Texas Instruments THS10064CDAR, THS10064IDA, THS10064CDA, THS10064IDAR Datasheet

THS10064
10-BIT 6 MSPS, SIMULTANEOUS SAMPLING
ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
features
Simultaneous Sampling of 4 Single-Ended Signals or 2 Differential Signals or Combination of Both
Integrated 16-Word FIFO
Signal-to-Noise and Distortion Ratio: 59 dB at f
I
= 2 MHz
Differential Nonlinearity Error: ±1 LSB
Integral Nonlinearity Error: ±1 LSB
Auto-Scan Mode for 2, 3, or 4 Inputs
3-V or 5-V Digital Interface Compatible
Low Power: 216 mW Max
5-V Analog Single Supply Operation
Internal Voltage References . . . 50 PPM/°C and ±5% Accuracy
Parallel µC/DSP Interface
applications
Radar Applications
Communications
Control Applications
High-Speed DSP Front-End
Automotive Applications
description
The THS10064 is a CMOS, low-power, 10-bit, 6 MSPS analog-to-digital converter (ADC). The speed, resolution, bandwidth, and single-supply operation are suited for applications in radar, imaging, high-speed acquisition, and communications. A multistage pipelined architecture with output error correction logic provides for no missing codes over the full operating temperature range. Internal control registers are used to program the ADC into the desired mode. The THS10064 consists of four analog inputs, which are sampled simultaneously . These inputs can be selected individually and configured to single-ended or differential inputs. An integrated 16 word deep FIFO allows the storage of data in order to improve data transfers to the processor. Internal reference voltages for the ADC (1.5 V and 3.5 V) are provided.
An external reference can also be chosen to suit the dc accuracy and temperature drift requirements of the application. Two different conversion modes can be selected. In single conversion mode, a single and simultaneous conversion of up to four inputs can be initiated by using the single conversion start signal (CONVST
). The conversion clock in single conversion mode is generated internally using a clock oscillator circuit. In continuous conversion mode, an external clock signal is applied to the CONV_CLK input of the THS10064. The internal clock oscillator is switched off in continuous conversion mode.
The THS10064C is characterized for operation from 0°C to 70°C, and the THS10064I is characterized for operation from –40°C to 85°C.
Copyright 1999, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16
32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17
D0 D1 D2 D3 D4 D5
BV
DD
BGND
D6 D7 D8
D9 RA0 RA1
CONV_CLK (CONVST
)
DATA_AV
AINP AINM BINP BINM REFIN REFOUT REFP REFM AGND AV
DD
CS0 CS1 WR
(R/W) RD DV
DD
DGND
DA (TSSOP) PACKAGE
(TOP VIEW)
THS10064 10-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
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POST OFFICE BOX 655303 DALLAS, TEXAS 75265
AVAILABLE OPTIONS
PACKAGED DEVICE
T
A
TSSOP
(DA)
0°C to 70°C THS10064CDA
–40°C to 85°C THS10064IDA
functional block diagram
Logic
and
Control
10 Bit
Pipeline
ADC
S/H
S/H
S/H
S/H
Single Ended and/or
Differential
MUX
+
V
REFP
V
REFM
1.5 V
3.5 V
1.225 V REF
FIFO
16 × 10
10
10
Buffers
2.5 V
Control
Register
AV
DD
DV
DD
AGND DGND
REFOUT
DATA_AV
BV
DD
D0 D1
D2 D3 D4 D5
D6 D7 D8 D9 RA0 RA1
BGND
REFP
REFM
AINP
AINM
BINP
BINM
CONV_CLK (CONVST
) CS0 CS1
RD
WR (R/W)
REFIN
THS10064
10-BIT 6 MSPS, SIMULTANEOUS SAMPLING
ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME NO.
I/O
DESCRIPTION
AINP 32 I Analog input, single-ended or positive input of differential channel A AINM 31 I Analog input, single-ended or negative input of differential channel A BINP 30 I Analog input, single-ended or positive input of differential channel B BINM 29 I Analog input, single-ended or negative input of differential channel B AV
DD
23 I Analog supply voltage AGND 24 I Analog ground BV
DD
7 I Digital supply voltage for buffer BGND 8 I Digital ground for buffer CONV_CLK (CONVST) 15 I Digital input. This input is used to apply an external conversion clock in continuous conversion
mode. In single conversion mode, this input functions as the conversion start (CONVST
) input. A high to low transition on this input holds simultaneously the selected analog input channels and initiates a single conversion of all selected analog inputs.
CS0 22 I Chip select input (active low) CS1 21 I Chip select input (active high) DATA_AV 16 O Data available signal, which can be used to generate an interrupt for processors and as a level
information of the internal FIFO. This signal can be configured to be active low or high and can be configured as a static level or pulse output. See Table 14.
DGND 17 I Digital ground. Ground reference for digital circuitry. DV
DD
18 I Digital supply voltage D0 – D9 1–6, 9–12 I/O/Z Digital input, output; D0 = LSB RA0 13 I Digital input. RA0 is used as an address line for the control register . This is required for writing
to the control register 0 and control register 1. See Table 8.
RA1 14 I Digital input. RA1 is used as an address line for the control register . This is required for writing
to control register 0 and control register 1. See Table 8.
REFIN 28 I Common-mode reference input for the analog input channels. It is recommended that this pin
be connected to the reference output REFOUT.
REFP 26 I Reference input, requires a bypass capacitor of 10 µF to AGND in order to bypass the internal
reference voltage. An external reference voltage at this input can be applied. This option can be programmed through control register 0. See Table 9.
REFM 25 I Reference input, requires a bypass capacitor of 10 µF to AGND in order to bypass the internal
reference voltage. An external reference voltage at this input can be applied. This option can be programmed through control register 0. See Table 9.
REFOUT 27 O Analog fixed reference output voltage of 2.5 V. Sink and source capability of 250 µA. The
reference output requires a capacitor of 10 µF to AGND for filtering and stability .
RD
19 I The RD input is used only if the WR input is configured as a write only input. In this case, it is a
digital input, active low as a data read select from the processor. See timing section.
WR (R/W)
20 I This input is programmable. It functions as a read-write input R/W and can also be configured
as a write-only input WR
, which is active low and used as data write select from the processor.
In this case, the RD
input is used as a read input from the processor. See timing section.
The start-conditions of RD
and WR (R/W) are unknown. The first access to the ADC has to be a write access to initialize the ADC.
THS10064 10-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTER
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absolute maximum ratings over operating free-air temperature (unless otherwise noted)
Supply voltage range, DGND to DVDD –0.3 V to 6.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
BGND to BVDD –0.3 V to 6.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
AGND to AV
DD
–0.3 V to 6.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Analog input voltage range AGND – 0.3 V to AVDD + 1.5 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Reference input voltage –0.3 + AGND to AVDD + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Digital input voltage range –0.3 V to BVDD/DVDD + 0.3 V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating virtual junction temperature range, TJ –40°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Operating free-air temperature range,T
A
THS10064C 0°C to 70°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
THS10064I –40°C to 85°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range, T
stg
–65°C to 150°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
recommended operating conditions
power supply
MIN NOM MAX UNIT
AV
DD
4.75 5 5.25
Supply voltage
DV
DD
3 3.3 5.25
V
BV
DD
3 3.3 5.25
analog and reference inputs
MIN NOM MAX UNIT
Analog input voltage in single-ended configuration V
REFM
V
REFP
V Common-mode input voltage VCM in differential configuration 1 2.5 4 V External reference voltage,V
REFP
(optional) 3.5 AVDD–1.2 V
External reference voltage, V
REFM
(optional) 1.4 1.5 V
Input voltage difference, REFP – REFM 2 V
digital inputs
MIN NOM MAX UNIT
p
BVDD = 3.3 V 2 V
High-level input voltage, V
IH
BVDD = 5.25 V 2.6 V
p
BVDD = 3.3 V 0.6 V
Low-level input voltage, V
IL
BVDD = 5.25 V 0.6 V Input CONV_CLK frequency DVDD = 3 V to 5.25 V 0.1 6 MHz CONV_CLK pulse duration, clock high, t
w(CONV_CLKH)
DVDD = 3 V to 5.25 V 80 83 5000 ns CONV_CLK pulse duration, clock low, t
w(CONV_CLKL)
DVDD = 3 V to 5.25 V 80 83 5000 ns
p
p
THS10064CDA 0 70
°
Operating free-air temperature, T
A
THS10064IDA –40 85
°C
THS10064
10-BIT 6 MSPS, SIMULTANEOUS SAMPLING
ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
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POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics over recommended operating conditions, DVDD = 3.3 V , A VDD = 5 V , V
REF
= internal (unless otherwise noted)
digital specifications
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Digital inputs
I
IH
High-level input current DVDD = digital inputs –50 50 µA
I
IL
Low-level input current Digital input = 0 V –50 50 µA
C
i
Input capacitance 5 pF
Digital outputs
V
OH
High-level output voltage I
OH
= –50 µA, BVDD = 3.3 V, 5 V BVDD–0.5 V
V
OL
Low-level output voltage I
OL
= 50 µA, BVDD = 3.3 V, 5 V 0.4 V
I
OZ
High-impedance-state output current CS1 = DGND, CS0 = DV
DD
–10 10 µA
C
O
Output capacitance 5 pF
C
L
Load capacitance at databus D0 – D11 30 pF
THS10064 10-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
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electrical characteristics over recommended operating conditions, AVDD = 5 V, DV
DD
= BVDD = 3.3 V, fs = 6 MSPS, V
REF
= internal (unless otherwise noted) (continued)
dc specifications
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Resolution 10 Bits
Accuracy
Integral nonlinearity, INL ±1 LSB Differential nonlinearity , DNL ±1 LSB
After calibration in single-ended mode –15 15 mV
Offset error
After calibration in differential mode –5 5 mV
Gain error 1% FSR
Analog input
Input capacitance 15 pF Input leakage current V
AIN
= V
REFM
to V
REFP
±10 µA
Internal voltage reference
Accuracy, V
REFP
3.33 3.5 3.67 V
Accuracy, V
REFM
1.42 1.5 1.58 V T emperature coef ficient 50 PPM/°C Reference noise 100 µV Accuracy, REFOUT 2.475 2.5 2.525 V
Power supply
I
DDA
Analog supply current AVDD =5 V, BVDD = DVDD = 3.3 V 36 40 mA
I
DDD
Digital supply voltage AVDD = 5 V, BVDD = DVDD = 3.3 V 0.5 1 mA
I
DDB
Buffer supply voltage AVDD = 5 V, BVDD = DVDD = 3.3 V 1.5 4 mA
I
DD_P
Supply current in power-down mode AVDD = 5 V, BVDD = DVDD = 3.3 V 7 mA Power dissipation AVDD = 5 V, DVDD = BVDD = 3.3 V 186 216 mW Power dissipation in power down AVDD = 5 V, DVDD = BVDD = 3.3 V 30 mW
THS10064
10-BIT 6 MSPS, SIMULTANEOUS SAMPLING
ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
electrical characteristics over recommended operating conditions, V
REF
= internal, fs = 6 MHz,
f
I
= 2 MHz at –1dBFS (unless otherwise noted) (continued)
ac specifications, AVDD = 5 V, BVDD = DVDD = 3.3 V, CL < 30 pF
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Differential mode 56 59 dB
SINAD Signal-to-noise ratio + distortion
Single-ended mode (see Note 1)
59 dB
Differential mode 59 61 dB
SNR Signal-to-noise ratio
Single-ended mode (see Note 1)
60 dB
Differential mode –67 –61 dB
THD
T otal harmonic distortion
Single-ended mode –67 dB Differential mode 9 9.6 Bits
ENOB
(SNR)
Effective number of bits
Single-ended mode (see Note 1)
9.5 Bits
p
Differential mode 61 68 dB
SFDR
Spurious free dynamic range
Single-ended mode 68 dB
Analog Input
Full-power bandwidth with a source impedance of 150 in differential configuration.
Full scale sinewave, –3 dB 96 MHz
Full-power bandwidth with a source impedance of 150 in single-ended configuration.
Full scale sinewave, –3 dB 54 MHz
Small-signal bandwidth with a source impedance of 150 in differential configuration.
100 mVpp sinewave, –3 dB 96 MHz
Small-signal bandwidth with a source impedance of 150 in single-ended configuration.
100 mVpp sinewave, –3 dB 54 MHz
NOTE 1: The SNR (ENOB) and SINAD is degraded typically by 2 dB in single-ended mode when the reading of data is asynchronous to the
sampling clock.
THS10064 10-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
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POST OFFICE BOX 655303 DALLAS, TEXAS 75265
timing specifications, AV
DD
= 5 V, BVDD = DVDD = 3.3 V, V
REF
= internal, CL < 30 pF
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
d(DATA_AV)
Delay time 5 ns
t
d(o)
Delay time 5 ns
t
pipe
Latency 5
CONV
CLK
timing specification of the single conversion mode
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
t
c
Clock cycle of the internal clock oscillator 159 167 175 ns
t
w1
Pulse width, CONVST 1.5×t
c
ns
t
dA
Aperture time 1 ns
1 analog input 2×t
c
2 analog inputs 3×t
c
ns
t2Time between consecutive start of single conversion
3 analog inputs 4×t
c
4 analog inputs 5×t
c
ns
1 analog input, TL = 1 6×t
c
Delay time, DATA_AV becomes active for the trigger
2 analog inputs, TL = 2 7×t
c
ns
y, _ gg
level condition: TRIG0 = 0, TRIG1 = 0
3 analog inputs, TL = 3 8×t
c
4 analog inputs, TL = 4 9×t
c
ns
1 analog input, TL = 4 3×t2 +6×t
c
Delay time, DATA_AV becomes active for the trigger
2 analog inputs, TL = 4 t2 +7×t
c
ns
t
d(DATA_AV)
y, _ gg
level condition: TRIG0 = 1, TRIG1 = 0
3 analog inputs, TL = 6 t2 +8×t
c
4 analog inputs, TL = 8 t2 +9×t
c
ns
1 analog input, TL = 8 7×t2 +6×t
c
Delay time, DATA_AV becomes active for the trigger
2 analog inputs, TL = 8 3×t2 +7×t
c
ns
y, _ gg
level condition: TRIG0 = 0, TRIG1 = 1
3 analog inputs, TL = 9 2×t2 +8×t
c
4 analog inputs, TL = 12 2×t2 +9×t
c
ns
1 analog input, TL = 14 13×t2 +6×t
c
t
d(DATA_AV)
Delay time, DATA_AV becomes active for the trigger
2 analog inputs, TL = 12 5×t2 +7×t
c
ns
(
_
)
level condition: TRIG0 = 1, TRIG1 = 1
3 analog inputs, TL = 12 3×t2 +8×t
c
ns
Timing parameters are ensured by design but are not tested.
THS10064
10-BIT 6 MSPS, SIMULTANEOUS SAMPLING
ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
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POST OFFICE BOX 655303 DALLAS, TEXAS 75265
detailed description
reference voltage
The THS10064 has a built-in reference, which provides the reference voltages for the ADC. VREFP is set to
3.5 V and VREFM is set to 1.5 V . An external reference can also be used through two reference input pins, REFP and REFM, if the reference source is programmed as external. The voltage levels applied to these pins establish the upper and lower limits of the analog inputs to produce a full-scale and zero-scale reading respectively.
analog inputs
The THS10064 consists of 4 analog inputs, which are sampled simultaneously . These inputs can be selected individually and configured as single-ended or differential inputs. The desired analog input channel can be programmed.
analog-to-digital converter
The THS10064 uses a 10-bit pipelined multistaged architecture with 4 1-bit stages followed by 4 2-bit stages, which achieves a high sample rate with low power consumption. The THS10064 distributes the conversion over several smaller ADC sub-blocks, refining the conversion with progressively higher accuracy as the device passes the results from stage to stage. This distributed conversion requires a small fraction of the number of comparators used in a traditional flash ADC. A sample-and-hold amplifier (SHA) within each of the stages permits the first stage to operate on a new input sample while the second through the eighth stages operate on the seven preceding samples.
conversion modes
The conversion can be performed in two different conversion modes. In the single conversion mode, the conversion is initiated by an external signal (CONVST). An internal oscillator controls the conversion time. In the continuous conversion mode, an external clock signal is applied to the clock input (CONV_CLK). A new conversion is started with every falling edge of the applied clock signal.
sampling rate
The maximum possible conversion rate per channel is dependent on the selected analog input channels. T able 1 shows the maximum conversion rate in the continuous conversion mode for different combinations.
Table 1. Maximum Conversion Rate in Continuous Conversion Mode
CHANNEL CONFIGURATION
NUMBER OF
CHANNELS
MAXIMUM CONVERSION
RATE PER CHANNEL
1 single-ended channel 1 6 MSPS 2 single-ended channels 2 3 MSPS 3 single-ended channels 3 2 MSPS 4 single-ended channels 4 1.5 MSPS 1 differential channel 1 6 MSPS 2 differential channels 2 3 MSPS 1 single-ended and 1 differential channel 2 3 MSPS 2 single-ended and 1 differential channels 3 2 MSPS
The maximum conversion rate in the continuous conversion mode per channel, fc, is given by:
fc
+
6 MSPS
# channels
Table 2 shows the maximum conversion rate in the single conversion mode.
THS10064 10-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTER
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sampling rate (continued)
Table 2. Maximum Conversion Rate in Single Conversion Mode
CHANNEL CONFIGURATION
NUMBER OF
CHANNELS
MAXIMUM CONVERSION
RATE PER CHANNEL
1 single-ended channel 1 3 MSPS 2 single-ended channels 2 2 MSPS 3 single-ended channels 3 1.5 MSPS 4 single-ended channels 4 1.2 MSPS 1 differential channel 1 3 MSPS 2 differential channels 2 2 MSPS 1 single-ended and 1 differential channel 2 1.5 MSPS 2 single-ended and 1 differential channels 3 1.2 MSPS
single conversion mode
In single conversion mode, a single conversion of the selected analog input channels is performed. The single conversion mode is selected by setting bit 1 of control register 0 to 1.
A single conversion is initiated by pulsing the CONVST input. On the falling edge of CONVST, the sample and hold stages of the selected analog inputs are placed into hold simultaneously, and the conversion sequence for the selected channels is started.
The conversion clock in single conversion mode is generated internally using a clock oscillator circuit. The signal DATA_AV (data available) becomes active when the trigger level is reached and indicates that the converted sample(s) is (are) written into the FIFO and can be read out. The trigger level in the single conversion mode can be selected according to Table 13.
Figure 1 shows the timing of the single conversion mode. In this mode, up to four analog input channels can be selected to be sampled simultaneously (see Table 2).
CONVST
AIN
Sample N
t
1
t
1
t
d(A)
t
2
t
DATA_AV
DATA_AV,
Trigger Level = 1
Figure 1. Timing of Single Conversion Mode
The time (t2) between consecutive starts of single conversions is dependent on the number of selected analog input channels. The time t
DATA_AV
, until DA TA_AV becomes active is given by: t
DATA_AV
= t
pipe
+ n × tc. This equation is valid for a trigger level which is equivalent to the number of selected analog input channels. For all other trigger level conditions refer to the timing specifications of single conversion mode.
THS10064
10-BIT 6 MSPS, SIMULTANEOUS SAMPLING
ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
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POST OFFICE BOX 655303 DALLAS, TEXAS 75265
continuous conversion mode
The internal clock oscillator used in the single-conversion mode is switched off in continuous conversion mode. In continuous conversion mode, (bit 1 of control register 0 set to 0) the ADC operates with a free running external clock signal CONV_CLK. With every rising edge of the CONV_CLK signal a new converted value is written into the FIFO. The first conversion value is written into the FIFO with a latency of 8 + TL (trigger level) clock cycles after the FIFO reset.
Figure 2 shows the timing of continuous conversion mode when one analog input channel is selected. The maximum throughput rate is 6 MSPS in this mode. The timing of the DA T A_A V signal is shown here in the case of a trigger level set to 1 or 4.
Sample N Channel 1
Sample N+1
Channel 1
Sample N+2
Channel 1
Sample N+3
Channel 1
Sample N+4
Channel 1
Sample N+5
Channel 1
Sample N+6
Channel 1
Sample N+7
Channel 1
Sample N+8
Channel 1
Data N–5
Channel 1
Data N–4
Channel 1
Data N–3
Channel 1
Data N–2
Channel 1
Data N–1
Channel 1
Data N
Channel 1
Data N+1
Channel 1
Data N+2
Channel 1
Data N+3 Channel 1
t
d(A)
t
w(CONV_CLKH)
t
w(CONV_CLKL)
t
c
t
d(O)
t
d(DATA_AV)
t
d(DATA_AV)
AIN
CONV_CLK
Data Into
FIFO
DATA_AV,
Trigger Level = 1
DATA_AV,
Trigger Level = 4
t
d(pipe)
50% 50%
Figure 2. Timing of Continuous Conversion Mode (1-channel operation)
Figure 3 shows the timing of continuous conversion mode when two analog input channels are selected. The maximum throughput rate per channel is 3 MSPS in this mode. The data flow in the bottom of the figure shows the order the converted data is written into the FIFO. The timing of the DA TA_A V signal shown here is for a trigger level set to 2 or 4.
AIN
CONV_CLK
Data Into
FIFO
DATA_AV,
Trigger Level = 2
DATA_AV,
Trigger Level = 4
Data N–3
Channel 2
Data N–2
Channel 1
Data N–2
Channel 2
Data N–1
Channel 1
Data N–1
Channel 2
Data N
Channel 1
Data N
Channel 2
Data N+1
Channel 1
Data N+1
Channel 2
t
d(DATA_AV)
t
w(CONV_CLKH)
t
w(CONV_CLKL)
t
d(A)
Sample N
Channel 1,2
Sample N+1
Channel 1,2
Sample N+2 Channel 1,2
Sample N+3 Channel 1,2
Sample N+4 Channel 1,2
t
c
t
d(O)
t
d(Pipe)
t
d(DATA_AV)
50% 50%
Figure 3. Timing of Continuous Conversion Mode (2-channel operation)
THS10064 10-BIT 6 MSPS, SIMULTANEOUS SAMPLING ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
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POST OFFICE BOX 655303 DALLAS, TEXAS 75265
continuous conversion mode (continued)
Figure 4 shows the timing of continuous conversion mode when three analog input channels are selected. The maximum throughput rate per channel is 2 MSPS in this mode. The data flow in the bottom of the figure shows in which order the converted data is written into the FIFO. The timing of the DA TA_AV signal shown here is for a trigger level set to 3.
AIN
CONV_CLK
Data Into
FIFO
DATA_AV,
Trigger Level = 3
t
d(DATA_AV)
Sample N
Channel 1,2,3
Sample N+1
Channel 1,2,3
Sample N+2
Channel 1,2,3
t
d(O)
Data N–2 Channel 2
Data N–2
Channel 3
Data N–1
Channel 1
Data N–1
Channel 2
Data N–1
Channel 3
Data N
Channel 1
Data N
Channel 2
Data N
Channel 3
t
c
t
d(A)
t
w(CONV_CLKH)
t
w(CONV_CLKL)
t
d(Pipe)
50% 50%
Figure 4. Timing of Continuous Conversion Mode (3-channel operation)
Figure 5 shows the timing of continuous conversion mode when four analog input channels are selected. The maximum throughput rate per channel is 1.5 MSPS in this mode. The data flow in the bottom of the figure shows in which order the converted data is written into the FIFO. The timing of the DA TA_AV signal shown here is for a trigger level of 4.
AIN
CONV_CLK
Data Into
FIFO
DATA_AV,
Trigger Level = 4
t
w(CONV_CLKH)
Sample N
Channel 1,2,3,4
Sample N+1
Channel 1,2,3,4
Sample N+2
Channel 1,2,3,4
t
d(Pipe)
t
w(CONV_CLKL)
t
c
t
d(O)
Data N–2
Channel 4
Data N–1
Channel 1
Data N–1 Channel 2
Data N–1 Channel 3
Data N–1
Channel 4
Data N
Channel 1
Data N
Channel 2
Data N
Channel 3
Data N
Channel 4
t
d(DATA_AV)
t
d(A)
50% 50%
Figure 5. Timing of Continuous Conversion Mode (4-channel operation)
THS10064
10-BIT 6 MSPS, SIMULTANEOUS SAMPLING
ANALOG-TO-DIGITAL CONVERTER
SLAS255 – DECEMBER 1999
13
POST OFFICE BOX 655303 DALLAS, TEXAS 75265
digital output data format
The digital output data format of the THS10064 can either be in binary format or in two’s complement format. The following tables list the digital outputs for the analog input voltages.
Table 3. Binary Output Format for Single-Ended Configuration
SINGLE-ENDED, BINARY OUTPUT
ANALOG INPUT VOLTAGE DIGITAL OUTPUT CODE
AIN = V
REFP
3FFh
AIN = (V
REFP
+ V
REFM
)/2 200h
AIN = V
REFM
000h
Table 4. Two’s Complement Output Format for Single-Ended Configuration
SINGLE-ENDED, TWOS COMPLEMENT
ANALOG INPUT VOLTAGE DIGITAL OUTPUT CODE
AIN = V
REFP
1FFh
AIN = (V
REFP
+ V
REFM
)/2 000h
AIN = V
REFM
200h
Table 5. Binary Output Format for Differential Configuration
DIFFERENTIAL, BINARY OUTPUT
ANALOG INPUT VOLTAGE DIGITAL OUTPUT CODE
Vin = AINP – AINM
V
REF
= V
REFP
– V
REFM
Vin = V
REF
3FFh Vin = 0 200h Vin = –V
REF
000h
Table 6. Two’s Complement Output Format for Differential Configuration
DIFFERENTIAL, BINARY OUTPUT
ANALOG INPUT VOLTAGE DIGITAL OUTPUT CODE
Vin = AINP – AINM
V
REF
= V
REFP
– V
REFM
Vin = V
REF
1FFh Vin = 0 000h Vin = –V
REF
200h
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