White Electronic Designs WEDF1M32B-120HC5A, WEDF1M32B-120HC5, WEDF1M32B-120G2TM5A, WEDF1M32B-120G2TM5, WEDF1M32B-120G2TI5A Datasheet

1

White Electronic Designs Corporation • Phoenix, AZ • [phone]

HI-RELIABILITY PRODUCT

1Mx32 5V FLASH MODULE

ADVANCED*

■ Organized as 1Mx32, user configurable as 2Mx16 or 4Mx8.

■ Commercial, Industrial and Military Temperature Ranges

■ 5V ± 10% for Read and Write Operations.

■ Low Power CMOS

■ Embedded Erase and Program Algorithm

■ Built-in Decoupling Caps and Multiple Ground Pins for Low

Noise Operation

■ Weight

WEDF1M32B-XG2TX5 - 8 grams typical
WEDF1M32B-XHX5 - 13 grams typical

* This data sheet describes a product that may or may not be under

development and is subject to change or cancellation without notice.

FEATURES

■ Access Times of 70, 90, 120ns

■ Packaging:

• 66 pin, PGA Type, 1.185" square, Hermetic Ceramic HIP
(Package 401)

• 68 lead, 22mm Low Profile CQFP, 4.6mm (0.180"),

(Package 509)

■ Sector Architecture

• One 16KByte Sectors

• Two 8KByte Sectors

• One 32KByte Sectors

• Fifteen 64KByte Sectors

■ 1,000,000 Erase/Program Cycles

WEDF1M32B-XXX5

May 1999 Rev. 1

I/O8

I/O9

I/O10

A14

A16

A11

A0

A18

I/O0

I/O1

I/O2

RESET

CS2

GND

I/O

11

A10

A9

A15

VCC

CS1

A19

I/O3

I/O15

I/O14

I/O13

I/O12

OE

A

17

WE

I/O

7

I/O6

I/O5

I/O4

I/O24

I/O25

I/O26

A7

A12

NC

A

13

A8

I/O16

I/O17

I/O18

VCC

CS4

NC

I/O

27

A4

A5

A6

NC

CS

3

GND

I/O

19

I/O31

I/O30

I/O29

I/O28

A1

A2

A3

I/O23

I/O22

I/O21

I/O20

11 22 33 44 55 66

1 12 23 34 45 56

FIG. 1 PIN CONFIGURATION FOR WEDF1M32B-XHX5

PIN DESCRIPTION

TOP VIEW

I/O0-31 Data Inputs/Outputs

A0-19 Address Inputs

WE Write Enable

CS1-4 Chip Selects

OE Output Enable

RESET Reset

VCC Power Supply

GND Ground

NC Not Connected

BLOCK DIAGRAM

1M x 8

8

I/O

0-7

CS

1

1M x 8

8

I/O

8-15

CS

2

1M x 8

8

I/O

16-23

CS

3

1M x 8

8

I/O

24-31

CS

4

A0-

19

OE

WE

RESET

2

White Electronic Designs Corporation • Phoenix, AZ • [phone]

WEDF1M32B-XXX5

10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26

60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44

9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61

27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43

I/O

0

I/O

1

I/O

2

I/O

3

I/O

4

I/O

5

I/O

6

I/O

7

GND

I/O

8

I/O

9

I/O

10

I/O

11

I/O

12

I/O

13

I/O

14

I/O

15

V

CC

A11A12A13A14A15A

16

CS

1

OE

CS

2

A

17

WE2WE3WE

4

A18A

19

NC

I/O

16

I/O

17

I/O

18

I/O

19

I/O

20

I/O

21

I/O

22

I/O

23

GND
I/O

24

I/O

25

I/O

26

I/O

27

I/O

28

I/O

29

I/O

30

I/O

31

RESET

A0A1A2A3A4A5CS3GND

CS4WE1A6A7A8A9A10V

CC

FIG. 2 PIN CONFIGURATION FOR WEDF1M32B-XG2TX5

TOP VIEW

The White 68 lead G2T CQFP
fills the same fit and function as
the JEDEC 68 lead CQFJ or 68
PLCC. But the G2T has the TCE
and lead inspection advantage
of the CQFP form.

0.940"

1M x 8

8

I/O

0-7

1M x 8

8

I/O

8-15

1M x 8

8

I/O

16-23

1M x 8

8

I/O

24-31

CS

4

A0-

19

OE

RESET

CS

3

CS

2

CS

1

WE

4

WE

3

WE

2

WE

1

BLOCK DIAGRAM

PIN DESCRIPTION

I/O0-31 Data Inputs/Outputs

A0-19 Address Inputs

WE1-4 Write Enables

CS1-4 Chip Selects

OE Output Enable

RESET Reset

VCC Power Supply

GND Ground

NC Not Connected

3

White Electronic Designs Corporation • Phoenix, AZ • [phone]

WEDF1M32B-XXX5

FIG. 3

AC TEST CIRCUIT

NOTES:

V

Z is programmable from -2V to +7V.

I

OL & IOH programmable from 0 to 16mA.

Tester Impedance Z

0 = 75 Ω.

V

Z is typically the midpoint of VOH and VOL.

I

OL & IOH

are adjusted to simulate a typical resistive load circuit.

ATE tester includes jig capacitance.

AC TEST CONDITIONS

I

Current Source

D.U.T.

C = 50 pf

eff

I

OL

V ≈ 1.5V
(Bipolar Supply)

Z

Current Source

OH

RECOMMENDED OPERATING CONDITIONS

Parameter Symbol Min Max Unit

Supply Voltage VCC 4.5 5.5 V
Input High Voltage VIH 2.0 VCC + 0.5 V
Input Low Voltage VIL -0.5 +0.8 V
Operating Temp. (Mil.) T

A -55 +125 °C

Parameter Typ Unit

Input Pulse Levels

VIL = 0, VIH = 3.0

V
Input Rise and Fall 5 ns
Input and Output Reference Level 1.5 V
Output Timing Reference Level 1.5 V

CAPACITANCE

(TA = +25°C)

Parameter

Symbol

Conditions Max Unit

OE capacitance COE

VIN = 0 V, f = 1.0 MHz

50 pF

WE1-4 capacitance CWE

VIN = 0 V, f = 1.0 MHz

20 pF

CS1-4 capacitance CCS

VIN = 0 V, f = 1.0 MHz

20 pF

Data I/O capacitance CI/O

V

I/O

= 0 V, f = 1.0 MHz

20 pF

Address input capacitance C

ADVIN

= 0 V, f = 1.0 MHz

50 pF

This parameter is guaranteed by design but not tested.

ABSOLUTE MAXIMUM RATINGS

NOTES:

1. Minimum DC voltage is -0.5V on input/output pins. During transitions, this
level may undershoot to -2.0V for periods <20ns. Maximum DC voltage on
input/output pins is V

CC + 0.5V which, during transitions, may overshoot to

V

CC + 2.0V for periods <20ns.

2. Minimum DC input voltage on pins A

9, OE, and RESET is -0.5V. During

voltage transitions, A

9, OE, and RESET may undershoot Vss to -2.0V for

periods of up to 20ns. See Figure 6. Maximum DC input voltage on pin A

9 is

+12.5V which may overshoot to +13.5V for periods up to 20ns.

3. Output shorted for no more than one second. No more than one output
shorted at a time.

Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a Stress rating only and functional
operation of the device at these or any other conditions above those indicated in
the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.

Parameter Unit

Voltage on Any Pin with Respect to -0.5 to +7.0 V
GND – VCC and VPP)

Voltage with Respect to GND – -2.0 to +12.5 V
A9, OE, and RESET (2)

Voltage with Respect to GND – -2.0 to +7.0 V
All other pins (1)

Output Short Circuit Current 200 mA

DATA RETENTION

Parameter Test Conditions Min Unit

Minimum Pattern Data 150°C 10 Years
Retention Time 125°C 20 Years