FEATURES
Guaranteed 16-Bit Monotonicity
Monolithic BiMOS II Construction
60.01% Typical Nonlinearity
8- and 16-Bit Bus Compatibility
3 ms Settling to 16 Bits
Low Drift
Low Power
Low Noise
APPLICATIONS
Robotics
Closed-Loop Positioning
High-Resolution ADCs
Microprocessor-Based Process Control
MIL-STD-883 Compliant Versions Available
PRODUCT DESCRIPTION
The AD569 is a monolithic 16-bit digital-to-analog converter
(DAC) manufactured in Analog Devices’ BiMOS II process.
BiMOS II allows the fabrication of low power CMOS logic
functions on the same chip as high precision bipolar linear circuitry. The AD569 chip includes two resistor strings, selector
switches decoding logic, buffer amplifiers, and double-buffered
input latches.
The AD569’s voltage-segmented architecture insures 16-bit
monotonicity over time and temperature. Integral nonlinearity is
maintained at ±0.01%, while differential nonlinearity is
±0.0004%. The on-chip, high-speed buffer amplifiers provide a
voltage output settling time of 3 µs to within ±0.001% for a
full-scale step.
The reference input voltage which determines the output range
can be either unipolar or bipolar. Nominal reference range is
±5 V and separate reference force and sense connections are
provided for high accuracy applications. The AD569 can operate with an ac reference in multiplying applications.
Data may be loaded into the AD569’s input latches from 8- and
16-bit buses. The double-buffered structure simplifies 8-bit bus
interfacing and allows multiple DACs to be loaded asynchronously and updated simultaneously. Four TTL/LSTTL/5 V
CMOS-compatible signals control the latches:
and
LDAC
The AD569 is available in five grades: J and K versions are
specified from 0°C to +70°C and are packaged in a 28-pin plastic DIP and 28-pin PLCC package; AD and BD versions are
specified from –25°C to +85°C and are packaged in a 28-pin
ceramic DIP. The SD version, also in a 28-pin ceramic DIP, is
specified from –55°C to +125°C.
CS, LBE, HBE,
Voltage Output D/A Converter
AD569
FUNCTIONAL BLOCK DIAGRAM
PRODUCT HIGHLIGHTS
1. Monotonicity to 16 bits is insured by the AD569’s voltagesegmented architecture.
2. The output range is ratiometric to an external reference or ac
signal. Gain error and gain drift of the AD569 are negligible.
3. The AD569’s versatile data input structure allows loading
from 8- and 16-bit buses.
4. The on-chip output buffer amplifier can supply ± 5 V into a
1 kΩ load, and can drive capacitive loads of up to 1000 pF.
5. Kelvin connections to the reference inputs preserve the gain
and offset accuracy of the transfer function in the presence of
wiring resistances and ground currents.
6. The AD569 is available in versions compliant with MIL-STD-
883. Refer to the Analog Devices Military Products Databook or current AD569/883B data sheet for detailed
specifications.
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617/329-4700Fax: 617/326-8703
FSR stands for Full-Scale Range, and is 10 V for a –5 V to +5 V span.
2
Refer to Definitions section.
3
For operation with supplies other than ±12 V, refer to the Power Supply and Reference Voltage Range Section.
4
Measured between +V
5
Sensitivity of Full-Scale Error due to changes in +VS and sensitivity of Offset to changes in –VS.
Specifications subject to change without notice.
Specifications shown in boldface are tested on all production units at final electrical test. Results from those tests are used to calculate outgoing quality levels. All min
and max specifications are guaranteed, although only those shown in boldface are tested on all production units.
Force and –V
REF
REF
Force.
–2–
REV. A
AC PERFORMANCE CHARACTERISTICS
These characteristics are included for Design Guidance Only and are not subject to test.
+VS = +12 V; –VS = –12 V; +V
ParameterLimitUnitsTest Conditions/Comments
Output Voltage Settling5µs maxNo Load Applied
(Time to ±0.001% FS3µs typ (DAC output measured from falling edge of
For FS Step)6µs maxV
= +5 V; –V
REF
= –5 V excepts where stated.
REF
Load = 1 kΩ, C
OUT
= 1000 pF.
LOAD
4µs typ (DAC output measured from falling edge of LDAC. )
AD569
LDAC.)
Digital-to-Analog Glitch500nV-sec typMeasured with V
= 0 V. DAC registers alternatively loaded
REF
Impulsewith input codes of 8000
transition). Load = 1 kΩ.
Multiplying Feedthrough–100dB max+V
= 1 V rms 10 kHz sine wave,
REF
–V
= 0 V
REF
Output Noise Voltage40nV/ÏHz typMeasured between V
120 ns minCS Pulse Width
60 ns minCS Data Setup Time
20 ns minCS Data Hold Time
HS
Case BNone
t
WB
t
SB
t
HB
t
SCS
t
HCS
t
WD
Case CNone
t
WB
t
SB
t
HB
t
SCS
t
HCS
70 ns minHBE, LBE Pulse Width
80 ns minHBE, LBE Data Setup Time
20 ns minHBE, LBE Data Hold Time
120 ns minCS Setup Time
10 ns minCS Hold Time
120 ns minLDAC Pulse Width
Figure 2a. AD569 Timing Diagram – Case B
120 ns minHBE, LBE Pulse Width
80 ns minHBE, LBE Data Setup Time
20 ns minHBE, LBE Data Hold Time
120 ns minCS Setup Time
10 ns minCS Hold Time
Lead Temperature Range (Soldering, 10 secs) . . . . . . . +300°C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
S
operation of the device at these or any other conditions above those indicated in the
S
operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
S
ESD SENSITIVITY
The AD569 features input protection circuitry consisting of large “distributed” diodes and polysilicon
series resistors to dissipate both high-energy discharges (Human Body Model) and fast, low-energy
pulses (Charged Device Model). Per Method 3015.2 of MIL-STD-883C, the AD569 has been
classified as a Category A device.
Proper ESD precautions are strongly recommended to avoid functional damage or performance
degradation. Charges as high as 4000 volts readily accumulate on the human body and test equipment
and discharge without detection. Unused devices must be stored in conductive foam or shunts, and
the foam should be discharged to the destination socket before devices are removed. For further
information on ESD precautions, refer to Analog Devices’ ESD Prevention Manual.
PIN DESIGNATIONS
ORDERING GUIDE
Integral NonlinearityDifferential NonlinearityTemperaturePackage
+258CT
MIN–TMAX
+258CT
MIN–TMAX
RangeOption
2
Model
1
AD569JN±0.04%±0.04%±1 LSB±1 LSB 0°C to +70°CN-28
AD569JP±0.04%±0.04%±1 LSB±1 LSB 0°C to +70°CP-28A
AD569KN±0.024%±0.024%±1/2 LSB±1 LSB 0°C to +70°CN-28
AD569KP±0.024%±0.024%±1/2 LSB±1 LSB 0°C to +70°CP-28A
AD569AD±0.04%±0.04%±1 LSB±1 LSB –25°C to +85°CD-28
AD569BD±0.024%±0.024%±1/2 LSB±1 LSB –25°C to +85°CD-28
AD569SD±0.04%±0.04%±1 LSB±1 LSB –55°C to +125°CD-28
NOTES
1
For details on grade and package offerings screened in accordance with MIL-STD-883, refer to the Analog Devices Military Products Databook
or current AD569/883B data sheet.
2
D = Ceramic DIP; N = Plastic DIP; P = Plastic Leaded Chip Carrier.
–4–
REV. A
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