EPA/600/R-14/211 | October 2014 | www.epa.gov/research
Zeiss ΣIGMA VP-FE-SEM
User Guide
R E S E A R C H A N D D E V E L O P M E N T
Zeiss ΣIGMA VP-FE-SEM
User Guide
Prepared for
Jeremy Hilgar, Darlene Usi and Katrina Varner
U.S. Environmental Protection Agency
Office of Research and Development
National Exposure Research Laboratory
Environmental Sciences Division
Las Vegas, NV 89119
Although this work was reviewed by EPA and approved for publication, it may not necessarily reflect
official Agency policy. Mention of trade names and commercial products does not constitute
endorsement or recommendation for use.
U.S. Environmental Protection Agency
Office of Research and Development
Washington, DC 20460
Zeiss ΣIGMA VP-FE-SEM
User Guide
May 2014
By:
Jeremy Hilgar, Darlene Usi
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TABLE OF CONTENTS
Section Page
1.0 Procedural Section ............................................................................................................................................ 3
1.1 Sample Preparation and Loading ............................................................................................................. 3
1.1.1 Support Selection ................................................................................................................ 3
1.1.2 Sample Deposition .............................................................................................................. 3
1.1.2.1 Liquid Samples ..................................................................................................... 3
1.1.2.2 Solid Samples ....................................................................................................... 4
1.1.3 Loading the Carousel .......................................................................................................... 4
1.2 Instrument Startup .................................................................................................................................... 5
1.2.1 Software Startup ................................................................................................................. 5
1.2.2 Gas Pressure and Vacuum Control ..................................................................................... 5
1.2.3 Accelerating Voltage .......................................................................................................... 6
1.3 Producing an Image .................................................................................................................................. 7
1.3.1 Detectors ............................................................................................................................. 7
1.3.2 Stage Control and Working Distance using Analog Controls............................................. 8
1.3.3 Stage Control Using SmartSEM’s Stage Navigation .......................................................... 9
1.3.4 Scan Speed and Noise Reduction ..................................................................................... 10
1.3.5 Reduced Raster ................................................................................................................. 10
1.3.6 Brightness and Contrast .................................................................................................... 11
1.3.7 Magnification and Focus .................................................................................................. 11
1.3.8 Stigmation and Focus Wobbles ........................................................................................ 11
1.3.9 Saving an Image ............................................................................................................... 12
1.4 STEM Mode ........................................................................................................................................... 13
1.4.1 Stage Navigation and the STEM Detector ........................................................................ 13
1.4.2 Imaging Modes ................................................................................................................. 14
1.5 Logging Off ............................................................................................................................................ 15
1.5.1 Stage Positioning and STEM Detector ............................................................................. 15
1.5.2 Accelerating Voltage ........................................................................................................ 15
1.5.3 Vacuum Control and Gas Pressure ................................................................................... 16
1.5.4 Closing the Software ......................................................................................................... 16
2.0 References ...................................................................................................................................................... 16
1.0 Procedural Section
1.1 Sample Preparation and Loading
Note: The cleanliness of the vacuum chamber is very important. It is encouraged
that the investigator wear gloves while handling objects that will enter the
vacuum chamber, specifically the sample carousels. It is also good practice to
keep the chamber door closed as often as possible. This practice reduces the
contamination rate of the chamber.
Sample preparation consists of two basics steps and will vary depending
on both the nature of the analyte and the information required from the analyte
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Zeiss VP-FE-SEM Quick Start Guide
1.1.1 Support Selection
Sample supports and films are most broadly categorized by
whether or not they are STEM-compatible. STEM-compatible films and
grids are always slotted to allow the passage (transmission) of electrons to
a detector. The most commonly used STEM-compatible support film is
the lacey carbon copper grid. These grids can come equipped with a
Formvar resin to enhance the stability of the lacey carbon network. The
usage of STEM-compatible support films often proves convenient given
that these sample mounts can also be used in normal SEM mode. The
selection of an appropriate support medium for a given task is often a
process of trial and error.
1.1.2 Sample Deposition
1.1.2.1 Liquid Samples
Liquid samples are deposited onto the appropriate support
in a drop-by-drop fashion using a variety of tools. Given that
sample supports are often large enough to house several different
analytes, it is often desirable to control both the location and size
of the spots deposited. The tools used to reach this end vary, but
are all fairly simple. Perhaps the most convenient instrument used
to deposit spots on the support is the mechanical micropipette. The
exact volume of the spot will naturally vary depending on the
situation. It is advisable to test different sample volumes on a
separate surface prior to deposition on a support film.
Occasionally the use of a micropipette proves to be rather
unwieldy and the task requires different methodology. It has been
found that simply using the disposable plastic tips of the
micropipette as a spotter is a viable alternative. Glass spotters can
be used to some degree of success, but have found to be a rather
poor alternative to the aforementioned methods.
1.1.2.2 Solid Samples
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Samples that are solid are most commonly dissolved or
suspended in an appropriate solvent and mounted the same as
liquid samples (Section 1.1.2.1). Samples that cannot be dissolved
or suspended practically are attached to their support using either a
conductive tape or a conductive paste as adhesives. It is advisable
to refer to the instructions specific to the adhesive being used
before utilizing them. Note that pastes and adhesives are not used
when operating in STEM modes.
1.1.3 Loading the Carousel
Once prepared, sample supports are fixed to an appropriate grid
carousel capable of holding several films simultaneously. These sample
carousels come in many different styles and are what ultimately interface
with the microscope’s stage platform. All carousels are fixed to the stage
via a dovetail joint. One end of the joint on the stage platform has a flat
docking bar that articulates with the flat end of the grooves found on the
bottom of the sample carousel. It is important to ensure that the carousel is
seated correctly before continuing. This precaution will both reduce the
likelihood of collision happening within the vacuum chamber and increase
the ease in which samples can be located on the support carousel using the
STEM Navigation tool (Section 1.3.3).
1.2 Instrument Startup
This section chronologically outlines the steps required to properly start up
the instrument safely.
1.2.1 Software Startup
The microscope is controlled entirely by the SmartSEM software
suite developed by Zeiss. The software requires users to login to an
account before use. User accounts are important for both logging operator
actions as well as saving personalized user interface preferences. Once
opened and logged in, the software will automatically show a view of the
vacuum chamber as well as the status of the instrument. The operator is
encouraged to become familiar with the layout of the user interface prior
to preforming any work with the instrument. The help system built into the
SmartSEM software suite has been found to be an effective resource in this
arena.
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1.2.2 Gas Pressure and Vacuum Control
This microscope uses pressurized gases for both vacuum chamber
valve actuation and variable pressure viewing modes. Prior to pulling a
vacuum, the operator must ensure that the instrument is being supplied
with compressed air at a pressure of 87 psi (116 psi, maximum). If the
operator intends to view samples under variable pressure mode (which
will not be discussed in this guide), the instrument must also be supplied
with nitrogen gas at a pressure of 2.9 psi (4.4 psi, maximum).
Assuming the sample has been properly prepared and loaded
(Section 1.1), the operator must ensure that both the vacuum chamber door
is completely closed, and that the instrument is being supplied with
pressurized gas before pumping down the chamber. Find the Vac status
box at the bottom right section of the SmartSEM interface and select
Pump. At this point the roughing pump will switch on and begin pulling a
vacuum. Shortly thereafter, the turbo molecular pump can be heard
spinning up once the roughing pump has pulled the chamber to an
appropriate pressure.
The pressure of the sample chamber can be viewed under the
Vacuum tab on the right sidebar. Pressure units can be cycled through to
the user’s preference by left-clicking the vacuum pressure status boxes.
The microscope requires a vacuum below 0.009 Pa before extra high
tension (EHT) can be enabled, which is required to produce an image.
Although the software allows enabling EHT at this pressure, better images
are usually produced at lower pressures (~ 10-4 Pa).
1.2.3 Accelerating Voltage
The voltage used to accelerate electrons toward the sample has an
important impact on the produced image. Before turning on EHT, the
operator is advised to ensure that the accelerating voltage is set to a
reasonably-low value (~ 2.0 kV, ± 1.0 kV). The accelerating voltage can
be changed most easily by double-clicking the EHT textbox at the bottom
of the main camera window. When EHT is off, this textbox will show
EHT = 0.00 kV. After checking that both the vacuum chamber pressure
and accelerating voltages are at reasonable values, EHT can safely be
enabled by clicking the EHT status box at the bottom-right of the
SmartSEM window. If successfully enabled, the status box will change
accordingly. Note that it is common practice to change EHT values in
small increments (no more than ± 5 kV) in hopes of prolonging the
lifetime of the filament responsible for emitting electrons.
As a general rule, lower EHT values gives greater information
about the surface of a sample with cost to resolution. Conversely, higher
accelerating voltages yield higher resolutions while obfuscating details
about the surface. It is also important to use lower voltages (in the absence
of variable-pressure modes) on samples that conduct electrons poorly to
decrease the effects of charging.
It is important to be aware of the effects accelerating voltage has
on the final image. The beginner is encouraged to experiment with
different EHT values while attempting to produce an image (Section 1.3).
The more experienced user will also find this practice to be beneficial
when working with new sample types. Once familiar with the basic
process of producing an image (focusing, stigmating, etc.), practice saving
images (Section 1.3.9) of the same scene at different accelerating voltage
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values. Compare these images with one another and make a mental note of
their differences.
1.3 Producing an Image
Note: This section assumes that the operator is working in SEM mode only and
that no STEM stage or detector will be used. The operator is encouraged to begin
their journey with the microscope in SEM mode since it is somewhat simpler and
less hazardous then STEM mode. Please refer to section 1.4 for instructions
specific to STEM imaging.
This section briefly outlines the steps required to produce a focused image
of the sample in the main viewing window. Many of the procedures listed in this
section will make use of both the Zeiss SEM keyboard and the SEM Stage Control
board. The adjustments made using these input boards can be performed in either
coarse or fine modes. To cycle between the two modes simply toggle the textbox
at the bottom right of the screen that reads either Fine or Coarse, depending on
the currently selected adjustment mode.
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1.3.1 Detectors
The instrument comes equipped with a variety of detectors that suit
different situations. For the purposes of this guide, only the TV, SE2, and
STEM detectors will be covered. The data coming from the detectors are
viewed in the main viewing window at the center of the SmartSEM
program screen. At the bottom of this window can be found the currently
selected detector channel, it is listed as Signal A. Switching detector
channels can be done in a number of ways, with the simplest being via the
Camera button on the Zeiss SEM keyboard.
The detector shown at startup by default is the TV detector. This
channel simply shows a view of the vacuum chamber, as seen from the
orifice. It is critical that the operator use this channel when making gross
adjustments to the position of the sample stage (Section 1.3.2). The SE2
detector is responsible for viewing electrons generated through ionization
of the sample. The electrons, called secondary electrons, are collected at a
detector at an angle to the primary electron beam and are excellent at
showing the topography, or surface characteristics, of a sample. The final
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detector to be discussed is the STEM detector, which is composed of both
dark-field and bright-field components. The STEM detector collects
electrons that travel through the sample while mounted on STEMcompatible carousel and support film. Since this detector is responsible for
detecting electrons that traverse through the sample, it is typically suited
toward higher accelerating voltages, and thus higher resolutions.
It is important to note that while the SE2 detector can be used with
or without STEM-compatible carousels and support films, the STEM
detector will not function in their absence.
1.3.2 Stage Control and Working Distance Using Analog Controls
Caution: Careless use of the stage controls can cause serious damage to
the instrument. Use the TV detector when making gross changes to the
position of the stage and always be mindful of the stage’s position relative
to other objects in the vacuum chamber.
May 2014
The stage is responsible for mounting and moving the sample
carousel with its attached media. The stage is allowed to move through 5
degrees of freedom, all of which are most easily controlled by the two
control sticks found on the SEM Stage Control board. Assuming the
instrument was logged off correctly after its previous use, the use of these
control sticks will be disabled at startup. To enable use of the control
sticks, click on the Stage tab under the SEM Control group on the right
side-panel. Find the checkbox that says Joystick Disable and uncheck it.
As previously stated, the SEM Stage Control board is composed of
two control sticks. The narrow stick on the left of the control board is
responsible for controlling both the tilt, and the vertical height (z-axis) of
the stage. Changing the position of the stage in the z-axis effectively
changes the working distance, or the distance between the beam aperture
and the surface of the currently selected carousel. The working distance
effects both the resolution and depth of field of the final image. Here, the
general rule is that smaller working distances equate to higher resolution
and shallower depths of field, and vice versa. Per usual, the optimum
value here generally depends on the situation at hand. It is common
practice, however, to simply set the working distance as small as the
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operator is comfortable with. Be sure to select the TV detector channel
while making changes to the working distance.
The larger control stick on the right is responsible for moving the
stage through three degrees of freedom. As depicted on the control board,
actuating the stick in the up/down-left/right directions move the stage
along the corresponding x and y axes. The stick can also be rotated along
its shaft to similarly rotate the stage through the axis normal to the x-y
plane.
It is important to note that the velocity at which the stage moves in
any of these directions is inversely proportional to the currently selected
magnification level of the microscope. Put more simply, as one increases
the magnification, the control sticks become more precise, moving the
stage much more slowly.
1.3.3 Stage Control Using SmartSEM’s Stage Navigation
It is often the case that finding the specific sample of interest is too
cumbersome using the analog controls on the SEM Stage Control board.
Here the Stage Navigation tool is a very useful aid. The Stage Navigation
tool can be launched from the docking side-panel seen on the right of the
main viewing window. Click the arrow on the panel to expand it and then
double-click the item labelled Stage Navigation. The window that opens
shows both a side and top-down view of the currently selected carousel
relative to the electron beam. It is important to make sure that the carousel
that is currently in use is the one selected in the Sample Holder dropdown
near the bottom right of the window. Once properly selected, finding the
right sample is as easy as double-clicking on the appropriate label in the
top-down carousel view. Again, it is important to have the TV detector
channel selected before moving the stage by large amounts, as is common
while using the Stage Navigation tool.
Once the sample of interest is roughly in line of the electron beam,
it is customary to revert back to using the SEM Stage Control board for
further adjustments.
1.3.4 Scan Speed and Noise Reduction
The data coming from the currently selected detector channel on
the instrument can be sampled and processed differently depending on the
task at hand. The scan speed changes how fast the instrument samples data
from the detector, with higher scan speeds equating to faster sampling
rates (similar to a frame-rate). While exploring the sample, it is often
easier to use a higher scan speed since the viewing window will update
changes in the image more quickly than slower scan speeds. The catch to
this is that at higher scan speeds, more image detail is lost. To investigate
details more effectively, or to capture and save images of the sample,
slower scan speeds are favored. The detector scan speed can most easily
be changed by pressing the + or – buttons labelled Scan Speed on the
right side of the Zeiss SEM keyboard. Alternatively, the scan speed
parameters can be viewed and altered using the Scanning tab of the SEM
Control group located on the software’s side-panel.
Noise is an inherent consequence of any sensing methodology. The
methods by which detector noise is handled by the software are ultimately
averaging processes. For the purposes of this guide only two noise
reduction procedures will be utilized: pixel averaging and line averaging.
Pixel averaging is effective when the operator is actively exploring the
sample, or when the sample image is changing often (e.g. during
magnification of focusing). Line averaging is used when the operator is
inspecting the details of an image, or when the operator wishes to capture
and save an image. Changing the noise averaging mode can be done under
the Scanning tab of the SEM Control group located on the software’s
side-panel. The second dropdown menu in the Noise Reduction box
allows the user to select the appropriate averaging technique.
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1.3.5 Reduced Raster
small section of the viewing screen. This is advantageous when the
operator wishes to use a slower scan speed (higher resolution) without
having to wait for the entire frame to be scanned after making changes. To
enable the reduced raster window, click the Reduced button directly
above the Magnification knob on the left-hand side of the Zeiss SEM
Many of the procedures detailed below can be performed on a
Keyboard. Once enabled, a small box will appear somewhere in the
viewing window. Any changes made to the scene will only take place
within the perimeter of this box. The location and size of the reduced
raster window can be changed by clicking and dragging around the edges
of the box as desired.
1.3.6 Brightness and Contrast
The brightness and contrast of the image displayed in the main
viewing window can independently be set either automatically or (after
some practice) manually using the Zeiss SEM keyboard. Beginners are
advised to ensure that the brightness and contrast levels are set
automatically by the software. To enable this feature, click the Detectors
tab under the SEM Control group on the right side-panel. Find the first
dropdown menu in the Signal Adjust box and select Auto BC = On.
Different modes can be enabled per the operator’s preference using this
dropdown menu.
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1.3.7 Magnification and Focus
The two primary factors that affect the characteristics of the final
image are the magnification and focus of the microscope. The current
magnification level is shown at the bottom of the main viewing window in
the textbox that reads Mag = Y X. Changing the magnification of the
image is done using the dial labelled Magnification on the left-hand side
of the Zeiss SEM keyboard. It is sometimes convenient to zoom all the
way out while switching between samples (Sections 1.3.2 and 1.3.3).
The focus of the image is changed similarly by rotating the dial on
the right-hand side of the keyboard labelled Focus. It is often
advantageous to repetitively magnify and focus the microscope until the
quality of the produced image begins to depreciate. Once at this point the
operator should check to ensure that the electron beam is properly
stigmated and that the apertures are aligned.
1.3.8 Stigmation and Focus Wobble.
Producing well-focused images, especially at higher
magnifications, requires the cross-section of the electron beam to be
circular. The process of circularizing the electron beam is called
stigmation and it is carried out using various electromagnetic coils called
stigmators. Improper beam circularization is referred to as astigmatism
and can most easily be observed as directional fuzziness in the produced
image. Stigmation is performed much in the same way that focusing is,
except the process is done along two orthogonal axes and thus requires
two knobs instead of one. To remedy astigmatism, first magnify and focus
on a part of the sample that has a great degree of contrast. Once selected,
locate the knobs labelled Stigmator X and Stigmator Y at the top left of
the Zeiss SEM Keyboard. While observing areas of high contrast, rotate
these stigmator knobs independently until the image appears to have no
directional fuzziness. Try refocusing the image after correcting for any
astigmatism and observing the results.
Often times the image will appear to move when the operator
attempts to focus it. This phenomenon is referred to focus wobble and
occurs when the various electron beam apertures in the focusing column
are in poor alignment. To correct for focus wobble, find a part of the
image that has a high amount of contrast. Focus upon the selected scene
and correct for any apparent beam astigmatism. Once sufficiently focused,
locate and press the button labelled Wobble on the top portion of the Zeiss
SEM Keyboard. A reduced raster box will appear showing an
amplification of the current focus wobble. Fixing the wobble is done using
the Aperture X and Aperture Y control knobs on the top of the SEM
keyboard. The goal is to use these knobs to stop the image from wobbling.
If done correctly, the image will simply go in and out of focus while
remaining in place. Fixing focus wobble takes a considerable amount of
practice to master.
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1.3.9 Saving an Image
on a single frame, and then exporting that frame to an image file. As
previously stated (Section 1.3.4), the detector scan speed should be fairly
Capturing and saving an image involves freezing the scan process
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low and the noise reduction method should be set to line average. To
freeze a frame, open the Scanning tab on the SEM Control side-panel
and select Freeze on = End Frame from the first dropdown menu in the
Noise Reduction box. A red dot indicator showing that the frame has been
frozen will appear at the bottom right of the viewing window when the
frame has been completely scanned and frozen. Once frozen, go to the File
menu and select Save As. A dialogue box will open asking for the
directory and filename of the image to be saved. Images can be scanned
and stored at various resolutions (default, 1024 by 768 pixels). To
increase or decrease the image resolution, simply change the value of the
Store resolution = X dropdown in the Scanning tab. Once the image has
been exported the frame can unfrozen by selecting Freeze on =
Command from the first dropdown menu in the Noise Reduction box.
1.4 STEM Mode
Imaging in STEM mode is similar in many ways to that of SEM mode.
This section briefly outlines the important differences between the two
techniques. It is assumed that the investigator has already loaded an appropriate
stage, evacuated the vacuum chamber, and enabled EHT.
1.4.1 Stage Navigation and the STEM Detector
compatible stage must be used. Once the appropriate stage is loaded, it is
important to update the sample holder setting in the Stage Navigation tool
(Section 1.3.3). Setting the correct stage type will help reduce the risk of
collisions between the stage and obstacles in the vacuum chamber while
simultaneously increasing the ease in which samples can be located in the
viewing window.
fully retracted or fully extended. To utilize the STEM detector, the
detector arm must be in its extended position directly below the stage.
Prior to inserting the detector arm, it is imperative to move the STEM
stage to what is called the ‘safe zone’. Moving the stage to the safe zone is
accomplished using the Stage Points List tool. This tool can be found in
the docking sidebar on the right-hand side of the viewing window. After
If the operator wishes to use the STEM detector, a STEM-
The STEM detector is fixed to a mechanical arm that can either be
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switching to the TV detector channel (Section 1.3.1), open the Stage
Points List tool and double click the stage point labelled
$STEM_SAFE_ZONE. The stage will move to an area in the chamber
that is safe for detector arm insertion.
Once the stage is in the safe zone, the STEM detector arm can be
inserted using the STEM Control tool. To open this tool, open the
docking sidebar and double-click the tool labelled STEM Control. The
arm can now be inserted by clicking the button labelled STEM -> IN. The
STEM stage can now be moved into position using either the Stage
Navigation tool (Section 1.3.3), or the Stage Points List tool.
Finally, the STEM detector can be displayed in the viewing
window by selecting the STEM channel in the Detectors tab (Section
1.3.1). It is important to note that since the STEM detector is detecting
electrons that are transmitted through the sample, better results are often
observed at higher accelerating voltages.
1.4.2 Imaging Modes
The STEM detector is composed of both dark-field and bright-field
components which are assigned labels called quadrants. The bright-field
component of the detector is located directly in line with the electron beam
and is responsible for detecting electrons that are either completely
transmitted, or weakly deflected by the sample. This field is labelled Q1
(for quadrant 1). There are two dark-field components that form a
perimeter around the bright-field component which are responsible for
detecting electrons that are scattered to a certain degree with respect to the
electron beam. These components are labelled Q2 and Q3.
Different quadrants, and thus different fields, can be set to three
different modes independently from one another (with the modes being
normal, inverted, and off). The sum of these permutations yield 27 (i.e. 3 )
distinct field modes, with several modes often being visually
indistinguishable from one another. Experimentation with different
combinations of field modes is encouraged given that different
combinations usually lead to very different images. Changing the modes
STEM detector quadrants is accomplished with the STEM Control tool
found in the docking sidebar (Section 1.4.1).
3
1.5 Logging Off
Finishing a session with the microscope is roughly the reverse of the
startup process. The following sections will briefly outline the steps to safely log
off the instrument.
1.5.1 Stage Positioning and STEM Detector
stowing the stage and disabling the control sticks. To begin, switch the
detector channel to TV (Section 1.3.1). If the STEM stage was used, move
it to the stage point labelled $STEM_SAFE_ZONE using the Stage
Points List tool found in the docking side-panel (Section 1.4.1). Once in
the safe zone, retract the STEM detector by clicking the STEM -> OUT
button found in the STEM Control tool found in the docking side-panel
(Section 1.4.1). If a normal SEM stage was used during the session,
completely lower the stage using the left control stick on the SEM Stage
Control board. Once the stage has been stowed, the operator must lock the
stage controls by enabling the Joystick Disable checkbox under the Stage
tab. This helps minimize the chance of someone inadvertently moving the
stage while the microscope is not in use.
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The first steps to safely logging off the instrument involves
1.5.2 Accelerating Voltage
accelerating voltage to a low value before disabling the EHT. It is
common to lower the voltage to 2.0 kV or lower, while remembering to
change in increments no larger than 5 kV. Once the accelerating voltage is
sufficiently low, EHT can be disabled by clicking the EHT textbox at the
bottom right portion of the screen.
After safely stowing the stage, the operator must ramp down the
1.5.3 Vacuum Control and Gas Pressure
Note: If the instrument will be used again after a short period of time, or if
the operator does not wish to vent the vacuum chamber, this step can be
skipped.
Venting the vacuum chamber can be accomplished by clicking the
Vac status textbox at the bottom right portion of the Zeiss SmartSEM
window and selecting the Vent option. The roughing pump will promptly
switch off and the vacuum chamber will begin to vent. After a short time
the chamber door can be opened if the operator wishes to retrieve any
samples. It is very important to minimize the amount of time that the
chamber door is open in order to reduce the rate at which the vacuum
chamber soils.
Finally, it is important to close the valves on the pressurized gas
cylinders after venting the instrument. This prolongs the lifetime of the
tanks when the microscope is not in use.
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1.5.4 Closing the Software
2.0 References
1. Operator’s User Guide. Zeiss ΣIGMA Field Emission Scanning Electron
Microscope. Carl Zeiss NTS Limited, 2011.
2. Robbins, Roger. Scanning Electron Microscope Operation Zeiss Supra-40. The
University of Texas at Dallas, 2011 version.
Given that user accounts are customizable, and that user actions
are logged, it is important that operators log off their account or close the
SmartSEM software when they are finished with their session. A usage log
should be kept near the instrument and be updated with information
detailing the session time and general activities conducted during each
user’s session with the microscope.
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