Other options and accessories ....................................................... 12
2
Introduction
Your choice of test capability
The HP 37717C communications performance analyzer supports
comprehensive functional test and jitter capability to help you test
your PDH/DSn, SONET/SDH and ATM networks or network
equipment. The analyzer comprises a mainframe with large color
display and integral floppy disk drive, optional 80-column graphics
printer, and includes power cord and operating manuals. You add
the test capability you require by selecting from the optional test
modules.
To meet your specific test needs, just order the capability you
require. Simply order the HP 37717C analyzer and choose the
application orientated options you require, from the tables in the
pages that follow. Remember, you can configure your analyzer to
simultaneously include PDH/DSn, SONET/SDH, ATM and jitter, or
you can configure it to contain PDH/DSn only, SDH only, SONET/
SDH only, ATM only or almost any combination.
HP 37717C communications
performance analyzer
with color display, floppy disk
drive as standard and optional
integrated printer.
All the power you need for
comprehensive performance
testing.
Select optional PDH/DSn, SONET/SDH, ATM cell layer, ATM services
and jitter modules from an expanding range of options:
● ATM services layer testing with/without native LAN connectivity
● ATM cell layer generation and measurement
● SONET/SDH electrical interfaces
● SONET/SDH optical interfaces (1310 and 1550 nm)
● SONET/SDH binary interfaces
● PDH and SDH jitter/wander Tx and Rx
● DSn testing (DS1, DS3, E1, E3 structured)
● Multiple PDH outputs
● PDH testing (704 kb/s to 140 Mb/s)
● PDH binary interfaces with external clock input
● Printer/remote interfaces
● Graphics printer.
3
Example configurations
1. STM-4o/STM-1o plus jitter
Example user requirements
● PDH (2, 8, 34, 140 Mb/s) – mux/demux capability
● STM-1e (155 Mb/s) electrical interfaces
● STM-4o/STM-1o (1310 nm) optical interfaces
● Optical power measurement
● Jitter and wander generation
● Jitter measurement (at all above interface rates)
Configuring the HP 37717C
communications performance analyzer
There are reserved slots for optical interfacing and remote-control
modules. In addition, you have a maximum of eight userconfigurable slots to add PDH/DSn, SONET/SDH, ATM and jitter
capability. Ensure that the number of slots used does not exceed
eight.
2
1345678
Optical
Step 1Review sections 1 to 12 in the following pages to determine the
capability you require. In each section, select one option as required
and tick the option box.
Remote
Step 2Enter the option code and slots used in the table below. Confirm
Step 3Check that you have specified both test and interfacing for all
required capabilities.
Your local HP sales representative will be happy to help you
configure the HP 37717C analyzer to match your specific needs.
5
Module interworking section
The following three tables indicate which modules are capable of networking with
each other. Choose one from each category (if required)†
PDH/SDH and ATM cell layer supported configurations
PDH/ATM cell test
and PDH interfaces
Option UKKPage 8
Unstructured PDH: 0.7, 2, 8,
34 and 140 Mb/s.
Option UKJPage 8
Structured PDH: 2, 8, 34 and
140 Mb/s.
Option UKNPage 8
ATM cell: 2, 34 and 140 Mb/s
(includes all capability of
option UKJ).
Option UH3†Page 9
Binary (NRZ) clock and data
plus external clock input.
Must also order option UKK,
UKJ or UKN.
Option UHC†Page 11
Three additional 2, 8, 34 and
140 Mb/s outputs. Must also
order option UKK, UKJ or
UKN.
STM-0e/STM-1e test
and interfaces
Option A3RPage 8
STM-0e (52 Mb/s) and STM-1e
(155 Mb/s) electrical
interface: STM-0/STM-1
overhead access, thru mode
and pointer sequences ,
TU-12, TU-2, VC-3 and VC-4
mappings.
Optical
interfaces
Option UH1Page 10
155 Mb/s (1310 nm).
Option 130Page 10
622/155/52 Mb/s (1310 and
1550 nm), optical power
measurement.
Option 131Page 10
622/155/52 Mb/s (1310 nm),
optical power measurement.
Option 0YH†Page 10
622/155/52 Mb/s binary (NRZ)
interfaces. Must also order
option 130 or 131.
Jitter, wander and slips
testing – generation
Option A3KPage 9
PDH and SDH jitter and
wander generation.
Option 140Page 9
PDH and SDH jitter
generation.
Jitter, wander and slips
testing – measurement
Option UHNPage 9
PDH jitter measurement: 2, 8,
34 and 140 Mb/s.
Option A3LPage 9
STM-1e line and PDH jitter
measurement: 2, 8, 34, 140
and 155 Mb/s.
Option A3VPage 9
STM-1o, STM-1e line and PDH
jitter measurement: 2, 8, 34,
140 Mb/s and 155 Mb/s.
Option A3NPage 9
STM-4o, STM-1o, STM-1e line
and PDH jitter measurement:
2, 8, 34, 140 Mb/s, 155 Mb/s
and 622 Mb/s.
Dual standard SONET/SDH and DSn/PDH supported configurations
PDH/DSn interfaces
Option 110Page 8
Structured PDH: DS1, DS3,
E1, E3.
Option UKKPage 8
Unstructured PDH: 0.7, 2, 8,
34 and 140 Mb/s.
Option UKJPage 8
Structured PDH: 2, 8, 34 and
140 Mb/s.
Option UKNPage 8
ATM cell: 2, 34 and 140 Mb/s
(includes all capability of
option UKJ).
Option UH3†Page 9
Binary (NRZ) clock and data
plus external clock input.
Must also order option UKK,
UKJ, UKN or 110.
SONET/SDH
test and interfaces
Option 120Page 8
STS-1/STM-0e (52 Mb/s) and
STS-3/STM-1e (155 Mb/s)
electrical interface:
Overhead access, thru mode
and pointer sequences.
VT1.5/TU-11, VT2/TU-12,
VT6/TU-2, VC-3/STS-1 SPE
and VC-4/STS-3c SPE
mappings.
Optical
interfaces
Option UH1Page 10
155 Mb/s (1310 nm).
Option 130Page 10
622/155/52 Mb/s optical
interface (1310 and
1550 nm), optical power
measurement.
Option 131Page 10
622/155/52 Mb/s optical
interface (1310 nm), optical
power measurement.
Option 0YH†Page 10
622/155/52 Mb/s binary
(NRZ) interfaces. Must also
order option 130 or 131.
Jitter, wander and slips
testing – generation*
Option A3KPage 9
PDH, 155 Mb/s, 622 Mb/s
jitter and wander generation.
Option 140Page 9
As option A3K, but without
wander generation.
Jitter, wander and slips
testing – measurement*
Option UHNPage 9
PDH jitter measurement.
Option A3LPage 9
155 Mb/s electrical and PDH
jitter measurement.
Option A3VPage 9
155 Mb/s optical, electrical
and PDH jitter measurement.
Option A3NPage 9
622 Mb/s and 155 Mb/s
optical, electrical and PDH
jitter measurement.
6
Broadband ATM services supported configurations
ATM cell test
interfaces
Option UKN
ATM cell generation and
analysis: 2, 34 and 140 Mb/s
(includes all capability of
option UKJ structured PDH).
Option UKZ
Generation and measurement
of ATM payloads: 1.544 (DS1),
44.736 (DS3), 2.048 (E1) and
34.368 (E3) Mb/s.
1
ITU-T
2
ANSI/ITU-T
1
Page 8
2
Page 8
ATM services
layer test
Option 0YKPage 9
Adds Channel View, graphical
display of CDV, AAL analysis,
rate history, benchmark traffic
generation. Must also order
option UKN or UKZ,
Option USLPage 9
Adds Ethernet LAN
connectivity testing plus all
features of option 0YK. Must
also order option UKN or UKZ.
STM-1e test
and interfaces
Option A1TPage 8
STM-1e (155 Mb/s) electrical
interface. Overhead access,
thru mode and pointer
sequences. TU-12, TU-2, VC-3
and VC-4 mappings.
(Provides STM-1o output
when option UKN and optical
interface option are selected.
STM-1o and OC-3c are
provided when option UKZ
and an optical interface
option are selected).
Optical
interfaces
Option UH1Page 10
155 Mb/s (1310 nm).
Option USNPage 10
622/155 Mb/s (1310 and
1550 nm), optical power
measurement.
Option UKTPage 10
622/155 Mb/s (1310 nm),
optical power measurement.
Jitter, wander and slips
testing – generation*
Option A3KPage 9
PDH, 155 Mb/s, 622 Mb/s
jitter and wander generation.
Option 140Page 9
As option A3K but without
wander generation.
Jitter, wander and slips
testing – measurement*
Option UHNPage 9
PDH jitter measurement.
Option A3LPage 9
155 Mb/s electrical and PDH
jitter measurement.
Option A3VPage 9
155 Mb/s optical, electrical
and PDH jitter measurement.
Option A3NPage 9
622 Mb/s, 155 Mb/s optical,
electrical and PDH jitter.
† Where specified two modules may be ordered from certain categories (ie. UH3, UHC, 0YH).
* NB Jitter generation and measurement does not include DS1, DS3 and 52 Mb/s. PDH jitter depends on options fitted.
If option UKK/UKJ/UKN fitted then PDH jitter generation and measurement is provided at E1/E2/E3/E4.
If option 110 fitted then PDH jitter generation and measurement capability is provided at E1 and E3. 622 Mb/s
and 155 Mb/s jitter presented in ITU-T terminology as is specified in the HP 37717B/C communications performance
analyzer technical specifications (publication number 5966-0892E).
For compliance to Bellcore standards, please contact you local Hewlett-Packard representative for details.
Please contact your local sales
office if you require module
interworking capability not
specified here.
All modules work with UKX
(printer), A3B/A3D (remote
control) and USS (distributed
network analyzer software).
7
OptionNo ofTick
codeslotsone
1.PDH/DSn and ATM test and interfaces options
Choose one option (if required). All options provide PDH interfaces and
PDH test capability.
● Unstructured PDH testing: 0.7, 2, 8, 34 and 140 Mb/s interfaces plus an error output. ................. UKK2
● Structured PDH testing: 2, 8, 34 and 140 Mb/s interfaces (64 kb/s and n × 64 kb/s testing). ......... UKJ2
● ATM cell generation and analysis: 2, 34 and 140 Mb/s interfaces† ...................................................... UKN2
– includes all capability of option UKJ (structured PDH testing).
(64 kb/s, 56 kb/s, n x 64 kb/s and n x 56 kb/s testing)
● ATM cell generation and analysis: DS1, DS3, E1 and E3 interfaces ................................................... UKZ*2
(equivalent to 1.5 Mb/s, 45 Mb/s, 2 Mb/s, 34 Mb/s)‡.
† If you need ATM cell generation and analysis at STM-1, then also order STM-0e/STM-1e
option A3R (section 2).
‡ If you need OC-3c, then also order STM-1e option A1T (section 2) and appropriate
optical interfaces and adaptor options (sections 7 and 12).
* Option UKZ does not support option A3R or 120 at present.
Please refer to module interworking section (pages 6 and 7).
OptionNo ofTick
codeslotsone
2.SONET/SDH test and interfaces options
Choose one option (if required). These options provide SDH electrical interfacing
and SDH test capability.
● SDH test module: STM-0e (52 Mb/s) and STM-1e (155 Mb/s) electrical interfaces, ........................ A3R*2
STM-0/STM-1 overhead access,thru mode and pointer sequence generation, TU-12,
TU-2, VC-3 and VC-4 mappings plus frequency offset generation, alarm and error
generation/detection plus an error output, SDH alarm and BIP scan, tributary scan
and protection switch times.
● SONET/SDH test module: STS-1/STM-0e (52 Mb/s) and STS-3/STM-1e (155 Mb/s).......................... 120†2
electrical interfaces, overhead access,thru mode and pointer sequence
generation, VT1.5/TU-11, VT2/TU-12, VT6/TU-2, STS-1/VC-3 SPE and STS-3c/VC-4 SPE
mappings plus frequency offset generation, alarm and error generation/detection
plus an error output, offset generation and BIP scan, tributary scan and protection switch times
plus frequency and BIP scan.
* Option A3R does not support option UKZ at present.
Please refer to module interworking section (pages 6 and 7).
† Option 120 does not support option UKZ and UHC at present.
Please refer to module interworking section (pages 6 and 7).
STM-1e (155 Mb/s) electrical interface: As per option A3R but without ..................................... A1T2
STM-0e (52 Mb/s)capability, and without an error output.
OptionNo ofTick
codeslotsone
3.Wander and jitter generation options
Choose on option (if required). For PDH jitter generation, also order PDH/DSn
option (section 1). For SDH jitter generation, also order SONET/SDH option (section 2)
plus appropriate optical interfaces and adaptor options (sections 7 and 12).
● PDH jitter generation: 2, 8, 34 and 140 Mb/s up to 80 UI (2 Mb/s)........................................................ 140†1
SDH jitter generation: STM-1 (155 Mb/s) and STM-4 (622 Mb/s) up to 200 UI (STM-4).
● All the capability of option 140 plus wander generation: 2 Mb/s, STM-1 (155 Mb/s)....................... A3K1
and STM-4 (622 Mb/s) up to 14400 UI (STM-4).
† 8 and 140 Mb/s jitter generation requires a PDH option with 8 and 140 Mb/s
interface to be fitted
8
OptionNo ofTick
codeslotso ne
4.Wander and jitter measurement options
Choose one option (if required). If you need PDH jitter
measurement then also order PDH/DSn interface option (section 1).
● PDH (tributary) jitter and wander measurement: 2, 8, 34, 140 Mb/s, with HP1, HP2 and............... UHN1
LP filters to ITU-T O.171 plus 2 Mb/s wander and estimated frame slip measurement.
● STM-1e line jitter and PDH (tributary) jitter; rms, peak-to-peak, auto jitter transfer ...................... A3L2
and wander measurement: 155 Mb/s electrical interface with HP1, HP2, LP and 12 kHz HP
filters to ITU-T O.171/G.825.
● STM-1o/STM-1e, plus all the capability of option A3L.............................................................................. A3V2
● STM-4o/STM-1o/STM-1e, plus all the capability of option A3L. ............................................................ A3N2
† 8 and 140 Mb/s jitter measurement requires a PDH option with 8 and 140 Mb/s
interface to be fitted
OptionNo ofTick
codeslotso ne
5.ATM services layer test options
Choose one option (if required). As these modules use the interfacing provided by a
PDH/DSn and ATM test option, must also order ATM option UKN or UKZ (section 1).
● Provides ATM and AAL capabilities including Channel View, rate history,....................................... 0YK†1
graphical CDV, benchmark traffic.
● As per option 0YK (but occupying two slots) plus native Ethernet LAN .......................................... USL†2
connectivity tests.
† Option 0YK and USL do not support options A3R and 120 at present.
Please refer to module interworking section (pages 6 and 7).
OptionNo ofTick
codeslotso ne
6.PDH binary interfaces options
Choose one option (if required). Must also order a PDH and ATM test option (section 1).
(Option UH3 does not support options UKZ, 0YK or USL at present.)
● PDH NRZ interfaces: Adds binary Tx clock and data, binary Rx clock and data,........................... UH3†1
plus external clock input.
● PDH synthesized BER testing bundle : Includes UH3 (binary clock and data), ................................ 2003
UKK (unstructured BER module) and HP 8647A synthesizer.
† Option UH3 does not support options UKZ, 0YK and USL at present.
Please refer to module interworking section (pages 6 and 7).
9
OptionTick
codeone
7.Optical interfaces options
Choose one option (if required). All optical interfaces receive at 1310 and
1550 nm.
Provides optical interfaces. Must also order STM-0e/STM-1e option A3R (section 2),
and appropriate optical adaptor options (section 12).
STM-1 optical interfaces only (for testing STM-1 only)*
Provides optical interfaces, plus optical power measurement and STM-4 test
functionality, ie, for STM-4 overhead access. Must also order 52/155 Mb/s
option A3R or 120 (section 2), and appropriate optical adaptor options (section 12).
●RS-232-C and HP-IB remote-control/external-printer interfaces..........................................................A3D reserved
remote
●LAN remote control, RS-232-C and HP-IB remote-control/external-printer interfaces...................A3B slot
Option Tick if
code required
11.Printer option
Choose if required.
●Integrated, full-width, 80-column graphics printer (for printing of graphics,...................................UKX Uses lid
results and screen dumps).
Option Tick as
code required
12.Optical adaptor options
If specifying an SDH optical interface and/or wander and jitter measurements,
choose the connector adaptor type(s) to suit your particular requirements:
●FC/PC...................................................................................................................................................................UH4 Not
Choose if required. Must also order a remote-control/external printer interface
(see section 10).
●Allows the instrument to be used with HP E4540A distributed network analyzer...........................USS Not
software* for Windows®. Software allows remote, interactive control for applicable
centralized testing.
*For full details of centralized testing using the HP 37717C analyzer and other
telecom testers from HP, please ask your local HP representative for
brochure 5964-2240E (distributed network analyzer software).
11
Other options and accessories
Optical coupler
HP15744A: Optical coupler.*
*Order the appropriate option. For full
details of the HP 15744A optical
coupler, please ask your local HP
representative for a brochure.
The optical coupler and graphics
printer (option UKX) cannot both be
fitted at the same time.
HP 15722A: Telephone handset for
options UKJ or UKN.
Fiber optic cable
HP E4545A: 3 m fiber optic cable
(FC/PC connectors).
Graphics printer paper
Printer paper: Part number 9270-1360.
Warranty
3-year warranty as standard.
Manuals and calibration
certificate
Option AVA: Calibration manual.
Option OB2: One additional operating
For more information about HewlettPackard test & measurement products,
applications, services, and for a current
sales office listing, visit our web site,
http://www.hp.com/go/tmdir. You can also
contact one of the following centers and
ask for a test and measurement sales
representative.
United States:
Hewlett-Packard Company
Test and Measurement Call Center
P.O. Box 4026
Englewood, CO 80155-4026
1 800 452 4844
HP 15910B: Soft, vinyl carrying case.
HP 15772B: Hard, robust transit case.
HP 15770A: Rack mount kit.
HP 15777C upgrade kit
Enhance the capabilities of the
HP 37717C analyzer at a later date.
To order HP 15777C upgrade kit options,
contact your local HP sales
representative.
Standards conformance
CE mark:* The HP 37717C
communications performance analyzer
has full CE mark compliance and meets
the following standards:
● ESD/mains fast transients/radiated
susceptibility: meets EN50082-1 (1991).
● Radiation emissions/conducted
emissions: meets EN55011 (1991).
Product safety: The HP 37717C
communications performance analyzer
meets the following safety standards:
● IEC 348/EN61010.
* All products sold in EC and ETSI
countries must have the CE mark.
Europe:
Hewlett-Packard
European Marketing Centre
P. O. Box 999
1180 AZ Amstelveen
The Netherlands
(31 20) 547 9900
Japan:
Hewlett-Packard Japan Ltd.
Measurement Assistance Center
9-1, Takakura-Cho, Hachioji-Shi
Tokyo 192, Japan
Tel: (81) 426 56-7832
Fax: (81) 426 56-7840
Latin America:
Hewlett-Packard
Latin American Region Headquarters
5200 Blue Lagoon Drive
9th Floor
Miami, Florida 33126
USA
(305) 267 4245/4220
Fax: (305) 267-4288
Australia/New Zealand:
Hewlett-Packard Australia Ltd.
31-41 Joseph Street
Blackburn, Victoria 3130
Australia
Tel: 1 800 629 485 (Australia)
Tel: (0800) 738 378 (New Zealand)
Fax: (61 3) 9210 5489
MS Windows is a US trademark of Microsoft Corporation.
HP manufactures the HP 37717C communications performance analyzer under
a quality system approved to the international standard ISO 9001 plus TickIT
(BSI Registration Certificate No FM 10987).
Asia Pacific:
Hewlett-Packard Asia Pacific Ltd.
17-21/F Shell Tower, Times Square
1 Matheson Street, Causeway Bay
Hong Kong
Tel: (852) 2599 7777
Fax: (852) 2506 9285