Numonyx M45PE80 Technical data

8 Mbit, low voltage, Page-Erasable Serial Flash memory
with byte alterability and a 50 MHz SPI bus interface
Features
SPI bus compatible serial interface
50 MHz clock rate (maximum)
8 Mbit of Page-Erasable Flash memory
Page size: 256 bytes:
– Page Write in 11 ms (typical) – Page Program in 0.8 ms (typical) – Page Erase in 10 ms (typical)
Sector Erase (64 Kbytes)
Hardware Write protection of the bottom sector
(64 Kbytes)
Electronic signature
– JEDEC standard two-byte signature
(4014h)
Deep Power-down mode 1 µA (typical)
More than 100 000 Write cycles
More than 20 years’ data retention
Packages
– ECOPACK® (RoHS compliant)
M45PE80
VFQFPN8 (MP)
6 × 5 mm (MLP8)
SO8W (MW)
208 mils width
SO8N (MN)
150 mils width
December 2007 Rev 9 1/47
www.numonyx.com
1
Contents M45PE80
Contents
1 Summary description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
2 Signal description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.1 Serial Data Output (Q) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.2 Serial Data Input (D) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.3 Serial Clock (C) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.4 Chip Select (S
2.5 Reset (Reset) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
2.6 Write Protect (W
2.7 V
2.8 V
supply voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
CC
ground . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
SS
) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
3 SPI modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
4 Operating features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
4.1 Sharing the overhead of modifying data . . . . . . . . . . . . . . . . . . . . . . . . . . 12
4.2 An easy way to modify data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
4.3 A fast way to modify data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
4.4 Polling during a Write, Program or Erase cycle . . . . . . . . . . . . . . . . . . . . 13
4.5 Reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
4.6 Active Power, Stand-by Power and Deep Power-Down modes . . . . . . . . 13
4.7 Status Register . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
4.8 Protection modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
5 Memory organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
6 Instructions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
6.1 Write Enable (WREN) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
6.2 Write Disable (WRDI) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
6.3 Read Identification (RDID) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
6.4 Read Status Register (RDSR) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
6.4.1 WIP bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
2/47
M45PE80 Contents
6.4.2 WEL bit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
6.5 Read Data Bytes (READ) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
6.6 Read Data Bytes at Higher Speed (FAST_READ) . . . . . . . . . . . . . . . . . . 22
6.7 Page Write (PW) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
6.8 Page Program (PP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
6.9 Page Erase (PE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
6.10 Sector Erase (SE) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
6.11 Deep Power-down (DP) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
6.12 Release from Deep Power-down (RDP) . . . . . . . . . . . . . . . . . . . . . . . . . . 30
7 Power-up and Power-down . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
8 Initial delivery state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
9 Maximum rating . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
10 DC and AC parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
11 Package mechanical . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
12 Part numbering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
13 Reference . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
14 Revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
3/47
List of tables M45PE80
List of tables
Table 1. Signal names . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Table 2. Memory organization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Table 3. Instruction set . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Table 4. Read Identification (RDID) data-out sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Table 5. Status Register Format . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Table 6. Power-Up timing and VWI threshold. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Table 7. Absolute maximum ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
Table 8. Operating conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Table 9. AC measurement conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Table 10. Capacitance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Table 11. DC characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Table 12. AC characteristics (25 MHz operation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 36
Table 13. AC characteristics (33 MHz operation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Table 14. AC characteristics (50 MHz operation) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 38
Table 15. Reset conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Table 16. Timings after a Reset Low pulse . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Table 17. VFQFPN8 (MLP8)8-lead Very thin Fine Pitch Quad Flat Package No lead,
6 × 5 mm, package mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Table 18. SO8 wide – 8 lead Plastic Small Outline, 208 mils body width, mechanical data. . . . . . . . 42
Table 19. SO8N - 8 lead Plastic Small Outline, 150 mils body width, package
mechanical data . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 43
Table 20. Ordering information scheme . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Table 21. Document revision history . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
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M45PE80 List of figures
List of figures
Figure 1. Logic diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Figure 2. VFQFPN and SO connections . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7
Figure 3. Bus master and memory devices on the SPI bus . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Figure 4. SPI modes supported . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Figure 5. Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Figure 6. Write Enable (WREN) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Figure 7. Write Disable (WRDI) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Figure 8. Read Identification (RDID) instruction sequence and data-out sequence . . . . . . . . . . . . . 19
Figure 9. Read Status Register (RDSR) instruction sequence and data-out sequence . . . . . . . . . . 20
Figure 10. Read Data Bytes (READ) instruction sequence and data-out sequence . . . . . . . . . . . . . . 21
Figure 11. Read Data Bytes at Higher Speed (FAST_READ) instruction sequence
and data-out sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Figure 12. Page Write (PW) instruction sequence. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
Figure 13. Page Program (PP) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Figure 14. Page Erase (PE) instruction sequence. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Figure 15. Sector Erase (SE) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
Figure 16. Deep Power-down (DP) instruction sequence . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Figure 17. Release from Deep Power-down (RDP) instruction sequence . . . . . . . . . . . . . . . . . . . . . . 30
Figure 18. Power-up timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Figure 19. AC measurement I/O waveform . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Figure 20. Serial input timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Figure 21. Write Protect setup and hold timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Figure 22. Output timing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 39
Figure 23. Reset ac waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40
Figure 24. VFQFPN8 (MLP8) 8-lead Very thin Fine Pitch Quad Flat Package No lead,
6 × 5 mm, package outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Figure 25. SO8 wide – 8 lead Plastic Small Outline, 208 mils body width, package outline . . . . . . . . 42
Figure 26. SO8N - 8 lead Plastic Small Outline, 150 mils body width, package outline . . . . . . . . . . . 43
5/47
Summary description M45PE80

1 Summary description

The M45PE80 is a 8 Mbit (1 Mbit × 8 bit) Serial Paged Flash Memory accessed by a high
speed SPI-compatible bus.
The memory can be written or programmed 1 to 256 bytes at a time, using the Page Write or
Page Program instruction. The Page Write instruction consists of an integrated Page Erase
cycle followed by a Page Program cycle.
The memory is organized as 16 sectors, each containing 256 pages. Each page is 256
bytes wide. Thus, the whole memory can be viewed as consisting of 4096 pages, or 1 048
576 bytes.
The memory can be erased a page at a time, using the Page Erase instruction, or a sector
at a time, using the Sector Erase instruction.
In order to meet environmental requirements, Numonyx offers the M45PE80 in ECOPACK®
packages. ECOPACK® packages are Lead-free and RoHS compliant.

Figure 1. Logic diagram

V
CC
D
C
S
W
Reset

Table 1. Signal names

Signal name Function Direction
C Serial Clock Input
D Serial Data Input Input
Q Serial Data Output Output
S Chip Select Input
Write Protect Input
W
Reset Input
Reset
M45PE80
V
SS
Q
AI06810B
V
CC
V
SS
6/47
Supply Voltage
Ground
M45PE80 Summary description

Figure 2. VFQFPN and SO connections

M45PE80
DQ
1
C
2
Reset
3 4
1. There is an exposed central pad on the underside of the VFQFPN package. This is pulled, internally, to VSS, and must not be allowed to be connected to any other voltage or signal line on the PCB.
2. See Section 11: Package mechanical for package dimensions, and how to identify pin-1.
8 7 6 5
AI06811B
V
SS
V
CC
WS
7/47
Signal description M45PE80

2 Signal description

2.1 Serial Data Output (Q)

This output signal is used to transfer data serially out of the device. Data is shifted out on the falling edge of Serial Clock (C).

2.2 Serial Data Input (D)

This input signal is used to transfer data serially into the device. It receives instructions, addresses, and the data to be programmed. Values are latched on the rising edge of Serial Clock (C).

2.3 Serial Clock (C)

This input signal provides the timing of the serial interface. Instructions, addresses, or data present at Serial Data Input (D) are latched on the rising edge of Serial Clock (C). Data on Serial Data Output (Q) changes after the falling edge of Serial Clock (C).

2.4 Chip Select (S)

When this input signal is High, the device is deselected and Serial Data Output (Q) is at high impedance. Unless an internal Read, Program, Erase or Write cycle is in progress, the device will be in the Standby mode (this is not the Deep Power-down mode). Driving Chip Select (S
After Power-up, a falling edge on Chip Select (S instruction.
) Low enables the device, placing it in the active power mode.

2.5 Reset (Reset)

The Reset (Reset) input provides a hardware reset for the memory.
When Reset (Reset
When Reset (Reset output Q is high impedance:
If an internal operation (Write, Erase or Program cycle) is in progress when Reset (Reset driven Low, the device enters the Reset mode and any on-going Write, Program or Erase cycle is aborted. The addressed data may be lost.
) is driven High, the memory is in the normal operating mode.
) is driven Low, the device enters the Reset mode. In this mode, the

2.6 Write Protect (W)

) is required prior to the start of any
) is
This input signal puts the device in the Hardware Protected mode, when Write Protect (W) is connected to V them from write, program and erase operations. When Write Protect (W V
, the first 256 pages of memory behave like the other pages of memory.
CC
8/47
, causing the first 256 pages of memory to become read-only by protecting
SS
) is connected to
M45PE80 Signal description

2.7 VCC supply voltage

VCC is the supply voltage.

2.8 VSS ground

VSS is the reference for the VCC supply voltage.
9/47
SPI modes M45PE80

3 SPI modes

These devices can be driven by a microcontroller with its SPI peripheral running in either of the two following modes:
CPOL=0, CPHA=0
CPOL=1, CPHA=1
For these two modes, input data is latched in on the rising edge of Serial Clock (C), and output data is available from the falling edge of Serial Clock (C).
The difference between the two modes, as shown in Figure 4, is the clock polarity when the bus master is in Stand-by mode and not transferring data:
C remains at 0 for (CPOL=0, CPHA=0)
C remains at 1 for (CPOL=1, CPHA=1)

Figure 3. Bus master and memory devices on the SPI bus

V
SS
V
CC
R
SPI Interface with
(CPOL, CPHA) =
(0, 0) or (1, 1)
SPI Bus Master
CS3 CS2 CS1
1. The Write Protect (W) and Hold (HOLD) signals should be driven, High or Low as appropriate.
SDO
SDI
SCK
Device
W
V
CC
HOLD
V
CQD
RR R
SPI Memory
S
CQD
SS
SPI Memory
S
Device
W
V
CC
HOLD
V
SS
Figure 3 shows an example of three devices connected to an MCU, on an SPI bus. Only one
device is selected at a time, so only one device drives the Serial Data Output (Q) line at a time, the other devices are high impedance. Resistors R (represented in Figure 3) ensure that the M45PE80 is not selected if the Bus Master leaves the S state. As the Bus Master may enter a state where all inputs/outputs are in high impedance at the same time (for example, when the Bus Master is reset), the clock line (C) must be connected to an external pull-down resistor so that, when all inputs/outputs become high impedance, the S C do not become High at the same time, and so, that the t
line is pulled High while the C line is pulled Low (thus ensuring that S and
requirement is met). The
SHCH
typical value of R is 100 kΩ, assuming that the time constant R*C capacitance of the bus line) is shorter than the time during which the Bus Master leaves the SPI bus in high impedance.
CQD
S
V
CC
SPI Memory
Device
W
V
SS
HOLD
AI12836b
line in the high impedance
(Cp = parasitic
p
10/47
M45PE80 SPI modes
Example: Cp = 50 pF, that is R*Cp = 5 µs <=> the application must ensure that the Bus
Master never leaves the SPI bus in the high impedance state for a time period shorter than 5µs.

Figure 4. SPI modes supported

CPHA
CPOL
C
0
0
1
1
C
D
Q
MSB
MSB
AI01438B
11/47
Operating features M45PE80

4 Operating features

4.1 Sharing the overhead of modifying data

To write or program one (or more) data bytes, two instructions are required: Write Enable (WREN), which is one byte, and a Page Write (PW) or Page Program (PP) sequence, which consists of four bytes plus data. This is followed by the internal cycle (of duration t
To share this overhead, the Page Write (PW) or Page Program (PP) instruction allows up to 256 bytes to be programmed (changing bits from 1 to 0) or written (changing bits to 0 or 1) at a time, provided that they lie in consecutive addresses on the same page of memory.

4.2 An easy way to modify data

The Page Write (PW) instruction provides a convenient way of modifying data (up to 256 contiguous bytes at a time), and simply requires the start address, and the new data in the instruction sequence.
PW
or tPP).
The Page Write (PW) instruction is entered by driving Chip Select (S transmitting the instruction byte, three address bytes (A23-A0) and at least one data byte, and then driving Chip Select (S bytes are written to the data buffer, starting at the address given in the third address byte (A7-A0). When Chip Select (S unchanged, bytes of the data buffer are automatically loaded with the values of the corresponding bytes of the addressed memory page. The addressed memory page then automatically put into an Erase cycle. Finally, the addressed memory page is programmed with the contents of the data buffer.
All of this buffer management is handled internally, and is transparent to the user. The user is given the facility of being able to alter the contents of the memory on a byte-by-byte basis.
For optimized timings, it is recommended to use the Page Write (PW) instruction to write all consecutive targeted bytes in a single sequence versus using several Page Write (PW) sequences with each containing only a few bytes (see Page Write (PW) and Ta bl e 1 4 : AC
characteristics (50 MHz operation)).
) High. While Chip Select (S) is being held Low, the data
) is driven High, the Write cycle starts. The remaining,
) Low, and then
12/47
M45PE80 Operating features

4.3 A fast way to modify data

The Page Program (PP) instruction provides a fast way of modifying data (up to 256 contiguous bytes at a time), provided that it only involves resetting bits to 0 that had previously been set to 1.
This might be:
when the designer is programming the device for the first time
when the designer knows that the page has already been erased by an earlier Page
Erase (PE) or Sector Erase (SE) instruction. This is useful, for example, when storing a fast stream of data, having first performed the erase cycle when time was available
when the designer knows that the only changes involve resetting bits to 0 that are still
set to 1. When this method is possible, it has the additional advantage of minimizing the number of unnecessary erase operations, and the extra stress incurred by each page.
For optimized timings, it is recommended to use the Page Program (PP) instruction to program all consecutive targeted bytes in a single sequence versus using several Page Program (PP) sequences with each containing only a few bytes (see Page Program (PP) and Table 14: AC characteristics (50 MHz operation)).

4.4 Polling during a Write, Program or Erase cycle

A further improvement in the write, program or erase time can be achieved by not waiting for the worst case delay (t Status Register so that the application program can monitor its value, polling it to establish when the previous cycle is complete.
, tPP, tPE, or tSE). The Write In Progress (WIP) bit is provided in the
PW

4.5 Reset

An internal Power-On Reset circuit helps protect against inadvertent data writes. Addition protection is provided by driving Reset (Reset driving it High when V
has reached the correct voltage level, VCC(min).
CC
) Low during the Power-on process, and only

4.6 Active Power, Stand-by Power and Deep Power-Down modes

When Chip Select (S) is Low, the device is enabled, and in the Active Power mode.
When Chip Select (S mode until all internal cycles have completed (Program, Erase, Write). The device then goes in to the Stand-by Power mode. The device consumption drops to I
The Deep Power-down mode is entered when the specific instruction (the Enter Deep Power-down Mode (DP) instruction) is executed. The device consumption drops further to I
. The device remains in this mode until another specific instruction (the Release from
CC2
Deep Power-down Mode) is executed.
) is High, the device is disabled, but could remain in the Active Power
.
CC1
While in the Deep Power-down mode, the device ignores all Write, Program and Erase instructions (see Deep Power-down (DP)). This can be used as an extra software protection mechanism, when the device is not in active use, to protect the device from inadvertent Write, Program or Erase instructions.
13/47
Operating features M45PE80

4.7 Status Register

The Status Register contains two status bits that can be read by the Read Status Register (RDSR) instruction. See Section 6.4: Read Status Register (RDSR) for a detailed description of the Status Register bits.

4.8 Protection modes

The environments where non-volatile memory devices are used can be very noisy. No SPI device can operate correctly in the presence of excessive noise. To help combat this, the M45PE80 boasts the following data protection mechanisms:
Power-On Reset and an internal timer (t
inadvertent changes while the power supply is outside the operating specification.
Program, Erase and Write instructions are checked that they consist of a number of
clock pulses that is a multiple of eight, before they are accepted for execution.
All instructions that modify data must be preceded by a Write Enable (WREN)
instruction to set the Write Enable Latch (WEL) bit. This bit is returned to its reset state by the following events:
–Power-up – Reset (RESET
) driven Low – Write Disable (WRDI) instruction completion – Page Write (PW) instruction completion – Page Program (PP) instruction completion – Page Erase (PE) instruction completion – Sector Erase (SE) instruction completion
The Hardware Protected mode is entered when Write Protect (W) is driven Low,
causing the first 256 pages of memory to become read-only. When Write Protect (W driven High, the first 256 pages of memory behave like the other pages of memory
The Reset (Reset) signal can be driven Low to protect the contents of the memory
during any critical time, not just during Power-up and Power-down.
In addition to the low power consumption feature, the Deep Power-down mode offers
extra software protection from inadvertent Write, Program and Erase instructions while the device is not in active use.
) can provide protection against
PUW
) is
14/47
M45PE80 Memory organization

5 Memory organization

The memory is organized as:
4096 pages (256 bytes each).
1 048 576 bytes (8 bits each)
16 sectors (512 Kbits, 65536 bytes each)
Each page can be individually:
programmed (bits are programmed from 1 to 0)
erased (bits are erased from 0 to 1)
written (bits are changed to either 0 or 1)
The device is Page or Sector Erasable (bits are erased from 0 to 1).

Table 2. Memory organization

Sector Address range
15 F0000h FFFFFh
14 E0000h EFFFFh
13 D0000h DFFFFh
12 C0000h CFFFFh
11 B0000h BFFFFh
10 A0000h AFFFFh
9 90000h 9FFFFh
8 80000h 8FFFFh
7 70000h 7FFFFh
6 60000h 6FFFFh
5 50000h 5FFFFh
4 40000h 4FFFFh
3 30000h 3FFFFh
2 20000h 2FFFFh
1 10000h 1FFFFh
0 00000h 0FFFFh
15/47
Memory organization M45PE80

Figure 5. Block diagram

Reset
W
S
C
D
Q
Control Logic
Address Register
and Counter
Y Decoder
10000h
00000h
High Voltage
Generator
I/O Shift Register
256 Byte
Data Buffer
256 Bytes (Page Size)
FFFFFh
000FFh
Status
Register
First 256 Pages can be made read-only
16/47
X Decoder
AI06812
M45PE80 Instructions

6 Instructions

All instructions, addresses and data are shifted in and out of the device, most significant bit first.
Serial Data Input (D) is sampled on the first rising edge of Serial Clock (C) after Chip Select (S
) is driven Low. Then, the one-byte instruction code must be shifted in to the device, most significant bit first, on Serial Data Input (D), each bit being latched on the rising edges of Serial Clock (C).
The instruction set is listed in Ta bl e 3 .
Every instruction sequence starts with a one-byte instruction code. Depending on the instruction, this might be followed by address bytes, or by data bytes, or by both or none.
In the case of a Read Data Bytes (READ), Read Data Bytes at Higher Speed (Fast_Read) or Read Status Register (RDSR) instruction, the shifted-in instruction sequence is followed by a data-out sequence. Chip Select (S sequence is being shifted out.
In the case of a Page Write (PW), Page Program (PP), Page Erase (PE), Sector Erase (SE), Write Enable (WREN), Write Disable (WRDI), Deep Power-down (DP) or Release from Deep Power-down (RDP) instruction, Chip Select (S boundary, otherwise the instruction is rejected, and is not executed. That is, Chip Select (S must driven High when the number of clock pulses after Chip Select (S an exact multiple of eight.
) can be driven High after any bit of the data-out
) must be driven High exactly at a byte
) being driven Low is
)
All attempts to access the memory array during a Write cycle, Program cycle or Erase cycle are ignored, and the internal Write cycle, Program cycle or Erase cycle continues unaffected.

Table 3. Instruction set

Instruction Description
WREN Write Enable 0000 0110 06h 0 0 0
WRDI Write Disable 0000 0100 04h 0 0 0
RDID Read Identification 1001 1111 9Fh 0 0 1 to 3
RDSR Read Status Register 0000 0101 05h 0 0 1 to
READ Read Data Bytes 0000 0011 03h 3 0 1 to
FAST_READ
PW Page Write 0000 1010 0Ah 3 0 1 to 256
PP Page Program 0000 0010 02h 3 0 1 to 256
PE Page Erase 1101 1011 DBh 3 0 0
SE Sector Erase 1101 1000 D8h 3 0 0
DP Deep Power-down 1011 1001 B9h 0 0 0
Read Data Bytes at Higher Speed
One-byte instruction
code
0000 1011 0Bh 3 1 1 to
Address
bytes
Dummy
bytes
Data
bytes
RDP
Release from Deep Power-down
1010 1011 ABh 0 0 0
17/47
Instructions M45PE80

6.1 Write Enable (WREN)

The Write Enable (WREN) instruction (Figure 6) sets the Write Enable Latch (WEL) bit.
The Write Enable Latch (WEL) bit must be set prior to every Page Write (PW), Page Program (PP), Page Erase (PE), and Sector Erase (SE) instruction.
The Write Enable (WREN) instruction is entered by driving Chip Select (S instruction code, and then driving Chip Select (S

Figure 6. Write Enable (WREN) instruction sequence

S
C
D
Q

6.2 Write Disable (WRDI)

The Write Disable (WRDI) instruction (Figure 7) resets the Write Enable Latch (WEL) bit.
The Write Disable (WRDI) instruction is entered by driving Chip Select (S instruction code, and then driving Chip Select (S
The Write Enable Latch (WEL) bit is reset under the following conditions:
Power-up
Write Disable (WRDI) instruction completion
Page Write (PW) instruction completion
Page Program (PP) instruction completion
Page Erase (PE) instruction completion
Sector Erase (SE) instruction completion
21 34567
0
Instruction
High Impedance
) Low, sending the
) High.
AI02281E
) Low, sending the
) High.

Figure 7. Write Disable (WRDI) instruction sequence

S
C
D
Q
18/47
0
21 34567
Instruction
High Impedance
AI03750D
M45PE80 Instructions

6.3 Read Identification (RDID)

The Read Identification (RDID) instruction allows the 8-bit manufacturer identification to be read, followed by two bytes of device identification. The manufacturer identification is assigned by JEDEC, and has the value 20h for Numonyx. The device identification is assigned by the device manufacturer, and indicates the memory type in the first byte (40h), and the memory capacity of the device in the second byte (14h).
Any Read Identification (RDID) instruction while an Erase or Program cycle is in progress, is not decoded, and has no effect on the cycle that is in progress. The Read Identification (RDID) instruction should not be issued while the device is in Deep Power-down mode.
The device is first selected by driving Chip Select (S
) Low. Then, the 8-bit instruction code for the instruction is shifted in. This is followed by the 24-bit device identification, stored in the memory, being shifted out on Serial Data Output (Q), each bit being shifted out during the falling edge of Serial Clock (C).
The instruction sequence is shown in Figure 8.
The Read Identification (RDID) instruction is terminated by driving Chip Select (S
) High at
any time during data output.
When Chip Select (S
) is driven High, the device is put in the Stand-by Power mode. Once in the Stand-by Power mode, the device waits to be selected, so that it can receive, decode and execute instructions.

Table 4. Read Identification (RDID) data-out sequence

Device Identification
Manufacturer Identification
Memory Type Memory Capacity
20h 40h 14h

Figure 8. Read Identification (RDID) instruction sequence and data-out sequence

S
21 3456789101112131415
0
C
Instruction
D
16 16 18 28 29 30 31
Q
High Impedance
Manufacturer Identification
MSB
Device Identification
15 1413 3210
MSB
AI06809
19/47
Instructions M45PE80

6.4 Read Status Register (RDSR)

The Read Status Register (RDSR) instruction allows the Status Register to be read. The Status Register may be read at any time, even while a Program, Erase or Write cycle is in progress. When one of these cycles is in progress, it is recommended to check the Write In Progress (WIP) bit before sending a new instruction to the device. It is also possible to read the Status Register continuously, as shown in Figure 9.
The status bits of the Status Register are as follows:

6.4.1 WIP bit

The Write In Progress (WIP) bit indicates whether the memory is busy with a Write, Program or Erase cycle. When set to 1, such a cycle is in progress, when reset to 0 no such cycle is in progress.

6.4.2 WEL bit

The Write Enable Latch (WEL) bit indicates the status of the internal Write Enable Latch. When set to 1 the internal Write Enable Latch is set, when set to 0 the internal Write Enable Latch is reset and no Write, Program or Erase instruction is accepted.
Table 5. Status Register Format
b7 b0
0 0 0 0 0 0 WEL
1. WEL and WIP are volatile read-only bits (WEL is set and reset by specific instructions; WIP is
automatically set and reset by the internal logic of the device).
(1)
WIP
(1)
Figure 9. Read Status Register (RDSR) instruction sequence and data-out
sequence
S
21 3456789101112131415
0
C
Instruction
D
Q
High Impedance
Status Register Out
7 6543210
MSB
Status Register Out
7 6543210
MSB
7
AI02031E
20/47
M45PE80 Instructions

6.5 Read Data Bytes (READ)

The device is first selected by driving Chip Select (S) Low. The instruction code for the Read Data Bytes (READ) instruction is followed by a 3-byte address (A23-A0), each bit being latched-in during the rising edge of Serial Clock (C). Then the memory contents, at that address, is shifted out on Serial Data Output (Q), each bit being shifted out, at a maximum frequency f
The instruction sequence is shown in Figure 10.
The first byte addressed can be at any location. The address is automatically incremented to the next higher address after each byte of data is shifted out. The whole memory can, therefore, be read with a single Read Data Bytes (READ) instruction. When the highest address is reached, the address counter rolls over to 000000h, allowing the read sequence to be continued indefinitely.
, during the falling edge of Serial Clock (C).
R
The Read Data Bytes (READ) instruction is terminated by driving Chip Select (S Select (S
) can be driven High at any time during data output. Any Read Data Bytes (READ)
) High. Chip
instruction, while an Erase, Program or Write cycle is in progress, is rejected without having any effects on the cycle that is in progress.

Figure 10. Read Data Bytes (READ) instruction sequence and data-out sequence

S
21 345678910 2829303132333435
0
C
Instruction 24-Bit Address
D
High Impedance
Q
1. Address bits A23 to A20 are Don’t Care.
23
MSB
2221 3210
76543 1 7
MSB
36 37 38
Data Out 1
39
Data Out 2
2
0
AI03748D
21/47
Instructions M45PE80

6.6 Read Data Bytes at Higher Speed (FAST_READ)

The device is first selected by driving Chip Select (S) Low. The instruction code for the Read Data Bytes at Higher Speed (FAST_READ) instruction is followed by a 3-byte address (A23­A0) and a dummy byte, each bit being latched-in during the rising edge of Serial Clock (C). Then the memory contents, at that address, is shifted out on Serial Data Output (Q), each bit being shifted out, at a maximum frequency f
The instruction sequence is shown in Figure 11.
The first byte addressed can be at any location. The address is automatically incremented to the next higher address after each byte of data is shifted out. The whole memory can, therefore, be read with a single Read Data Bytes at Higher Speed (FAST_READ) instruction. When the highest address is reached, the address counter rolls over to 000000h, allowing the read sequence to be continued indefinitely.
The Read Data Bytes at Higher Speed (FAST_READ) instruction is terminated by driving Chip Select (S
) High. Chip Select (S) can be driven High at any time during data output. Any Read Data Bytes at Higher Speed (FAST_READ) instruction, while an Erase, Program or Write cycle is in progress, is rejected without having any effects on the cycle that is in progress.
Figure 11. Read Data Bytes at Higher Speed (FAST_READ) instruction sequence
and data-out sequence
, during the falling edge of Serial Clock (C).
C
S
21 345678910 28293031
0
C
Instruction 24 BIT ADDRESS
23
D
High Impedance
Q
S
32 33 34 36 37 38 39 40 41 42 43 44 45 46
C
D
Q
765432 0
35
Dummy Byte
2221 3210
1
DATA OUT 1
765432 0
MSB
47
DATA OUT 2
7 6543210
1
MSB MSB
7
1. Address bits A23 to A20 are Don’t Care.
22/47
AI04006
M45PE80 Instructions

6.7 Page Write (PW)

The Page Write (PW) instruction allows bytes to be written in the memory. Before it can be accepted, a Write Enable (WREN) instruction must previously have been executed. After the Write Enable (WREN) instruction has been decoded, the device sets the Write Enable Latch (WEL).
The Page Write (PW) instruction is entered by driving Chip Select (S instruction code, three address bytes and at least one data byte on Serial Data Input (D). The rest of the page remains unchanged if no power failure occurs and the device is not reset during the write cycle.
The Page Write (PW) instruction performs a page erase cycle even if only one byte is updated.
If the 8 least significant address bits (A7-A0) are not all zero, all transmitted data exceeding the addressed page boundary roll over, and are written from the start address of the same page (the one whose 8 least significant address bits (A7-A0) are all zero). Chip Select (S must be driven Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 12.
If more than 256 bytes are sent to the device, previously latched data are discarded and the last 256 data bytes are guaranteed to be written correctly within the same page. If less than 256 Data bytes are sent to device, they are correctly written at the requested addresses without having any effects on the other bytes of the same page.
For optimized timings, it is recommended to use the Page Write (PW) instruction to write all consecutive targeted bytes in a single sequence versus using several Page Write (PW) sequences with each containing only a few bytes (see Table 14: AC characteristics (50 MHz
operation)).
Chip Select (S latched in, otherwise the Page Write (PW) instruction is not executed.
) must be driven High after the eighth bit of the last data byte has been
) Low, followed by the
)
As soon as Chip Select (S is t
) is initiated. While the Page Write cycle is in progress, the Status Register may be
PW
read to check the value of the Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Page Write cycle, and is 0 when it is completed. At some unspecified time before the cycle is complete, the Write Enable Latch (WEL) bit is reset.
A Page Write (PW) instruction applied to a page that is Hardware Protected is not executed.
Any Page Write (PW) instruction, while an Erase, Program or Write cycle is in progress, is rejected without having any effects on the cycle that is in progress.
) is driven High, the self-timed Page Write cycle (whose duration
23/47
Instructions M45PE80

Figure 12. Page Write (PW) instruction sequence

S
21 345678910 2829303132333435
0
C
Instruction 24-Bit Address
D
S
4241 43 44 45 46 47 48 49 50 52 53 54 5540
C
Data Byte 2
D
765432 0
MSB MSB MSB
1
1. Address bits A23 to A20 are Don’t Care
2. 1 ≤ n ≤ 256
23
2221 3210
MSB
51
Data Byte 3 Data Byte n
765432 0
1
765432 0
MSB
765432 0
36 37 38
Data Byte 1
39
1
1
AI04045
24/47
M45PE80 Instructions

6.8 Page Program (PP)

The Page Program (PP) instruction allows bytes to be programmed in the memory (changing bits from 1 to 0, only). Before it can be accepted, a Write Enable (WREN) instruction must previously have been executed. After the Write Enable (WREN) instruction has been decoded, the device sets the Write Enable Latch (WEL).
The Page Program (PP) instruction is entered by driving Chip Select (S the instruction code, three address bytes and at least one data byte on Serial Data Input (D). If the 8 least significant address bits (A7-A0) are not all zero, all transmitted data exceeding the addressed page boundary roll over, and are programmed from the start address of the same page (the one whose 8 least significant address bits (A7-A0) are all zero). Chip Select (S
) must be driven Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 13.
If more than 256 bytes are sent to the device, previously latched data are discarded and the last 256 data bytes are guaranteed to be programmed correctly within the same page. If less than 256 Data bytes are sent to device, they are correctly programmed at the requested addresses without having any effects on the other bytes of the same page.
For optimized timings, it is recommended to use the Page Program (PP) instruction to program all consecutive targeted bytes in a single sequence versus using several Page Program (PP) sequences with each containing only a few bytes (see Table 14: AC
characteristics (50 MHz operation)).
Chip Select (S latched in, otherwise the Page Program (PP) instruction is not executed.
As soon as Chip Select (S duration is t may be read to check the value of the Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Page Program cycle, and is 0 when it is completed. At some unspecified time before the cycle is complete, the Write Enable Latch (WEL) bit is reset.
) must be driven High after the eighth bit of the last data byte has been
) is driven High, the self-timed Page Program cycle (whose
) is initiated. While the Page Program cycle is in progress, the Status Register
PP
) Low, followed by
A Page Program (PP) instruction applied to a page that is Hardware Protected is not executed.
Any Page Program (PP) instruction, while an Erase, Program or Write cycle is in progress, is rejected without having any effects on the cycle that is in progress.
25/47
Instructions M45PE80

Figure 13. Page Program (PP) instruction sequence

S
21 345678910 2829303132333435
0
C
Instruction 24-Bit Address
D
S
4241 43 44 45 46 47 48 49 50 52 53 54 5540
C
Data Byte 2
D
765432 0
MSB MSB MSB
1
1. Address bits A23 to A20 are Don’t Care
2. 1 ≤ n ≤ 256
23
2221 3210
MSB
51
Data Byte 3 Data Byte n
765432 0
1
765432 0
MSB
765432 0
36 37 38
Data Byte 1
39
1
1
AI04044
26/47
M45PE80 Instructions

6.9 Page Erase (PE)

The Page Erase (PE) instruction sets to 1 (FFh) all bits inside the chosen page. Before it can be accepted, a Write Enable (WREN) instruction must previously have been executed. After the Write Enable (WREN) instruction has been decoded, the device sets the Write Enable Latch (WEL).
The Page Erase (PE) instruction is entered by driving Chip Select (S
) Low, followed by the instruction code, and three address bytes on Serial Data Input (D). Any address inside the Page is a valid address for the Page Erase (PE) instruction. Chip Select (S
) must be driven
Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 14.
Chip Select (S
) must be driven High after the eighth bit of the last address byte has been latched in, otherwise the Page Erase (PE) instruction is not executed. As soon as Chip Select (S
) is driven High, the self-timed Page Erase cycle (whose duration is tPE) is initiated. While the Page Erase cycle is in progress, the Status Register may be read to check the value of the Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self­timed Page Erase cycle, and is 0 when it is completed. At some unspecified time before the cycle is complete, the Write Enable Latch (WEL) bit is reset.
A Page Erase (PE) instruction applied to a page that is Hardware Protected is not executed.
Any Page Erase (PE) instruction, while an Erase, Program or Write cycle is in progress, is rejected without having any effects on the cycle that is in progress.

Figure 14. Page Erase (PE) instruction sequence

S
21 3456789 293031
0
C
Instruction
D
1. Address bits A23 to A20 are Don’t Care.
24 Bit Address
23 22 2 0
MSB
27/47
1
AI04046
Instructions M45PE80

6.10 Sector Erase (SE)

The Sector Erase (SE) instruction sets to 1 (FFh) all bits inside the chosen sector. Before it can be accepted, a Write Enable (WREN) instruction must previously have been executed. After the Write Enable (WREN) instruction has been decoded, the device sets the Write Enable Latch (WEL).
The Sector Erase (SE) instruction is entered by driving Chip Select (S
) Low, followed by the instruction code, and three address bytes on Serial Data Input (D). Any address inside the Sector (see Ta bl e 2 ) is a valid address for the Sector Erase (SE) instruction. Chip Select (S must be driven Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 15.
Chip Select (S
) must be driven High after the eighth bit of the last address byte has been latched in, otherwise the Sector Erase (SE) instruction is not executed. As soon as Chip Select (S
) is driven High, the self-timed Sector Erase cycle (whose duration is tSE) is initiated. While the Sector Erase cycle is in progress, the Status Register may be read to check the value of the Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the self-timed Sector Erase cycle, and is 0 when it is completed. At some unspecified time before the cycle is complete, the Write Enable Latch (WEL) bit is reset.
A Sector Erase (SE) instruction applied to a sector that contains a page that is Hardware Protected is not executed.
Any Sector Erase (SE) instruction, while an Erase, Program or Write cycle is in progress, is rejected without having any effects on the cycle that is in progress.

Figure 15. Sector Erase (SE) instruction sequence

S
21 3456789 293031
0
C
)
Instruction
D
1. Address bits A23 to A20 are Don’t Care.
28/47
24 Bit Address
23 22 2 0
MSB
1
AI03751D
M45PE80 Instructions

6.11 Deep Power-down (DP)

Executing the Deep Power-down (DP) instruction is the only way to put the device in the lowest consumption mode (the Deep Power-down mode). It can also be used as an extra software protection mechanism, while the device is not in active use, since in this mode, the device ignores all Write, Program and Erase instructions.
Driving Chip Select (S
) High deselects the device, and puts the device in the Standby mode (if there is no internal cycle currently in progress). But this mode is not the Deep Power­down mode. The Deep Power-down mode can only be entered by executing the Deep Power-down (DP) instruction, to reduce the standby current (from I
CC1
to I
, as specified
CC2
in Ta bl e 1 1 ).
To exit from Deep Power-down mode, the Release from Deep Power-down (RDP) instruction must be issued. No other instruction must be issued while
the device is in this mode.
The Deep Power-down mode automatically stops at Power-down, and the device always Powers-up in the Standby mode.
The Deep Power-down (DP) instruction is entered by driving Chip Select (S by the instruction code on Serial Data Input (D). Chip Select (S
) must be driven Low for the
) Low, followed
entire duration of the sequence.
The instruction sequence is shown in Figure 16.
Chip Select (S
) must be driven High after the eighth bit of the instruction code has been latched in, otherwise the Deep Power-down (DP) instruction is not executed. As soon as Chip Select (S to I
and the Deep Power-down mode is entered.
CC2
) is driven High, it requires a delay of tDP before the supply current is reduced
Any Deep Power-down (DP) instruction, while an Erase, Program or Write cycle is in progress, is rejected without having any effects on the cycle that is in progress.

Figure 16. Deep Power-down (DP) instruction sequence

S
t
21 345670
C
Instruction
D
29/47
DP
Stand-by Mode
Deep Power-down Mode
AI03753D
Instructions M45PE80

6.12 Release from Deep Power-down (RDP)

To exit from Deep Power-down mode, the Release from Deep Power-down (RDP) instruction must be issued. No other instruction must be issued while the device is in this mode.
The Release from Deep Power-down (RDP) instruction is entered by driving Chip Select (S Low, followed by the instruction code on Serial Data Input (D). Chip Select (S
) must be
driven Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 17.
The Release from Deep Power-down (RDP) instruction is terminated by driving Chip Select (S
) High. Sending additional clock cycles on Serial Clock (C), while Chip Select (S) is driven
Low, cause the instruction to be rejected, and not executed.
After Chip Select (S Standby mode. Chip Select (S
) has been driven High, followed by a delay, t
) must remain High at least until this period is over. The
, the device is put in the
RDP
device waits to be selected, so that it can receive, decode and execute instructions.
Any Release from Deep Power-down (RDP) instruction, while an Erase, Program or Write cycle is in progress, is rejected without having any effects on the cycle that is in progress.

Figure 17. Release from Deep Power-down (RDP) instruction sequence

S
t
21 345670
C
Instruction
D
RDP
)
High Impedance
Q
30/47
Deep Power-down Mode
Stand-by Mode
AI06807
M45PE80 Power-up and Power-down

7 Power-up and Power-down

At Power-up and Power-down, the device must not be selected (that is Chip Select (S) must follow the voltage applied on V
V
(min) at Power-up, and then for a further delay of t
CC
VSS at Power-down
A safe configuration is provided in Section 3: SPI modes.
To avoid data corruption and inadvertent write operations during power up, a Power On Reset (POR) circuit is included. The logic inside the device is held reset while V than the POR threshold value, V respond to any instruction.
Moreover, the device ignores all Write Enable (WREN), Page Write (PW), Page Program (PP), Page Erase (PE) and Sector Erase (SE) instructions until a time delay of t elapsed after the moment that V operation of the device is not guaranteed if, by this time, V Write, Program or Erase instructions should be sent until the later of:
t
t
after VCC passed the VWI threshold
PUW
after VCC passed the VCC(min) level
VSL
These values are specified in Ta bl e 6 .
) until VCC reaches the correct value:
CC
VSL
– all operations are disabled, and the device does not
WI
rises above the VWI threshold. However, the correct
CC
is still below VCC(min). No
CC
is less
CC
PUW
has
If the delay, t selected for READ instructions even if the t
As an extra protection, the Reset (Reset
, has elapsed, after VCC has risen above VCC(min), the device can be
VSL
delay is not yet fully elapsed.
PUW
) signal could be driven Low for the whole duration
of the Power-up and Power-down phases.
At Power-up, the device is in the following state:
The device is in the Standby mode (not the Deep Power-down mode).
The Write Enable Latch (WEL) bit is reset.
The Write In Progress (WIP) bit is reset.
Normal precautions must be taken for supply rail decoupling, to stabilize the V device in a system should have the V
rail decoupled by a suitable capacitor close to the
CC
feed. Each
CC
package pins. (Generally, this capacitor is of the order of 100 nF).
At Power-down, when V value, V
, all operations are disabled and the device does not respond to any instruction.
WI
drops from the operating voltage, to below the POR threshold
CC
(The designer needs to be aware that if a Power-down occurs while a Write, Program or Erase cycle is in progress, some data corruption can result.)
31/47
Power-up and Power-down M45PE80

Figure 18. Power-up timing

V
CC
VCC(max)
Program, Erase and Write Commands are Rejected by the Device
Chip Selection Not Allowed
VCC(min)
Reset State
of the
Device
V
WI

Table 6. Power-Up timing and VWI threshold

tVSL
tPUW
Read Access allowed Device fully
accessible
time
AI04009C
Symbol Parameter Min. Max. Unit
(1)
t
VSL
t
PUW
V
WI
1. These parameters are characterized only, over the temperature range –40°C to +85°C.
VCC(min) to S low 30 µs
(1)
Time delay before the first Write, Program or Erase instruction 1 10 ms
(1)
Write inhibit voltage 1.5 2.5 V
32/47
M45PE80 Initial delivery state

8 Initial delivery state

The device is delivered with the memory array erased: all bits are set to 1 (each byte contains FFh). All usable Status Register bits are 0.

9 Maximum rating

Stressing the device above the rating listed in the Absolute Maximum Ratings table may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the Numonyx SURE Program and other relevant quality documents.

Table 7. Absolute maximum ratings

Symbol Parameter Min. Max. Unit
T
T
LEAD
V
V
V
1. Compliant with JEDEC Std J-STD-020C (for small body, Sn-Pb or Pb assembly), the Numonyx
ECOPACK® 7191395 specification, and the European directive on Restrictions on Hazardous Substances (RoHS) 2002/95/EU.
2. JEDEC Std JESD22-A114A (C1=100 pF, R1=1500 Ω, R2=500 Ω)
Storage temperature –65 150 °C
STG
Lead temperature during soldering See
Input and output voltage (with respect to Ground) –0.6 VCC + 0.6 V
IO
Supply voltage –0.6 4.0 V
CC
Electrostatic Discharge Voltage (Human Body Model)
ESD
(2)
–2000 2000 V
(1)
°C
33/47
DC and AC parameters M45PE80

10 DC and AC parameters

This section summarizes the operating and measurement conditions, and the DC and AC characteristics of the device. The parameters in the DC and AC Characteristic tables that follow are derived from tests performed under the Measurement Conditions summarized in the relevant tables. Designers should check that the operating conditions in their circuit match the measurement conditions when relying on the quoted parameters.

Table 8. Operating conditions

Symbol Parameter Min. Max. Unit
V
CC
T
A

Table 9. AC measurement conditions

Supply voltage 2.7 3.6 V
Ambient operating temperature –40 85 °C
Symbol Parameter Min. Max. Unit
C
Load capacitance 30 pF
L
Input rise and fall times 5 ns
Input pulse voltages 0.2VCC to 0.8V
Input and output timing reference voltages 0.3V
1. Output Hi-Z is defined as the point where data out is no longer driven.
to 0.7V
CC
CC
CC

Figure 19. AC measurement I/O waveform

Input Levels
0.8V
0.2V

Table 10. Capacitance

CC
CC
(1)
Input and Output
Timing Reference Levels
0.7V
CC
0.3V
CC
AI00825B
V
V
Symbol Parameter Test Condition Min. Max. Unit
C
OUT
C
1. Sampled only, not 100% tested, at T
Output capacitance (Q) V
Input capacitance (other pins) VIN = 0 V 6 pF
IN
=25°C and a frequency of 20MHz.
A
34/47
= 0 V 8 pF
OUT
M45PE80 DC and AC parameters

Table 11. DC characteristics

Symbol Parameter
I
Input leakage current ± 2 µA
LI
Output leakage current ± 2 µA
I
LO
Standby current
I
(Standby and Reset
CC1
modes)
I
I
I
I
V
V
V
Deep Power-down
CC2
current
Operating current
CC3
(FAST_READ)
Operating current (PW) S = V
CC4
Operating current (SE) S = V
CC5
V
Input low voltage – 0.5 0.3V
IL
Input high voltage 0.7V
IH
Output low voltage IOL = 1.6 mA 0.4 V
OL
Output high voltage IOH = –100 µA VCC–0.2 V
OH
Test condition
(in addition to those in Tabl e 8 )
S = VCC, V
= VCC, V
S
= VSS or V
IN
= VSS or V
IN
CC
CC
C = 0.1VCC / 0.9.VCC at 25 MHz,
Q = open
C = 0.1V
/ 0.9.VCC at 50 MHz,
CC
Q = open
CC
CC
Min. Max. Unit
50 µA
10 µA
6
mA
8
15 mA
15 mA
V
CC
CCVCC
+0.4 V
35/47
DC and AC parameters M45PE80

Table 12. AC characteristics (25 MHz operation)

Test conditions specified in Tab l e 8 and Tab l e 9
Symbol Alt. Parameter Min. Typ. Max. Unit
Clock Frequency for the following
f
C
f
R
(1)
t
CH
(1)
t
CL
t
SLCHtCSS
t
CHSL
t
DVCHtDSU
t
CHDXtDH
t
CHSH
t
SHCH
t
SHSLtCSH
t
SHQZ
t
CLQV
t
CLQX
t
SHRH
t
WHSL
t
SHWL
(2)
t
DP
t
RDP
t
PW
(3)
t
PP
t
PE
t
SE
1. tCH + tCL must be greater than or equal to 1/ f
2. Value guaranteed by characterization, not 100% tested in production.
3. When using PP and PW instructions to update consecutive bytes, optimized timings are obtained with one
sequence including all the bytes versus several sequences of only a few bytes. (1 ≤ n ≤ 256)
f
instructions: FAST_READ, PW, PP, PE,
C
D.C. 25 MHz
SE, DP, RDP, WREN, WRDI, RDSR
Clock Frequency for READ instructions D.C. 20 MHz
t
Clock High Time 18 ns
CLH
t
Clock Low Time 18 ns
CLL
(2)
Clock Slew Rate
(peak to peak) 0.03 V/ns
S Active Setup Time (relative to C) 10 ns
S Not Active Hold Time (relative to C) 10 ns
Data In Setup Time 5 ns
Data In Hold Time 5 ns
S Active Hold Time (relative to C) 10 ns
S Not Active Setup Time (relative to C) 10 ns
S Deselect Time 200 ns
(2)
t
Output Disable Time 15 ns
DIS
tVClock Low to Output Valid 15 ns
t
Output Hold Time 0 ns
HO
Chip should have been deselected before Reset is de-asserted
10 ns
Write Protect Setup Time 50 ns
Write Protect Hold Time 100 ns
S to Deep Power-down 3 μs
(2)
S High to Standby Mode 30 μs
Page Write Cycle Time (256 bytes) 11
(3)
Page Write Cycle Time (n bytes)
10.2+
n*0.8/256
Page Program Cycle Time (256 bytes) 1.2
Page Program Cycle Time (n bytes)
0.4+
n*0.8/256
Page Erase Cycle Time 10 20 ms
Sector Erase Cycle Time 1 5 s
C
25 ms
5ms
36/47
M45PE80 DC and AC parameters

Table 13. AC characteristics (33 MHz operation)

33 MHz only available for products marked since week 40 of 2005
Test conditions specified in Tab l e 8 and Tab l e 9
Symbol Alt. Parameter Min. Typ. Max. Unit
Clock frequency for the following instructions: FAST_READ, PW, PP, PE,
f
C
f
C
SE, DP, RDID, RDP, WREN, WRDI,
D.C. 3 3 MHz
RDSR
f
R
(2)
t
CH
(2)
t
CL
Clock frequency for READ instructions D.C. 20 MHz
t
Clock High time 13 ns
CLH
t
Clock Low time 13 ns
CLL
(3)
Clock slew rate
(peak to peak)
0.03 V/ns
(1)
t
SLCHtCSS
t
CHSL
t
DVCHtDSU
t
CHDXtDH
t
CHSH
t
SHCH
t
SHSLtCSH
(3)
t
SHQZ
t
CLQV
t
CLQX
t
THSL
t
SHTL
(3)
t
DP
(3)
t
RDP
(4)
t
PW
(4)
t
PP
S active setup time (relative to C) 10 ns
S not active hold time (relative to C) 10 ns
Data In setup time 3 ns
Data In hold time 5 ns
S active hold time (relative to C) 5 ns
S not active setup time (relative to C) 5 ns
S deselect time 200 ns
t
Output Disable time 12 ns
DIS
tVClock Low to Output Valid 12 ns
t
Output hold time 0 ns
HO
Top Sector Lock setup time 50 ns
Top Sector Lock hold time 100 ns
S to Deep Power-down 3 μs
S High to Standby Power mode 30 μs
Page Write cycle time (256 bytes) 11
Page Write cycle time (n bytes)
10.2+
n*0.8/256
25 ms
Page Program cycle time (256 bytes) 1.2
Page Program cycle time (n bytes)
0.4+
n*0.8/256
5ms
t
PE
t
SE
1. Details of how to find the date of marking are given in Application Note, AN1995.
2. tCH + tCL must be greater than or equal to 1/ f
3. Value guaranteed by characterization, not 100% tested in production.
4. When using PP and PW instructions to update consecutive bytes, optimized timings are obtained with one
sequence including all the bytes versus several sequences of only a few bytes. (1 ≤ n ≤ 256)
Page Erase cycle time 10 20 ms
Sector Erase cycle time 1 5 s
C
37/47
DC and AC parameters M45PE80

Table 14. AC characteristics (50 MHz operation)

50 MHz preliminary data for T9HX technology
(1)
(2)
Test conditions specified in Tabl e 8 and Table 9
Symbol Alt. Parameter Min. Typ. Max. Unit
Clock frequency for the following instructions:
f
C
f
FAST_READ, PW, PP, PE, SE, DP, RDP,
C
D.C. 50 MH z
WREN, WRDI, RDSR, RDID
f
R
(3)
t
CH
(3)
t
CL
t
SLCHtCSS
t
CHSL
t
DVC HtDSU
t
CHDX
t
CHSH
t
SHCH
t
SHSL
(4)
t
SHQZ
t
CLQV
t
CLQX
t
WHSL
t
SHWL
(4)
t
DP
(4)
t
RDP
(4)
t
RLRH
t
RHSLtREC
t
SHRH
(5)
t
PW
(5)
t
PP
t
PE
t
SE
1. Preliminary data.
2. Delivery of parts in T9HX process to start from June 2007.
+ tCL must be greater than or equal to 1/ f
3. t
CH
4. Value guaranteed by characterization, not 100% tested in production.
5. n = number of bytes to program. int(A) corresponds to the upper integer part of A. Examples: int(1/8) = 1, int(16/8) = 2, int(17/8) = 3.
Clock frequency for READ instructions D.C. 33 MHz
t
Clock High time 9 ns
CLH
t
Clock Low time 9 ns
CLL
(4)
Clock slew rate
(peak to peak) 0.1 V/ns
S active setup time (relative to C) 5 ns
S not active hold time (relative to C) 5 ns
Data in setup time 2 ns
t
Data in hold time 5 ns
DH
S active hold time (relative to C) 5 ns
S not active setup time (relative to C) 5 ns
t
S deselect time 100 ns
CSH
t
Output disable time 8 ns
DIS
tVClock Low to Output Valid 8 ns
t
Output hold time 0 ns
HO
Write Protect setup time 50 ns
Write Protect hold time 100 ns
S to Deep Power-down 3 µs
S High to Standby mode 30 µs
t
Reset pulse width 10 µs
RST
Reset recovery time 3 µs
Chip should have been deselected before Reset is de-asserted
10 ns
Page Write cycle time (256 bytes) 11 23 ms
Page Program cycle time (256 bytes) 0.8
3ms
Page Program cycle time (n bytes) int(n/8) × 0.025
Page Erase cycle time 10 20 ms
Sector Erase cycle time 1 5 s
C
38/47
M45PE80 DC and AC parameters

Figure 20. Serial input timing

tSHSL
S
tSLCH
C
tDVCH
tCHSHtCHSL
tSHCH
tCHCL
tCHDX
D
Q
MSB IN
High Impedance

Figure 21. Write Protect setup and hold timing

W
tWHSL
S
C
D
High Impedance
Q
tCLCH
LSB IN
AI01447C
tSHWL
AI07439

Figure 22. Output timing

S
C
tCLQV
tCLQX
Q
ADDR.LSB IN
D
tCLQX
tCLQV
tCH
tCL
LSB OUT
tQLQH tQHQL
tSHQZ
AI01449e
39/47
DC and AC parameters M45PE80

Table 15. Reset conditions

Test conditions specified in Tab l e 8 and Ta b l e 9
Symbol Alt. Parameter Conditions Min. Typ. Max. Unit
(1)
t
RLRH
t
SHRH
1. Value guaranteed by characterization, not 100% tested in production.

Table 16. Timings after a Reset Low pulse

t
Reset Pulse Width 10 µs
RST
Chip Select High to Reset High
Chip should have been deselected before Reset is de-asserted
(1)
10 ns
Test conditions specified in Tabl e 8 and Table 9
Symbol Alt. Parameter
While decoding an instruction
Conditions:
Reset pulse occurred
(2)
Min. Typ. Max. Unit
: WREN, WRDI, RDID, RDSR, READ, Fast_Read, PW, PP, PE, SE, DP, RDP
Under completion of an Erase or Program cycle of a PW, PP, PE, SE
t
RHSLtREC
Reset Recovery time
operation
Device deselected (S High) and in Standby mode
1. All the values are guaranteed by characterization, and not 100% tested in production.
2. S remains Low while Reset is Low.

Figure 23. Reset ac waveforms

S
tRHSLtSHRH
Reset
tRLRH
30 µs
300 µs
s
40/47
AI06808
M45PE80 Package mechanical

11 Package mechanical

Figure 24. VFQFPN8 (MLP8) 8-lead Very thin Fine Pitch Quad Flat Package No lead,
6 × 5 mm, package outline
θ
aaa CA
A2
C
ddd
CAB
eE2
M
bbb
b
D2
L
70-ME
E
B
E1
aaa CB
A
2x
R1
0.10 CB
A1
A3
A
D
D1
0.10 CA
1. Drawing is not to scale.
2. The circle in the top view of the package indicates the position of pin 1.
Table 17. VFQFPN8 (MLP8)8-lead Very thin Fine Pitch Quad Flat Package No lead,
6 × 5 mm
, package mechanical data
millimeters inches
Symbol
Typ Min Max Typ Min Max
A 0.85 0.80 1.00 0.0335 0.0315 0.0394
A1 0.00 0.05 0.0000 0.0020
A2 0.65 0.0256
A3 0.20 0.0079
b 0.40 0.35 0.48 0.0157 0.0138 0.0189
D 6.00 0.2362
D1 5.75 0.2264
D2 3.40 3.20 3.60 0.1339 0.1260 0.1417
E 5.00 0.1969
E1 4.75 0.1870
E2 4.00 3.80 4.30 0.1575 0.1496 0.1693
e1.27– –0.0500– –
R1 0.10 0.00 0.0039 0.0000
L 0.60 0.50 0.75 0.0236 0.0197 0.0295
Θ 12° 12°
aaa 0.15 0.0059
bbb 0.10 0.0039
ddd 0.05 0.0020
41/47
Package mechanical M45PE80
Figure 25. SO8 wide – 8 lead Plastic Small Outline, 208 mils body width, package
outline
A2
b
e
D
N
1
1. Drawing is not to scale.
2. The circle in the top view of the package indicates the position of pin 1.
Table 18. SO8 wide – 8 lead Plastic Small Outline, 208 mils body width, mechanical
CP
E
E1
A
c
LA1 k
6L_ME
data
millimeters inches
Symbol
Typ Min Max Typ Min Max
A 2.50 0.098
A1 0.00 0.25 0.000 0.010
A2 1.51 2.00 0.059 0.079
b 0.40 0.35 0.51 0.016 0.014 0.020
c 0.20 0.10 0.35 0.008 0.004 0.014
CP 0.10 0.004
D 6.05 0.238
E 5.02 6.22 0.198 0.245
E1 7.62 8.89 0.300 0.350
e1.27– –0.050–
k 10° 10°
L 0.50 0.80 0.020 0.031
N8 8
42/47
M45PE80 Package mechanical

Figure 26. SO8N - 8 lead Plastic Small Outline, 150 mils body width, package outline

h x 45˚
A2
b
e
D
8
1
1. Drawing is not to scale.
Table 19. SO8N - 8 lead Plastic Small Outline, 150 mils body width, package
E1
A
ccc
E
A1
L
L1
c
0.25 mm
GAUGE PLANE
k
SO-A
mechanical data
millimeters inches
Symbol
Typ Min Max Typ Min Max
A1.750.069
A1 0.10 0.25 0.004 0.010
A2 1.25 0.049
b 0.28 0.48 0.011 0.019
c 0.17 0.23 0.007 0.009
ccc 0.10 0.004
D 4.90 4.80 5.00 0.193 0.189 0.197
E 6.00 5.80 6.20 0.236 0.228 0.244
E1 3.90 3.80 4.00 0.154 0.150 0.157
e1.27– –0.050– –
h 0.25 0.50 0.010 0.020
k 0°8° 0°8°
L 0.40 1.27 0.016 0.050
L1 1.04 0.041
43/47
Part numbering M45PE80

12 Part numbering

Table 20. Ordering information scheme

Example: M45PE80 V MP 6 T G
Device Type
M45PE = Page-Erasable Serial Flash Memory
Device Function
80 = 8 Mbit (1 Mbit x 8)
Operating Voltage
V = V
Package
MW = SO8W (208 mils width)
MP = VFQFPN8 6 × 5 mm (MLP8)
MN = SO8N (150 mils width)
Device Grade
6 = Industrial temperature range, –40 to 85 °C. Device tested with standard test flow
Option
blank = Standard Packing
T = Tape & Reel Packing
Plating Technology
P
= 2.7 to 3.6V
CC
(1)
or G = ECOPACK® (RoHS compliant)
1. Package available only in T9HX technology.
For a list of available options (speed, package, etc.) or for further information on any aspect of this device or when ordering parts operating at 50 MHz (0.11µm technology, process digit “4”), please contact your nearest Numonyx Sales Office.
The category of second Level Interconnect is marked on the package and on the inner box label, in compliance with JEDEC Standard JESD97. The maximum ratings related to soldering conditions are also marked on the inner box label.
44/47
M45PE80 Reference

13 Reference

AN1995: Serial Flash Memory Device Marking.

14 Revision history

Table 21. Document revision history

Date Version Changes
10-Feb-2003 1.0 Document written
02-Apr-2003 1.1 VFQFPN8 (MLP) package added
08-Apr-2003 1.2 Document promoted to Product Preview
05-May-2003 1.3 Document promoted to Preliminary Data
Description corrected of entering Hardware Protected mode (W
04-Jun-2003 1.4
26-Nov-2003 2.0
23-Jan-2004 3.0 SO16 pin-out corrected
28-May-2004 4.0
10-May-2005 5.0
4-Oct-2005 6.0
14-Feb-2006 7
driven, and cannot be left unconnected). Document Revision History for 05-May-2003 corrected.
(min) extended to –0.6V, and tPP(typ) improved to 1.2ms. Table of
V
IO
contents, SO16 package, warning about exposed paddle on MLP8, and Pb-free options added. Change of naming for VDFPN8 package. Document promoted to full datasheet
Soldering temperature information clarified for RoHS compliant devices. Device Grade clarified
SO16 wide package replaced by SO8 wide package.
Active Power, Stand-by Power and Deep Power-Down modes, Read Identification (RDID), Deep Power-down (DP), and Release from Deep Power-down (RDP) descriptions updated.
Table 20: Ordering information scheme updated. Figure 22: Output timing updated.
Added Table 13: AC characteristics (33 MHz operation). An easy way to
modify data, A fast way to modify data, Page Write (PW) and Page Program (PP) sections updated to explain optimal use of Page Write and
Page Program instructions. Updated I
characteristics. Updated Table 20: Ordering information scheme
ECOPACK® information added.
X process technology added (see Section 2.5: Reset (Reset), Table 14:
Reset timings for U process technology devices and Tabl e 1 5 : R e s e t timings for X process technology devices). MLP package renamed as
VFQFPN8, MLP silhouette modified on page 1. T
Table 7: Absolute maximum ratings. Table 5: Status Register Format moved from Section 4.7: Status Register
to Section 6.4: Read Status Register (RDSR). Blank option removed under Plating Technology in Table 20: Ordering information scheme.
values in Tabl e 1 1 : D C
CC3
removed from
LEAD
must be
45/47
Revision history M45PE80
Table 21. Document revision history
Date Version Changes
50 MHz frequency added, Table 14: AC characteristics (50 MHz
operation) added. Small text changes. Section 2.5: Reset (Reset) updated. V
descriptions added.
Figure 3: Bus master and memory devices on the SPI bus modified and
explanatory text added.
15-Dec-2006 8
Behavior of WIP bit specified at Power-up in Section 7: Power-up and
Power-down.
max modified and T
V
IO
LEAD
ratings. Table 15: Reset conditions and Table 16: Timings after a Reset Low
pulse updated.
SO8N package added (T9HX technology only), SO8W and VFQFPN8 package specifications updated (see Section 11: Package mechanical).
10-Dec-2007 9 Applied Numonyx branding.
added in Table 7: Absolute maximum
supply voltage and VSS ground
CC
46/47
M45PE80
Please Read Carefully:
INFORMATION IN THIS DOCUMENT IS PROVIDED IN CONNECTION WITH NUMONYX™ PRODUCTS. NO LICENSE, EXPRESS OR
IMPLIED, BY ESTOPPEL OR OTHERWISE, TO ANY INTELLECTUAL PROPERTY RIGHTS IS GRANTED BY THIS DOCUMENT. EXCEPT
AS PROVIDED IN NUMONYX'S TERMS AND CONDITIONS OF SALE FOR SUCH PRODUCTS, NUMONYX ASSUMES NO LIABILITY
WHATSOEVER, AND NUMONYX DISCLAIMS ANY EXPRESS OR IMPLIED WARRANTY, RELATING TO SALE AND/OR USE OF
NUMONYX PRODUCTS INCLUDING LIABILITY OR WARRANTIES RELATING TO FITNESS FOR A PARTICULAR PURPOSE,
MERCHANTABILITY, OR INFRINGEMENT OF ANY PATENT, COPYRIGHT OR OTHER INTELLECTUAL PROPERTY RIGHT.
Numonyx products are not intended for use in medical, life saving, life sustaining, critical control or safety systems, or in nuclear facility
Numonyx may make changes to specifications and product descriptions at any time, without notice.
Numonyx, B.V. may have patents or pending patent applications, trademarks, copyrights, or other intellectual property rights that relate to the presented subject matter. The furnishing of documents and other materials and information does not provide any license, express or implied,
by estoppel or otherwise, to any such patents, trademarks, copyrights, or other intellectual property rights.
Designers must not rely on the absence or characteristics of any features or instructions marked “reserved” or “undefined.” Numonyx reserves
these for future definition and shall have no responsibility whatsoever for conflicts or incompatibilities arising from future changes to them.
Contact your local Numonyx sales office or your distributor to obtain the latest specifications and before placing your product order.
Copies of documents which have an order number and are referenced in this document, or other Numonyx literature may be obtained by
visiting Numonyx's website at http://www.numonyx.com.
Numonyx StrataFlash is a trademark or registered trademark of Numonyx or its subsidiaries in the United States and other countries.
*Other names and brands may be claimed as the property of others.
Copyright © 11/5/7, Numonyx, B.V., All Rights Reserved.
applications.
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