No. 5997-14/17
LC662508A, 662512A, 662516A
Electrical Characteristics at Ta = –30 to +70°C, VSS= 0 V, VDD= 3.0 to 5.5 V unless otherwise specified.
Parameter Symbol Conditions min typ max Unit Note
P2, P3 (except for the P33/HOLD pin),
IIH1 P61, and P63: VIN= 13.5 V, with the output 5.0 µA 1
Nch transistor off
P0, P1, P4, P5, P6, P9, PC, TEST, RES, and
Input high-level current
IIH2
P33/HOLD (Does not apply to P61 and P63.):
1.0 µA 1
V
IN
= VDD,
with the output Nch transistor off
I
IH
3
PD, PE: V
IN
= VDD,
1.0 µA 1
with the output Nch transistor off
I
IL
1
Input ports other than PD and PE3:
–1.0 µA 2
Input low-level current
V
IN
= VSS, with the output Nch transistor off
I
IL
2
PD, PE: V
IN
= VSS,
–1.0 µA 2
with the output Nch transistor off
P2, P3 (except for the P33/HOLD pin),
V
DD
– 1.0
Output high-level voltage V
OH
1
P6, P8, P9, and PC: I
OH
= –1 mA
V 3
P2, P3 (except for the P33/HOLD pin),
V
DD
– 0.5
P6, P8, P9, and PC: I
OH
= –0.1 mA
Value of the output pull-up resistor R
PO
P0, P1, P4, P5, P7, PA, and PB 30 100 300 kΩ
V
OL
1
P0, P1, P2, P3, P4, P5, P6, P7, P8, P9, PA, PB,
0.4 V 5
Output low-level voltage
and PC
(except for the P33/HOLD pin): IOL= 1.6 mA
VOL2
P0, P1, P2, P3, P4, P5, P6, P7, P8, P9, PA, PB,
1.5 V 5
and PC
(except for the P33/HOLD pin): IOL= 8 mA
I
OFF
1 P2, P3, P61, P63, and PA: VIN= 13.5 V 5.0 µA 6
I
OFF
2
Does not apply to P2, P3, P61, P63, P8, and PA:
1.0 µA 6
Output off leakage current
V
IN
= V
DD
I
OFF
3 P8: VIN= V
SS
–1.0 µA 7
[Schmitt characteristics]
Hysteresis voltage V
HYS
0.1 V
DD
V
High-level threshold voltage Vt
H
P2, P3, P5, P6, P61, P9, RES, OSC1 (EXT) 0.5 V
DD
0.8 V
DD
V
Low-level threshold voltage Vt
L
0.2 V
DD
0.5 V
DD
V
[Ceramic oscillator]
Oscillator frequency f
CF
OSC1, OSC2: See Figure 2. 4 MHz 4.0 MHz
Oscillator stabilization time f
CFS
See Figure 3. 4 MHz 10.0 ms
[Serial clock]
Cycle time
Input
t
CKCY
0.9 µs
Output 2.0 Tcyc
Low-level and high-level
Input t
CKL
0.4 µs
pulse widths
Output t
CKH
1.0 Tcyc
Rise an fall times Output t
CKR
, t
CKF
0.1 µs
[Serial input]
Data setup time t
ICK
0.3 µs
Data hold time t
CKI
0.3 µs
[Serial output]
SO0, SO1: With the timing of Figure 5 and the
Output delay time t
CKO
test load of Figure 5. Stipulated with respect to 0.3 µs
the falling edge (↓) of SCK0, SCK1.
SI0, SI1: With the timing of Figure 4.
Stipulated with respect to the rising edge (↑) of
SCK0, SCK1.
SCK0, SCK1: With the timing of Figure 4 and
the test load of Figure 5.
Continued on next page.