This user’s guide describes the evaluation module (EVM) for the TPS25921. The TPS25921X is an eFuse
with precision current limit, 4.5-V to 18-V supply voltage operation, programmable undervoltage,
overvoltage, overcurrent and inrush current protection features.
The TPS25921XEVM allows reference circuit evaluation of TI's TPS25921X devices. The TPS25921X
devices are available with both latching and auto-retry operation.
1.1EVM Features
•General TPS25921XEVM features include:
– 4.5-V to 18.0-V (TYP) operation
•CH1 Rising input voltage turn-on threshold – 4.5 V (TYP)
•CH1 rising input voltage turn-off threshold (OVP) – 17 V (TYP)
•CH1 Falling Input voltage turn-off threshold (UVLO) –4.2 V (TYP)
•CH2 Rising Input voltage turn-on threshold – 4.5 V (TYP)
•CH2 Rising Input voltage turn-off threshold (OVP) – 17 V (TYP)
•CH2 Falling Input voltage turn-off threshold (UVLO) – 4.2 V (TYP)
The TPS25921XEVM-637 enables full evaluation of the TPS25921X devices. The EVM supports two
versions (Auto-Retry and Latched) of the devices on two Channels (CH1 and CH2, respectively). Input
power is applied at J1 (CH1) and, J5 (CH2) while J2 and (CH1)/J6 (CH2) provide the output connection to
the load. Refer to the schematic in Figure 1, and EVM test setup in Figure 2.
D1/C1(CH1), D5/C9 (CH2) provide input protection for the TPS25921X (U1 and U2, respectively) while
D2/C2-C6 (CH1), D6/C10-C14 (CH2) provide output protection and inrush current demand from the load.
S1 and S2 allow U1 and U2, respectively, to be RESET or disabled. A power good (PG) indicator is
provided by D3, D7 for CH1 and CH2, respectively, and circuit faults can be observed with D4. Scaled
channel current can be monitored at TP10 and TP20 with a scale factor of approximately 1 V/A.
This section describes the physical access, test equipment and set up, and the test setup and procedures
for this EVM.
4.1Physical Access
Table 2 lists the TPS25921XEVM-637 input and output connector functionality.
Table 2. Input and Output Connector Functionality
ConnectorLabelDescription
J1CH1VIN1(+), GND(–)CH1 Input power supply to the EVM
J2VOUT1(+),GND(–)CH1 Output power from the EVM
J5CH2VIN2(+), GND(–)CH2 Input power supply to the EVM
J6VOUT2(+),GND(–)CH2 Output power from the EVM
Table 3 describes the test point availability.
ChannelTest PointsLabelDescription
CH1TP6VIN1CH1 Input power supply to the EVM
TP3EN1CH1 Active high enable and under voltage input
TP22OVP1CH1, Active high overvoltage input
TP10IMON1CH1 Current monitor. Load current ≈1 × voltage on TP10
TP5VOUT1CH1 Output from the EVM
TP4FLTb1CH1, Fault test point
TP1GNDGND
TP2GNDGND
TP7GNDGND
TP8GNDGND
CH2TP19VIN2CH2 Input power supply to the EVM
TP16EN2CH2 Active high enable and under voltage input
TP23OVP2CH2, Active high overvoltage input
TP20IMON2CH2 Current monitor. Load current ≈1 × voltage on TP20
TP18VOUT2CH2 Output from the EVM
TP20FLTb2CH2, Fault test point
TP11GNDGND
TP12GNDGND
TP13GNDGND
TP21GNDGND
General Configurations
Table 3. Test Points Description
SLUUB50–August 2014TPS25921X-637EVM: Evaluation Module for TPS25921X