ST M48T212A User Manual

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NVRAMs
YEAR 2000 COMPLIANT (4-Digit Year)
USES SUPER CAPACITOR or LITHIUM
BATTERY (User Supplied)
BATTERY LOW FLAG
INTEGRATED REAL TIME CLOCK,
POWER-FAIL CONTROL CIRCUIT
AUTOMATIC POWER-FAIL CHIP DESELECT
and WRITE PROTECTION
WATCHDOG T IM E R
WRITE PROTECT VOLTAGES
(V
= Power-fail Deselect Voltage):
PFD
– M48T212A: 2.7V ≤ V
MICROPRO CESSOR POWER-ON RESET
PROG R AMMA BLE ALA R M O U TPUT ACTIVE
in the BATTERY BACKED-UP MODE
PFD
3.0V
M48T212A
3.3V TIMEKEEPER® CONTROLLER
PRELIMINARY DATA
44
1
SOH44 (MH)
Figure 1. Logic Diagram
CC
V
CAP
V
DESCRIPTION
The M48T212A is a se lf-contained device that in­cludes a real time clock (RTC), programmable alarms, a watchdog timer, and two external chip enable outputs which provide control of up to four (two in parallel) external low-power static RAMs.
A built-in 32.768 kHz oscillator (external crystal controlled) is used for the clock/calendar function.
Access to all TIMEKEEPER functions and the ex­ternal RAM is the same as conventional byte-wide SRAM. The 16 TIMEKEEPER Registers offer Century, Year, Month, Date, Day, Hour, Minute, Second, Control, Calibration, Alarm, Watchdog, and Flags. Externally attached static RAMs are controlled by the M48T212A via the E1
signals (see Table 4).
E2
CON
CON
and
Automatic backup and write protection for an ex­ternal SRAM is provided through V and E2
pins. (Users are urged to insure that
CON
OUT
, E1
CON
voltage specifications, for both the controll er chip and external SRAM chosen, are similar).
A0-A3
EX
W
WDI RSTIN1 RSTIN2
X0
XI
4
A E
G
M48T212A
V
SS
V
BAT–
8
DQ0-DQ7
IRQ/FT RST E1
CON
E2
CON
V
CCSW
V
OUT
AI03047
March 2000
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to change without notice.
1/20
M48T212A
Figure 2. SOIC Connections
XI
1 2 3 4 5 6 7 8 9
A
10 11
M48T212A
12 13 14 15 16 17 18 19 20 21 22
RSTIN1 RSTIN2
RST
NC XO EX
NC NC
NC NC NC
A3 A2 A1 A0
WDI
E2
CON
DQ1 DQ2
V
SS
44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23
AI03048
V
CC
V
OUT
V
CCSW
IRQ/FT
NC NC NC NC NC G W V
BAT–
NC E E1
CON
DQ7 DQ6 DQ5DQ0 DQ4 DQ3 V
CAP
Table 1. Signal Names
A0-A3 Address Inputs DQ0-DQ7 Data Inputs/Outputs XO Oscillator Output XI Oscillator Input RSTIN1 RSTIN2 RST WDI Watchdog Input A Bank Select Input E EX G W E1
CON
E2
CON
IRQ
/FT Int/Freq Test Output (Open Drain) Vccsw V
OUT
V
CAP
V
BAT–
V
CC
V
SS
NC Not Connected internally
Reset 1 Input Reset 2 Input Reset Output (Open Drain)
Chip Enable Input External Chip Enable Input Output Enable Input Write Enable Input RAM Chip Enable 1 Output RAM Chip Enable 2 Output
VCC Switch Output Supply Voltage Output Super Capacitor Input Battery Ground Pin (optional) Supply Voltage Ground
The lithium energy source (or super capacitor) used to permanently power the real time clock is also used to retain RAM data in the absence of
power through the V
V
CC
The chip enable outputs to RAM (E1
) are controlled during power transie nts to
E2
CON
OUT
pin.
CON
and
prevent data corruption. The dat e is aut om atically adjusted for months with less than 31 days and corrects for leap years. The internal watchdog tim­er provides programmable alarm windows.
The nine clock bytes (Fh - 9h and 1h) are not the actual clock counters, they are memory locations consisting of BiPORT
TM
read/write memory cells within the static RAM array. Clock circuitry up­dates the clock bytes with current information once per second. The information ca n be accessed by the user in the same manner as any other location in the static memory array.
Byte 8h is the clock control register. This byte con­trols user access to the clock information and also stores the clock calibra tion setting. Byte 7h con-
2/20
tains the watchdog timer setting. The watchdog timer can generate either a reset or an interrupt, depending on the state of the W atchdog Stee ring bit (WDS). Bytes 6h-2h include bits that, when pro­grammed, provide for clock alarm functionality.
Alarms are activated when the register content matches the month, date, hours, minutes, and seconds of the clock registers. Byte 1h contains century information. Byte 0h contains additional flag information pertaining to the watchdog timer, alarm and battery status.
The M48T212A also has its o wn Power-Fail De­tect circuit. This control circuitry constantly moni­tors the supply voltage for an out of tolerance condition. When V
is out of tolerance, the circuit
CC
write pro tect s the TI MEKEEPER regist er data and external SRAM, providing data security in the midst of unpredictable system operat ion. As V
CC
falls, the control circuitry automatically switches to the battery, maintaining data and clock o peration until valid power is restored.
M48T212A
Table 2. Absolute Maximum Ratings
(1)
Symbol Parameter Value Unit
T
A
T
STG
(2)
T
SLD
V
IO
V
CC
I
O
P
D
Note: 1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress
rating only and functional opera tion of the devi ce at these or any other conditions above those i ndi cated in th e operational section of this spec ification is not im plied. Exposure t o the abso lute max imum rat ing cond itions for extende d period s of tim e may affe ct reliability.
2. Soldering temperature not to exceed 260°C for 10 seconds (total thermal budget not to exceed 150°C for longer than 30 seconds).
CAUTION: Negative undershoots below –0.3V are not allowe d on any pin while i n the Batter y Back-up mod e.
Table 3. Operating Modes
Mode
Deselect
Write Read Read
Deselect Deselect
Note: 1. X = VIH or VIL.
2. V
SO
Ambient Operating Temperature 0 to 70 °C
Storage Temperature (VCC Off, Oscillator Off)
–55 to 125 °C Lead Solder Temperature for 10 sec 260 °C Input or Output Voltages –0.3 to 4.6 V
Supply Voltage –0.3 to 4.6 V Output Current 20 mA Power Dissipation 1 W
(1)
V
CC
3.0V to 3.6V
V
to V
SO
PFD
V
SO
= Battery Back-up Swit chover Voltage. (See Ta bl e 7 for details).
(min)
(2)
(2)
E G W DQ7-DQ0 Power
V
IH
V
IL
V
IL
V
IL
X X High-Z Standby X
V
IL
V
IH
V
IL
V
IH
V
IH
D
IN
D
OUT
High-Z Active X X X High-Z CMOS Standby X X X High-Z Battery Back-Up
Active Active
Table 4. Truth Table for SRAM Bank Select
Mode
V
CC
(1)
EX A
E1
CON
E2
CON
Low Low Low High Active
Select
3.0V to 3.6V
Low High High Low Active
Deselect High X High High Standby Deselect
Deselect
Note: 1. X = VIH or VIL.
= Battery Back-up Swit chover Voltage. (See Ta bl e 7 for details).
2. V
SO
to V
V
SO
PFD
V
SO
(min)
(2)
(2)
X X High High CMOS Standby X X High High Battery Back-Up
Power
3/20
M48T212A
Figure 3. Hardware Hookup
A0-A18
3.3V
0.1µF
SuperCap Supply
1N5817
0.1µF
32 kHz Crystal
MOTOROLA MTD20P06HDL
V
CC
E
V
CC
E
A0-Axx
CMOS SRAM
A0-Axx
CMOS SRAM
A0-A3
V
V
CC
(1)
A
E
M48T212A
EX
W
G
WDI
RSTIN1
RSTIN2
DQ0-DQ7
V
CAP
V
SS
CCSW
V
OUT
E1
CON
E2
CON
RST
IRQ/FT
Note 2
X0
XI
Note: 1. See descri ption in Power Suppl y Decouplin g and Undershoot Protection.
2. Trac es connecting E1
Figure 4. AC Testing Load Circuit
CON
and E2
to external SRAM should be as short as possible.
CON
(3,4)
Table 5. AC Measurement Conditions
Input Rise and Fall Times 5ns
DEVICE UNDER
TEST
645
Input Pulse Voltages 0 to 3V Input and Output Timing Ref. Voltages 1.5V
Note that Output Hi-Z is defined as the point where data is no longer driven.
(1)
(2)
1.75V
AI03239
CL includes JIG capacitance
Note: 1. DQ0-DQ7
2. E1
3. Exc l udi ng open-drain output pins
CON
and E2
CON
CL = 100pF or 5pF CL = 30 pF
4/20
AI03049
M48T212A
Table 6. Capacitance
(T
= 25 °C, f = 1 MHz)
A
(1)
Symbol Parameter Test Condition Min Max Unit
C
C
OUT
Note: 1. Sampled only, not 100% tested.
2. Outputs desele ct ed.
Input Capacitance
IN
(2)
Input/Output Capacitance
V
V
OUT
IN
= 0V
= 0V
10 pF 10 pF
Table 7. DC Characteristics
= 0 to 70°C; VCC = 3V to 3.6V)
(T
A
Symbol Parameter Test Condition Min Typ Max Unit
(1,2)
I
LI
I
LO
I
CC
I
CC1
I
CC2
I
BAT
V V
Input Leakage Current
(1)
Output Leakage Curren t Supply Current Outputs Open 4 10 mA Supply Current (Standby) TTL
Supply Current (Standby) CMOS Battery Current OSC ON 575 800 nA Battery Current OSC OFF 100 nA Input Low Voltage –0.3 0.8 V
IL
Input High Voltage 2.0
IH
Output Low Voltage
V
OL
Output Low Voltage (open drain)
V
V
OHB
I
OUT1
I
OUT2
V
PFD
V
V
V
CAP
Note: 1. Outputs deselected.
Output High Voltage
OH
(4)
VOH Battery Back-up I
(5)
V
Current (Active) V
OUT
V
Current (Battery Back-up) V
OUT
Power-fail Deselect Voltage 2.7 2.9 3.0 V Battery Back-up Switchover Voltage
SO
Battery Voltage 3.0 V
BAT
CON
(6)
- E2
CON
Capacitor Voltage
2. RST IN1
3. For I RQ
4. Con di t i oned output s (E1
5. External SRAM must match TIMEKEEPER Controller chip V
6. Whe n fu l l y charged.
and RSTIN2 internally pulled-up to VCC through 100K resistor. WDI internally pulled-down to VSS through 100K resistor. /FT & RST pins (Open Drain).
rents will reduce battery life.
(3)
) can onl y sustain CMOS leakage currents in the battery back-up mode. Hi gher leaka ge cur-
0V V
0V V
OUT
E
= V
E
= V
I
= 2.1mA
OL
IOL = 10mA
I
= –1.0mA
OH
= –1.0µA
OUT2
> VCC –0.3
OUT1
> V
OUT2
V
IN
CC
V
IH
–0.2
CC
–0.3
BA T
specification.
CC
CC
±1 µA ±1 µA
3mA 2mA
V
+ 0.3
CC
0.4 V
0.4 V
2.4 V
2.0 3.6 V 70 mA
100 µA
V
–100mV
PFD
V
CC
V
V
V
5/20
M48T212A
Figure 5. Power Down/Up AC Waveform
V
CC
V
(max)
PFD
V
(min)
PFD
VSO
INPUTS
OUTPUTS
RST
V
CCSW
tF
tFB
VALID VALID
VALID VALID
DON'T CARE
HIGH-Z
tR
tRECtRB
AI02638
Table 8. Power Down/Up AC Characteristics
(T
= 0 to 70°C)
A
Symbol Parameter Min Max Unit
V
t
F
(max) to V
PFD
(min) VCC Fall Time
PFD
300 µs
6/20
t
FB
t
t
REC
t
RB
V
(min) to VSS VCC Fall Time
PFD
V
R
(min) to V
PFD
V
(max) to RST High
PFD
VSS to V
PFD
(max) VCC Rise Time
PFD
(min) VCC Rise Time
150 µs
10 µs 40 20 0 ms
s
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