Texas Instruments CY74FCT191CTSOCT, CY74FCT191CTSOC, CY74FCT191CTQCT, CY74FCT191CTQC, CY74FCT191ATSOCT Datasheet
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4-Bit Up/Down Binary Counter
CY74FCT191T
SCCS016 - May 1994 - Revised February 2000
Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.
Copyright © 2000, Texas Instruments Incorporated
Features
• Function, pinout, and drive compatible with FCT and F
logic
• FCT-C speed at 6.2 ns max,
FCT-A speed at 7.8 ns max.
• Reduced V
OH
(typically = 3.3V) versions of equivalent
FCT functions
• Edge-rate control circuitry for significantly improved
noise characteristics
• Power-off disable permits live insertion
• ESD > 2000V
• Matched rise and fall times
• Sink current 64 mA
Source current 32 mA
Functional Description
The FCT191T is a reversible modulo-16 binary counter,
featuringsynchronouscountingandasynchronouspresetting.
The preset allows the FCT191T to be used in programmable
dividers. The count enable input, terminal count output, and ripple
clock output make possible a variety of methods of implementing
multiusage counters. In the counting modes, state changes are
initiated by the rising edge of the clock.
The outputs are designed with a power-off disable feature to
allow for live insertion of boards.
Logic Block Diagram
CP
RC Q
0
J
Q
CLOCK
PRESET
K
CLEAR
Q
J
Q
CLOCK
PRESET
K
CLEAR
Q
J
Q
CLOCK
PRESET
K
CLEAR
Q
J
Q
CLOCK
PRESET
K
CLEAR
Q
Q
1
Q
2
Q
3
TC
CEP
0
P
1
P
2
P
3
PLU/D
Pin Configurations
1
2
3
4
5
6
7
8
Q
1
Q
0
CE
U/D
Q
2
Q
3
V
CC
GND
Top View
SOIC/QSOP
16
15
14
13
12
11
10
9
P
1
PL
P
2
P
3
P
0
CP
RC
TC
Pin Description
Name Description
CE Count Enable Input (Active LOW)
CP Clock Pulse Input (Active Rising Edge)
P Parallel Data Inputs
PL Asynchronous Parallel Load Input (Active LOW)
U/D Up/Down Count Control Input
Q Flip-Flop Outputs
RC Ripple Clock Output (Active LOW)
TC Terminal Count Output
RC Function Table
[1]
Inputs Outputs
CE CP T
[2]
RC
L
H
X
X
X
H
X
L
H
H
CY74FCT191T
2
Maximum Ratings
[3, 4]
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–65°C to +135°C
Supply Voltage to Ground Potential............... –0.5V to +7.0V
DC Input Voltage ........................................... –0.5V to +7.0V
DC Output Voltage......................................... –0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ......120 mA
Power Dissipation..........................................................0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Notes:
1. H = HIGH Voltage Level, L = LOW Voltage Level, X = Don‘t Care,
= LOW-to-HIGH clock transition. =Low Pulse.
2. TC is generated internally.
Mode Select
[1]
Inputs
PL CE U/D CP Mode
H
H
L
H
L
L
X
H
L
H
X
X
X
X
Count Up
Count Down
Preset (Asynchronous)
No Change (Hold)
RC Function Table
[1]
Inputs Outputs
CE CP T
[2]
RC
Operating Range
Range
Ambient
Temperature V
CC
Commercial –40°C to +85°C 5V ± 5%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
[5]
Max. Unit
V
OH
Output HIGH Voltage VCC=Min., IOH=–32 mA 2.0 V
VCC=Min., IOH=–15 mA 2.4 3.3 V
V
OL
Output LOW Voltage VCC=Min., IOL=64 mA 0.3 0.55 V
V
IH
Input HIGH Voltage 2.0 V
V
IL
Input LOW Voltage 0.8 V
V
H
Hysteresis
[6]
All inputs 0.2 V
V
IK
Input Clamp Diode Voltage VCC=Min., IIN=–18 mA –0.7 –1.2 V
I
I
Input HIGH Current VCC=Max., VIN=V
CC
5 µA
I
IH
Input HIGH Current VCC=Max., VIN=2.7V ±1 µA
I
IL
Input LOW Current VCC=Max., VIN=0.5V ±1 µA
I
OS
Output Short Circuit Current
[7]
VCC=Max., V
OUT
=0.0V –60 –120 –225 mA
I
OFF
Power-Off Disable VCC=0V, V
OUT
=4.5V ±1 µA
Capacitance
[6]
Parameter Description Typ.
[5]
Max. Unit
C
IN
Input Capacitance 5 10 pF
C
OUT
Output Capacitance 9 12 pF
Notes:
3. Unless otherwise noted, these limits are over the operating free-air temperature range.
4. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
5. Typical values are at VCC=5.0V, TA=+25˚C ambient.
6. This parameter is specified but not tested.
7. Not more than one output should beshorted ata time. Duration ofshort should not exceed one second. The use of high-speedtest apparatus and/or sample
and hold techniques are preferable in order to minimize internal chipheating and more accurately reflect operational values. Otherwiseprolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, IOS tests should be performed last.
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