•Available in Standard SOIC, MSOP
PowerPAD™, JG, or FK Package
•Evaluation Module Available
DESCRIPTION
The THS4031 and THS4032 are ultralow-voltage
noise, high-speed voltage feedback amplifiers that
are ideal for applications requiring low voltage noise,
including communications and imaging. The single
amplifier THS4031 and the dual amplifier THS4032
offer very good ac performance with 100-MHz
bandwidth (G = 2), 100-V/ms slew rate, and 60-ns
settling time (0.1%). The THS4031 and THS4032 are
unity gain stable with 275-MHz bandwidth. These
amplifiers have a high drive capability of 90 mA and
draw only 8.5-mA supply current per channel. With
–90 dBc of total harmonic distortion (THD) at f = 1
MHz and a very low noise of 1.6 nV/√Hz, the
THS4031 and THS4032 are ideally suited for
applications requiring low distortion and low noise
such as buffering analog-to-digital converters.
SLOS224G –JULY 1999–REVISED MARCH 2010
100-MHz LOW-NOISE HIGH-SPEED AMPLIFIERS
Check for Samples: THS4031, THS4032
DEVICEDESCRIPTION
THS4051/270-MHz High-Speed Amplifiers
THS4081/2175-MHz Low Power High-Speed Amplifiers
space
1
2PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
V
n
I
n
1
10100 1 k
− Voltage Noise −
10
f − Frequency − Hz
VOLTAGE NOISE AND CURRENT NOISE
vs
FREQUENCY
20
10 k100 k
V
n
nV/ Hz
VCC = ± 15 V AND ± 5 V
TA = 25°C
− Current Noise −I
n
pA/ Hz
THS4031
THS4032
SLOS224G –JULY 1999–REVISED MARCH 2010
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These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam
during storage or handling to prevent electrostatic damage to the MOS gates.
www.ti.com
AVAILABLE OPTIONS
PACKAGED DEVICES
T
A
0°C to 70°C
–40°C to 85°C
–55°C to 125°C1———THS4031MJGTHS4031MFK—
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) The D and DGN packages are available taped and reeled. Add an R suffix to the device type (that is, THS4031CDGNR).
(3) The PowerPAD™ on the underside of the DGN package is electrically isolated from all other pins and active circuitry. Connection to the
PCB ground plane is recommended, although not required, as this copper plane is typically the largest copper plane on the PCB.
Over operating free-air temperature range (unless otherwise noted).
V
CC
V
I
I
O
V
IO
T
A
T
J
T
stg
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) The maximum junction temperature for continuous operation is limited by package constraints. Operation above this temperature may
result in reduced reliability and/or lifetime of the device. Does not apply to the JG package or FK package.
Supply voltage, V
CC+
to V
Input voltage±V
Output current150mA
Differential input voltage±4V
Continuous total power dissipationSee Dissipation Ratings Table
C-suffix0 to 70
Operating free-air
temperature
I-suffix–40 to 85°C
M-suffix–55 to 125
Maximum junction temperature, (any condition)150°C
Maximum junction temperature, continuous operation, long term reliability
Storage temperature–65 to 150°C
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds300°C
Lead temperature 1,6 mm (1/16 inch) from case for 60 seconds, JG package300°C
Case temperature for 60 seconds, FK package260°C
DISSIPATION RATINGS TABLE
q
PACKAGE
D167
(2)
DGN
(1) This data was taken using the JEDEC standard Low-K test PCB. For the JEDEC Proposed High-K test PCB, the qJAis 95°C/W with a
(2) This data was taken using 2 oz. trace and copper pad that is soldered directly to a 3-in. × 3-in. PC. For further information, refer to
(1) Full range = 0°C to 70°C for THS403xC and –40°C to 85°C for THS403xI suffix.
(2) Full power bandwidth = slew rate / [√2 pV
(3) Slew rate is measured from an output level range of 25% to 75%.
VCC= ±5 V or ±15 V, V
f = 1 MHz, Gain = 2, TA= 25°C
VCC= ±5 V or ±15 V,
TA= 25°C
VCC= ±5 V or ±15 V,
TA= 25°C
Gain = 2,NTSC and PAL,
O(pp)
= 2 V,
40 IRE modulation,±100 IRE ramp,
Differential phase error°
TA= 25°CRL= 150 Ω
RL= 150 Ω–81
RL= 1 kΩ–96
VCC= ±15 V0.015%
VCC= ±5 V0.02%
VCC= ±15 V0.025
VCC= ±5 V0.03
DC PERFORMANCE
VCC= ±15 V, RL= 1 kΩ, VO= ±10 V
Open loop gaindB
VCC= ±5 V, RL= 1 kΩ, VO= ±2.5 V
V
I
I
Input offset voltageVCC= ±5 V or ±15 VmV
OS
Input bias currentVCC= ±5 V or ±15 VmA
IB
Input offset currentVCC= ±5 V or ±15 VnA
OS
TA= 25°C9398
TA= full range92
TA= 25°C9295
TA= full range91
TA= 25°C0.52
TA= full range3
TA= 25°C36
TA= full range8
TA= 25°C30250
TA= full range400
Offset voltage driftVCC= ±5 V or ±15 VTA= full range2mV/°C
Input offset current driftVCC= ±5 V or ±15 VTA= full range0.2nA/°C
(1) Full range = 0°C to 70°C for THS403xC and –40°C to 85°C for THS403xI suffix.
(2) This parameter is not tested.
(3) Full power bandwidth = slew rate / [√2 pV
0.1% settling timevs Output voltage step size25
Small signal frequency response with varying feedback resistanceGain = 1, VCC= ±15V, RL= 1kΩ26
Frequency response with varying output voltage swingGain = 1, VCC= ±15V, RL= 1kΩ27
Small signal frequency response with varying feedback resistanceGain = 1, VCC= ±15V, RL= 150kΩ28
Frequency response with varying output voltage swingGain = 1, VCC= ±15V, RL= 150kΩ29
Small signal frequency response with varying feedback resistanceGain = 1, VCC= ±5V, RL= 1kΩ30
Frequency response with varying output voltage swingGain = 1, VCC= ±5V, RL= 1kΩ31
Small signal frequency response with varying feedback resistanceGain = 1, VCC= ±5V, RL= 150kΩ32
Frequency response with varying output voltage swingGain = 1, VCC= ±5V, RL= 150kΩ33
Small signal frequency response with varying feedback resistanceGain = 2, VCC= ±5V, RL= 150kΩ34
Small signal frequency response with varying feedback resistanceGain = 2, VCC= ±5V, RL= 150kΩ35
Small signal frequency response with varying feedback resistanceGain = –1, VCC= ±15V, RL= 150kΩ36
Frequency response with varying output voltage swingGain = –1, VCC= ±5V, RL= 150kΩ37
Small signal frequency responseGain = 5, VCC= ±15V, ±5V38
Output amplitudevs Frequency, Gain = 2, VS= ±15V39
Output amplitudevs Frequency, Gain = 2, VS= ±5V40
Output amplitudevs Frequency, Gain = –1, VS= ±15V41
Output amplitudevs Frequency, Gain = –1, VS= ±5V42
Differential phasevs Number of 150Ω loads43, 44
Differential gainvs Number of 150Ω loads45, 46
1-V step responsevs Time47, 48
4-V step responsevs Time49
20-V step responsevs Time50
The THS403x is a high-speed operational amplifier configured in a voltage feedback architecture. It is built using
a 30-V, dielectrically isolated, complementary bipolar process with NPN and PNP transistors possessing fTs of
several GHz. This results in an exceptionally high-performance amplifier that has wide bandwidth, high slew rate,
fast settling time, and low distortion. A simplified schematic is shown in Figure 51.
T = Temperature in degrees Kelvin (273 +°C)
RF || RG = Parallel resistance of RF and R
G
eno+ eniAV+ e
ni
ǒ
1 )
R
F
R
G
Ǔ
(Noninverting Case)
THS4031
THS4032
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SLOS224G –JULY 1999–REVISED MARCH 2010
NOISE CALCULATIONS AND NOISE FIGURE
Noise can cause errors on very small signals. This is especially true when amplifying small signals. The noise
model for the THS403x, shown in Figure 52, includes all of the noise sources as follows:
•en= Amplifier internal voltage noise (nV/√Hz)
•IN+ = Noninverting current noise (pA/√Hz)
•IN– = Inverting current noise (pA/√Hz)
•eRx= Thermal voltage noise associated with each resistor (eRx= 4 kTRx)
Figure 52. Noise Model
The total equivalent input noise density (eni) is calculated by using the following equation:
(1)
To get the equivalent output noise of the amplifier, just multiply the equivalent input noise density (eni) by the
overall amplifier gain (AV).
(2)
As the previous equations show, to keep noise at a minimum, small-value resistors should be used. As the
closed-loop gain is increased (by reducing RG), the input noise is reduced considerably because of the parallel
resistance term. This leads to the general conclusion that the most dominant noise sources are the source
resistor (RS) and the internal amplifier noise voltage (en). Because noise is summed in a root-mean-squares
method, noise sources smaller than 25% of the largest noise source can be effectively ignored. This advantage
can greatly simplify the formula and make noise calculations much easier to calculate.
For more information on noise analysis, refer to the application note, Noise Analysis for High-Speed Op Amps
(SBOA066).
Internal frequency compensation of the THS403x was selected to provide very wide bandwidth performance and
still maintain a very low noise floor. In order to meet these performance requirements, the THS403x must have a
minimum gain of 2 (–1). Because everything is referred to the noninverting terminal of an operational amplifier,
the noise gain in a G = –1 configuration is the same as a G = 2 configuration.
One of the keys to maintaining a smooth frequency response, and hence, a stable pulse response, is to pay
particular attention to the inverting terminal. Any stray capacitance at this node causes peaking in the frequency
response (see Figure 53 and Figure 54). Two things can be done to help minimize this effect. The first is to
simply remove any ground planes under the inverting terminal of the amplifier, including the trace that connects
to this terminal. Additionally, the length of this trace should be minimized. The capacitance at this node causes a
lag in the voltage being fed back due to the charging and discharging of the stray capacitance. If this lag
becomes too long, the amplifier will not be able to correctly keep the noninverting terminal voltage at the same
potential as the inverting terminal's voltage. Peaking and possible oscillations will then occur if this happens.
The second precaution to help maintain a smooth frequency response is to keep the feedback resistor (Rf) and
the gain resistor (Rg) values fairly low. These two resistors are effectively in parallel when looking at the ac
small-signal response. But, as can be seen in Figure 26 through Figure 37, a value too low starts to reduce the
bandwidth of the amplifier. Table 1 shows some recommended feedback resistors to be used with the THS403x.
Driving capacitive loads with high-performance amplifiers is not a problem as long as certain precautions are
taken. The first is to realize that the THS403x has been internally compensated to maximize its bandwidth and
slew-rate performance. When the amplifier is compensated in this manner, capacitive loading directly on the
output will decrease the phase margin of the device leading to high-frequency ringing or oscillations. Therefore,
for capacitive loads of greater than 10 pF, it is recommended that a resistor be placed in series with the output of
the amplifier, as shown in Figure 55. A minimum value of 20 Ω should work well for most applications. For
example, in 75-Ω transmission systems, setting the series resistor value to 75 Ω both isolates any capacitance
loading and provides the proper line impedance matching at the source end.
The THS403x has very low input offset voltage for a high speed amplifier. However, if additional correction is
required, the designer can make use of an offset nulling function provided on the THS4031. By placing a
potentiometer between terminals 1 and 8 of the device and tying the wiper to the negative supply, the input offset
can be adjusted. This is shown in Figure 56.
Figure 56. Offset Nulling Schematic
OFFSET VOLTAGE
The output offset voltage (VOO) is the sum of the input offset voltage (VIO) and both input bias currents (IIB) times
the corresponding gains. The following schematic and formula can be used to calculate the output offset voltage:
R1 = R2 = R
C1 = C2 = C
Q = Peaking Factor
(Butterworth Q = 0.707)
(
=
1
Q
2 –
)
R
G
R
F
_
+
f
–3dB
+
1
2pRC
THS4031
THS4032
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SLOS224G –JULY 1999–REVISED MARCH 2010
GENERAL CONFIGURATIONS
When receiving low-level signals, limiting the bandwidth of the incoming signals into the system is often required.
The simplest way to accomplish this is to place an RC filter at the noninverting terminal of the amplifer (see
Figure 58).
Figure 58. Single-Pole Low-Pass Filter
If even more attenuation is needed, a multiple-pole filter is required. The Sallen-Key filter can be used for this
task. For best results, the amplifier should have a bandwidth that is 8 to 10 times the filter frequency bandwidth.
Otherwise, phase shift of the amplifier can occur.
In order to achieve the levels of high-frequency performance of the THS403x, it is essential that proper
printed-circuit board (PCB) high-frequency design techniques be followed. A general set of guidelines is given
below. In addition, a THS403x evaluation board is available to use as a guide for layout or for evaluating the
device performance.
•Ground planes: It is highly recommended that a ground plane be used on the board to provide all
components with a low inductive ground connection. However, in the areas of the amplifier inputs and output,
the ground plane can be removed to minimize the stray capacitance.
•Proper power-supply decoupling: Use a 6.8-mF tantalum capacitor in parallel with a 0.1-mF ceramic capacitor
on each supply terminal. It may be possible to share the tantalum among several amplifiers depending on the
application, but a 0.1-mF ceramic capacitor should always be used on the supply terminal of every amplifier.
In addition, the 0.1-mF capacitor should be placed as close as possible to the supply terminal. As this distance
increases, the inductance in the connecting trace makes the capacitor less effective. The designer should
strive for distances of less than 0.1 inch between the device power terminals and the ceramic capacitors.
•Sockets: Sockets are not recommended for high-speed operational amplifiers. The additional lead inductance
in the socket pins will often lead to stability problems. Surface-mount packages soldered directly to the
printed-circuit board is the best implementation.
•Short trace runs/compact part placements: Optimum high-frequency performance is achieved when stray
series inductance has been minimized. To realize this, the circuit layout should be made as compact as
possible, thereby minimizing the length of all trace runs. Particular attention should be paid to the inverting
input of the amplifier. Its length should be kept as short as possible. This will help to minimize stray
capacitance at the input of the amplifier.
•Surface-mount passive components: Using surface-mount passive components is recommended for
high-frequency amplifier circuits for several reasons. First, because of the extremely low lead inductance of
surface-mount components, the problem with stray series inductance is greatly reduced. Second, the small
size of surface-mount components naturally leads to a more compact layout thereby minimizing both stray
inductance and capacitance. If leaded components are used, it is recommended that the lead lengths be kept
as short as possible.
GENERAL PowerPAD™ DESIGN CONSIDERATIONS
The THS403x is available in a thermally-enhanced DGN package, which is a member of the PowerPAD family of
packages. This package is constructed using a downset leadframe upon which the die is mounted [see
Figure 60(a) and Figure 60(b)]. This arrangement results in the leadframe being exposed as a thermal pad on
the underside of the package [see Figure 60(c)]. Because this thermal pad has direct thermal contact with the
die, excellent thermal performance can be achieved by providing a good thermal path away from the thermal
pad.
The PowerPAD package allows for both assembly and thermal management in one manufacturing operation.
During the surface-mount solder operation (when the leads are being soldered), the thermal pad can also be
soldered to a copper area underneath the package. Through the use of thermal paths within this copper area,
heat can be conducted away from the package into either a ground plane or other heat-dissipating device.
The PowerPAD package represents a breakthrough in combining the small area and ease of assembly of
surface mount with the heretofore awkward mechanical methods of heatsinking.
A.The thermal pad is electrically isolated from all terminals in the package.
Figure 60. Views of Thermally-Enhanced DGN Package
Thermal pad area (68 mils x 70 mils) with 5 vias
(Via diameter = 13 mils)
THS4031
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SLOS224G –JULY 1999–REVISED MARCH 2010
Although there are many ways to properly heatsink this device, the following steps illustrate the recommended
approach.
Figure 61. PowerPAD™ PCB Etch and Via Pattern
1. Prepare the PCB with a top-side etch pattern as shown in Figure 61. There should be etch for the leads as
well as etch for the thermal pad.
2. Place five holes in the area of the thermal pad. These holes should be 13 mils (0,3302 mm) in diameter.
They are kept small so that solder wicking through the holes is not a problem during reflow.
3. Additional vias may be placed anywhere along the thermal plane outside of the thermal pad area. This helps
dissipate the heat generated by the THS403xDGN IC. These additional vias may be larger than the 13-mil
diameter vias directly under the thermal pad. They can be larger because they are not in the thermal pad
area to be soldered so that wicking is not a problem.
4. Connect all holes to the internal ground plane.
5. When connecting these holes to the ground plane, do not use the typical web or spoke via connection
methodology. Web connections have a high thermal-resistance connection that is useful for slowing the heat
transfer during soldering operations. This makes the soldering of vias that have plane connections easier. In
this application, however, low thermal resistance is desired for the most efficient heat transfer. Therefore, the
holes under the THS403xDGN package should connect to the internal ground plane with a complete
connection around the entire circumference of the plated-through hole.
6. The top-side solder mask should leave the terminals of the package and the thermal pad area with its five
holes exposed. The bottom-side solder mask should cover the five holes of the thermal pad area, which
prevents solder from being pulled away from the thermal pad area during the reflow process.
7. Apply solder paste to the exposed thermal pad area and to all the IC terminals.
8. With these preparatory steps in place, the THS403xDGN IC is simply placed in position and run through the
solder reflow operation as any standard surface-mount component. This results in a part that is properly
installed.
= Absolute maximum operating junction temperature (125°C)
T
A
= Free-ambient air temperature (°C)
θ
JA
= θ
JC
+θ
CA
θ
JC
= Thermal coefficient from junction to case
θ
CA
= Thermal coefficient from case to ambient air (°C/W)
MAXIMUMPOWERDISSIPATION
AMBIENTTEMPERATURE
vs
0
0.5
1
1.5
2
2.5
3
-40-20020406080100
TA-Free AirTemperature-°C
MaximumPowerDissipation-W
DGNPackage
=58.4ºC/W2oz.
TraceandCopperPad
WithSolder
q
JA
T =130ºC
J
DGNPackage
=158.4ºC/W2oz.
TraceandCopperPad
WithoutSolder
q
JA
SOICPackage
High-KTestPCB
=98ºC/Wq
JA
SOICPackage
High-KTestPCB
=166.7ºC/Wq
JA
THS4031
THS4032
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The actual thermal performance achieved with the THS403xDGN in its PowerPAD™ package depends on the
application. In the example above, if the size of the internal ground plane is approximately 3 inches × 3 inches
(7,62 cm × 7,62 cm), then the expected thermal coefficient, qJA, is about 58.4°C/W. For comparison, the
non-PowerPAD™ version of the THS403x IC (SOIC) is shown. For a given qJA, the maximum power dissipation
is shown in Figure 62 and is calculated by the following formula:
(3)
Results are with no air flow and PCB size = 3”× 3” (7,62 cm x 7,62 cm)
Figure 62. Maximum Power Dissipation vs Free-Air Temperature
More complete details of the PowerPAD installation process and thermal management techniques can be found
in the Texas Instruments technical brief, PowerPAD™ Thermally-Enhanced Package (SLMA002). This document
can be found at the TI web site (www.ti.com) by searching on the key word PowerPAD. The document can also
be ordered through your local TI sales office. Refer to literature number SLMA002 when ordering.
The next thing to be considered is package constraints. The two sources of heat within an amplifier are quiescent
power and output power. The designer should never forget about the quiescent heat generated within the device,
especially multiamplifier devices. Because these devices have linear output stages (Class A-B), most of the heat
dissipation is at low output voltages with high output currents. Figure 63 to Figure 66 shows this effect, along with
the quiescent heat, with an ambient air temperature of 50°C. When using VCC= ±5 V, heat is generally not a
problem, even with SOIC packages. But, when using VCC= ±15 V, the SOIC package is severely limited in the
amount of heat it can dissipate. The other key factor when looking at these graphs is how the devices are
mounted on the PCB. The PowerPAD™ devices are extremely useful for heat dissipation. But, the device should
always be soldered to a copper plane to fully use the heat dissipation properties of the PowerPAD™. The SOIC
package, on the other hand, is highly dependent on how it is mounted on the PCB. As more trace and copper
area is placed around the device, qJAdecreases and the heat dissipation capability increases. The currents and
voltages shown in these graphs are for the total package. For the dual amplifier package (THS4032), the sum of
the RMS output currents and voltages should be used to choose the proper package.
An evaluation board is available for the THS4031 (literature number SLOP203) and THS4032 (literature number
SLOP135). This board has been configured for very low parasitic capacitance in order to realize the full
performance of the amplifier. A schematic of the evaluation board is shown in Figure 67. The circuitry has been
designed so that the amplifier may be used in either an inverting or noninverting configuration. For more
information, refer to the THS4031 EVM User's Guide (SLOU038) or the THS4032 EVM User's Guide (SLOU039).
To order the evaluation board, contact your local TI sales office or distributor.
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
Changes from Revision F (September, 2008) to Revision GPage
•Changed units for input voltage noise parameter (+25°C specifications) from nA/√Hz to nV√Hz ....................................... 4
•Changed units for input voltage noise parameter (full range of TAspecifications) from nA/√Hz to nV√Hz .......................... 6
Changes from Revision E (June, 2007) to Revision FPage
•Deleted bullet point for Stable in Gain of 2 (–1) or greater ................................................................................................... 1
•Editorial changes to paragraph format ................................................................................................................................ 28
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in
a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.
(2)
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check
http://www.ti.com/productcontent for the latest availability information and additional product content details.
TBD: The Pb-Free/Green conversion plan has not been defined.
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS
compatible) as defined above.
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)
(3)
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder
temperature.
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take
Addendum-Page 2
PACKAGE OPTION ADDENDUM
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www.ti.com3-Mar-2010
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited
information may not be available for release.
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI
to Customer on an annual basis.
OTHER QUALIFIED VERSIONS OF THS4031, THS4031M, THS4032 :
Enhanced Product: THS4032-EP
•
NOTE: Qualified Version Definitions:
Enhanced Product - Supports Defense, Aerospace and Medical Applications
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. This package can be hermetically sealed with a ceramic lid using glass frit.
D. Index point is provided on cap for terminal identification.
E. Falls within MIL STD 1835 GDIP1-T8
0.130 (3,30) MIN
0°–15°
0.014 (0,36)
0.008 (0,20)
4040107/C 08/96
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
MECHANICAL DATA
查询"THS4031M"供应商
FK (S-CQCC-N**) LEADLESS CERAMIC CHIP CARRIER
28 TERMINAL SHOWN
MLCC006B – OCTOBER 1996
A SQ
B SQ
19
20
22
23
24
25
21
1282627
12
131415161817
0.020 (0,51)
0.010 (0,25)
MIN
0.342
(8,69)
0.442
0.640
0.739
0.938
1.141
A
0.358
(9,09)
0.458
(11,63)
0.660
(16,76)
0.761
(19,32)(18,78)
0.962
(24,43)
1.165
(29,59)
NO. OF
TERMINALS
**
11
10
9
8
7
6
5
432
20
28
44
52
68
84
0.020 (0,51)
0.010 (0,25)
(11,23)
(16,26)
(23,83)
(28,99)
MINMAX
0.307
(7,80)
0.406
(10,31)
0.495
(12,58)
0.495
(12,58)
0.850
(21,6)
1.047
(26,6)
0.080 (2,03)
0.064 (1,63)
B
MAX
0.358
(9,09)
0.458
(11,63)
0.560
(14,22)
0.560
(14,22)
0.858
(21,8)
1.063
(27,0)
0.055 (1,40)
0.045 (1,14)
0.028 (0,71)
0.022 (0,54)
0.050 (1,27)
NOTES: A. All linear dimensions are in inches (millimeters).
B. This drawing is subject to change without notice.
C. This package can be hermetically sealed with a metal lid.
D. The terminals are gold plated.
E. Falls within JEDEC MS-004
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
0.045 (1,14)
0.035 (0,89)
0.045 (1,14)
0.035 (0,89)
4040140/D 10/96
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