FEATURES
Two 8-Bit DACs in One Package
8-Pin DIP/SOIC and microSOIC Packages
+2.7 V to +5.5 V Operation
Internal & External Reference Capability
Individual DAC Power-Down Function
Three-Wire Serial Interface
QSPI™, SPI™ and Microwire™ Compatible
On-Chip Output Buffer
Rail-to-Rail Operation
On-Chip Control Register
Low Power Operation: 2.3 mA @ 3.3 V
Full Power-Down to 1 mA max, typically 80 nA
APPLICATIONS
Portable Battery Powered Instruments
Digital Gain and Offset Adjustment
Programmable Voltage and Current Sources
Programmable Attenuators
Voltage Output 8-Bit DAC
AD7303
FUNCTIONAL BLOCK DIAGRAM
GENERAL DESCRIPTION
The AD7303 is a dual, 8-bit voltage out DAC that operates
from a single +2.7 V to +5.5 V supply. Its on-chip precision output buffers allow the DAC outputs to swing rail to rail. This device uses a versatile 3-wire serial interface that operates at clock
rates up to 30 MHz, and is compatible with QSPI, SPI, microwire
and digital signal processor interface standards. The serial input
register is sixteen bits wide; 8 bits act as data bits for the DACs,
and the remaining eight bits make up a control register.
The on-chip control register is used to address the relevant
DAC, to power down the complete device or an individual
DAC, to select internal or external reference and to provide a
synchronous loading facility for simultaneous update of the
DAC outputs with a software LDAC function.
The low power consumption of this part makes it ideally suited
to portable battery operated equipment. The power consumption is 7.5 mW max at 3 V, reducing to less than 3 µW in full
power-down mode.
The AD7303 is available in an 8-pin plastic dual in-line package, 8-lead SOIC and microSOIC packages.
QSPI and SPI are trademarks of Motorola.
Microwire is a trademark of National Semiconductor.
PRODUCT HIGHLIGHTS
1. Low power, single supply operation. This part operates from
a single +2.7 V to +5.5 V supply and consumes typically
15 mW at 5.5 V, making it ideal for battery powered
applications.
2. The on-chip output buffer amplifiers allow the outputs of the
DACs to swing rail to rail with a settling time of typically 1.2 µs.
3. Internal or external reference capability.
4. High speed serial interface with clock rates up to 30 MHz.
5. Individual power-down of each DAC provided. When completely powered down, the DAC consumes typically 80 nA.
REV. 0
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
(VDD = +2.7 V to +5.5 V, Internal Reference; RL = 10 kV to VDD and GND; CL = 100 pF
AD7303–SPECIFICATIONS
ParameterB Versions
to GND; all specifications T
1
UnitsConditions/Comments
MIN
to T
unless otherwise noted)
MAX
STATIC PERFORMANCE
Resolution8Bits
Relative Accuracy±1LSB maxNote 2
Differential Nonlinearity±1LSB maxGuaranteed Monotonic
Zero-Code Error @ +25°C3LSB maxAll Zeros Loaded to DAC Register
Full-Scale Error–0.5LSB typAll Ones Loaded to DAC Register
Gain Error
3
+1% FSR typ
Zero-Code Temperature Coefficient100µV/°C typ
DAC REFERENCE INPUT
REFIN Input Range1 to V
REFIN Input Impedance10ΜΩ typ
Internal Voltage Reference Error
4
±1% max
/2V min to max
DD
OUTPUT CHARACTERISTICS
Output Voltage Range0 to V
DD
V min to max
Output Voltage Settling Time2µs maxTypically 1.2 µs
Slew Rate7.5V/µs typ
Digital to Analog Glitch Impulse0.5nV-s typ1 LSB Change Around Major Carry
Digital Feedthrough0.2nV-s typ
Digital Crosstalk0.2nV-s typ
Analog Crosstalk±0.2LSB typ
DC Output Impedance40Ω typ
Short Circuit Current14mA typ
Power Supply Rejection Ratio0.0001%/% max∆ VDD = ±10%
LOGIC INPUTS
Input Current±10µA max
V
, Input Low Voltage0.8V maxVDD = +5 V
INL
V
, Input High Voltage2.4V minVDD = +5 V
INH
0.6V maxV
2.1V minV
= +3 V
DD
= +3 V
DD
Pin Capacitance5pF max
POWER REQUIREMENTS
V
DD
I
(Normal Mode)Both DACs Active and Excluding Load Currents,
DD
V
= 3.3 VVIH = VDD, VIL = GND
DD
2.7/5.5V min/max
@ +25°C2.1mA maxSee Figure 8
T
V
MIN
DD
– T
= 5.5 V
MAX
2.3mA max
@ +25°C2.7mA max
T
– T
MIN
I
(Full Power-Down)
DD
MAX
@ +25°C80nA typV
T
– T
MIN
MAX
NOTES
1
Temperature ranges are as follows: B Version, –40°C to +105°C.
2
Relative Accuracy is calculated using a reduced digital code range of 15 to 245.
3
Gain Error is specified between Codes 15 and 245. The actual error at Code 15 is typically 3 LSB.
4
Internal Voltage Reference Error = (Actual V
is selected.
Specifications subject to change without notice.
REF
3.5mA max
1µA maxSee Figure 19
– Ideal V
REF
/Ideal V
) • 100. Ideal V
REF
= VDD/2, actual V
REF
= VDD, VIL = GND
IH
= voltage on reference pin when internal reference
REF
ORDERING GUIDE
TemperaturePackage
ModelRangeOptions*
AD7303BN–40°C to +105°CN-8
AD7303BR–40°C to +105°CSO-8
AD7303BRM–40°C to +105°CRM-8
*N = Plastic DIP; R = SOIC; RM = microSOIC.
–2–
REV. 0
AD7303
(VDD = +2.7 V to +5.5 V; GND = 0 V; Reference = Internal VDD/2 Reference; all specifications
1, 2
T
to T
TIMING CHARACTERISTICS
ParameterLimit at T
t
1
t
2
t
3
t
4
t
5
t
6
t
7
t
8
NOTES
1
Sample tested at +25°C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2,
tr and tf should not exceed 1 µs on any input.
2
See Figures 1 and 2.
33ns minSCLK Cycle Time
13ns minSCLK High Time
13ns minSCLK Low Time
5ns minSYNC Setup Time
5ns minData Setup Time
4.5ns minData Hold Time
4.5ns minSYNC Hold Time
33ns minMinimum SYNC High Time
MIN
, T
MIN
(B Version)UnitsConditions/Comments
MAX
SCLK (I)
t
t
8
4
SYNC (I)
t
5
t
6
DIN (I)
DB15
unless otherwise noted)
MAX
t
1
t
2
t
3
DB0
t
7
t
4
SCLK (I)
SYNC (I)
DIN (I)
Figure 1. Timing Diagram for Continuous 16-Bit Write
t
t
t
4
8
t
5
t
6
DB15DB8
Figure 2. Timing Diagram for 2 × 8-Bit Writes
t
1
t
2
3
t
5
t
6
DB7DB0
t
7
REV. 0
–3–
AD7303
WARNING!
ESD SENSITIVE DEVICE
ABSOLUTE MAXIMUM RATINGS*
(TA = +25°C unless otherwise noted)
VDD to GND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
Reference Input Voltage to GND . . . . –0.3 V to V
Digital Input Voltage to GND . . . . . . . –0.3 V to V
V
OUT
A, V
B to GND . . . . . . . . . . . –0.3 V to VDD + 0.3 V
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only; functional operation
of the device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7303 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
PIN CONFIGURATIONS
(DIP, SOIC and microSOIC)
B
V
1
V
A
OUT
V
2
DD
AD7303
TOP VIEW
3
GND
(Not to Scale)
REF
4
8
OUT
7
SYNC
6
DIN
5
SCLK
PIN FUNCTION DESCRIPTIONS
Pin
No.MnemonicFunction
1V
2V
AAnalog Output Voltage from DAC A. The output amplifier swings rail to rail on its output.
OUT
DD
Power Supply Input. These parts can be operated from +2.7 V to +5.5 V and should be decoupled to GND.
3GNDGround reference point for all circuitry on the part.
4REFExternal Reference Input. This can be used as the reference for both DACs, and is selected by setting the
INT/EXT bit in the control register to a logic one. The range on this reference input is 1 V to VDD/2. When
the internal reference is selected, this voltage will appear as an output for decoupling purposes at the REF Pin.
When using the internal reference, external voltages should not be connected to the REF Pin, see Figure 21.
5SCLKSerial Clock. Logic Input. Data is clocked into the input shift register on the rising edge of the serial clock
input. Data can be transferred at rates up to 30 MHz.
6DINSerial Data Input. This device has a 16-bit shift register, 8 bits for data and 8 bits for control. Data is clocked
into the register on the rising edge of the clock input.
7
SYNCLevel Triggered Control Input (active low). This is the frame synchronization signal for the input data. When
8V
SYNC goes low, it enables the input shift register and data is transferred in on the rising edges of the following
clocks. The rising edge of the
BAnalog output voltage from DAC B. The output amplifier swings rail to rail on its output.
OUT
SYNC causes the relevant registers to be updated.
–4–
REV. 0
AD7303
TERMINOLOGY
INTEGRAL NONLINEARITY
For the DACs, relative accuracy or endpoint nonlinearity is a
measure of the maximum deviation, in LSBs, from a straight
line passing through the endpoints of the DAC transfer function. A graphical representation of the transfer curve is shown
in Figure 15.
DIFFERENTIAL NONLINEARITY
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change of any two adjacent codes. A
specified differential nonlinearity of ±1 LSB maximum ensures
monotonicity.
ZERO CODE ERROR
Zero code error is the measured output voltage from V
OUT
of
either DAC when zero code (all zeros) is loaded to the DAC
latch. It is due to a combination of the offset errors in the DAC
and output amplifier. Zero-scale error is expressed in LSBs.
GAIN ERROR
This is a measure of the span error of the DAC. It is the deviation in slope of the DAC transfer characteristic from ideal
expressed as a percent of the full-scale value. Gain error is calculated between Codes 15 and 245.
FULL-SCALE ERROR
Full-Scale Error is a measure of the output error when the DAC
latch is loaded with FF Hex. Full-scale error includes the offset
error.
DIGITAL-TO-ANALOG GLITCH IMPULSE
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the digital inputs change state with the
DAC selected and the software LDAC used to update the DAC.
It is normally specified as the area of the glitch in nV-s and is
measured when the digital input code is changed by 1 LSB at
the major carry transition.
DIGITAL FEEDTHROUGH
Digital feedthrough is a measure of the impulse injected into the
analog output of a DAC from the digital inputs of the same
DAC, but is measured when the DAC is not updated. It is
specified in nV-s and measured with a full-scale code change on
the data bus, i.e., from all 0s to all 1s and vice versa.
DIGITAL CROSSTALK
Digital crosstalk is the glitch impulse transferred to the output
of one converter due to a digital code change to another DAC.
It is specified in nV-s.
ANALOG CROSSTALK
Analog crosstalk is a change in output of any DAC in response
to a change in the output of the other DAC. It is measured in
LSBs.
POWER SUPPLY REJECTION RATIO (PSRR)
This specification indicates how the output of the DAC is
affected by changes in the power supply voltage. Power supply
rejection ratio is quoted in terms of % change in output per %
of change in V
for full-scale output of the DAC. VDD is varied
DD
± 10%. This specification applies to an external reference only
because the output voltage will track the V
voltage when in-
DD
ternal reference is selected.
REV. 0
–5–
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