ANALOG DEVICES AD5520 Service Manual

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Per Pin Parametric
Measurement Unit/Source Measure Unit
AD5520
FEATURES Force/Measure Functions
Force Voltage/Current, Measure Current/Voltage
Force Current/Voltage, Measure Current/Voltage Force/Measure Voltage Range 11 V 4 Programmable Force/Measure Current Ranges
4 A, 40 A, 400 A, 4 mA Extended Current Ranges
40 mA and 160 mA with External Driver Clamp Circuitry and Window Comparators On Board Guard Amplifier 64-Lead LQFP Package
APPLICATIONS Automatic Test Equipment
Per Pin PMU, Shared Pin PMU, Device Power Supply Instrumentation
Source Measure, Parametric Measurement, Precision
Measurement
FUNCTIONAL BLOCK DIAGRAM
AD5520
FIN
CLH
CLL
REFGND
MEASIOUT
MEASOUT
MEASVOUT
COMPARATOR
CPH
CPOH
CPOH
CPL
CPCK
REV. A
COMPIN1
COMPIN0
STB
STANDBY
GENERAL DESCRIPTION
The AD5520 is a single channel per pin parametric measure­ment unit (PPMU) for use in semiconductor automatic test equipment. The part is also suited for use as a source measurement unit for instrumentation applications. It contains programmable modes to force a pin voltage and measure the corresponding current or force a current and measure the voltage. The AD5520 can force/measure over a ± 11 V range or currents up to ± 4 mA with its on-board force amplifier. An external amplifier is required for wider current ranges. The device provides a force sense capability to ensure accuracy at the tester pin. A guard output is also available to drive the shield of a force/sense pair. The AD5520 is available in a 64-lead LQFP package.
AVEEAV
CC
COMPIN2
BW SELECT
CLAMP
DETECT
LOGICS
FSEL
CPSEL
COMPOUT1
COMPOUT0
G = 16
I
SENSE
INST AMP
V
SENSE
INST AMP
G = 1
AM1
AM2
MSEL
COMPOUT2
MOE
CLHDETECT
AM0
MEASI5H
MEASI4H
MEASI3H
MEASI2H
MEASI1H
MEASI0H
GUARDIN
G = 1
MEASVH
MEASVL
CLLDETECT
AC0
AC1
FOH
FOH3
FOH2
FOH1
FOH0
MEASIL
GUARD
AGND
QM5
QM4
DVDDCS
DGND
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 www.analog.com Fax: 781/326-8703 © 2003 Analog Devices, Inc. All rights reserved.
(AVCC = +15 V 5%, AVEE = –15 V 5%, DVDD = 5 V 10%, AGND = 0 V, REFGND = 0 V,
AD5520–SPECIFICATIONS
DGND = 0 V. All specifications 0C to 70C, unless otherwise noted.)
Parameter Min Typ1Max Unit Test Conditions/Comments
VOLTAGE FORCE MODE
Force Control Output Voltage Range ⫾11 V R
= 10 k, C
LOAD
LOAD
= 50 pF
FOH Output Impedance 70
FOH0 2.5 k FOH1 3 k FOH2 500
FOH3 60 Input Offset Error ⫾1 ⫾5mV Gain Error 1 % Clamp Voltage Error
2
1% FSof FIN
CURRENT MEASURE/FORCE Set with external sense resistors
FOH0 ± 4 µA MODE0, RS = 125 k FOH1 ± 40 µA MODE1, R FOH2 ± 400 µA MODE2, R
= 12.5 k
S
= 12.5 k
S
FOH3 ± 4mAMODE3, RS = 125
CURRENT MEASURE MODE
High Sense Input Range, V Linearity
3
Input Bias Current ⫾1 ⫾3nA Input Bias Current Drift
1
MEASIxH
50 pA/°C
11 V0.01 % FSR +11 V > V
> –11 V
FOL
Output Offset Error ⫾100 mV MODE0
100 mV MODE1100 mV MODE2100 mV MODE3
Gain Error ⫾0.1 0.35 % Gain of 16 Gain Error Temperature Coefficient
4
30 µV/°C MEASIOUT Output Load Current ⫾4mA CMRR 95 dB @ DC
CURRENT FORCE MODE
Input Offset Error 10 mV With MODE0, MODE1, MODE2, MODE3 Gain Error 1 % Clamp Current Error
2
1% FSof FIN
VOLTAGE MEASURE MODE
Differential Input Range ⫾11 V Low Sense Input Voltage Range ⫾100 mV MEASVL Linearity
3
+0.005 % FSR +11 V > V
MEASVH
to V
MEASVL
> –11 V Input Offset Error ⫾5 10 mV FIN = 0 V, Measured @ MEASVOUT Input Offset Error Temperature
Coefficient Gain Error ⫾0.03 ⫾0.15 % Gain of 1 Gain Error Temperature Coefficient Input Bias Current ⫾1 ⫾3nA Input Bias Current Drift MEASVOUT Output Load Current ⫾4mA CMRR
AMPLIFIER SETTLING TIME
V
SENSE
I
SENSE
LOOP SETTLING
1
4
4
4
4, 5
15 mV/°C
2 mV/°C
50 pA/°C
73 dB @ DC
Amp 20 µsTo 0.2%
Amp 12 µsTo 0.2%
4, 5
Settling to within 0.024% of 8 V step
COMPIN2 = 100 pF 450 600 µs MODE0
285 390 µs MODE1 170 240 µs MODE2, MODE3
COMPIN1 = 1000 pF 2 2.5 ms MODE0
1.8 2.4 ms MODE1, MODE2, MODE3
COMPIN0 = 3000 pF 5.75 8.7 ms MODE0, MODE1, MODE2, MODE3
REV. A–2–
Parameter Min Typ1Max Unit Test Conditions/Comments
SLEW RATE
4, 5
50 mV/µs COMPIN2 = 100 pF
4.3 mV/µs COMPIN1 = 1000 pF
1.28 mV/µs COMPIN0 = 3000 pF
COMPARATOR
CPH, CPL Input Range ⫾11 V V
CPH
> V
CPL
Input Offset ⫾7mV
GUARD DRIVER
Output Voltage ⫾11 V Output Impedance 130 Capacitive Load Only Output Offset Voltage 400 mV Load Current Output Settling Time
4
4
4mA
0.5 2 µs 100 pF Capacitive Load
ANALOG REFERENCE INPUTS
Force Control Input Range ⫾11 V Force Control Input Impedance 1 M Clamp Control Input Range ⫾11 V V
CLH
> V
CLL
Clamp Control Input Impedance 1 M Comparator Threshold Input Range ⫾11 V Comparator Threshold Input Impedance 1 M Input Capacitance
4
3pF
ANALOG MEASUREMENT OUTPUTS
Voltage Measure Output Impedance 2 Current Measure Output Impedance 3 Multiplexed Sense Output Impedance 1 k Input Capacitance
MEASIxH, MEASVH, FOHx 8 pF
LOGIC INPUTS
Input Current ⫾1 µAAll digital inputs together Input Low Voltage, V Input High Voltage, V Input Capacitance
LOGIC OUTPUTS
Output Low Voltage, V Output High Voltage, V
INL
IHL
4
4
OL
4
OH
POWER REQUIREMENTS
AV
CC
AV
EE
Power Supply Rejection Ratio, PSRR
2.0 V
2.4 V I
+14.25 +15 +15.75 V For specific performance –14.25 –15 +15.75 V
1
0.8 V
3pF
0.4 V I
= 2 mA
SINK
SOURCE
= 2 mA
6
FOH –25 dB 100 kHz
–16 dB 500 kHz –15 dB 1 MHz
MEASOUT –55 dB 100 kHz
–10 dB 500 kHz DC PSR 90 dB DV
DD
I
AVCC
I
AVEE
I
DVDD
NOTES
1
Typical values are at 25°C and nominal supply, unless otherwise noted.
2
Full-scale = 11 V.
3
Full-scale range = 22 V.
4
Guaranteed by design and characterization but not subject to production test.
5
Force control amplifier dominates slew rate and settling time.
6
Operational with ± 12 V supplies, force/measure range is reduced to ± 8.5 V.
Specifications subject to change without notice.
5V
12 mA 12 mA
0.5 mA Digital inputs at supply rails
AD5520
REV. A
–3–
AD5520
(AVCC = +15 V 5%, AVEE = –15 V 5%, AGND = 0 V, REFGND = 0 V, DGND = 0 V. All
1, 2
TIMING CHARACTERISTICS
DV
Parameter 5 V 10% 3.3 V Unit Conditions/Comments
t
1
t
2
t
3
t
4
t
5
t
6
t
7
t
8
t
9
t
10
t
11
t
12
t
13
NOTES
1
See Figure 1.
2
All input signals are specified with tr = tf = 1 ns (10% to 90% of VDD) and timed from a voltage level of (VIL + VIH)/2.
Specifications subject to change without notice.
00ns min CS Falling Edge to STB Falling Edge Setup Time 30 200 ns min STB Pulse Width 40 70 ns min STB Rising Edge to CS Rising Edge Setup Time 040ns min Data Setup Time 550 560 ns min CS Falling Edge to CPCK Rising Edge Setup Time 320 320 ns min CPCK Pulse Width 450 500 ns min CPCK to STB Falling Edge Setup Time 150 800 ns min STB Rising Edge to QMx, CLxDETECT Valid 100 440 ns min STB Rising Edge to CPOH, CPOL Valid 240 240 µs min Comparator Setup Time, MODE2, MODE3 settling 150 500 ns min Comparator Hold Time 100 440 ns min Comparator Output Delay Time 320 320 ns min Comparator Strobe Pulse Width
DD
specifications 0C to 70C, unless otherwise noted.)
STB
AMx, ACx, FSEL,
MSEL, CPSEL
CPCK
QM4, QM5,
CLHDETECT,
CLLDETECT
CPOL, CPOH
CS
t
1
t
4
MEASVOUT
OR MEASIOUT
CPOH, CPOL
t
2
CPCK
t
3
t
5
t
8
Figure 1. Timing Diagram
t
11
t
10
t
12
t
13
t
t
6
7
t
9
Figure 2. Comparator Timing
REV. A–4–
AD5520
ABSOLUTE MAXIMUM RATINGS*
(TA = 25°C, unless otherwise noted.)
AVCC to AVEE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34 V
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +17 V
AV
CC
AV
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V, –17 V
EE
DV
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6 V
DD
Digital Inputs to DGND . . . . . . . . . . –0.3 V to DV
Analog Inputs to AGND . . . . . AV
C
to CLL . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +34 V
LH
to CPL . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +34 V
C
PH
REFGND, DGND . . . . . . . . . AV
+ 0.3 V to AVEE – 0.3 V
CC
+ 0.3 V to AVEE – 0.3 V
CC
+ 0.3 V
DD
Operating Temperature Range
Commercial (J Version) . . . . . . . . . . . . . . . . . . 0°C to 70°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Maximum Junction Temperature, (T
Package Power Dissipation . . . . . . . . . . . . . (T
Thermal Impedance JA . . . . . . . . . . . . . . . . . . . . . . 47.8°C/W
Lead Temperature (Soldering 10 sec) . . . . . . . . . . . . . . 300°C
IR Reflow, Peak Temperature . . . . . . . . . . . . . . . . . . . . 220°C
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those listed in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
ORDERING GUIDE
Model Temperature Range Package Description Package Option
AD5520JST 0°C to 70°C 64-Lead LQFP ST-64-2 AD5520JST-REEL 0°C to 70°C 64-Lead LQFP ST-64-2 EVAL-AD5520EB Evaluation Board and Software
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD5520 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
max) . . . . . . . . . 150°C
J
max – TA)/
J
JA
REV. A
–5–
AD5520
CPH
CPL
DV
CPOH
CPOL
CPCK
DGND
CLHDETECT
CLLDETECT
QM4
QM5
MOE
CS
STB
AC0
AC1
PIN CONFIGURATION
64-Lead LQFP
COMPIN0
COMPIN1
COMPIN2
REFGND
MEASOUT
REFGND
MEASIOUT
MEASVOUT
FIN
CLH
CLL
1
2
3
DD
4
5
6
7
8
9
10
11
12
13
14
15
16
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
AD5520
(Not to Scale)
COMPOUT1
COMPOUT2
CC_B
COMPOUT0
AV
49505152535455565758596061626364
FOH
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
AV
EE_B
MEASI5H
MEASI4H
FOH3
MEASI3H
FOH2
MEASI2H
FOH1
MEASI1H
FOH0
MEASI0H
MEASIL
MEASVH
GUARD(NC)
MEASVL
AV
CC_G
DGND
DV
DD
AM2
AM1
AM0
FSEL
STANDBY
NC = NO CONNECT
MSEL
CPSEL
AV
EE
AV
CC
AGND
EE_G
AV
NC
GUARD
GUARDIN
PIN FUNCTION DESCRIPTIONS
Pin No. Mnemonic Description
1 CPH Upper Comparator Threshold Voltage Input, CPH > CPL. 2 CPL Lower Comparator Threshold Voltage Input, CPL < CPH. 3, 18 DV
DD
Digital Supply Voltage. 4 CPOH Logic Output. When high, indicates MEASVOUT or MEASIOUT > CPH. 5 CPOL Logic Output. When high, indicates MEASVOUT or MEASIOUT < CPL. 6CPCK Logic Input. Used to initiate comparator sampling and update CPOH and CPOL. 7, 17 DGND Digital Ground. 8 CLHDETECT Logic Output. When high, indicates upper clamp active. For details, see the Clamp Function section. 9 CLLDETECT Logic Output. When high, indicates lower clamp active. For details, see the Clamp Function section. 10 QM4 Logic Output. When high, indicates current range Mode 4 is enabled. May be used to drive external
relay or switch. For details, see the High Current Ranges section. 11 QM5 Logic Output. When high, indicates current range Mode 5 is enabled. May be used to drive external
relay or switch. For details, see the High Current Ranges section. 12 MOE Active Low MEASOUT Enable. 13 CS Active Low Logic Input. The device is selected when this pin is low. For details, see the Interface
section. 14 STB Active Low Logic Input. Used in conjunction with CPCK and CS to configure the device for differ-
ent configurations. Rising edge of STB triggers sequence inputs. For details, see the Interface section. 15 AC0 Logic Input. Used in conjunction with AC1 to select one of three external compensation capacitors.
For details, see the Force Control Amplifier section. 16 AC1 Logic Input. Used in conjunction with AC0 to select one of three external compensation capacitors.
For details, see the Force Control Amplifier section.
REV. A–6–
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