High relative accuracy (INL): ±2 LSB maximum at 16 bits
Tiny package: 3 mm × 3 mm, 16-lead LFCSP
Total unadjusted error (TUE): ±0.1% of FSR maximum
Offset error: ±1.5 mV maximum
Gain error: ±0.1% of FSR maximum
High drive capability: 20 mA, 0.5 V from supply rails
User-selectable gain of 1 or 2 (GAIN pin)
Reset to zero scale or midscale (RSTSEL pin)
1.8 V logic compatibility
400 kHz I
4 I
Low glitch: 0.5 nV-sec
Robust 3.5 kV HBM and 1.5 kV FICDM ESD rating
Low power: 1.8 mW at 3 V
2.7 V to 5.5 V power supply
−40°C to +105°C temperature range
APPLICATIONS
Digital gain and offset adjustment
Programmable attenuators
Process control (PLC I/O cards)
Industrial automation
Data acquisition systems
2
2
C-compatible serial interface
C addresses available
LOGIC
SCL
SDA
A1
A0
with I2C Interface
AD5696/AD5694
FUNCTIONAL BLOCK DIAGRAM
DD
AD5696/AD5694
INPUT
REGISTER
INPUT
REGISTER
INPUT
REGISTER
INTERFACE L OGIC
INPUT
REGISTER
GND
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
DAC
REGISTER
POWER-ON
RESET
RSTSELGAINLDAC RESET
Figure 1.
REF
STRING
DAC A
STRING
DAC B
STRING
DAC C
STRING
DAC D
GAIN =
×1/×2
BUFFER
BUFFER
BUFFER
BUFFER
POWER-
DOWN
LOGIC
V
A
OUT
V
B
OUT
V
C
OUT
V
D
OUT
10799-001
GENERAL DESCRIPTION
The AD5696 and AD5694, members of the nanoDAC+™ family,
are low power, quad, 16-/12-bit buffered voltage output DACs.
The devices include a gain select pin giving a full-scale output
of 2.5 V (gain = 1) or 5 V (gain = 2). The devices operate from
a single 2.7 V to 5.5 V supply, are guaranteed monotonic by
design, and exhibit less than 0.1% FSR gain error and 1.5 mV
offset error performance. The devices are available in a 3 mm ×
3 mm LFCSP package and in a TSSOP package.
The AD5696/AD5694 incorporate a power-on reset circuit and a
RSTSEL pin; the RSTSEL pin ensures that the DAC outputs power
up to zero scale or midscale and remain at that level until a valid
write takes place. The parts contain a per-channel power-down
feature that reduces the current consumption of the device in
power-down mode to 4 μA at 3 V.
The AD5696/AD5694 use a versatile 2-wire serial interface that
operates at clock rates up to 400 kHz and include a V
intended for 1.8 V/3 V/5 V logic.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Zero-Code Error 0.4 4 0.4 1.5 mV All 0s loaded to DAC register
Offset Error +0.1 ±4 +0.1 ±1.5 mV
Full-Scale Error +0.01 ±0.2 +0.01 ±0.1 % of FSR All 1s loaded to DAC register
Gain Error ±0.02 ±0.2 ±0.02 ±0.1 % of FSR
= 2.5 V; 1.8 V ≤ V
REF
≤ 5.5 V; RL = 2 kΩ; CL = 200 pF; all specifications T
LOGIC
MIN
to T
, unless otherwise noted.
MAX
design
design
±0.25 ±0.2 % of FSR Gain = 1
Offset Error Drift3
Gain Temperature
Coefficient
DC Power Supply Rejection
Ratio
3
3
DC Crosstalk3
±1 ±1 µV/°C ±1 ±1 ppm Of FSR/°C
0.15 0.15 mV/V DAC code = midscale; V
DD
5 V ± 10%
±2 ±2 µV Due to single channel, full-
=
scale output change
±3 ±3 µV/mA Due to load current change
±2 ±2 µV Due to power-down (per
channel)
Output Voltage Range 0 V
0 2 × V
0 V
REF
0 2 × V
V Gain = 1
REF
V Gain = 2 (see Figure 20)
Capacitive Load Stability 2 2 nF RL = ∞
Resistive Load4 1 1 kΩ
Load Regulation DAC code = midscale
80 80 µV/mA 5 V ± 10%; −30 mA ≤ I
OUT
≤
+30 mA
80 80 µV/mA 3 V ± 10%; −20 mA ≤ I
OUT
≤
+20 mA
Short-Circuit Current5 40 40 mA
Load Impedance at Rails6 25 25 Ω See Figure 20
Power-Up Time 2.5 2.5 µs Coming out of power-down
DD
= 5 V
mode; V
REFERENCE INPUT
Reference Current 90 90 µA V
180 180 µA V
= VDD = 5.5 V, gain = 1
= VDD = 5.5 V, gain = 2
Reference Input Range 1 VDD 1 VDD V Gain = 1
1 VDD/2 1 VDD/2 V Gain = 2
Reference Input Impedance 16 16 kΩ Gain = 2
32 32 kΩ Gain = 1
Rev. 0 | Page 3 of 24
AD5696/AD5694 Data Sheet
INH
LOGIC
LOGIC
SINK
LOGIC
LOGIC
SOUR CE
LOGIC
I
LOGIC
3 3 µA
A Grade B Grade
Parameter Min Typ Max Min Typ Max Unit Test Conditions/Comments1
LOGIC INPUTS3
Input Current ±2 ±2 µA Per pin
Input Low Voltage, V
0.3 × V
INL
Input High Voltage, V
Pin Capacitance 2 2 pF
LOGIC OUTPUTS (SDA)3
Output Low Voltage, VOL 0.4 0.4 V I
Output High Voltage, VOH V
Floating State Output
Capacitance
POWER REQUIREMENTS
V
1.8 5.5 1.8 5.5 V
VDD 2.7 5.5 2.7 5.5 V Gain = 1
V
IDD VIH = VDD, VIL = GND, VDD =
Normal Mode7 0.59 0.7 0.59 0.7 mA
All Power-Down Modes8 1 4 1 4 µA −40°C to +85°C
6 6 µA −40°C to +105°C
1
Temperature range is −40°C to +105°C.
2
DC specifications are tested with the outputs unloaded, unless otherwise noted. Upper dead band (10 mV) exists only when V
with gain = 2. Linearity calculated using a reduced code range of 256 to 65,280 (AD5696) or 12 to 4080 (AD5694).
3
Guaranteed by design and characterization; not production tested.
4
Channel A and Channel B can have a combined output current of up to 30 mA. Similarly, Channel C and Channel D can have a combined output current of up to 30 mA
up to a junction temperature of 110°C.
5
VDD = 5 V. The device includes current limiting that is intended to protect the device during temporary overload conditions. Junction temperature can be exceeded
during current limit. Operation above the specified maximum junction temperature may impair device reliability.
6
When drawing a load current at either rail, the output voltage headroom with respect to that rail is limited by the 25 Ω typical channel resistance of the output devices.
For example, when sinking 1 mA, the minimum output voltage = 25 Ω × 1 mA = 25 mV (see Figure 20).
7
Interface inactive. All DACs active. DAC outputs unloaded.
8
All DACs powered down.
0.3 × V
0.7 × V
LOGIC
0.7 × V
− 0.4 V
V
− 0.4 V I
LOGIC
4 4 pF
+ 1.5 5.5 V
REF
+ 1.5 5.5 V Gain = 2
REF
V
2.7 V to 5.5 V
= VDD with gain = 1 or when V
REF
= 3 mA
= 3 mA
/2 = VDD
REF
Rev. 0 | Page 4 of 24
Data Sheet AD5696/AD5694
1, 2
OUT
OUT
OUT
AC CHARACTERISTICS
VDD = 2.7 V to 5.5 V; V
Table 3.
Parameter
Min Typ Max Unit Test Conditions/Comments3
Output Voltage Settling Time ¼ to ¾ scale settling to ±2 LSB
AD56965 8 µs
AD56945 7 µs
Slew Rate 0.8 V/µs
Digital-to-Analog Glitch Impulse 0.5 nV-sec 1 LSB change around major carry transition
Digital Feedthrough 0.13 nV-sec
Multiplying Bandwidth 500 kHz
Digital Crosstalk 0.1 nV-sec
Analog Crosstalk 0.2 nV-sec
DAC-to-DAC Crosstalk 0.3 nV-sec
Total Harmonic Distortion4 −80 dB At TA, BW = 20 kHz, VDD = 5 V, f
Output Noise Spectral Density 100 nV/√Hz DAC code = midscale, 10 kHz, gain = 2
Output Noise 6 µV p-p 0.1 Hz to 10 Hz
Signal-to-Noise Ratio (SNR) 90 dB At TA, BW = 20 kHz, VDD = 5 V, f
Spurious-Free Dynamic Range (SFDR) 83 dB At TA, BW = 20 kHz, VDD = 5 V, f
Signal-to-Noise-and-Distortion Ratio
(SINAD)
1
Guaranteed by design and characterization; not production tested.
2
See the Terminology section.
3
Temperature range is −40°C to +105°C; typical at 25°C.
4
Digitally generated sine wave at 1 kHz.
= 2.5 V; 1.8 V ≤ V
REF
≤ 5.5 V; RL = 2 kΩ; CL = 200 pF; all specifications T
LOGIC
MIN
to T
, unless otherwise noted.
MAX
80 dB At TA, BW = 20 kHz, VDD = 5 V, f
= 1 kHz
= 1 kHz
= 1 kHz
= 1 kHz
OUT
Rev. 0 | Page 5 of 24
AD5696/AD5694 Data Sheet
1, 2
HIGH
LOW
HD, STA
SU ,DAT
6
3
HD ,DAT
SU, STA
SU,ST O
BUF
10
11
SP
6
B
SCL
SDA
t
1
t
3
LDAC
1
LDAC
2
START
CONDITION
REPEATED START
CONDITION
STOP
CONDITION
NOTES
1
ASYNCHRONOUS LDAC UPDATE MO DE .
2
SYNCHRONOUS LDAC UPDATE MO DE .
t
4
t
6
t
5
t
7
t
8
t
2
t
13
t
4
t
11
t
10
t
12
t
12
t
9
10799-002
TIMING CHARACTERISTICS
VDD = 2.7 V to 5.5 V; 1.8 V ≤ V
Table 4.
Parameter
Min Max Unit Description
t1 2.5 µs SCL cycle time
t2 0.6 µs t
t3 1.3 µs t
t4 0.6 µs t
t5 100 ns t
t
0 0.9 µs t
t7 0.6 µs t
t8 0.6 µs t
t9 1.3 µs t
4
t
0 300 ns tR, rise time of SCL and SDA when receiving
4, 5
t
20 + 0.1CB 300 ns tF, fall time of SCL and SDA when transmitting/receiving
t12 20 ns
t13 400 ns SCL rising edge to
t
0 50 ns Pulse width of suppressed spike
5
C
400 pF Capacitive load for each bus line
1
See Figure 2.
2
Guaranteed by design and characterization; not production tested.
3
A master device must provide a hold time of at least 300 ns for the SDA signal (referred to the VIH min of the SCL signal) to bridge the undefined region of the SCL
falling edge.
4
tR and tF are measured from 0.3 × VDD to 0.7 × VDD.
5
CB is the total capacitance of one bus line in pF.
6
Input filtering on the SCL and SDA inputs suppresses noise spikes that are less than 50 ns.
Timing Diagram
≤ 5.5 V; all specifications T
LOGIC
MIN
to T
, unless otherwise noted.
MAX
, SCL high time
, SCL low time
, start/repeated start hold time
, data setup time
, data hold time
, repeated start setup time
, stop condition setup time
, bus free time between a stop condition and a start condition
pulse width
LDAC
rising edge
LDAC
Figure 2. 2-Wire Serial Interface Timing Diagram
Rev. 0 | Page 6 of 24
Data Sheet AD5696/AD5694
LOGIC
OUT
REF
LOGIC
Operating Temperature Range
−40°C to +105°C
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted.
Table 5.
Parameter Rating
VDD to GND −0.3 V to +7 V
V
to GND −0.3 V to +7 V
V
to GND −0.3 V to VDD + 0.3 V
V
to GND −0.3 V to VDD + 0.3 V
Digital Input Voltage to GND1 −0.3 V to V
SDA and SCL to GND −0.3 V to +7 V
Storage Temperature Range −65°C to +150°C
Junction Temperature 125°C
Reflow Soldering Peak Temperature,
Pb Free (J-STD-020)
ESD
Human Body Model (HBM) 3.5 kV
Field-Induced Charged Device
Model (FICDM)
1
Excluding SDA and SCL.
260°C
1.5 kV
+ 0.3 V
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
θJA is specified for the worst-case conditions, that is, a device
soldered in a circuit board for surface-mount packages. This
value was measured using a JEDEC standard 4-layer board with
zero airflow. For the LFCSP package, the exposed pad must be
tied to GND.
Table 6. Thermal Resistance
Package Type θJA Unit
16-Lead LFCSP 70 °C/W
16-Lead TSSOP 112.6 °C/W
ESD CAUTION
Rev. 0 | Page 7 of 24
AD5696/AD5694 Data Sheet
OUT
OUT
OUT
DD
REF
LOGIC
, the input register and the DAC register are updated with zero scale or midscale, depending
DD
REF
OUT
12
11
10
1
3
4
A1
SCL
A0
9
V
LOGIC
V
OUT
A
V
DD
2
GND
V
OUT
C
6
SDA
5
V
OUT
D
7
LDAC
8
GAIN
16
V
OUT
B
15
V
REF
14
RSTSEL
13
RESET
AD5696/AD5694
NOTES
1. THE EXPOSED PAD MUST BE TIED TO GND.
TOP VIEW
(Not to S cale)
10799-006
1
2
3
4
5
6
7
8
V
OUT
B
V
OUT
A
GND
V
OUT
D
V
OUT
C
V
DD
V
REF
SDA
16
15
14
13
12
11
10
9
RESET
A1
SCL
GAIN
LDAC
V
LOGIC
A0
RSTSEL
TOP VIEW
(Not to S cale)
AD5696/
AD5694
10799-007
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
Figure 3. Pin Configuration, 16-Lead LFCSP
Table 7. Pin Function Descriptions
Pin No.
LFCSP TSSOP
1 3 V
Mnemonic Description
A Analog Output Voltage from DAC A. The output amplifier has rail-to-rail operation.
2 4 GND Ground Reference Point for All Circuitry on the Part.
3 5 VDD Power Supply Input. The parts can be operated from 2.7 V to 5.5 V. The supply should be decoupled
with a 10 µF capacitor in parallel with a 0.1 µF capacitor to GND.
4 6 V
5 7 V
C Analog Output Voltage from DAC C. The output amplifier has rail-to-rail operation.
D Analog Output Voltage from DAC D. The output amplifier has rail-to-rail operation.
6 8 SDA Serial Data Input. This pin is used in conjunction with the SCL line to clock data into or out of the
24-bit input shift register. SDA is a bidirectional, open-drain data line that should be pulled to the
supply with an external pull-up resistor.
7 9
LDAC
can be operated in two modes, asynchronous update mode and synchronous update mode.
LDAC
Pulsing this pin low allows any or all DAC registers to be updated if the input registers have new
data; all DAC outputs are simultaneously updated. This pin can also be tied permanently low.
8 10 GAIN Gain Select Pin. When this pin is tied to GND, all four DAC outputs have a span of 0 V to V
9 11 V
When this pin is tied to V
Digital Power Supply. Voltage ranges from 1.8 V to 5.5 V.
, all four DAC outputs have a span of 0 V to 2 × V
10 12 A0 Address Input. Sets the first LSB of the 7-bit slave address.
11 13 SCL Serial Clock Line. This pin is used in conjunction with the SDA line to clock data into or out of the
24-bit input shift register.
12 14 A1 Address Input. Sets the second LSB of the 7-bit slave address.
13 15
Asynchronous Reset Input. The
RESET
RESET
(low)
on the state of the RSTSEL pin. When
14 16 RSTSEL Power-On Reset Pin. When this pin is tied to GND, all four DACs are powered up to zero scale.
15 1 V
16 2 V
When this pin is tied to V
Reference Input Voltage.
B Analog Output Voltage from DAC B. The output amplifier has rail-to-rail operation.
, all four DACs are powered up to midscale.
17 N/A EPAD Exposed Pad. The exposed pad must be tied to GND.
Rev. 0 | Page 8 of 24
Figure 4. Pin Configuration, 16-Lead TSSOP
input is falling edge sensitive. When
RESET
is low, all
pulses are ignored.
LDAC
.
RESET
.
REF
is activated
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