V min, V
INH
= 0.8 V max
INL
= 0.8 V max
INL
REV. B
–3–
AD7834/AD7835
)

TIMING SPECIFICATIONS

Parameter Limit at T
AD7834 Specific
2
t
1
2
t
2
2
t
3
t
4
t
5
t
6
t
7
t
8
t
9
t
21
1
(VCC = +5 V 5%; VDD = +11.4 V to +15.75 V; VSS = –11.4 V to –15.75 V; AGND = DGND = 0 V)
MIN, TMAX
Unit Description
100 ns min SCLK Cycle Time 50 ns min SCLK Low 30 ns min SCLK High Time 30 ns min FSYNC, PAEN Setup Time 40 ns min FSYNC, PAEN Hold Time 30 ns min Data Setup Time 10 ns min Data Hold Time 0 ns min LDAC to FSYNC Setup Time 40 ns min LDAC to FSYNC Hold Time 20 ns min Delay Between Write Operations
AD7835 Specific
t
11
t
12
t
13
t
14
t
15
t
16
t
17
t
18
t
19
t
20
15 ns min A0, A1, A2, BYSHF to CS Setup Time 15 ns min A0, A1, A2, BYSHF to CS Hold Time 0 ns min CS to WR Setup Time 0 ns min CS to WR Hold Time 40 ns min WR Pulsewidth 40 ns min Data Setup Time 10 ns min Data Hold Time 0 ns min LDAC to CS Setup Time 0 ns min CS to LDAC Setup Time 0 ns min LDAC to CS Hold Time
General
t
10
NOTES
1
All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
2
Rise and fall times should be no longer than 50 ns.
Specifications subject to change without notice.
40 ns min LDAC, CLR Pulsewidth
SCLK
FSYNC
DIN
(SIMULTANEOUS
LDAC
UPDATE)
LDAC
(PER-CHANNEL
UPDATE
1ST
2ND
CLK
CLK
t
4
t
7
MSB LSB
D23 D22
t
8
t
2
t
6
24TH
t
1
CLK
D1
t
D0
t
3
Figure 1. AD7834 Timing Diagram
A0 A1 A2
BYSHF
t
11
CS
t
13
5
t
21
t
10
t
9
(SIMULTANEOUS
(PER-CHANNEL
WR
DATA
LDAC
UPDATE)
LDAC
UPDATE)
t
t
15
t
16
18
t
12
t
14
t
17
t
10
t
19
t
20
Figure 2. AD7835 Timing Diagram
–4–
REV. B
AD7834/AD7835

ABSOLUTE MAXIMUM RATINGS

(TA = 25C unless otherwise noted.)
VCC to DGND3 . . . . . . . . . . . . . . –0.3 V, +7 V or V
1, 2
+ 0.3 V
DD
(Whichever Is Lower)
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +17 V
V
DD
V
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V, –17 V
SS
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +0.3 V
Digital Inputs to DGND . . . . . . . . . . . . . . –0.3 V, V
(+) to V
V
REF
V
(+) to AGND . . . . . . . . . . . . . . . V
REF
(–) to AGND . . . . . . . . . . . . . . . V
V
REF
DSG to AGND . . . . . . . . . . . . . . . . . V
V
(1–4) to AGND . . . . . . . . . . . . V
OUT
(–) . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +18 V
REF
– 0.3 V, VDD + 0.3 V
SS
– 0.3 V, VDD + 0.3 V
SS
– 0.3 V, VDD + 0.3 V
SS
– 0.3 V, VDD + 0.3 V
SS
+ 0.3 V
CC
Operating Temperature Range
Industrial (A Version) . . . . . . . . . . . . . . . . . . .–40C to +85∞C
Storage Temperature Range . . . . . . . . . . . . . –65C to +150∞C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150∞C
Plastic Package
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 75∞C/W
JA
Lead Temperature, Soldering (10 sec) . . . . . . . . . . . . 260∞C
SOIC Package
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 75∞C/W
JA
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . 215∞C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . 220∞C
MQFP Package
␪JA Thermal Impedance . . . . . . . . . . . . . . . . . . . . . . 95∞C/W
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . 215∞C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . 220∞C
PLCC Package
Thermal Impedance. . . . . . . . . . . . . . . . . . . . . . 55∞C/W
JA
Lead Temperature, Soldering
Vapor Phase (60 sec) . . . . . . . . . . . . . . . . . . . . . . . 215∞C
Infrared (15 sec) . . . . . . . . . . . . . . . . . . . . . . . . . . . 220∞C
Power Dissipation (Any Package) . . . . . . . . . . . . . . . . 480 mW
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma­nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch up.
3
VCC must not exceed VDD by more than 0.3 V. If it is possible for this to happen during power supply sequencing, the following diode protection scheme will ensure protection.
V
V
DD
CC
IN4148
SD103C
V
V
DD
CC
AD7834/
AD7835

ORDERING GUIDE

Temperature Linearity DNL Package
Model Range Error (LSBs) (LSBs) Option
AD7834AR –40C to +85∞C ± 2 ± 0.9 R-28 AD7834AR-REEL –40C to +85∞C ± 2 ± 0.9 R-28 AD7834BR –40C to +85∞C ± 1 ± 0.9 R-28 AD7834BR-REEL –40C to +85∞C ± 1 ± 0.9 R-28 AD7834AN –40C to +85∞C ± 2 ± 0.9 N-28 AD7834BN –40C to +85∞C ± 1 ± 0.9 N-28 AD7835AP AD7835AP-REEL AD7835AS AD7835AS-REEL
NOTES
1
R = SOIC; N = Plastic DIP; S = Plastic Quad Flatpack (MQFP); P = Plastic Leaded Chip Carrier (PLCC).
2
Contact Sales Office for availability.
2
2
2
2
–40C to +85∞C ± 2 ± 0.9 P-44A –40C to +85∞C ± 2 ± 0.9 P-44A –40C to +85∞C ± 2 ± 0.9 S-44 –40C to +85∞C ± 2 ± 0.9 S-44
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7834/AD7835 feature proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
1
WARNING!
ESD SENSITIVE DEVICE
REV. B
–5–
AD7834/AD7835

AD7834 PIN FUNCTION DESCRIPTIONS

Pin Mnemonic Description
V
CC
V
SS
V
DD
DGND Digital Ground
AGND Analog Ground
V
(+) Positive Reference Input. The positive reference voltage is referred to AGND.
REF
V
(–)Negative Reference Input. The negative reference voltage is referred to AGND.
REF
V
1 to V
OUT
OUT
DSG Device Sense Ground Input. Used in conjunction with the CLR input for power-on protection of the DACs.
DIN Serial Data Input
SCLK Clock Input for writing data to the device. Data is clocked into the input register on the falling edge of SCLK. FSYNC Frame Sync Input. Active low logic input used, in conjunction with DIN and SCLK, to write data to the device
PA0 to PA4 Package Address Inputs. These inputs are hardwired high (V
PAEN Package Address Enable Input. When low, this input allows normal operation of the device. When it is high, the
LDAC Load DAC Input (level sensitive). This input signal, in conjunction with the FSYNC input signal, determines
CLR Asynchronous Clear Input (level sensitive, active low). When this input is brought low, all analog outputs are
Logic Power Supply; +5 V ± 5% Negative Analog Power Supply; –15 V ± 5% or –12 V ± 5% Positive Analog Power Supply; +15 V ± 5% or +12 V ± 5%
4 DAC Outputs
When CLR is low, the DAC outputs are forced to the potential on the DSG pin.
with serial data expected after the falling edge of this signal. The contents of the 24-bit serial-to-parallel input register are transferred on the rising edge of this signal.
) or low (DGND) to assign dedicated package
CC
addresses in a multipackage environment.
device ignores the package address (but not the channel address) in the serial data stream and loads the serial data into the input registers. This feature is useful in a multipackage application where it can be used to load the same data into the same channel in each package.
how the analog outputs are updated. If LDAC is maintained high while new data is being loaded into the devices input registers, no change occurs on the analog outputs. Subsequently, when LDAC is brought low, the contents of all four input registers are transferred into their respective DAC latches, updating the analog outputs.
Alternatively, if LDAC is kept low while new data is shifted into the device, then the addressed DAC latch (and corresponding analog output) is updated immediately on the rising edge of FSYNC.
switched to the externally set potential on the DSG pin. When CLR is brought high, the signal outputs remain at the DSG potential until LDAC is brought low. When LDAC is brought low, the analog outputs are switched back to reflect their individual DAC output levels. As long as CLR remains low, the LDAC signals are ignored and the signal outputs remain switched to the potential on the DSG pin.
PIN CONFIGURATIONS
PDIP AND SOIC
28
27
26
25
24
23
22
21
20
19
18
17
16
15
AGND
NC
NC
NC
NC
V
DD
V
OUT
V
OUT
CLR
LDAC
FSYNC
PAEN
PA4
PA3
1
3
V
REF
V
REF
V
V
DGND
V
DSG
NC
OUT
OUT
V
SCLK
DIN
PA0
PA1
PA2
SS
(–)
(+)
2
4
CC
1
2
3
4
5
AD7834
6
TOP VIEW
(Not to Scale)
7
8
9
10
11
12
13
14
NC = NO CONNECT
–6–
REV. B
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