Fairchild Semiconductor 100398QIX, 100398QI, 100398QCX, 100398QC, 100398PC Datasheet

© 2000 Fairchild Semiconductor Corporation DS010970 www.fairchildsemi.com
February 1992 Revised August 2000
100398 Quad Differential ECL/TTL Translating Transceiver with Latch
100398 Quad Differential ECL/TTL Translating Transceiver
with Latch
General Description
ECL load with cutoff capabil-
ity, and will sink a 64 mA TTL load. The 100398 is ideal for mixed technology applications utilizing either an ECL or TTL backplane.
The direction of translat ion is set by the direction control pin (DIR). The DIR pin on the 100398 accept s TTL logic levels. A TTL LOW on DIR sets up the ECL pi ns as inputs and TTL pins as ou tputs. A TTL HIG H on DIR sets up the TTL pins as inputs and ECL pins as outputs.
A LOW on the outp ut en able inp ut pi n (OE) hol ds the ECL output in a cut-off state and the TTL outputs at a high impedance level. A HIGH on the latch enable input (LE) latches the data at both inputs even though only one output is enabled at the time. A LOW on LE makes the latch trans­parent.
The cut-off state is designe d to be more negative than a normal ECL LOW l evel. This allows the output emi tter-fol­lowers to turn off when the termination supply is
2.0V, pre-
senting a high impedance to the data bus. This high impedance reduces termination power and prevents loss of low state noise margin when several loads share the bus.
The 100398 is designe d with FAST
TTL output buffers,
featuring optimal DC drive an d capabl e of quickly cha rging and discharging highly capacitive loads. All Inputs have 50 k
pull-down resistors.
Features
Differential ECL input/output structure
64 mA FAST TTL outputs
25
differential ECL outputs with cut-off
Bi-directional translation
2000V ESD protection
Latched outputs
3-STATE outputs
Voltage compensated operating range
= −4.2V to 5.7V
Ordering Code:
Devices also availab le in Tape and Reel. Specify by appending th e s uffix let t er “X” to the ordering code.
FAST is a registered trademark of Fairc hild Semiconductor.
Order Number Package Number Package Description
100398PC N24E 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-010, 0.400 Wide 100398QC V28A 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square 100398QI V28A 28-Lead Plastic Lead Chip Carrier (PLCC), JEDEC MO-047, 0.450 Square
Industrial Temperature Range (
40°C to +85°C)
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100398
Logic Symbol
Connection Diagrams
24-Pin DIP
28-Pin PLCC
Pin Descriptions
Tr uth Table
H = HIGH Voltage Level L = LOW Voltage Level X = Don’t Care Z = High Impedance
Note 1: ECL input to TTL out put mode. Note 2: TTL input to ECL output mode. Note 3: Retains data present before LE set HIGH. Note 4: Latch is transparent.
Pin Names Description
E
0–E3
ECL Data I/O
E
0–E3
Complementary ECL
Data I/O
T
0–T3
TTL Data I/O OE Output Enable Input Levels LE Latch Enable Input Levels DIR Direction Control
Input (TTL levels) GNDECL ECL Ground GNDECLO ECL Output Ground GNDS ECL Ground-to-Substrate V
EE
ECL Quiescent Power Supply
V
EED
ECL Dynamic Power Supply GNDTTL TTL Quiescent Ground GNDTTLD TTL Dynamic Ground V
TTL
TTL Quiescent Power Supply V
TTLD
TTL Dynamic Power Supply
LE DIR OE ECL TTL
Notes
Port Port
000LOWZ
(Cut-Off) 0 0 1 Input Output (Note 1)(Note 4) 010LOWZ
(Cut-Off) 0 1 1 Output Input (Note 2)(Note 4) 1 0 0 Input Z (Note 1)(Note 3) 1 0 1 Latched X (Note 1)(Note 3) 1 1 0 Low Input (Note 2)(Note 3)
(Cut-Off) 1 1 1 Latched X (Note 2)(Note 3)
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100398
Functional Diagram
Note: LE, and OE use TTL logic levels
Detail
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100398
Absolute Maximum Ratings(Note 5) Recommended Operating
Conditions
Note 5: The Absolute Maximum Ratings are those values beyon d which
the safety of the dev ice cannot be guaranteed. T he device sh ould not be operated at these limit s. The parametric values defin ed in the Electrical Characteristics tables are not guaranteed at the absolute maximum rating. The Recomme nded O peratin g Cond itions table will defin e the condition s for actual device operation.
Note 6: The specified limits represent t he worst case value for the param- eter. Since these value s normally occur at th e temperature extrem es, addi­tional noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are chosen to guarantee operation under worst case” conditions.
Note 7: ESD testing conf orm s t o M I L-STD-883, Method 3015.
Commercial Version TTL-to-ECL DC Electrical Characteristics
(Note 9)
V
EE
= 4.2V to 5.7V, GND = 0V, TC = 0°C to +85°C, V
TTL
= +4.5V to +5.5V
Note 8: Either voltage limit or cu rrent limit is sufficient to protec t inputs. Note 9: The specified limits represent the worst case value for the parameter. Since these values normally occur at the temperature extremes, additional
noise immunity and guardbanding can be achieved by decreasing the all owable syste m opera ti ng r ange s. Co ndi ti ons fo r t est ing shown in the ta ble s are cho­sen to guarantee operation under worst case” conditions.
Storage Temperature (T
STG
) 65°C to +150°C
Maximum Junction Temperature
(T
J
) +150°C
V
EE
Pin Potential to Ground Pin 7.0V to +0.5V
V
TTL
Pin Potential to Ground Pin 0.5V to +6.0V
ECL Input Voltage (DC) V
EE
to +0.5V
ECL Output Current
(DC Output HIGH)
50 mA
TTL Input Voltage (Note 6)
0.5V to +7.0V
TTL Input Current (Note 6)
30 mA to +5.0 mA
Voltage Applied to Output in
HIGH State 3-STATE Output
0.5V to +5.5V
Current Applied to TTL
Output in LOW State (Max) twice the Rated I
OL
(mA)
ESD (Note 7)
2000V
Case Temperature (T
C
)
Commercial 0
°C to +85°C
Industrial
40°C to +85°C
ECL Supply Voltage (V
EE
) 5.7V to 4.2V
TTL Supply Voltage (V
TTL
) +4.5V to +5.5V
Symbol Parameter Min Typ Max Units Conditions
V
OH
Output HIGH Voltage −1025 −955 −870 mV VIN = V
IH(Max)
or V
IL(Min)
V
OL
Output LOW Voltage −1830 −1705 1620 mV Loading with 50 to 2V Cutoff Voltage −2000 1950 mV OE and LE LOW, DIR HIGH
V
IN
= V
IH(Max)
or VIL(Min),
Loading with 50 to 2V
V
OHC
Output HIGH Voltage
1035 mV
Corner Point High VIN = V
IH(Min)
or V
IL(Max)
V
OLC
Output LOW Voltage
1610 mV
Loading with 50 to 2V
Corner Point Low
V
IH
Input HIGH Voltage 2.0 5.0 V Over V
TTL
, VEE, TC Range
V
IL
Input LOW Voltage 0 0.8 V Over V
TTL
, VEE, TC Range
I
IH
Input HIGH Current 5.0 µAVIN = +2.7V Breakdown Test 0.5 mA VIN = +5.5V
I
IL
Input LOW Current −700 µAVIN = +0.5V
V
FCD
Input Clamp
1.2 V IIN = 18 mA
Diode Voltage
I
EE
VEE Supply Current −99 50 mA LE LOW, OE and DIR HIGH
Inputs Open
I
EEZ
VEE Supply Current −159 90 mA LE and OE LOW, DIR HIGH
Inputs Open
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