32-channel DAC in a 64-lead LQFP
AD5372/AD5373
Maximum output voltage span of 4 × VREF (20 V)
Nominal output voltage range of −4 V to +8 V
Multiple, independent output voltage spans available
System calibration function allowing user-programmable
off
set and gain
Channel grouping and addressing features
Thermal shutdown function
DSP/microcontroller-compatible serial interface
SPI serial interface
SYNC
SDI
SCLK
SDO
BUSY
RESET
CLR
1
guaranteed monotonic to 16/14 bits
V
D
CONTROL
REGISTER
SERIAL
INTERFACE
STATE
MACHINE
V
C
D
C
n
AGND DGND
SS
D
n = 16 FOR AD5372
n = 14 FOR AD5373
8
A/B SELECT
REGISTE R
n
X1 REGISTER
n
M REGISTER
n
C REGISTER
nnnnn
X1 REGISTER
n
M REGISTER
n
C REGISTER
88
A/B SELECT
REGISTE R
n
X1 REGISTER
n
M REGISTER
n
C REGISTER
nnnnn
X1 REGISTER
n
M REGISTER
n
C REGISTER
8
nnn
n
n
n
n
nnn
n
n
n
n
FUNCTIONAL BLOCK DIAGRAM
TO
MUX 2s
A/B
MUX
A/B
MUX
TO
MUX 2s
A/B
MUX
A/B
MUX
X2A REG ISTER
X2B REG ISTER
X2A REG ISTER
X2B REG ISTER
X2A REG ISTER
X2B REG ISTER
X2A REG ISTER
X2B REG ISTER
Serial Input, Voltage Output DAC
AD5372/AD5373
2.5 V to 5.5 V JEDEC-compliant digital levels
Digital reset (
Clear function to user-defined SIGGNDx
Simultaneous update of DAC outputs
APPLICATIONS
Level setting in automatic test equipment (ATE)
Variable optical attenuators (VOA)
Optical switches
Industrial control systems
Instrumentation
LDAC
14
OFS0
REGISTER
DAC 0
2
REGISTER
MUX
DAC 7
2
REGISTER
MUX
14
OFS1
REGISTER
DAC 0
2
REGISTER
MUX
DAC 7
2
REGISTER
MUX
RESET
n
n
n
n
)
OFFSET
DAC 0
DAC 0
DAC 7
OFFSET
DAC 1
DAC 0
DAC 7
BUFFER
BUFFER
BUFFER
BUFFER
GROUP 0
OUTPUT BU FFER
AND POWER-
DOWN CONTROL
OUTPUT B UFFER
AND POWER-
DOWN CONTROL
GROUP 1
OUTPUT BU FFER
AND POWER-
DOWN CONTROL
OUTPUT B UFFER
AND POWER-
DOWN CONTROL
VREF0
VOUT0
VOUT1
VOUT2
VOUT3
VOUT4
VOUT5
VOUT6
VOUT7
SIGG ND0
VREF1
VOUT8
VOUT9
VOUT10
VOUT11
VOUT12
VOUT13
VOUT14
VOUT15
SIGGND1
AD5372/
AD5373
GROUP 2 TO GROUP 3
ARE ID ENTICA L TO GRO UP 1
VREF1 SUPPLI ES
GROUP 1 TO GROUP 3
SIGGN D2
Figure 1.
1
Protected by U.S. Patent No. 5,969,657; other patents pending.
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Anal og Devices for its use, nor for any infringements of patents or ot her
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
Changes to Table 3.............................................................................6
Changes to AD5373 Transfer Function Section......................... 16
Changes to Calibration Section.................................................... 17
Changes to Table 8.......................................................................... 18
Changes to Register Update Rates Section.................................. 20
Changes to Ordering Guide.......................................................... 25
8/07—Revision 0: Initial Version
Rev. B | Page 2 of 24
AD5372/AD5373
www.BDTIC.com/ADI
GENERAL DESCRIPTION
The AD5372/AD5373 contain 32 16-/14-bit DACs in a single
64-lead LQFP. The devices provide buffered voltage outputs with
a nominal span of 4× the reference voltage. The gain and offset
of each DAC can be independently trimmed to remove errors. For
even greater flexibility, the device is divided into four groups of
eight DACs. Two offset DACs allow the output range of the groups
to be altered. Group 0 can be adjusted by Offset DAC 0, and
Group 1 to Group 3 can be adjusted by Offset DAC 1.
The AD5372/AD5373 offer guaranteed operation over a wide
pply range: V
su
16.5 V. The output amplifier headroom requirement is 1.4 V
operating with a load current of 1 mA.
AD536016 4 × V
AD536114 4 × V
AD536216 4 × V
AD536314 4 × V
AD537016 4 × V
AD537114 4 × V
AD5372 16 4 × V
AD5373 14 4 × V
AD537814 ±8.75 V 32 ±3
AD537914 ±8.75 V 40 ±3
from −16.5 V to −4.5 V and VDD from 9 V to
SS
(20 V) 16 ±4
REF
(20 V) 16 ±1
REF
(20 V) 8 ±4
REF
(20 V) 8 ±1
REF
(12 V) 40 ±4
REF
(12 V) 40 ±1
REF
(12 V) 32 ±4
REF
(12 V) 32 ±1
REF
The AD5372/AD5373 have a high speed serial interface that is
mpatible with SPI, QSPI™, MICROWIRE™, and DSP inter-
co
face standards and can handle clock speeds of up to 50 MHz.
The DAC registers are updated on reception of new data. All
t
he outputs can be updated simultaneously by taking the
input low. Each channel has a programmable gain and an offset
adjust register.
Each DAC output is gained and buffered on chip with respect
an external SIGGNDx input. The DAC outputs can also be
to
switched to SIGGNDx via the
CLR
pin.
LDAC
Rev. B | Page 3 of 24
AD5372/AD5373
www.BDTIC.com/ADI
SPECIFICATIONS
DVCC = 2.5 V to 5.5 V; VDD = 9 V to 16.5 V; VSS = −16.5 V to −8 V; VREF0 = VREF1 = 3 V; AGND = DGND = SIGGNDx = 0 V;
= open circuit; RL = open circuit; gain (M), offset (C), and DAC offset registers at default values; all specifications T
C
L
unless otherwise noted.
MIN
to T
MAX
,
Table 2.
AD5372
Parameter
ACCURACY
Resolution 16 14 Bits
Integral Nonlinearity (INL) ±4 ±1 LSB max
Differential Nonlinearity (DNL) ±1 ±1 LSB max
Zero-Scale Error ±10 ±10 mV max Before calibration
Full-Scale Error ±10 ±10 mV max Before calibration
Gain Error 0.1 0.1 % FSR Before calibration
Zero-Scale Error
Full-Scale Error
Span Error of Offset DAC ±35 ±35 mV max See the Offset DACS section for details
VOUTx Temperature Coefficient 5 5 ppm FSR/°C typ Includes linearity, offset, and gain drift
DC Crosstalk2 100 100 μV max
REFERENCE INPUTS (VREF0, VREF1)
VREFx Input Current ±10 ±10 μA max Per input; typically ±30 nA
VREFx Range 2/5 2/5 V min/V max ±2% for specified operation
SIGGND INPUTS (SIGGND0 TO SIGGND3)2
DC Input Impedance 50 50 kΩ min Typically 55 kΩ
Input Range ±0.5 ±0.5 V min/V max
SIGGNDx Gain 0.995/1.005 0.995/1.005 min/max
OUTPUT CHARACTERISTICS
Output Voltage Range VSS + 1.4 VSS + 1.4 V min I
V
Nominal Output Voltage Range −4 to +8 −4 to +8 V min/V max
Short-Circuit Current 15 15 mA max VOUTx to DVCC, VDD, or VSS
Load Current ±1 ±1 mA max
Capacitive Load 2200 2200 pF max
DC Output Impedance 0.5 0.5 Ω max
DIGITAL INPUTS JEDEC compliant
Input High Voltage 1.7 1.7 V min DVCC = 2.5 V to 3.6 V
2.0 2.0 V min DVCC = 3.6 V to 5.5 V
Input Low Voltage 0.8 0.8 V max DVCC = 2.5 V to 5.5 V
Input Current ±1 ±1 μA max
CLR High Impedance Leakage Current
Input Capacitance
DIGITAL OUTPUTS (SDO, BUSY)
Output Low Voltage 0.5 0.5 V max Sinking 200 μA
Output High Voltage (SDO) DVCC − 0.5 DVCC − 0.5 V min Sourcing 200 μA
SDO High Impedance Leakage Current ±5 ±5 μA max
High Impedance Output Capacitance210 10 pF typ
2
2
2
2
2
B Version
1 1 LSB typ After calibration
1 1 LSB typ After calibration
±20 ±20 μA max
10 10 pF max
1
AD53731
B Version
− 1.4 VDD − 1.4 V max I
DD
Unit Test C
onditions/Comments
Guaranteed monotonic by design over
ature
temper
Typically 20 μV; measured channel at midscale,
le change on any other channel
full-sca
= 1 mA
LOAD
= 1 mA
LOAD
Excluding CLR
pin
2
Rev. B | Page 4 of 24
AD5372/AD5373
www.BDTIC.com/ADI
Parameter
AD5372
B Version
1
AD53731
B Version Unit Test Conditions/Comments
2
POWER REQUIREMENTS
DVCC 2.5/5.5 2.5/5.5 V min/V max
VDD 9/16.5 9/16.5 V min/V max
VSS −16.5/−4.5 −16.5/−4.5 V min/V max
Power Supply Sensitivity
2
∆Full Scale/∆VDD −75 −75 dB typ
∆Full Scale/∆VSS −75 −75 dB typ
∆Full Scale/∆DVCC −90 −90 dB typ
DICC 2 2 mA max DVCC = 5.5 V, VIH = DVCC, VIL = GND
IDD 16 16 mA max Outputs unloaded, DAC outputs = 0 V
18 18 mA max Outputs unloaded, DAC outputs = full scale
ISS −16 −16 mA max Outputs unloaded, DAC outputs = 0 V
−18 −18 mA max Outputs unloaded, DAC outputs = full scale
Power-Down Mode Bit 0 in the control register is 1
DICC 5 5 μA typ
IDD 35 35 μA typ
ISS −35 −35 μA typ
Power Dissipation (Unloaded) 250 250 mW typ VSS = −8 V, VDD = 9.5 V, DVCC = 2.5 V
Junction Temperature
1
Temperature range for B version: −40°C to +85°C. Typical specifications are at 25°C.
2
Guaranteed by design and characterization; not production tested.
3
θJA represents the package thermal impedance.
3
130 130 °C max TJ = TA + P
TOTAL
× θJA
AC CHARACTERISTICS
DVCC = 2.5 V; VDD = 15 V; VSS = −15 V; VREF0 = VREF1 = 3 V; AGND = DGND = SIGGNDx = 0 V; CL = 200 pF; RL = 10 kΩ; gain (M),
offset (C), and DAC offset registers at default values; all specifications T
Table 3.
Parameter B Version Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
1
Output Voltage Settling Time 20 μs typ Full-scale change
30 μs max DAC latch contents alternately loaded with all 0s and all 1s
Slew Rate 1 V/μs typ
Digital-to-Analog Glitch Energy 5 nV-s typ
Glitch Impulse Peak Amplitude 10 mV max
Channel-to-Channel Isolation 100 dB typ VREF0, VREF1 = 2 V p-p, 1 kHz
DAC-to-DAC Crosstalk 10 nV-s typ
Digital Crosstalk 0.2 nV-s typ
Digital Feedthrough 0.02 nV-s typ Effect of input bus activity on DAC output under test
Output Noise Spectral Density @ 10 kHz 250 nV/√Hz typ VREF0 = VREF1 = 0 V
1
Guaranteed by design and characterization; not production tested.
MIN
to T
, unless otherwise noted.
MAX
Rev. B | Page 5 of 24
AD5372/AD5373
T
www.BDTIC.com/ADI
TIMING CHARACTERISTICS
DVCC = 2.5 V to 5.5 V; VDD = 9 V to 16.5 V; VSS = −16.5 V to −8 V; VREFx = 3 V; AGND = DGND = SIGGNDx = 0 V; CL = 200 pF to GND;
R
= open circuit; gain (M), offset (C), and DAC offset registers at default values; all specifications T
L
MIN
to T
, unless otherwise noted.
MAX
Table 4. SPI Interface
Parameter
t
1
1 , 2 , 3
Limit at T
MIN
, T
Unit Description
MAX
20 ns min SCLK cycle time
t2 8 ns min SCLK high time
t3 8 ns min SCLK low time
t4 11 ns min
t
5
20 ns min
t6 10 ns min
t
7
5 ns min Data setup time
falling edge to SCLK falling edge setup time
SYNC
Minimum SYNC
th
SCLK falling edge to SYNC rising edge
24
high time
t8 5 ns min Data hold time
4
t
9
t10 1/1.5 μs typ/μs max
42 ns max
rising edge to BUSY falling edge
SYNC
pulse width low (single-channel update); see Table 9
BUSY
t11 600 ns max Single-channel update cycle time
t12 20 ns min
t13 10 ns min
t14 3 μs max
t15 0 ns min
t16 3 μs max
rising edge to LDAC falling edge
SYNC
pulse width low
LDAC
rising edge to DAC output response time
BUSY
rising edge to LDAC falling edge
BUSY
falling edge to DAC output response time
LDAC
t17 20/30 μs typ/μs max DAC output settling time
t18 140 ns max
t19 30 ns min
t20 400 μs max
t21 270 ns min
5
t
22
25 ns max SCLK rising edge to SDO valid
t23 80 ns max
1
Guaranteed by design and characterization; not production tested.
2
All input signals are specified with tR = tF = 2 ns (10% to 90% of DVCC) and timed from a voltage level of 1.2 V.
3
See Figure 4 and Figure 5.
4
t9 is measured with the load circuit shown in Figure 2.
5
t22 is measured with the load circuit shown in Figure 3.
/RESET pulse activation time
CLR
pulse width low
RESET
time indicated by BUSY low
RESET
Minimum SYNC
rising edge to BUSY falling edge
RESET
high time in readback mode
50pF
C
200µAI
L
200µAI
DV
CC
R
L
TO
OUTPUT
PIN
Figure 2. Load Circuit for
2.2kΩ
C
L
50pF
BUSY
Timing Diagram
V
OL
05815-002
Rev. B | Page 6 of 24
O OUTPUT
PIN
Figure 3. Load Circuit for SDO Timing Diagram
OL
OH
VOH (MIN) – VOL (MAX)
2
5815-003
AD5372/AD5373
V
V
www.BDTIC.com/ADI
t
1
SCLK
SYNC
BUSY
LDAC
OUTx
LDAC
OUTx
SDI
1
1
2
2
1
2
t
3
t
4
t
5
t
7
t
8
DB23
24
t
2
t
6
DB0
t
9
t
1
t
11
t
10
12
t
13
24
t
17
t
14
t
15
t
13
t
17
t
16
CLR
t
18
VOUTx
t
19
RESET
VOUTx
BUSY
1
LDAC ACTIVE DURING BUSY.
2
LDAC ACTIVE AFTER BUSY.
t
23
t
18
t
20
05815-004
Figure 4. SPI Write Timing
Rev. B | Page 7 of 24
AD5372/AD5373
C
www.BDTIC.com/ADI
SCLK
SYN
SDI
INPUT WORD SPECIFIES
REGISTER TO BE READ
SDO
t
22
DB0DB23DB23
LSB FROM PREVIOUS WRITE
t
21
NOP CONDITI ON
DB0
DB23DB15
SELECTED REG ISTER DATA CL OCKED OUT
48
DB0
DB0
05815-005
Figure 5. SPI Read Timing
OUTPUT
VOLTAGE
8V
ACTUAL
TRANSFER
FUNCTION
IDEAL
TRANSFER
FUNCTION
FULL-SCALE
ERROR
+
ZERO-SCALE
ERROR
016383
–4V
DAC CODE
ZERO-SCALE
ERROR
Figure 6. DAC Tran
sfer Function
05815-006
Rev. B | Page 8 of 24
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