TPS2546 USB Charging Port Controller and Power Switch With Load Detection
1Features2Applications
1
•D+/D– CDP/DCP Modes per USB Battery
Charging Specification 1.2
•D+/D– Shorted Mode per Chinese
Telecommunication Industry Standard YD/T
1591-2009
•Supports Non-BC1.2 Charging Modes byThe TPS2546 is a USB charging port controller and
Automatic Selection:
– D+/D– Divider Modes 2 V/2.7 V and 2.7 V/2 V
– D+/D– 1.2-V Mode
•Supports Sleep-Mode Charging andcharging of popular mobile phones, tablets, and
Mouse/Keyboard Wakeup
•Automatic SDP/CDP Switching for Devices That
Do Not Connect to CDP Ports
•Load Detection for Power Supply Control in S4/S5
Charging and Port Power Management in All
Charge Modes
•Compatible With USB 2.0 and 3.0 Power Switch
Requirements
•Integrated 73-mΩ (Typical) High-Side MOSFET
•Adjustable Current-Limit up to 3 A (Typical)
•Operating Range: 4.5 V to 5.5 V
•Max Device Current:
– 2 µA When Device Disabled
– 270 µA When Device Enabled
•Drop-In and BOM Compatible With TPS2543
•Available in 16-Pin WQFN (3.00 mm × 3.00 mm)
Package
•8-kV ESD Rating on DM/DP Pins
•UL Listed File No. E169910 and CB certified
•USB Ports (Host and Hubs)
•Notebook and Desktop PCs
•Universal Wall-Charging Adapters
3Description
power switch with an integrated USB 2.0 high-speed
data line (D+/D–) switch. TPS2546 provides the
electrical signatures on D+/D– to support charging
schemes listed under Feature Description. TI tests
mediadeviceswiththeTPS2546toensure
compatibility with both BC1.2 compliant, and nonBC1.2 compliant devices.
In addition to charging popular devices, the TPS2546
alsosupportstwo distinctpowermanagement
features, namely, power wake and port power
management (PPM) through the STATUS pin. Power
wake allows for power supply control in S4/S5
charging and PPM the ability to manage port power in
a multi-port application. Additionally, system wake up
(from S3) with a mouse/keyboard (both low speed
and full speed) is fully supported in the TPS2546.
The TPS2546 73-mΩ power-distribution switch is
intended for applications where heavy capacitive
loads and short-circuits are likely to be encountered.
Twoprogrammablecurrentthresholdsprovide
flexibility for setting current limits and load detect
thresholds.
Device Information
PART NUMBERPACKAGEBODY SIZE (NOM)
TPS2546WQFN (16)3.00 mm × 3.00 mm
(1) For all available packages, see the orderable addendum at
the end of the data sheet.
(1)
1
Simplified Schematic
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision A (Febuary 2013) to Revision BPage
•Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and
Mechanical, Packaging, and Orderable Information section. ................................................................................................. 1
Changes from Original (February 2013) to Revision APage
•Changed the device From: Preview To: Production............................................................................................................... 1
1INP
2DM_OUTI/OD– data line to USB host controller.
3DP_OUTI/OD+ data line to USB host controller.
4ILIM_SELI
5ENIand power switches and holds OUT in discharge. Can be tied directly to IN or GND without pullup or
6CTL1I
7CTL2I
8CTL3I
9STATUSOActive-low open-drain output, asserted in load detection conditions.
10DP_INI/OD+ data line to downstream connector.
11DM_INI/OD– data line to downstream connector.
12OUTPPower-switch output.
13FAULTOActive-low open-drain output, asserted during overtemperature or current limit conditions.
14GNDPGround connection.
15ILIM_LOI
16ILIM_HIIExternal resistor connection used to set the high-current-limit threshold.
——
(1) G = ground, I = input, O = output, P = power.
ThermalInternally connected to GND; used to heatsink the part to the circuit board traces. Connect to GND
Padplane.
TYPE
(1)
Input voltage and supply voltage; connect 0.1 μF or greater ceramic capacitor from IN to GND as close
to the device as possible.
Logic-level input signal used to control the charging mode, current limit threshold, and load detection;
see Table 3. Can be tied directly to IN or GND without pullup or pulldown resistor.
Logic-level input for turning the power switch and the signal switches on/off; logic low turns off the signal
pulldown resistor.
Logic-level inputs used to control the charging mode and the signal switches; see Table 3. Can be tied
directly to IN or GND without pullup or pulldown resistor.
External resistor connection used to set the low current-limit threshold and the load detection current
threshold. A resistor to ILIM_LO is optional; see Current-Limit Settings in Detailed Description.
Over operating free-air temperature range (unless otherwise noted)
IN, EN, ILIM_LO, ILIM_HI, FAULT, STATUS,
VoltageV
Input clamp currentDP_IN, DM_IN, DP_OUT, DM_OUT±20mA
Continuous current in SDP or CDP
mode
Continuous current in BC1.2 DCP mode DP_IN to DM_IN±50mA
Continuous output currentOUTInternally limited
Continuous output sink currentFAULT, STATUS25mA
Continuous output source currentILIM_LO, ILIM_HIInternally limitedmA
Operating junction temperature, T
J
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under RecommendedOperating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
ILIM_SEL, CTL1, CTL2, CTL3, OUT
IN to OUT–77
DP_IN, DM_IN, DP_OUT, DM_OUT–0.3(IN + 0.3) or 5.7
DP_IN to DP_OUT or DM_IN to DM_OUT±100mA
(1)
MINMAXUNIT
–0.37
–40Internally limited°C
6.2 ESD Ratings
HBM±2000
V
(ESD)
Electrostatic
discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-
(1)
001
Charged-device model (CDM), per JEDEC specification JESD22-C101
HBM wrt GND and each
other, DP_IN, DM_IN,±8000V
OUT
(2)
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.3 Recommended Operating Conditions
voltages are referenced to GND (unless otherwise noted)
MINMAXUNIT
V
IN
V
IH
V
IL
I
OUT
R
ILIM_XX
T
J
Input voltage, IN4.55.5V
Input voltage, logic-level inputs, EN, CTL1, CTL2, CTL3, ILIM_SEL05.5V
Input voltage, data line inputs, DP_IN, DM_IN, DP_OUT, DM_OUT0V
High-level input voltage, EN, CTL1, CTL2, CTL3, ILIM_SEL1.8V
Low-level input voltage, EN, CTL1, CTL2, CTL3, ILIM_SEL0.8V
Continuous current, data line inputs, SDP or CDP mode, DP_IN to DP_OUT, DM_IN to
DM_OUT
Continuous current, data line inputs, BC1.2 DCP mode, DP_IN to DM_IN±15mA
Continuous output current, OUT02.5A
Continuous output sink current, FAULT, STATUS010mA
Current-limit set resistors16.9750kΩ
Operating virtual junction temperature–40125°C
VEN= 0 V, f = 250 MHz33dB
f = 250 MHz52dB
VEN= 0 V, V
measure I
RL= 50 Ω2.6GHz
(1) The resistance in series with the parasitic capacitance to GND is typically 250 Ω.
(2) The resistance in series with the parasitic capacitance to GND is typically 150 Ω
(3) These parameters are provided for reference only and do not constitute part of TI's published device specifications for purposes of TI's