Figure 25.SO8 wide – 8 lead Plastic Small Outline, 208 mils body width, package outline . . . . . . . . 42
Figure 26.SO8N - 8 lead Plastic Small Outline, 150 mils body width, package outline . . . . . . . . . . . 43
5/47
Summary descriptionM45PE80
1 Summary description
The M45PE80 is a 8 Mbit (1 Mbit × 8 bit) Serial Paged Flash Memory accessed by a high
speed SPI-compatible bus.
The memory can be written or programmed 1 to 256 bytes at a time, using the Page Write or
Page Program instruction. The Page Write instruction consists of an integrated Page Erase
cycle followed by a Page Program cycle.
The memory is organized as 16 sectors, each containing 256 pages. Each page is 256
bytes wide. Thus, the whole memory can be viewed as consisting of 4096 pages, or 1 048
576 bytes.
The memory can be erased a page at a time, using the Page Erase instruction, or a sector
at a time, using the Sector Erase instruction.
In order to meet environmental requirements, Numonyx offers the M45PE80 in ECOPACK®
packages. ECOPACK® packages are Lead-free and RoHS compliant.
Figure 1.Logic diagram
V
CC
D
C
S
W
Reset
Table 1.Signal names
Signal nameFunctionDirection
C Serial ClockInput
D Serial Data InputInput
Q Serial Data OutputOutput
SChip SelectInput
Write ProtectInput
W
ResetInput
Reset
M45PE80
V
SS
Q
AI06810B
V
CC
V
SS
6/47
Supply Voltage
Ground
M45PE80Summary description
Figure 2.VFQFPN and SO connections
M45PE80
DQ
1
C
2
Reset
3
4
1. There is an exposed central pad on the underside of the VFQFPN package. This is pulled, internally, to
VSS, and must not be allowed to be connected to any other voltage or signal line on the PCB.
2. See Section 11: Package mechanical for package dimensions, and how to identify pin-1.
8
7
6
5
AI06811B
V
SS
V
CC
WS
7/47
Signal descriptionM45PE80
2 Signal description
2.1 Serial Data Output (Q)
This output signal is used to transfer data serially out of the device. Data is shifted out on the
falling edge of Serial Clock (C).
2.2 Serial Data Input (D)
This input signal is used to transfer data serially into the device. It receives instructions,
addresses, and the data to be programmed. Values are latched on the rising edge of Serial
Clock (C).
2.3 Serial Clock (C)
This input signal provides the timing of the serial interface. Instructions, addresses, or data
present at Serial Data Input (D) are latched on the rising edge of Serial Clock (C). Data on
Serial Data Output (Q) changes after the falling edge of Serial Clock (C).
2.4 Chip Select (S)
When this input signal is High, the device is deselected and Serial Data Output (Q) is at high
impedance. Unless an internal Read, Program, Erase or Write cycle is in progress, the
device will be in the Standby mode (this is not the Deep Power-down mode). Driving Chip
Select (S
After Power-up, a falling edge on Chip Select (S
instruction.
) Low enables the device, placing it in the active power mode.
2.5 Reset (Reset)
The Reset (Reset) input provides a hardware reset for the memory.
When Reset (Reset
When Reset (Reset
output Q is high impedance:
If an internal operation (Write, Erase or Program cycle) is in progress when Reset (Reset
driven Low, the device enters the Reset mode and any on-going Write, Program or Erase
cycle is aborted. The addressed data may be lost.
) is driven High, the memory is in the normal operating mode.
) is driven Low, the device enters the Reset mode. In this mode, the
2.6 Write Protect (W)
) is required prior to the start of any
) is
This input signal puts the device in the Hardware Protected mode, when Write Protect (W) is
connected to V
them from write, program and erase operations. When Write Protect (W
V
, the first 256 pages of memory behave like the other pages of memory.
CC
8/47
, causing the first 256 pages of memory to become read-only by protecting
SS
) is connected to
M45PE80Signal description
2.7 VCC supply voltage
VCC is the supply voltage.
2.8 VSS ground
VSS is the reference for the VCC supply voltage.
9/47
SPI modesM45PE80
3 SPI modes
These devices can be driven by a microcontroller with its SPI peripheral running in either of
the two following modes:
●CPOL=0, CPHA=0
●CPOL=1, CPHA=1
For these two modes, input data is latched in on the rising edge of Serial Clock (C), and
output data is available from the falling edge of Serial Clock (C).
The difference between the two modes, as shown in Figure 4, is the clock polarity when the
bus master is in Stand-by mode and not transferring data:
●C remains at 0 for (CPOL=0, CPHA=0)
●C remains at 1 for (CPOL=1, CPHA=1)
Figure 3.Bus master and memory devices on the SPI bus
V
SS
V
CC
R
SPI Interface with
(CPOL, CPHA) =
(0, 0) or (1, 1)
SPI Bus Master
CS3CS2 CS1
1. The Write Protect (W) and Hold (HOLD) signals should be driven, High or Low as appropriate.
SDO
SDI
SCK
Device
W
V
CC
HOLD
V
CQD
RR R
SPI Memory
S
CQD
SS
SPI Memory
S
Device
W
V
CC
HOLD
V
SS
Figure 3 shows an example of three devices connected to an MCU, on an SPI bus. Only one
device is selected at a time, so only one device drives the Serial Data Output (Q) line at a
time, the other devices are high impedance. Resistors R (represented in Figure 3) ensure
that the M45PE80 is not selected if the Bus Master leaves the S
state. As the Bus Master may enter a state where all inputs/outputs are in high impedance
at the same time (for example, when the Bus Master is reset), the clock line (C) must be
connected to an external pull-down resistor so that, when all inputs/outputs become high
impedance, the S
C do not become High at the same time, and so, that the t
line is pulled High while the C line is pulled Low (thus ensuring that S and
requirement is met). The
SHCH
typical value of R is 100 kΩ, assuming that the time constant R*C
capacitance of the bus line) is shorter than the time during which the Bus Master leaves the
SPI bus in high impedance.
CQD
S
V
CC
SPI Memory
Device
W
V
SS
HOLD
AI12836b
line in the high impedance
(Cp = parasitic
p
10/47
M45PE80SPI modes
Example: Cp = 50 pF, that is R*Cp = 5 µs <=> the application must ensure that the Bus
Master never leaves the SPI bus in the high impedance state for a time period shorter than
5µs.
Figure 4.SPI modes supported
CPHA
CPOL
C
0
0
1
1
C
D
Q
MSB
MSB
AI01438B
11/47
Operating featuresM45PE80
4 Operating features
4.1 Sharing the overhead of modifying data
To write or program one (or more) data bytes, two instructions are required: Write Enable
(WREN), which is one byte, and a Page Write (PW) or Page Program (PP) sequence, which
consists of four bytes plus data. This is followed by the internal cycle (of duration t
To share this overhead, the Page Write (PW) or Page Program (PP) instruction allows up to
256 bytes to be programmed (changing bits from 1 to 0) or written (changing bits to 0 or 1) at
a time, provided that they lie in consecutive addresses on the same page of memory.
4.2 An easy way to modify data
The Page Write (PW) instruction provides a convenient way of modifying data (up to 256
contiguous bytes at a time), and simply requires the start address, and the new data in the
instruction sequence.
PW
or tPP).
The Page Write (PW) instruction is entered by driving Chip Select (S
transmitting the instruction byte, three address bytes (A23-A0) and at least one data byte,
and then driving Chip Select (S
bytes are written to the data buffer, starting at the address given in the third address byte
(A7-A0). When Chip Select (S
unchanged, bytes of the data buffer are automatically loaded with the values of the
corresponding bytes of the addressed memory page. The addressed memory page then
automatically put into an Erase cycle. Finally, the addressed memory page is programmed
with the contents of the data buffer.
All of this buffer management is handled internally, and is transparent to the user. The user
is given the facility of being able to alter the contents of the memory on a byte-by-byte basis.
For optimized timings, it is recommended to use the Page Write (PW) instruction to write all
consecutive targeted bytes in a single sequence versus using several Page Write (PW)
sequences with each containing only a few bytes (see Page Write (PW) and Ta bl e 1 4 : AC
characteristics (50 MHz operation)).
) High. While Chip Select (S) is being held Low, the data
) is driven High, the Write cycle starts. The remaining,
) Low, and then
12/47
M45PE80Operating features
4.3 A fast way to modify data
The Page Program (PP) instruction provides a fast way of modifying data (up to 256
contiguous bytes at a time), provided that it only involves resetting bits to 0 that had
previously been set to 1.
This might be:
●when the designer is programming the device for the first time
●when the designer knows that the page has already been erased by an earlier Page
Erase (PE) or Sector Erase (SE) instruction. This is useful, for example, when storing a
fast stream of data, having first performed the erase cycle when time was available
●when the designer knows that the only changes involve resetting bits to 0 that are still
set to 1. When this method is possible, it has the additional advantage of minimizing the
number of unnecessary erase operations, and the extra stress incurred by each page.
For optimized timings, it is recommended to use the Page Program (PP) instruction to
program all consecutive targeted bytes in a single sequence versus using several Page
Program (PP) sequences with each containing only a few bytes (see Page Program (PP)
and Table 14: AC characteristics (50 MHz operation)).
4.4 Polling during a Write, Program or Erase cycle
A further improvement in the write, program or erase time can be achieved by not waiting for
the worst case delay (t
Status Register so that the application program can monitor its value, polling it to establish
when the previous cycle is complete.
, tPP, tPE, or tSE). The Write In Progress (WIP) bit is provided in the
PW
4.5 Reset
An internal Power-On Reset circuit helps protect against inadvertent data writes. Addition
protection is provided by driving Reset (Reset
driving it High when V
has reached the correct voltage level, VCC(min).
CC
) Low during the Power-on process, and only
4.6 Active Power, Stand-by Power and Deep Power-Down modes
When Chip Select (S) is Low, the device is enabled, and in the Active Power mode.
When Chip Select (S
mode until all internal cycles have completed (Program, Erase, Write). The device then goes
in to the Stand-by Power mode. The device consumption drops to I
The Deep Power-down mode is entered when the specific instruction (the Enter Deep
Power-down Mode (DP) instruction) is executed. The device consumption drops further to
I
. The device remains in this mode until another specific instruction (the Release from
CC2
Deep Power-down Mode) is executed.
) is High, the device is disabled, but could remain in the Active Power
.
CC1
While in the Deep Power-down mode, the device ignores all Write, Program and Erase
instructions (see Deep Power-down (DP)). This can be used as an extra software protection
mechanism, when the device is not in active use, to protect the device from inadvertent
Write, Program or Erase instructions.
13/47
Operating featuresM45PE80
4.7 Status Register
The Status Register contains two status bits that can be read by the Read Status Register
(RDSR) instruction. See Section 6.4: Read Status Register (RDSR) for a detailed
description of the Status Register bits.
4.8 Protection modes
The environments where non-volatile memory devices are used can be very noisy. No SPI
device can operate correctly in the presence of excessive noise. To help combat this, the
M45PE80 boasts the following data protection mechanisms:
●Power-On Reset and an internal timer (t
inadvertent changes while the power supply is outside the operating specification.
●Program, Erase and Write instructions are checked that they consist of a number of
clock pulses that is a multiple of eight, before they are accepted for execution.
●All instructions that modify data must be preceded by a Write Enable (WREN)
instruction to set the Write Enable Latch (WEL) bit. This bit is returned to its reset state
by the following events:
●The Hardware Protected mode is entered when Write Protect (W) is driven Low,
causing the first 256 pages of memory to become read-only. When Write Protect (W
driven High, the first 256 pages of memory behave like the other pages of memory
●The Reset (Reset) signal can be driven Low to protect the contents of the memory
during any critical time, not just during Power-up and Power-down.
●In addition to the low power consumption feature, the Deep Power-down mode offers
extra software protection from inadvertent Write, Program and Erase instructions while
the device is not in active use.
) can provide protection against
PUW
) is
14/47
M45PE80Memory organization
5 Memory organization
The memory is organized as:
●4096 pages (256 bytes each).
●1 048 576 bytes (8 bits each)
●16 sectors (512 Kbits, 65536 bytes each)
Each page can be individually:
●programmed (bits are programmed from 1 to 0)
●erased (bits are erased from 0 to 1)
●written (bits are changed to either 0 or 1)
The device is Page or Sector Erasable (bits are erased from 0 to 1).
Table 2.Memory organization
Sector Address range
15F0000hFFFFFh
14E0000hEFFFFh
13D0000hDFFFFh
12C0000hCFFFFh
11 B0000hBFFFFh
10 A0000hAFFFFh
9 90000h9FFFFh
8 80000h8FFFFh
770000h7FFFFh
660000h6FFFFh
550000h5FFFFh
440000h4FFFFh
3 30000h3FFFFh
2 20000h2FFFFh
1 10000h1FFFFh
0 00000h0FFFFh
15/47
Memory organizationM45PE80
Figure 5.Block diagram
Reset
W
S
C
D
Q
Control Logic
Address Register
and Counter
Y Decoder
10000h
00000h
High Voltage
Generator
I/O Shift Register
256 Byte
Data Buffer
256 Bytes (Page Size)
FFFFFh
000FFh
Status
Register
First 256 Pages can
be made read-only
16/47
X Decoder
AI06812
M45PE80Instructions
6 Instructions
All instructions, addresses and data are shifted in and out of the device, most significant bit
first.
Serial Data Input (D) is sampled on the first rising edge of Serial Clock (C) after Chip Select
(S
) is driven Low. Then, the one-byte instruction code must be shifted in to the device, most
significant bit first, on Serial Data Input (D), each bit being latched on the rising edges of
Serial Clock (C).
The instruction set is listed in Ta bl e 3 .
Every instruction sequence starts with a one-byte instruction code. Depending on the
instruction, this might be followed by address bytes, or by data bytes, or by both or none.
In the case of a Read Data Bytes (READ), Read Data Bytes at Higher Speed (Fast_Read)
or Read Status Register (RDSR) instruction, the shifted-in instruction sequence is followed
by a data-out sequence. Chip Select (S
sequence is being shifted out.
In the case of a Page Write (PW), Page Program (PP), Page Erase (PE), Sector Erase (SE),
Write Enable (WREN), Write Disable (WRDI), Deep Power-down (DP) or Release from
Deep Power-down (RDP) instruction, Chip Select (S
boundary, otherwise the instruction is rejected, and is not executed. That is, Chip Select (S
must driven High when the number of clock pulses after Chip Select (S
an exact multiple of eight.
) can be driven High after any bit of the data-out
) must be driven High exactly at a byte
) being driven Low is
)
All attempts to access the memory array during a Write cycle, Program cycle or Erase cycle
are ignored, and the internal Write cycle, Program cycle or Erase cycle continues
unaffected.
Table 3.Instruction set
InstructionDescription
WREN Write Enable0000 011006h0 0 0
WRDI Write Disable0000 0100 04h0 0 0
RDID Read Identification1001 11119Fh0 0 1 to 3
RDSR Read Status Register 0000 010105h0 0 1 to ∞
READ Read Data Bytes0000 001103h30 1 to ∞
FAST_READ
PW Page Write0000 10100Ah30 1 to 256
PP Page Program0000 001002h30 1 to 256
PE Page Erase 1101 1011DBh3 0 0
SE Sector Erase 1101 1000D8h3 0 0
DP Deep Power-down1011 1001B9h0 0 0
Read Data Bytes at Higher
Speed
One-byte instruction
code
0000 10110Bh311 to ∞
Address
bytes
Dummy
bytes
Data
bytes
RDP
Release from Deep
Power-down
1010 1011ABh0 00
17/47
InstructionsM45PE80
6.1 Write Enable (WREN)
The Write Enable (WREN) instruction (Figure 6) sets the Write Enable Latch (WEL) bit.
The Write Enable Latch (WEL) bit must be set prior to every Page Write (PW), Page
Program (PP), Page Erase (PE), and Sector Erase (SE) instruction.
The Write Enable (WREN) instruction is entered by driving Chip Select (S
instruction code, and then driving Chip Select (S
Figure 6.Write Enable (WREN) instruction sequence
S
C
D
Q
6.2 Write Disable (WRDI)
The Write Disable (WRDI) instruction (Figure 7) resets the Write Enable Latch (WEL) bit.
The Write Disable (WRDI) instruction is entered by driving Chip Select (S
instruction code, and then driving Chip Select (S
The Write Enable Latch (WEL) bit is reset under the following conditions:
The Read Identification (RDID) instruction allows the 8-bit manufacturer identification to be
read, followed by two bytes of device identification. The manufacturer identification is
assigned by JEDEC, and has the value 20h for Numonyx. The device identification is
assigned by the device manufacturer, and indicates the memory type in the first byte (40h),
and the memory capacity of the device in the second byte (14h).
Any Read Identification (RDID) instruction while an Erase or Program cycle is in progress, is
not decoded, and has no effect on the cycle that is in progress. The Read Identification
(RDID) instruction should not be issued while the device is in Deep Power-down mode.
The device is first selected by driving Chip Select (S
) Low. Then, the 8-bit instruction code
for the instruction is shifted in. This is followed by the 24-bit device identification, stored in
the memory, being shifted out on Serial Data Output (Q), each bit being shifted out during
the falling edge of Serial Clock (C).
The instruction sequence is shown in Figure 8.
The Read Identification (RDID) instruction is terminated by driving Chip Select (S
) High at
any time during data output.
When Chip Select (S
) is driven High, the device is put in the Stand-by Power mode. Once in
the Stand-by Power mode, the device waits to be selected, so that it can receive, decode
and execute instructions.
Figure 8.Read Identification (RDID) instruction sequence and data-out sequence
S
213456789101112131415
0
C
Instruction
D
16 16 1828 29 30 31
Q
High Impedance
Manufacturer Identification
MSB
Device Identification
15 1413 3210
MSB
AI06809
19/47
InstructionsM45PE80
6.4 Read Status Register (RDSR)
The Read Status Register (RDSR) instruction allows the Status Register to be read. The
Status Register may be read at any time, even while a Program, Erase or Write cycle is in
progress. When one of these cycles is in progress, it is recommended to check the Write In
Progress (WIP) bit before sending a new instruction to the device. It is also possible to read
the Status Register continuously, as shown in Figure 9.
The status bits of the Status Register are as follows:
6.4.1 WIP bit
The Write In Progress (WIP) bit indicates whether the memory is busy with a Write, Program
or Erase cycle. When set to 1, such a cycle is in progress, when reset to 0 no such cycle is
in progress.
6.4.2 WEL bit
The Write Enable Latch (WEL) bit indicates the status of the internal Write Enable Latch.
When set to 1 the internal Write Enable Latch is set, when set to 0 the internal Write Enable
Latch is reset and no Write, Program or Erase instruction is accepted.
Table 5.Status Register Format
b7 b0
0 0 0 0 0 0 WEL
1. WEL and WIP are volatile read-only bits (WEL is set and reset by specific instructions; WIP is
automatically set and reset by the internal logic of the device).
(1)
WIP
(1)
Figure 9.Read Status Register (RDSR) instruction sequence and data-out
sequence
S
213456789101112131415
0
C
Instruction
D
Q
High Impedance
Status Register Out
7 6543210
MSB
Status Register Out
7 6543210
MSB
7
AI02031E
20/47
M45PE80Instructions
6.5 Read Data Bytes (READ)
The device is first selected by driving Chip Select (S) Low. The instruction code for the Read
Data Bytes (READ) instruction is followed by a 3-byte address (A23-A0), each bit being
latched-in during the rising edge of Serial Clock (C). Then the memory contents, at that
address, is shifted out on Serial Data Output (Q), each bit being shifted out, at a maximum
frequency f
The instruction sequence is shown in Figure 10.
The first byte addressed can be at any location. The address is automatically incremented
to the next higher address after each byte of data is shifted out. The whole memory can,
therefore, be read with a single Read Data Bytes (READ) instruction. When the highest
address is reached, the address counter rolls over to 000000h, allowing the read sequence
to be continued indefinitely.
, during the falling edge of Serial Clock (C).
R
The Read Data Bytes (READ) instruction is terminated by driving Chip Select (S
Select (S
) can be driven High at any time during data output. Any Read Data Bytes (READ)
) High. Chip
instruction, while an Erase, Program or Write cycle is in progress, is rejected without having
any effects on the cycle that is in progress.
Figure 10. Read Data Bytes (READ)instruction sequence and data-out sequence
S
21345678910 2829303132333435
0
C
Instruction24-Bit Address
D
High Impedance
Q
1. Address bits A23 to A20 are Don’t Care.
23
MSB
2221 3210
7654317
MSB
36 37 38
Data Out 1
39
Data Out 2
2
0
AI03748D
21/47
InstructionsM45PE80
6.6 Read Data Bytes at Higher Speed (FAST_READ)
The device is first selected by driving Chip Select (S) Low. The instruction code for the Read
Data Bytes at Higher Speed (FAST_READ) instruction is followed by a 3-byte address (A23A0) and a dummy byte, each bit being latched-in during the rising edge of Serial Clock (C).
Then the memory contents, at that address, is shifted out on Serial Data Output (Q), each
bit being shifted out, at a maximum frequency f
The instruction sequence is shown in Figure 11.
The first byte addressed can be at any location. The address is automatically incremented
to the next higher address after each byte of data is shifted out. The whole memory can,
therefore, be read with a single Read Data Bytes at Higher Speed (FAST_READ)
instruction. When the highest address is reached, the address counter rolls over to
000000h, allowing the read sequence to be continued indefinitely.
The Read Data Bytes at Higher Speed (FAST_READ) instruction is terminated by driving
Chip Select (S
) High. Chip Select (S) can be driven High at any time during data output. Any
Read Data Bytes at Higher Speed (FAST_READ) instruction, while an Erase, Program or
Write cycle is in progress, is rejected without having any effects on the cycle that is in
progress.
Figure 11. Read Data Bytes at Higher Speed (FAST_READ)instruction sequence
and data-out sequence
, during the falling edge of Serial Clock (C).
C
S
21345678910 28293031
0
C
Instruction24 BIT ADDRESS
23
D
High Impedance
Q
S
32 33 3436 37 38 39 40 41 42 43 44 45 46
C
D
Q
7654320
35
Dummy Byte
2221 3210
1
DATA OUT 1
7654320
MSB
47
DATA OUT 2
7 6543210
1
MSBMSB
7
1. Address bits A23 to A20 are Don’t Care.
22/47
AI04006
M45PE80Instructions
6.7 Page Write (PW)
The Page Write (PW) instruction allows bytes to be written in the memory. Before it can be
accepted, a Write Enable (WREN) instruction must previously have been executed. After the
Write Enable (WREN) instruction has been decoded, the device sets the Write Enable Latch
(WEL).
The Page Write (PW) instruction is entered by driving Chip Select (S
instruction code, three address bytes and at least one data byte on Serial Data Input (D).
The rest of the page remains unchanged if no power failure occurs and the device is not
reset during the write cycle.
The Page Write (PW) instruction performs a page erase cycle even if only one byte is
updated.
If the 8 least significant address bits (A7-A0) are not all zero, all transmitted data exceeding
the addressed page boundary roll over, and are written from the start address of the same
page (the one whose 8 least significant address bits (A7-A0) are all zero). Chip Select (S
must be driven Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 12.
If more than 256 bytes are sent to the device, previously latched data are discarded and the
last 256 data bytes are guaranteed to be written correctly within the same page. If less than
256 Data bytes are sent to device, they are correctly written at the requested addresses
without having any effects on the other bytes of the same page.
For optimized timings, it is recommended to use the Page Write (PW) instruction to write all
consecutive targeted bytes in a single sequence versus using several Page Write (PW)
sequences with each containing only a few bytes (see Table 14: AC characteristics (50 MHz
operation)).
Chip Select (S
latched in, otherwise the Page Write (PW) instruction is not executed.
) must be driven High after the eighth bit of the last data byte has been
) Low, followed by the
)
As soon as Chip Select (S
is t
) is initiated. While the Page Write cycle is in progress, the Status Register may be
PW
read to check the value of the Write In Progress (WIP) bit. The Write In Progress (WIP) bit is
1 during the self-timed Page Write cycle, and is 0 when it is completed. At some unspecified
time before the cycle is complete, the Write Enable Latch (WEL) bit is reset.
A Page Write (PW) instruction applied to a page that is Hardware Protected is not executed.
Any Page Write (PW) instruction, while an Erase, Program or Write cycle is in progress, is
rejected without having any effects on the cycle that is in progress.
) is driven High, the self-timed Page Write cycle (whose duration
23/47
InstructionsM45PE80
Figure 12. Page Write (PW) instruction sequence
S
21345678910 2829303132333435
0
C
Instruction24-Bit Address
D
S
424143 44 45 46 47 48 49 5052 53 54 5540
C
Data Byte 2
D
7654320
MSBMSBMSB
1
1. Address bits A23 to A20 are Don’t Care
2. 1 ≤ n ≤ 256
23
2221 3210
MSB
51
Data Byte 3Data Byte n
7654320
1
7654320
MSB
7654320
36 37 38
Data Byte 1
39
1
1
AI04045
24/47
M45PE80Instructions
6.8 Page Program (PP)
The Page Program (PP) instruction allows bytes to be programmed in the memory
(changing bits from 1 to 0, only). Before it can be accepted, a Write Enable (WREN)
instruction must previously have been executed. After the Write Enable (WREN) instruction
has been decoded, the device sets the Write Enable Latch (WEL).
The Page Program (PP) instruction is entered by driving Chip Select (S
the instruction code, three address bytes and at least one data byte on Serial Data Input (D).
If the 8 least significant address bits (A7-A0) are not all zero, all transmitted data exceeding
the addressed page boundary roll over, and are programmed from the start address of the
same page (the one whose 8 least significant address bits (A7-A0) are all zero). Chip Select
(S
) must be driven Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 13.
If more than 256 bytes are sent to the device, previously latched data are discarded and the
last 256 data bytes are guaranteed to be programmed correctly within the same page. If less
than 256 Data bytes are sent to device, they are correctly programmed at the requested
addresses without having any effects on the other bytes of the same page.
For optimized timings, it is recommended to use the Page Program (PP) instruction to
program all consecutive targeted bytes in a single sequence versus using several Page
Program (PP) sequences with each containing only a few bytes (see Table 14: AC
characteristics (50 MHz operation)).
Chip Select (S
latched in, otherwise the Page Program (PP) instruction is not executed.
As soon as Chip Select (S
duration is t
may be read to check the value of the Write In Progress (WIP) bit. The Write In Progress
(WIP) bit is 1 during the self-timed Page Program cycle, and is 0 when it is completed. At
some unspecified time before the cycle is complete, the Write Enable Latch (WEL) bit is
reset.
) must be driven High after the eighth bit of the last data byte has been
) is driven High, the self-timed Page Program cycle (whose
) is initiated. While the Page Program cycle is in progress, the Status Register
PP
) Low, followed by
A Page Program (PP) instruction applied to a page that is Hardware Protected is not
executed.
Any Page Program (PP) instruction, while an Erase, Program or Write cycle is in progress, is
rejected without having any effects on the cycle that is in progress.
25/47
InstructionsM45PE80
Figure 13. Page Program (PP) instruction sequence
S
21345678910 2829303132333435
0
C
Instruction24-Bit Address
D
S
424143 44 45 46 47 48 49 5052 53 54 5540
C
Data Byte 2
D
7654320
MSBMSBMSB
1
1. Address bits A23 to A20 are Don’t Care
2. 1 ≤ n ≤ 256
23
2221 3210
MSB
51
Data Byte 3Data Byte n
7654320
1
7654320
MSB
7654320
36 37 38
Data Byte 1
39
1
1
AI04044
26/47
M45PE80Instructions
6.9 Page Erase (PE)
The Page Erase (PE) instruction sets to 1 (FFh) all bits inside the chosen page. Before it can
be accepted, a Write Enable (WREN) instruction must previously have been executed. After
the Write Enable (WREN) instruction has been decoded, the device sets the Write Enable
Latch (WEL).
The Page Erase (PE) instruction is entered by driving Chip Select (S
) Low, followed by the
instruction code, and three address bytes on Serial Data Input (D). Any address inside the
Page is a valid address for the Page Erase (PE) instruction. Chip Select (S
) must be driven
Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 14.
Chip Select (S
) must be driven High after the eighth bit of the last address byte has been
latched in, otherwise the Page Erase (PE) instruction is not executed. As soon as Chip
Select (S
) is driven High, the self-timed Page Erase cycle (whose duration is tPE) is initiated.
While the Page Erase cycle is in progress, the Status Register may be read to check the
value of the Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1 during the selftimed Page Erase cycle, and is 0 when it is completed. At some unspecified time before the
cycle is complete, the Write Enable Latch (WEL) bit is reset.
A Page Erase (PE) instruction applied to a page that is Hardware Protected is not executed.
Any Page Erase (PE) instruction, while an Erase, Program or Write cycle is in progress, is
rejected without having any effects on the cycle that is in progress.
Figure 14. Page Erase (PE)instruction sequence
S
213456789293031
0
C
Instruction
D
1. Address bits A23 to A20 are Don’t Care.
24 Bit Address
23 2220
MSB
27/47
1
AI04046
InstructionsM45PE80
6.10 Sector Erase (SE)
The Sector Erase (SE) instruction sets to 1 (FFh) all bits inside the chosen sector. Before it
can be accepted, a Write Enable (WREN) instruction must previously have been executed.
After the Write Enable (WREN) instruction has been decoded, the device sets the Write
Enable Latch (WEL).
The Sector Erase (SE) instruction is entered by driving Chip Select (S
) Low, followed by the
instruction code, and three address bytes on Serial Data Input (D). Any address inside the
Sector (see Ta bl e 2 ) is a valid address for the Sector Erase (SE) instruction. Chip Select (S
must be driven Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 15.
Chip Select (S
) must be driven High after the eighth bit of the last address byte has been
latched in, otherwise the Sector Erase (SE) instruction is not executed. As soon as Chip
Select (S
) is driven High, the self-timed Sector Erase cycle (whose duration is tSE) is
initiated. While the Sector Erase cycle is in progress, the Status Register may be read to
check the value of the Write In Progress (WIP) bit. The Write In Progress (WIP) bit is 1
during the self-timed Sector Erase cycle, and is 0 when it is completed. At some unspecified
time before the cycle is complete, the Write Enable Latch (WEL) bit is reset.
A Sector Erase (SE) instruction applied to a sector that contains a page that is Hardware
Protected is not executed.
Any Sector Erase (SE) instruction, while an Erase, Program or Write cycle is in progress, is
rejected without having any effects on the cycle that is in progress.
Figure 15. Sector Erase (SE)instruction sequence
S
213456789293031
0
C
)
Instruction
D
1. Address bits A23 to A20 are Don’t Care.
28/47
24 Bit Address
23 2220
MSB
1
AI03751D
M45PE80Instructions
6.11 Deep Power-down (DP)
Executing the Deep Power-down (DP) instruction is the only way to put the device in the
lowest consumption mode (the Deep Power-down mode). It can also be used as an extra
software protection mechanism, while the device is not in active use, since in this mode, the
device ignores all Write, Program and Erase instructions.
Driving Chip Select (S
) High deselects the device, and puts the device in the Standby mode
(if there is no internal cycle currently in progress). But this mode is not the Deep Powerdown mode. The Deep Power-down mode can only be entered by executing the Deep
Power-down (DP) instruction, to reduce the standby current (from I
CC1
to I
, as specified
CC2
in Ta bl e 1 1 ).
To exit from Deep Power-down mode, the Release from Deep Power-down (RDP)
instruction must be issued. No other instruction must be issued while
the device is in this mode.
The Deep Power-down mode automatically stops at Power-down, and the device always
Powers-up in the Standby mode.
The Deep Power-down (DP) instruction is entered by driving Chip Select (S
by the instruction code on Serial Data Input (D). Chip Select (S
) must be driven Low for the
) Low, followed
entire duration of the sequence.
The instruction sequence is shown in Figure 16.
Chip Select (S
) must be driven High after the eighth bit of the instruction code has been
latched in, otherwise the Deep Power-down (DP) instruction is not executed. As soon as
Chip Select (S
to I
and the Deep Power-down mode is entered.
CC2
) is driven High, it requires a delay of tDP before the supply current is reduced
Any Deep Power-down (DP) instruction, while an Erase, Program or Write cycle is in
progress, is rejected without having any effects on the cycle that is in progress.
Figure 16. Deep Power-down (DP) instruction sequence
S
t
21345670
C
Instruction
D
29/47
DP
Stand-by Mode
Deep Power-down Mode
AI03753D
InstructionsM45PE80
6.12 Release from Deep Power-down (RDP)
To exit from Deep Power-down mode, the Release from Deep Power-down (RDP)
instruction must be issued. No other instruction must be issued while the device is in this
mode.
The Release from Deep Power-down (RDP) instruction is entered by driving Chip Select (S
Low, followed by the instruction code on Serial Data Input (D). Chip Select (S
) must be
driven Low for the entire duration of the sequence.
The instruction sequence is shown in Figure 17.
The Release from Deep Power-down (RDP) instruction is terminated by driving Chip Select
(S
) High. Sending additional clock cycles on Serial Clock (C), while Chip Select (S) is driven
Low, cause the instruction to be rejected, and not executed.
After Chip Select (S
Standby mode. Chip Select (S
) has been driven High, followed by a delay, t
) must remain High at least until this period is over. The
, the device is put in the
RDP
device waits to be selected, so that it can receive, decode and execute instructions.
Any Release from Deep Power-down (RDP) instruction, while an Erase, Program or Write
cycle is in progress, is rejected without having any effects on the cycle that is in progress.
Figure 17. Release from Deep Power-down (RDP) instruction sequence
S
t
21345670
C
Instruction
D
RDP
)
High Impedance
Q
30/47
Deep Power-down Mode
Stand-by Mode
AI06807
M45PE80Power-up and Power-down
7 Power-up and Power-down
At Power-up and Power-down, the device must not be selected (that is Chip Select (S) must
follow the voltage applied on V
●V
●
(min) at Power-up, and then for a further delay of t
CC
VSS at Power-down
A safe configuration is provided in Section 3: SPI modes.
To avoid data corruption and inadvertent write operations during power up, a Power On
Reset (POR) circuit is included. The logic inside the device is held reset while V
than the POR threshold value, V
respond to any instruction.
Moreover, the device ignores all Write Enable (WREN), Page Write (PW), Page Program
(PP), Page Erase (PE) and Sector Erase (SE) instructions until a time delay of t
elapsed after the moment that V
operation of the device is not guaranteed if, by this time, V
Write, Program or Erase instructions should be sent until the later of:
●t
●t
after VCC passed the VWI threshold
PUW
after VCC passed the VCC(min) level
VSL
These values are specified in Ta bl e 6 .
) until VCC reaches the correct value:
CC
VSL
– all operations are disabled, and the device does not
WI
rises above the VWI threshold. However, the correct
CC
is still below VCC(min). No
CC
is less
CC
PUW
has
If the delay, t
selected for READ instructions even if the t
As an extra protection, the Reset (Reset
, has elapsed, after VCC has risen above VCC(min), the device can be
VSL
delay is not yet fully elapsed.
PUW
) signal could be driven Low for the whole duration
of the Power-up and Power-down phases.
At Power-up, the device is in the following state:
●The device is in the Standby mode (not the Deep Power-down mode).
●The Write Enable Latch (WEL) bit is reset.
●The Write In Progress (WIP) bit is reset.
Normal precautions must be taken for supply rail decoupling, to stabilize the V
device in a system should have the V
rail decoupled by a suitable capacitor close to the
CC
feed. Each
CC
package pins. (Generally, this capacitor is of the order of 100 nF).
At Power-down, when V
value, V
, all operations are disabled and the device does not respond to any instruction.
WI
drops from the operating voltage, to below the POR threshold
CC
(The designer needs to be aware that if a Power-down occurs while a Write, Program or
Erase cycle is in progress, some data corruption can result.)
31/47
Power-up and Power-downM45PE80
Figure 18. Power-up timing
V
CC
VCC(max)
Program, Erase and Write Commands are Rejected by the Device
Chip Selection Not Allowed
VCC(min)
Reset State
of the
Device
V
WI
Table 6.Power-Up timing and VWI threshold
tVSL
tPUW
Read Access allowedDevice fully
accessible
time
AI04009C
SymbolParameterMin.Max.Unit
(1)
t
VSL
t
PUW
V
WI
1. These parameters are characterized only, over the temperature range –40°C to +85°C.
VCC(min) to S low30µs
(1)
Time delay before the first Write, Program or Erase instruction110ms
(1)
Write inhibit voltage1.52.5V
32/47
M45PE80Initial delivery state
8 Initial delivery state
The device is delivered with the memory array erased: all bits are set to 1 (each byte
contains FFh). All usable Status Register bits are 0.
9 Maximum rating
Stressing the device above the rating listed in the Absolute Maximum Ratings table may
cause permanent damage to the device. These are stress ratings only and operation of the
device at these or any other conditions above those indicated in the Operating sections of
this specification is not implied. Exposure to Absolute Maximum Rating conditions for
extended periods may affect device reliability. Refer also to the Numonyx SURE Program
and other relevant quality documents.
Table 7.Absolute maximum ratings
SymbolParameterMin.Max.Unit
T
T
LEAD
V
V
V
1. Compliant with JEDEC Std J-STD-020C (for small body, Sn-Pb or Pb assembly), the Numonyx
ECOPACK® 7191395 specification, and the European directive on Restrictions on Hazardous Substances
(RoHS) 2002/95/EU.
Input and output voltage (with respect to Ground)–0.6VCC + 0.6V
IO
Supply voltage–0.64.0V
CC
Electrostatic Discharge Voltage (Human Body Model)
ESD
(2)
–20002000V
(1)
°C
33/47
DC and AC parametersM45PE80
10 DC and AC parameters
This section summarizes the operating and measurement conditions, and the DC and AC
characteristics of the device. The parameters in the DC and AC Characteristic tables that
follow are derived from tests performed under the Measurement Conditions summarized in
the relevant tables. Designers should check that the operating conditions in their circuit
match the measurement conditions when relying on the quoted parameters.
Table 8.Operating conditions
SymbolParameterMin.Max.Unit
V
CC
T
A
Table 9.AC measurement conditions
Supply voltage2.73.6V
Ambient operating temperature–4085°C
SymbolParameterMin.Max.Unit
C
Load capacitance30pF
L
Input rise and fall times5ns
Input pulse voltages0.2VCC to 0.8V
Input and output timing reference voltages0.3V
1. Output Hi-Z is defined as the point where data out is no longer driven.
to 0.7V
CC
CC
CC
Figure 19. AC measurement I/O waveform
Input Levels
0.8V
0.2V
Table 10.Capacitance
CC
CC
(1)
Input and Output
Timing Reference Levels
0.7V
CC
0.3V
CC
AI00825B
V
V
SymbolParameterTest ConditionMin.Max.Unit
C
OUT
C
1. Sampled only, not 100% tested, at T
Output capacitance (Q)V
Input capacitance (other pins)VIN = 0 V6pF
IN
=25°C and a frequency of 20MHz.
A
34/47
= 0 V8pF
OUT
M45PE80DC and AC parameters
Table 11.DC characteristics
SymbolParameter
I
Input leakage current± 2µA
LI
Output leakage current± 2µA
I
LO
Standby current
I
(Standby and Reset
CC1
modes)
I
I
I
I
V
V
V
Deep Power-down
CC2
current
Operating current
CC3
(FAST_READ)
Operating current (PW)S = V
CC4
Operating current (SE)S = V
CC5
V
Input low voltage– 0.50.3V
IL
Input high voltage0.7V
IH
Output low voltageIOL = 1.6 mA0.4V
OL
Output high voltageIOH = –100 µAVCC–0.2V
OH
Test condition
(in addition to those in Tabl e 8 )
S = VCC, V
= VCC, V
S
= VSS or V
IN
= VSS or V
IN
CC
CC
C = 0.1VCC / 0.9.VCC at 25 MHz,
Q = open
C = 0.1V
/ 0.9.VCC at 50 MHz,
CC
Q = open
CC
CC
Min.Max.Unit
50µA
10µA
6
mA
8
15mA
15mA
V
CC
CCVCC
+0.4V
35/47
DC and AC parametersM45PE80
Table 12.AC characteristics (25 MHz operation)
Test conditions specified in Tab l e 8 and Tab l e 9
SymbolAlt.ParameterMin.Typ.Max.Unit
Clock Frequency for the following
f
C
f
R
(1)
t
CH
(1)
t
CL
t
SLCHtCSS
t
CHSL
t
DVCHtDSU
t
CHDXtDH
t
CHSH
t
SHCH
t
SHSLtCSH
t
SHQZ
t
CLQV
t
CLQX
t
SHRH
t
WHSL
t
SHWL
(2)
t
DP
t
RDP
t
PW
(3)
t
PP
t
PE
t
SE
1. tCH + tCL must be greater than or equal to 1/ f
2. Value guaranteed by characterization, not 100% tested in production.
3. When using PP and PW instructions to update consecutive bytes, optimized timings are obtained with one
sequence including all the bytes versus several sequences of only a few bytes. (1 ≤ n ≤ 256)
f
instructions: FAST_READ, PW, PP, PE,
C
D.C.25MHz
SE, DP, RDP, WREN, WRDI, RDSR
Clock Frequency for READ instructionsD.C.20MHz
t
Clock High Time18ns
CLH
t
Clock Low Time18ns
CLL
(2)
Clock Slew Rate
(peak to peak)0.03V/ns
S Active Setup Time (relative to C)10ns
S Not Active Hold Time (relative to C)10ns
Data In Setup Time5ns
Data In Hold Time5ns
S Active Hold Time (relative to C)10ns
S Not Active Setup Time (relative to C)10ns
S Deselect Time200ns
(2)
t
Output Disable Time15ns
DIS
tVClock Low to Output Valid15ns
t
Output Hold Time0ns
HO
Chip should have been deselected
before Reset is de-asserted
10ns
Write Protect Setup Time50ns
Write Protect Hold Time100ns
S to Deep Power-down3μs
(2)
S High to Standby Mode30μs
Page Write Cycle Time (256 bytes)11
(3)
Page Write Cycle Time (n bytes)
10.2+
n*0.8/256
Page Program Cycle Time (256 bytes)1.2
Page Program Cycle Time (n bytes)
0.4+
n*0.8/256
Page Erase Cycle Time1020ms
Sector Erase Cycle Time15s
C
25ms
5ms
36/47
M45PE80DC and AC parameters
Table 13.AC characteristics (33 MHz operation)
33 MHz only available for products marked since week 40 of 2005
Test conditions specified in Tab l e 8 and Tab l e 9
SymbolAlt.ParameterMin.Typ.Max.Unit
Clock frequency for the following
instructions: FAST_READ, PW, PP, PE,
f
C
f
C
SE, DP, RDID, RDP, WREN, WRDI,
D.C.3 3MHz
RDSR
f
R
(2)
t
CH
(2)
t
CL
Clock frequency for READ instructionsD.C.20MHz
t
Clock High time13ns
CLH
t
Clock Low time13ns
CLL
(3)
Clock slew rate
(peak to peak)
0.03V/ns
(1)
t
SLCHtCSS
t
CHSL
t
DVCHtDSU
t
CHDXtDH
t
CHSH
t
SHCH
t
SHSLtCSH
(3)
t
SHQZ
t
CLQV
t
CLQX
t
THSL
t
SHTL
(3)
t
DP
(3)
t
RDP
(4)
t
PW
(4)
t
PP
S active setup time (relative to C)10ns
S not active hold time (relative to C)10ns
Data In setup time3ns
Data In hold time5ns
S active hold time (relative to C)5ns
S not active setup time (relative to C)5ns
S deselect time200ns
t
Output Disable time12ns
DIS
tVClock Low to Output Valid12ns
t
Output hold time0ns
HO
Top Sector Lock setup time50ns
Top Sector Lock hold time100ns
S to Deep Power-down3μs
S High to Standby Power mode30μs
Page Write cycle time (256 bytes)11
Page Write cycle time (n bytes)
10.2+
n*0.8/256
25ms
Page Program cycle time (256 bytes)1.2
Page Program cycle time (n bytes)
0.4+
n*0.8/256
5ms
t
PE
t
SE
1. Details of how to find the date of marking are given in Application Note, AN1995.
2. tCH + tCL must be greater than or equal to 1/ f
3. Value guaranteed by characterization, not 100% tested in production.
4. When using PP and PW instructions to update consecutive bytes, optimized timings are obtained with one
sequence including all the bytes versus several sequences of only a few bytes. (1 ≤ n ≤ 256)
Page Erase cycle time1020ms
Sector Erase cycle time15s
C
37/47
DC and AC parametersM45PE80
Table 14.AC characteristics (50 MHz operation)
50 MHz preliminary data for T9HX technology
(1)
(2)
Test conditions specified in Tabl e 8 and Table 9
SymbolAlt.ParameterMin.Typ.Max.Unit
Clock frequency for the following instructions:
f
C
f
FAST_READ, PW, PP, PE, SE, DP, RDP,
C
D.C.50MH z
WREN, WRDI, RDSR, RDID
f
R
(3)
t
CH
(3)
t
CL
t
SLCHtCSS
t
CHSL
t
DVC HtDSU
t
CHDX
t
CHSH
t
SHCH
t
SHSL
(4)
t
SHQZ
t
CLQV
t
CLQX
t
WHSL
t
SHWL
(4)
t
DP
(4)
t
RDP
(4)
t
RLRH
t
RHSLtREC
t
SHRH
(5)
t
PW
(5)
t
PP
t
PE
t
SE
1. Preliminary data.
2. Delivery of parts in T9HX process to start from June 2007.
+ tCL must be greater than or equal to 1/ f
3. t
CH
4. Value guaranteed by characterization, not 100% tested in production.
5. n = number of bytes to program. int(A) corresponds to the upper integer part of A. Examples: int(1/8) = 1, int(16/8) = 2,
int(17/8) = 3.
Clock frequency for READ instructionsD.C.33MHz
t
Clock High time9ns
CLH
t
Clock Low time9ns
CLL
(4)
Clock slew rate
(peak to peak)0.1V/ns
S active setup time (relative to C)5ns
S not active hold time (relative to C)5ns
Data in setup time2ns
t
Data in hold time5ns
DH
S active hold time (relative to C)5ns
S not active setup time (relative to C)5ns
t
S deselect time100ns
CSH
t
Output disable time8ns
DIS
tVClock Low to Output Valid8ns
t
Output hold time0ns
HO
Write Protect setup time50ns
Write Protect hold time100ns
S to Deep Power-down3µs
S High to Standby mode30µs
t
Reset pulse width10µs
RST
Reset recovery time3µs
Chip should have been deselected before
Reset is de-asserted
10ns
Page Write cycle time (256 bytes)1123ms
Page Program cycle time (256 bytes)0.8
3ms
Page Program cycle time (n bytes)int(n/8) × 0.025
Page Erase cycle time1020ms
Sector Erase cycle time15s
C
38/47
M45PE80DC and AC parameters
Figure 20. Serial input timing
tSHSL
S
tSLCH
C
tDVCH
tCHSHtCHSL
tSHCH
tCHCL
tCHDX
D
Q
MSB IN
High Impedance
Figure 21. Write Protect setup and hold timing
W
tWHSL
S
C
D
High Impedance
Q
tCLCH
LSB IN
AI01447C
tSHWL
AI07439
Figure 22. Output timing
S
C
tCLQV
tCLQX
Q
ADDR.LSB IN
D
tCLQX
tCLQV
tCH
tCL
LSB OUT
tQLQH
tQHQL
tSHQZ
AI01449e
39/47
DC and AC parametersM45PE80
Table 15.Reset conditions
Test conditions specified in Tab l e 8 and Ta b l e 9
SymbolAlt.ParameterConditionsMin.Typ.Max.Unit
(1)
t
RLRH
t
SHRH
1. Value guaranteed by characterization, not 100% tested in production.
Table 16.Timings after a Reset Low pulse
t
Reset Pulse Width10µs
RST
Chip Select High to
Reset High
Chip should have been
deselected before Reset is
de-asserted
Under completion of an Erase or
Program cycle of a PW, PP, PE, SE
t
RHSLtREC
Reset
Recovery
time
operation
Device deselected (S High) and in
Standby mode
1. All the values are guaranteed by characterization, and not 100% tested in production.
2. S remains Low while Reset is Low.
Figure 23. Reset ac waveforms
S
tRHSLtSHRH
Reset
tRLRH
30µs
300µs
0µs
40/47
AI06808
M45PE80Package mechanical
11 Package mechanical
Figure 24. VFQFPN8 (MLP8) 8-lead Very thin Fine Pitch Quad Flat Package No lead,
6 × 5 mm, package outline
θ
aaa CA
A2
C
ddd
CAB
eE2
M
bbb
b
D2
L
70-ME
E
B
E1
aaa CB
A
2x
R1
0.10 CB
A1
A3
A
D
D1
0.10 CA
1. Drawing is not to scale.
2. The circle in the top view of the package indicates the position of pin 1.
Table 17.VFQFPN8 (MLP8)8-lead Very thin Fine Pitch Quad Flat Package No lead,
6 × 5 mm
, package mechanical data
millimetersinches
Symbol
TypMinMaxTypMinMax
A0.850.801.000.03350.03150.0394
A10.000.050.00000.0020
A20.650.0256
A30.200.0079
b0.400.350.480.01570.01380.0189
D6.000.2362
D15.750.2264
D23.403.203.600.13390.12600.1417
E5.000.1969
E14.750.1870
E24.003.804.300.15750.14960.1693
e1.27– –0.0500– –
R10.100.000.00390.0000
L0.600.500.750.02360.01970.0295
Θ12°12°
aaa0.150.0059
bbb0.100.0039
ddd0.050.0020
41/47
Package mechanicalM45PE80
Figure 25. SO8 wide – 8 lead Plastic Small Outline, 208 mils body width, package
outline
A2
b
e
D
N
1
1. Drawing is not to scale.
2. The circle in the top view of the package indicates the position of pin 1.
Table 18.SO8 wide – 8 lead Plastic Small Outline, 208 mils body width, mechanical
CP
E
E1
A
c
LA1k
6L_ME
data
millimetersinches
Symbol
TypMinMaxTypMinMax
A2.500.098
A10.000.250.0000.010
A21.512.000.0590.079
b0.400.350.510.0160.0140.020
c0.200.100.350.0080.0040.014
CP0.100.004
D6.050.238
E5.026.220.1980.245
E17.628.890.3000.350
e1.27– –0.050––
k0°10°0°10°
L0.500.800.0200.031
N88
42/47
M45PE80Package mechanical
Figure 26. SO8N - 8 lead Plastic Small Outline, 150 mils body width, package outline
h x 45˚
A2
b
e
D
8
1
1. Drawing is not to scale.
Table 19.SO8N - 8 lead Plastic Small Outline, 150 mils body width, package
E1
A
ccc
E
A1
L
L1
c
0.25 mm
GAUGE PLANE
k
SO-A
mechanical data
millimetersinches
Symbol
TypMinMaxTypMinMax
A1.750.069
A10.100.250.0040.010
A21.250.049
b0.280.480.0110.019
c0.170.230.0070.009
ccc0.100.004
D4.904.805.000.1930.1890.197
E6.005.806.200.2360.2280.244
E13.903.804.000.1540.1500.157
e1.27– –0.050– –
h0.250.500.0100.020
k0°8°0°8°
L0.401.270.0160.050
L11.040.041
43/47
Part numberingM45PE80
12 Part numbering
Table 20.Ordering information scheme
Example:M45PE80–V MP 6 T G
Device Type
M45PE = Page-Erasable Serial Flash Memory
Device Function
80 = 8 Mbit (1 Mbit x 8)
Operating Voltage
V = V
Package
MW = SO8W (208 mils width)
MP = VFQFPN8 6 × 5 mm (MLP8)
MN = SO8N (150 mils width)
Device Grade
6 = Industrial temperature range, –40 to 85 °C.
Device tested with standard test flow
Option
blank = Standard Packing
T = Tape & Reel Packing
Plating Technology
P
= 2.7 to 3.6V
CC
(1)
or G = ECOPACK® (RoHS compliant)
1. Package available only in T9HX technology.
For a list of available options (speed, package, etc.) or for further information on any aspect
of this device or when ordering parts operating at 50 MHz (0.11µm technology, process digit
“4”), please contact your nearest Numonyx Sales Office.
The category of second Level Interconnect is marked on the package and on the inner box
label, in compliance with JEDEC Standard JESD97. The maximum ratings related to
soldering conditions are also marked on the inner box label.
44/47
M45PE80Reference
13 Reference
●AN1995: Serial Flash Memory Device Marking.
14 Revision history
Table 21.Document revision history
DateVersionChanges
10-Feb-20031.0Document written
02-Apr-20031.1VFQFPN8 (MLP) package added
08-Apr-20031.2Document promoted to Product Preview
05-May-20031.3Document promoted to Preliminary Data
Description corrected of entering Hardware Protected mode (W
04-Jun-20031.4
26-Nov-20032.0
23-Jan-20043.0SO16 pin-out corrected
28-May-20044.0
10-May-20055.0
4-Oct-20056.0
14-Feb-20067
driven, and cannot be left unconnected). Document Revision History for
05-May-2003 corrected.
(min) extended to –0.6V, and tPP(typ) improved to 1.2ms. Table of
V
IO
contents, SO16 package, warning about exposed paddle on MLP8, and
Pb-free options added. Change of naming for VDFPN8 package.
Document promoted to full datasheet
Soldering temperature information clarified for RoHS compliant devices.
Device Grade clarified
SO16 wide package replaced by SO8 wide package.
Active Power, Stand-by Power and Deep Power-Down modes, Read
Identification (RDID), Deep Power-down (DP), and Release from Deep
Power-down (RDP) descriptions updated.
Added Table 13: AC characteristics (33 MHz operation). An easy way to
modify data, A fast way to modify data, Page Write (PW) and Page
Program (PP) sections updated to explain optimal use of Page Write and
Page Program instructions. Updated I
characteristics. Updated Table 20: Ordering information scheme
ECOPACK® information added.
X process technology added (see Section 2.5: Reset (Reset), Table 14:
Reset timings for U process technology devices and Tabl e 1 5 : R e s e t
timings for X process technology devices). MLP package renamed as
VFQFPN8, MLP silhouette modified on page 1. T
Table 7: Absolute maximum ratings.
Table 5: Status Register Format moved from Section 4.7: Status Register
to Section 6.4: Read Status Register (RDSR). Blank option removed
under Plating Technology in Table 20: Ordering information scheme.
values in Tabl e 1 1 : D C
CC3
removed from
LEAD
must be
45/47
Revision historyM45PE80
Table 21.Document revision history
DateVersionChanges
50 MHz frequency added, Table 14: AC characteristics (50 MHz
operation) added. Small text changes.
Section 2.5: Reset (Reset) updated. V
descriptions added.
Figure 3: Bus master and memory devices on the SPI bus modified and
explanatory text added.
15-Dec-20068
Behavior of WIP bit specified at Power-up in Section 7: Power-up and
Power-down.
max modified and T
V
IO
LEAD
ratings.
Table 15: Reset conditions and Table 16: Timings after a Reset Low
pulse updated.
SO8N package added (T9HX technology only), SO8W and VFQFPN8
package specifications updated (see Section 11: Package mechanical).
10-Dec-20079Applied Numonyx branding.
added in Table 7: Absolute maximum
supply voltage and VSS ground
CC
46/47
M45PE80
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