10-Bit CMOS Voltage Output DAC in an
8-T erminal Package
D
5-V Single Supply Operation
D
3-Wire Serial Interface
D
High-Impedance Reference Inputs
D
Voltage Output Range ...2 Times the
Reference Input Voltage
D
Internal Power-On Reset
D
Low Power Consumption . . . 1.75 mW Max
D
Update Rate of 1.21 MHz
D
Settling Time to 0.5 LSB . . . 12.5 µs Typ
D
Monotonic Over Temperature
D
Pin Compatible With the Maxim MAX515
description
The TLC5615 is a 10-bit voltage output digital-to-analog converter (DAC) with a buffered reference input (high
impedance). The DAC has an output voltage range that is two times the reference voltage, and the DAC is
monotonic. The device is simple to use, running from a single supply of 5 V. A power-on-reset function is
incorporated to ensure repeatable start-up conditions.
applications
D
Battery-Powered T est Instruments
D
Digital Offset and Gain Adjustment
D
Battery Operated/Remote Industrial
Controls
D
Machine and Motion Control Devices
D
Cellular Telephones
D, P, OR DGK PACKAGE
(TOP VIEW)
DIN
SCLK
CS
DOUT
1
2
3
4
8
7
6
5
V
DD
OUT
REFIN
AGND
Digital control of the TLC5615 is over a three-wire serial bus that is CMOS compatible and easily interfaced to
industry standard microprocessor and microcontroller devices. The device receives a 16-bit data word to
produce the analog output. The digital inputs feature Schmitt triggers for high noise immunity. Digital
communication protocols include the SPI, QSPI, and Microwire standards.
The 8-terminal small-outline D package allows digital control of analog functions in space-critical applications.
The TLC5615C is characterized for operation from 0°C to 70°C. The TLC5615I is characterized for operation
from –40°C to 85°C.
AVAILABLE OPTIONS
PACKAGE
T
A
0°C to 70°CTLC5615CDTLC5615CDGKTLC5615CP
–40°C to 85°CTLC5615IDTLC5615IDGKTLC5615IP
†
Available in tape and reel as the TLC5615CDR and the TLC5615IDR
SMALL OUTLINE
(D)
†
PLASTIC SMALL OUTLINE
(DGK)
PLASTIC DIP
(P)
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
Copyright 2000, Texas Instruments Incorporated
1
TLC5615C, TLC5615I
I/O
DESCRIPTION
10-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS142C – OCTOBER 1996 – REVISED MARCH 2000
functional block diagram
_
REFIN
AGND
CS
SCLK
DIN
+
Power-ON
Reset
Control
Logic
DAC
RR
10-Bit DAC Register
2
(LSB) (MSB)
0s
10 Data Bits
16-Bit Shift Register
+
_
2
Dummy
OUT
(Voltage Output)
4
Bits
DOUT
Terminal Functions
TERMINAL
NAMENO.
DIN1ISerial data input
SCLK2ISerial clock input
CS3IChip select, active low
DOUT4OSerial data output for daisy chaining
AGND5Analog ground
REFIN6IReference input
OUT7ODAC analog voltage output
V
DD
8Positive power supply
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
Supply voltage, V
High-level digital input voltage, V
Low-level digital input voltage, V
Reference voltage, V
Load resistance, R
p
DD
IH
IL
to REFIN terminal2 2.048 VDD–2V
ref
L
p
A
TLC5615C070°C
TLC5615I–4085°C
electrical characteristics over recommended operating free-air temperature range, VDD = 5 V ±5%,
= 2.048 V (unless otherwise noted)
V
ref
static DAC specifications
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Resolution10bits
Integral nonlinearity, end point adjusted (INL)V
Differential nonlinearity (DNL)V
E
E
NOTES: 1. The relative accuracy or integral nonlinearity (INL), sometimes referred to as linearity error, is the maximum deviation of the output
Zero-scale error (offset error at zero scale)V
ZS
Zero-scale-error temperature coefficientV
Gain errorV
G
Gain-error temperature coefficientV
pp
Analog full scale outputRL = 100 kΩ2V
from the line between zero and full scale excluding the effects of zero code and full-scale errors (see text).
2. The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal 1
LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same direction (or remains
constant) as a change in the digital input code.
3. Zero-scale error is the deviation from zero-voltage output when the digital input code is zero (see text).
4. Zero-scale-error temperature coefficient is given by: EZSTC = [EZS(T
5. Gain error is the deviation from the ideal output (V
error.
6. Gain temperature coefficient is given by: EGTC = [EG(T
7. Zero-scale-error rejection ratio (EZS-RR) is measured by varying the VDD from 4.5 V to 5.5 V dc and measuring the proportion of
this signal imposed on the zero-code output voltage.
8. Gain-error rejection ratio (EG-RR) is measured by varying the VDD from 4.5 V to 5.5 V dc and measuring the proportion of this signal
imposed on the full-scale output voltage after subtracting the zero-scale change.
Zero scale
Gain
= 2.048 V,See Note 1±1LSB
ref
= 2.048 V,See Note 2±0.1±0.5LSB
ref
= 2.048 V,See Note 3±3LSB
ref
= 2.048 V,See Note 43ppm/°C
ref
= 2.048 V,See Note 5±3LSB
ref
= 2.048 V,See Note 61ppm/°C
ref
80
80
) – EZS(T
– 1 LSB) with an output load of 10 kΩ excluding the effects of the zero-scale
ref
) – EG (T
max
max
min
)]/V
× 106/(T
ref
min
4.555.5V
2.4V
2kΩ
(1023/1024)V
ref
)]/V
max
× 106/(T
ref
– T
min
– T
max
).
0.8V
).
min
voltage output (OUT)
V
O
I
OSC
V
OL(low)
V
OH(high)
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Voltage output rangeRL = 10 kΩ0VDD–0.4V
Output load regulation accuracyV
Output short circuit currentOUT to VDD or AGND20mA
electrical characteristics over recommended operating free-air temperature range, VDD = 5 V ±5%,
V
= 2.048 V (unless otherwise noted) (continued)
ref
reference input (REFIN)
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
V
Input voltage0VDD–2V
I
r
Input resistance10MΩ
i
C
Input capacitance5pF
i
digital inputs (DIN, SCLK, CS)
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
V
High-level digital input voltage2.4V
IH
V
Low-level digital input voltage0.8V
IL
I
High-level digital input currentVI = V
IH
I
Low-level digital input currentVI = 0±1µA
IL
C
Input capacitance8pF
i
digital output (DOUT)
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
V
Output voltage, high-levelIO = –2 mAVDD–1V
OH
V
Output voltage, low-levelIO = 2 mA0.4V
OL
DD
±1µA
power supply
PARAMETERTEST CONDITIONSMINTYPMAX
V
Supply voltage4.555.5V
DD
VDD = 5.5 V,
pp
No load,
All inputs = 0 V or V
VDD = 5.5 V,
No load,
All inputs = 0 V or V
DD
DD
V
= 0150250µA
ref
V
= 2.048 V230350µA
ref
analog output dynamic performance
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
V
= 1 Vpp at 1 kHz + 2.048 Vdc,
ref
Signal-to-noise + distortion, S/(N+D)
NOTE 9: The limiting frequency value at 1 Vpp is determined by the output-amplifier slew rate.
code = 11 1111 111 1,
See Note 9
UNIT
60dB
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC5615C, TLC5615I
10-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS142C – OCTOBER 1996 – REVISED MARCH 2000
digital input timing requirements (see Figure 1)
PARAMETERMINNOMMAXUNIT
t
su(DS)
t
h(DH)
t
su(CSS)
t
su(CS1)
t
h(CSH0)
t
h(CSH1)
t
w(CS)
t
w(CL)
t
w(CH)
output switching characteristic
t
pd(DOUT)
operating characteristics over recommended operating free-air temperature range, VDD = 5 V ±5%,
V
ref
Setup time, DIN before SCLK high45ns
Hold time, DIN valid after SCLK high0ns
Setup time, CS low to SCLK high1ns
Setup time, CS high to SCLK high50ns
Hold time, SCLK low to CS low1ns
Hold time, SCLK low to CS high0ns
Pulse duration, minimum chip select pulse width high20ns
The TLC5615 uses a resistor string network buffered with an op amp in a fixed gain of 2 to convert 10-bit digital
data to analog voltage levels (see functional block diagram and Figure 9). The output of the TLC5615 is the
same polarity as the reference input (see Table 1).
An internal circuit resets the DAC register to all zeros on power up.
DIN SCLK CS
DOUT
REFIN
+
_
Resistor
String
DAC
AGNDV
0.1 µF
Figure 9. TLC5615 Typical Operating Circuit
Table 1. Binary Code Table (0 V to 2 V
†
INPUT
1111111111(00)
:
1000000001(00)
1000000000(00)
0111111111(00)
:
0000000001(00)
2ǒV
2ǒV
2
REFIN
2
2
R
DD
REFIN
REFIN
ǒ
V
REFIN
ǒ
V
REFIN
ǒ
V
REFIN
+
_
R
5 V
Output)
OUTPUT
1023
Ǔ
1024
:
513
Ǔ
1024
512
Ǔ
+
1024
511
Ǔ
1024
:
Ǔ
1024
1
V
REFIN
Gain = 2
,
OUT
10
0000000000(00)
†
A 10-bit data word with two bits below the LSB bit (sub-LSB) with 0 values
must be written since the DAC input latch is 12 bits wide.
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
0 V
TLC5615C, TLC5615I
10-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS142C – OCTOBER 1996 – REVISED MARCH 2000
APPLICATION INFORMATION
buffer amplifier
The output buffer has a rail-to-rail output with short circuit protection and can drive a 2-kΩ load with a 100-pF
load capacitance. Settling time is 12.5 µs typical to within 0.5 LSB of final value.
external reference
The reference voltage input is buffered, which makes the DAC input resistance not code dependent. Therefore,
the REFIN input resistance is 10 MΩ and the REFIN input capacitance is typically 5 pF independent of input
code. The reference voltage determines the DAC full-scale output.
logic interface
The logic inputs function with either TTL or CMOS logic levels. However, using rail-to-rail CMOS logic achieves
the lowest power dissipation. The power requirement increases by approximately 2 times when using TTL logic
levels.
serial clock and update rate
Figure 1 shows the TLC5615 timing. The maximum serial clock rate is:
wǒCH
1
)
t
Ǔ
)
Ǔ
wǒCL
t
wǒCL
Ǔ
Ǔ
)
t
Ǔ
wǒCS
Ǔ
f
(SCLK)max
or approximately 14 MHz. The digital update rate is limited by the chip-select period, which is:
t
p(CS)
and is equal to 820 ns which is a 1.21 MHz update rate. However, the DAC settling time to 10 bits of 12.5 µs
limits the update rate to 80 kHz for full-scale input step transitions.
When chip select (CS) is low, the input data is read into a 16-bit shift register with the input data clocked in most
significant bit first. The rising edge of the SLCK input shifts the data into the input register.
The rising edge of CS then transfers the data to the DAC register. When CS is high, input data cannot be clocked
into the input register. All CS transitions should occur when the SCLK input is low.
If the daisy chain (cascading) function (see daisy-chaining devices section) is not used, a 12-bit input data
sequence with the MSB first can be used as shown in Figure 10:
12 Bits
10 Data Bitsxx
MSBLSB2 Extra (Sub-LSB) Bits
x = don’t care
Figure 10. 12-Bit Input Data Sequence
or 16 bits of data can be transferred as shown in Figure 11 with the 4 upper dummy bits first.
16 Bits
4 Upper Dummy Bits
MSBLSB2 Extra (Sub-LSB) Bits
x = don’t care
10 Data Bitsxx
Figure 11. 16-Bit Input Data Sequence
The data from DOUT requires 16 falling edges of the input clock and, therefore, requires an extra clock width.
When daisy chaining multiple TLC5615 devices, the data requires 4 upper dummy bits because the data
transfer requires 16 input-clock cycles plus one additional input-clock falling edge to clock out the data at the
DOUT terminal (see Figure 1).
The two extra (sub-LSB) bits are always required to provide hardware and software compatibility with 12-bit data
converter transfers.
The TLC5615 three-wire interface is compatible with the SPI, QSPI†, and Microwire serial standards. The
hardware connections are shown in Figure 12 and Figure 13.
The SPI and Microwire interfaces transfer data in 8-bit bytes, therefore, two write cycles are required to input
data to the DAC. The QSPI interface, which has a variable input data length from 8 to 16 bits, can load the DAC
input register in one write cycle.
†
CPOL = 0, CPHA = 0, QSPI protocol designations
12
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
serial interface (continued)
TLC5615C, TLC5615I
10-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS142C – OCTOBER 1996 – REVISED MARCH 2000
APPLICATION INFORMATION
SCLK
DIN
TLC5615
CS
DOUT
NOTE A: The DOUT-SI connection is not required for writing
to the TLC5615 but may be used for verifying data
transfer if desired.
SK
SO
I/O
SI
Microwire
Port
Figure 12. Microwire Connection
SCLK
DIN
TLC5615
CS
DOUT
NOTE A: The DOUT-MISO connection is not required for writing to
the TLC5615 but may be used for verifying data transfer.
Figure 13. SPI/QSPI Connection
SCK
MOSI
SPI/QSPI
Port
I/O
MISO
CPOL = 0, CPHA = 0
daisy-chaining devices
DACs can be daisy-chained by connecting the DOUT terminal of one device to the DIN of the next device in
the chain, providing that the setup time, t
time, t
, plus the propagation delay time, t
su(DS)
su(CSS)
, (CS low to SCLK high) is greater than the sum of the setup
pd(DOUT)
, for proper timing (see digital input timing requirements
section). The data at DIN appears at DOUT, delayed by 16 clock cycles plus one clock width. DOUT is a
totem-poled output for low power. DOUT changes on the SCLK falling edge when CS
is low. When CS is high,
DOUT remains at the value of the last data bit and does not go into a high-impedance state.
linearity, offset, and gain error using single ended supplies
When an amplifier is operated from a single supply , the voltage offset can still be either positive or negative. With
a positive offset, the output voltage changes on the first code change. With a negative offset the output voltage
may not change with the first code depending on the magnitude of the offset voltage.
The output amplifier attempts to drive the output to a negative voltage. However, because the most negative
supply rail is ground, the output cannot drive below ground and clamps the output at 0 V.
The output voltage then remains at zero until the input code value produces a sufficient positive output voltage
to overcome the negative offset voltage, resulting in the transfer function shown in Figure 14.
Output
Voltage
0 V
Negative
Offset
DAC Code
Figure 14. Effect of Negative Offset (Single Supply)
linearity, offset, and gain error using single ended supplies (continued)
This offset error , not the linearity error, produces this breakpoint. The transfer function would have followed the
dotted line if the output buffer could drive below the ground rail.
For a DAC, linearity is measured between zero-input code (all inputs 0) and full-scale code (all inputs 1) after
offset and full scale are adjusted out or accounted for in some way . However , single supply operation does not
allow for adjustment when the offset is negative due to the breakpoint in the transfer function. So the linearity
is measured between full-scale code and the lowest code that produces a positive output voltage. For the
TLC5615, the zero-scale (offset) error is plus or minus 3 LSB maximum. The code is calculated from the
maximum specification for the negative offset.
power-supply bypassing and ground management
Printed-circuit boards that use separate analog and digital ground planes offer the best system performance.
Wire-wrap boards do not perform well and should not be used. The two ground planes should be connected
together at the low-impedance power-supply source. The best ground connection may be achieved by
connecting the DAC AGND terminal to the system analog ground plane making sure that analog ground
currents are well managed and there are negligible voltage drops across the ground plane.
A 0.1-µF ceramic-capacitor bypass should be connected between V
and AGND and mounted with short leads
DD
as close as possible to the device. Use of ferrite beads may further isolate the system analog supply from the
digital power supply.
Figure 15 shows the ground plane layout and bypassing technique.
Analog Ground Plane
1
2
3
4
8
7
6
5
0.1 µF
Figure 15. Power-Supply Bypassing
saving power
Setting the DAC register to all 0s minimizes power consumption by the reference resistor array and the output
load when the system is not using the DAC.
ac considerations
digital feedthrough
Even with CS
DAC package internal stray capacitance and appear at the DAC analog output as digital feedthrough. Digital
feedthrough is tested by holding CS
high, high-speed serial data at any of the digital input or output terminals may couple through the
high and transmitting 0101010101 from DIN to DOUT.
analog feedthrough
Higher frequency analog input signals may couple to the output through internal stray capacitance. Analog
feedthrough is tested by holding CS
high, setting the DAC code to all 0s, sweeping the frequency applied to
REFIN, and monitoring the DAC output.
14
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
TLC5615C, TLC5615I
10-BIT DIGITAL-TO-ANALOG CONVERTERS
SLAS142C – OCTOBER 1996 – REVISED MARCH 2000
MECHANICAL DATA
D (R-PDSO-G**) PLASTIC SMALL-OUTLINE PACKAGE
14 PINS SHOWN
0.050 (1,27)
14
1
0.069 (1,75) MAX
A
0.020 (0,51)
0.014 (0,35)
0.010 (0,25)
0.004 (0,10)
DIM
8
7
PINS **
0.010 (0,25)
0.157 (4,00)
0.150 (3,81)
M
0.244 (6,20)
0.228 (5,80)
Seating Plane
0.004 (0,10)
8
14
0.008 (0,20) NOM
0°–8°
16
Gage Plane
0.010 (0,25)
0.044 (1,12)
0.016 (0,40)
A MAX
A MIN
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. Body dimensions do not include mold flash or protrusion, not to exceed 0.006 (0,15).
D. Falls within JEDEC MS-012
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
0.197
(5,00)
0.189
(4,80)
0.344
(8,75)
0.337
(8,55)
0.394
(10,00)
0.386
(9,80)
4040047/D 10/96
15
MECHANICAL DATA
MPDI001A – JANUARY 1995 – REVISED JUNE 1999
MECHANICAL DATA
P (R-PDIP-T8)PLASTIC DUAL-IN-LINE
0.400 (10,60)
0.355 (9,02)
8
5
0.260 (6,60)
0.240 (6,10)
1
0.021 (0,53)
0.015 (0,38)
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-001
4
0.070 (1,78) MAX
0.020 (0,51) MIN
0.200 (5,08) MAX
0.125 (3,18) MIN
0.100 (2,54)
0.010 (0,25)
Seating Plane
M
0.325 (8,26)
0.300 (7,62)
0.015 (0,38)
Gage Plane
0.010 (0,25) NOM
0.430 (10,92)
MAX
4040082/D 05/98
For the latest package information, go to http://www.ti.com/sc/docs/package/pkg_info.htm
16
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
MPDI001A – JANUARY 1995 – REVISED JUNE 1999
MECHANICAL DATA
MECHANICAL DATA
DGK (R-PDSO-G8) PLASTIC SMALL-OUTLINE PACKAGE
0,65
8
1
1,07 MAX
3,05
2,95
0,38
0,25
5
3,05
2,95
4
Seating Plane
0,15
0,05
0,25
4,98
4,78
M
0,10
0,15 NOM
Gage Plane
0°–6°
0,25
0,69
0,41
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Body dimensions do not include mold flash or protrusion.
D. Falls within JEDEC MO-187
For the latest package information, go to http://www.ti.com/sc/docs/package/pkg_info.htm
4073329/B 04/98
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
17
IMPORTANT NOTICE
T exas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue
any product or service without notice, and advise customers to obtain the latest version of relevant information
to verify, before placing orders, that information being relied on is current and complete. All products are sold
subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those
pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty . Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICA TIONS USING SEMICONDUCT OR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL
APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER
CRITICAL APPLICA TIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERST OOD TO
BE FULLY AT THE CUSTOMER’S RISK.
In order to minimize risks associated with the customer’s applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI’s publication of information regarding any third
party’s products or services does not constitute TI’s approval, warranty or endorsement thereof.
Copyright 2000, Texas Instruments Incorporated
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