Datasheet UAA3202M Datasheet (Philips)

Page 1
INTEGRATED CIRCUITS
DATA SH EET
UAA3202M
Frequency Shift Keying (FSK) receiver
Preliminary specification File under Integrated Circuits, IC01
1997 Aug 12
Page 2
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M

FEATURES

Low cost single-chip FSK receiver
Superheterodyne architecture with high integration level
Few external low cost components
Wide supply voltage range
Low power consumption
Wide frequency range, 150 to 450 MHz
High sensitivity
IF band determined by application
High selectivity
Very low spurious radiation, 60 dBm
(meets FTZ 17TR2100)
Automotive temperature range
Power-down mode
SSOP20 package.

Applications

Keyless entry systems
Car alarm systems
Remote control systems
Security systems
Telemetry systems
Wireless data transmission
Domestic appliances.

GENERAL DESCRIPTION

The UAA3202M is a fully integrated single-chip receiver, primarily intended for use in VHF and UHF systems employing direct Frequency Shift Keying (FSK) modulation. The UAA3202M incorporates a SAW stabilized local oscillator, balanced mixer, IF amplifier, limiter, Received Signal Strength Indicator (RSSI), RSSI comparator, FSK demodulator, data filter and data slicer. The device features a power-down mode in order to minimize the average receiver supply current.

QUICK REFERENCE DATA

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V
CC
I
CC
P
sens
supply voltage 3.5 6V supply current for
operating mode on V operating mode off V
sensitivity fi= 433.92 MHz;
=0V; R2= 560 2.0 3.4 4.7 mA
PWD PWD=VCC
33A
−−−94 dBm
f
= 250 Hz square wave;
mod
f=±25 kHz; BER 3%
T
amb
operating ambient temperature 40 +85 °C

ORDERING INFORMATION

TYPE
NUMBER
NAME DESCRIPTION VERSION
UAA3202M SSOP20
plastic shrink small outline package; 20 leads; body width 5.3 mm
PACKAGE
SOT339-1
Page 3
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M

BLOCK DIAGRAM

MHA797
150 k
BIAS
ref
V
150 k
BUFFER
UAA3202M
EM MXIN LIN RSSI DMODLFB CPC PWD DATA
V
FA
30 k
COMP CPB CPA
SHIFT
PHASE
PHASE
DETECTOR
ref
V
RSSI
EE
V
Fig.1 Block diagram.
EO
LIMITER
AMPLIFIER
50 k
CC
V
MIXER
IF
1.4 k
20 19 18 17 16 15 14 13 12 11
AMP
1.5 k
1.5 k
OSCILLATOR
OSC OSE V
CC
12 3 4 5 6 7 8 9 10
MON MOP V
handbook, full pagewidth
1997 Aug 12 3
Page 4
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M

PINNING

SYMBOL PIN DESCRIPTION
MON 1 negative mixer output MOP 2 positive mixer output V
CC
3 positive supply voltage OSC 4 oscillator collector OSE 5 oscillator emitter V
EO
V
EE
6 negative supply voltage for oscillator
7 negative supply voltage COMP 8 RSSI comparator output CPB 9 comparator input B CPA 10 comparator input A DATA 11 data output PWD 12 power-down control input CPC 13 comparator input C DMOD 14 demodulator frequency adjustment RSSI 15 RSSI current output LFB 16 limiter feedback LIN 17 limiter input MXIN 18 mixer input V
EM
19 negative supply voltage for mixer
FA 20 IF amplifier output
handbook, halfpage
MON
1
MOP
2
V
3
CC
OSC
4
OSE
5
EO EE
UAA3202M
6 7 8 9
10
MHA796
V
V
COMP
CPB CPA
Fig.2 Pin configuration.
20 19 18 17 16 15 14 13 12 11
FA V
EM
MXIN LIN LFB RSSI DMOD CPC PWD DATA
Page 5
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M

FUNCTIONAL DESCRIPTION

The device is based on the superheterodyne architecture incorporating a mixer, local oscillator, IF amplifier, limiter, RSSI, RSSI comparator, FSK demodulator, data filter, data slicer and power-down circuitry. The device employs a low IF frequency of typically 1 MHz in order to allow IF filtering by means of external low cost R, L and C components. If image rejection is required it can be achieved by applying a matching external front-end SAW filter. The device provides a wide IF range of 300 kHz in order to allow the use of a SAW stabilized oscillator.
The on-chip local oscillator provides the injection signal for the mixer. Tuning of the on-chip local oscillator is not necessary. The oscillator frequency is determined by an external 1-port SAW resonator. The RF input signal is fed to the mixer and down converted to the IF frequency. After amplification and filtering the RF signal is applied to a limiter. The IF filter order and characteristics are determined by the external low cost R, L and C components. The limiter amplifier provides a RSSI signal which can be routed to an on-chip RSSI level comparator in order to derive a field strength indication for external use. The limited IF signal is fed to the FSK demodulator. The demodulator centre frequency is determined by an external capacitor. No alignment is necessary for the FSK demodulator. After filtering the demodulated data signal is fed to a data slicer and is made available at the data output. The data filter characteristics are determined by external capacitors. The data slicer employs an adaptive slice reference in order to track frequency offsets.
The device is switched from power-down to operating mode and vice versa by means of a control input. Extremely low supply current is drawn when the device is in power-down mode. Measures are taken to allow fast receiver settling when the device is switched from power-down to operating mode.

Mixer

Post mixer amplifier
The Post Mixer Amplifier (PMA) is a differential input, single-ended output amplifier. It separates the first and second IF filters from each other. Amplifier gain is provided in order to reduce the influence of the limiter noise figure on the total noise figure.

Limiter

The limiter is a single-ended input multiple stage amplifier with high total gain. Amplifier stability is achieved by means of an external DC feedback capacitor, which is also used to determine the lower limiter cut-off frequency. An RSSI signal proportional to the limiter input signal is provided.
IF filters
IF filtering with high selectivity is realized by means of external low cost R, L and C components. The first IF filter is located directly following the mixer output. An external L/C network assembles a band-pass with low sensitivity in order to meet the bandwidth of an elliptic low-pass filter external to the device and is located in front of the limiter. The filter source impedance is determined by the drive impedance of the IF amplifier. In order to improve the IF filter selectivity below the pass-band a high-pass characteristic is added by means of a DC blocking capacitor in front of the limiter input and by means of the limiter DC feedback capacitor.

RSSI

The RSSI signal is a current proportional to the limiter input level (RF input power). By means of an external resistor the resulting RSSI voltage level is set in order to fit the application. The RSSI voltage is available to external circuits and is fed to the input of the RSSI level comparator. For RSSI filtering an external capacitor is connected.
The mixer is a single balanced emitter coupled mixer with internal biasing. Matching of the RF source impedance to the mixer input requires an external matching network.

Oscillator

The oscillator consists of an on-chip transistor in common base configuration. An external tank and SAW resonator determines the oscillator frequency. Oscillator alignment is not necessary. Oscillator bias is controlled by an external resistor.

RSSI level comparator

The RSSI level comparator compares the RSSI level with a fixed and independent internal reference voltage. If the RSSI level exceeds the internal reference voltage a logic HIGH signal is generated. The level comparator provides some hysteresis in order to avoid spurious oscillation. The output of the level comparator is designed as an open-collector with internal pull-up.
Page 6
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M

FSK demodulator

The limited IF signal is converted into baseband data by means of a quadrature FM demodulator consisting of an all-pass filter and a mixer stage. No alignment of the demodulator is necessary. The demodulator centre frequency is set by a capacitor external to the device. The demodulator provides a large audio bandwidth in order to allow high data rate applications. The demodulator can detect a small IF frequency deviation even if a relatively large IF frequency offset is encountered.
Data filters
After demodulation a two-stage data filtering circuit is provided in order to suppress unwanted frequency components. Two R/C low-pass filters with on-chip resistors are provided which are separated by a buffer stage.

Data slicer

Data detection is provided by means of a level comparator with adaptive slice reference. After the first data filter stage the pre-filtered data is split into two parts. One part passes the second data filter stage and is fed to the positive comparator input.
The other path is fed to an integration circuit with a large time constant in order to derive the average value (DC component) as an adaptive slice reference which is presented to the negative comparator input. The adaptive reference enables the received data over a large range of demodulator frequency offsets to be detected. The integration circuit consists of a simple R/C low-pass filter with on-chip resistor. The level comparator output is designed as an open-collector with internal pull-up.

Power-down circuitry

The device provides a power-down mode. While in power-down mode the device disables the majority of the internal circuits and consumes extremely low current. Measures are taken to allow fast receiver settling when normal operation is resumed. Thus circuits with large time constants are only powered down partly or provide a high impedance during power-down in order to avoid the discharge of external capacitors as much as possible. Power-down mode is entered when the control input is active HIGH. The control input provides an internal pull-up resistor of high impedance.

LIMITING VALUES

In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT
V
CC
T
amb
T
stg
V
esd
supply voltage 0.3 +8.0 V
operating ambient temperature 40 +85 °C
storage temperature 55 +125 °C
electrostatic handling note 1
pins 4 and 5 2000 +1500 V pins 18 and 19 1500 +2000 V all other pins 2000 +2000 V
Note
1. Human body model: equivalent to discharging a 100 pF capacitor through a 1.5 k series resistor.

THERMAL CHARACTERISTICS

SYMBOL PARAMETER VALUE UNIT
R
th j-a
thermal resistance from junction to ambient in free air 125 K/W
Page 7
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M

DC CHARACTERISTICS

V
= 3.5 V; T
CC
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
Supplies
V
CC
I
CC
V
PWD(on)
V
PWD(off)
I
PWD(on)
I
PWD(off)
Oscillator
V
OSC(DC)
Mixer
V
MXIN(DC)
V
MOP(DC)
V
MON(DC)
Post mixer amplifier
V
FA(DC)
Limiter
V
LIN(DC)
V
LFB(DC)
V
RSSI(DC)
Demodulator
V
DMOD(DC)
Data slicer
V
CPC(DC)
V
CPA(DC)
V
CPB(DC)
V
OH(DAT)
V
OL(DAT)
RSSI comparator
V
OH(RSSI)
V
OL(RSSI)
=25°C; for application diagram seeFig.11; unless otherwise specified.
amb
supply voltage 3.5 6V supply current for note 1
operating mode on V
PWD
=0V;
2.0 3.4 4.7 mA
R2= 560
operating mode off V
PWD=VCC
330µA PWD voltage for operating mode ON 0 300 mV PWD voltage for operating mode OFF VCC− 0.3 − V PWD current for operating mode ON V PWD current for operating mode OFF V
=0V −30 10 3 µA
PWD PWD=VCC
13µA
CC
V
DC operating point pin 4 3.28 3.34 3.40 V
DC operating point pin 18 0.68 0.78 0.88 V DC operating point pin 2 2.78 2.98 3.18 V DC operating point pin 1 2.78 2.98 3.18 V
DC operating point pin 20 2.14 2.27 2.40 V
DC operating point pin 17 3.45 3.49 3.50 V DC operating point pin 16 2.76 2.81 2.86 V DC operating point pin 15 2.21 2.36 2.51 V
DC operating point pin 14 1.63 1.83 2.03 V
DC operating point pin 13 note 2 1.43 1.93 2.43 V DC operating point pin 10 note 2 1.43 1.93 2.43 V DC operating point pin 9 note 2 1.43 1.93 2.43 V HIGH-level data output voltage I LOW-level data output voltage I
HIGH-level comparator output voltage I LOW-level comparator output voltage I
= 10 µAVCC− 0.5 − V
DATA
= 200 µA0 0.6 V
DATA
= 10 µAVCC− 0.5 − V
RSSI
= 200 µA0 0.6 V
RSSI
CC
CC
V
V
Notes
1. The given values are valid for the whole temperature range from T
2. Tune RF input frequency until IF = 1 MHz.
= 40 to +85 °C.
amb
Page 8
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M

AC CHARACTERISTICS

V
= 3.5 V; T
CC
wave, i.e. 500 bits/s; unless otherwise specified.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
System performance
P
sens
P
i(max)
α
rad
t
st
B
IF
f
D
Mixer
G
mix
R
o(mix)
Post mixer amplifier
IP3
PMA
G
PMA
P
<1dB
BW
PMA
R
oPMA
Limiter
G
lim
B
lim
R
i(lim)
Demodulator
G
DMOD
f
c(DMOD)
f frequency deviation 20 25 70 kHz R
o(DMOD)
Data slicer
B
DS
R
o(DS)
RSSI comparator
V
o(RSSI)
V
o(COMP)
P
th(on)
P
hys(W)
=25°C; for application diagram seeFig.11; fi= 433.92 MHz; f=±25 kHz; f
amb
= 250 Hz square
mod
sensitivity BER 3% −−−94 dBm maximum input power BER 3% −−−30 dBm spurious radiation note 1 −−−60 dBm receiver settling time Pi=P IF bandwidth range Pi=P
+ 10 dB; see Fig.5 25ms
sens
+ 3 dB 850 1000 1150 kHz
sens
data frequency 140 250 Hz
mixer conversion gain 31 33 35 dB mixer output resistance 2.7 3 3.3 k
interception point (mixer + PMA) note 2 38 35 dBm PMA gain note 2 9 10.4 12 dB compression (mixer + PMA) Pi= 45 dBm 0 1 dBm PMA LP cut-off frequency 5 −−MHz PMA output resistance 1.2 1.4 1.6 k
limiter gain 60 63.5 67 dB limiter LP cut-off frequency 2 5 8 MHz limiter input resistance 40 50 60 k
demodulator gain note 2 0.8 1 1.2
mV
--------- ­kHz
demodulator centre frequency 800 1000 1200 kHz
demodulator output resistance 24 30 36 k
data slicer bandwidth 35 50 kHz data slicer output resistance 120 150 180 k
RSSI output voltage see Fig.3 −−−− COMP output voltage see Fig.4 −−−− threshold for switching COMP output
99.5 95.5 91.5 dBm
voltage to HIGH hysteresis width of COMP output voltage 1 2 4 dBm
Notes
1. Measured at the RF input connector of the test board.
2. Measured at test point A in Fig.11.
Page 9
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
handbook, full pagewidth
(1) T (2) T (3) T
amb amb amb
=85°C. =25°C. = 40 °C.
V
o(RSSI)
(V)
2.8
2.7
2.6
2.5
2.4
100
90 80 70 60 50
Pi (dBm)
Fig.3 RSSI output voltage as a function of RF input power.
(1)
(2) (3)
MHA811
handbook, halfpage
V
o(COMP)
(V)
3.0
0.6
P
hys(W)
97.5 95.5
Fig.4 Comparator output voltage as a function of HF input power.
P
th(ON)
MHA812
Pi (dBm)
Page 10
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
INTERNAL CIRCUITRY Table 1 Equivalent pin circuits and pin voltages for rough test of printed circuit board; V
PIN SYMBOL
DC VOLTAGE
(V)
EQUIVALENT CIRCUIT
1 MON 2.98 2 MOP 2.98
3V
CC
1.5 k 1.5 k
V
EM
1
2
4 OSC 3.34 5 OSE
4
5
6 k
= 3.5 V; no input signal
CC
V
CC
V
EE
MHA798
6V 7V
EO EE
0 0
8 COMP
9 CPB 1.93
10 CPA 1.93
V
150 k
150
CC
V
V
EE
1 k
EE
9
10
MHA799
8
MHA800
MHA801
V
CC
V
EE
1997 Aug 12 10
Page 11
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
PIN SYMBOL
DC VOLTAGE
(V)
11 DATA
12 PWD
13 CPC 1.93
EQUIVALENT CIRCUIT
V
CC
1 k
11
V
MHA802
EE
V
CC
300 k
12
MHA803
V
CC
14 DMOD 1.83
30 k
13
V
MHA804
CC
V
V
EE
EE
14
MHA805
1997 Aug 12 11
Page 12
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
PIN SYMBOL
DC VOLTAGE
(V)
15 RSSI 2.36
16 LFB 2.81
17 LIN 3.49
EQUIVALENT CIRCUIT
15
16
MHA807
V
CC
50 k
V
V
CC
EE
V
CC
MHA806
17
MHA808
V
EE
1997 Aug 12 12
Page 13
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
PIN SYMBOL
DC VOLTAGE
(V)
18 MXIN 0.78 19 V
EM
20 FA 2.27
EQUIVALENT CIRCUIT
0
18
15
CC
1.2 k
V
EE
19
20
MHA810
MHA809
V
1997 Aug 12 13
Page 14
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
TEST INFORMATION Tuning procedure for AC tests
1. Turn on the signal generator (f
= 433.92 MHz; no modulation; RF input level = 60 dBm).
i
2. Tune C6 (RF stage input) to obtain a peak voltage on test point A (see Fig.11).
3. Turn on modulation (fi= 433.92 MHz; f
= 250 Hz square wave; f = 25 kHz; RF input level = 60 dBm).
mod
4. Check that data is appearing on the data output (pin 11) and proceed with the AC tests.
AC test conditions Table 2 Test signals
The reference signal level P
for the following tests is defined as the minimum input level in dBm to give a
ref
BER 3 × 10−2 (e.g. 15 bit errors per second for 500 bits/s).
TEST
SIGNAL
FREQUENCY
(MHz)
DATA SIGNAL MODULATION
FREQUENCY
DEVIATION
1 433.92 250 Hz square wave FM (FSK) 25 kHz 2 433.92 no modulation 3 433.82 no modulation
Table 3 Test results
is the maximum available power from signal generator 1 at the input of the test board; P2 is the maximum available
P
1
power from signal generator 2 at the input of the test board.
GENERATOR
TEST
RESULT
12
Sensitivity into pin MXIN (see Fig.6)
Maximum input power (see Fig.6)
modulated test signal 1; P
1
modulated test signal 1; P
1
(minimum P
Receiver turn-on time; note 1 test signal 1;
P
1=Pref
+10dB
≤−94 dBm
≥−30 dBm
)
max
BER 3 × 10 (e.g. 15 bit errors per second for 500 bits/s)
BER 3 × 10 (e.g. 15 bit errors per second for 500 bits/s)
check that the first 10 bits are correct; error counting is started 10 ms after PWD
2
2
switched to operating mode: ON
Intercept point (mixer + PMA) see note 2 and Fig.7
Spurious radiation see note 3 and Fig.8
1 dB compression point (mixer + PMA) see note 2 and Fig.9
test signal 3;
= 55 dBm
P
1
test signal 2; P2=P
1
−−no spurious radiation (25 MHz 1 GHz)
test signal 3; P
= 70 dBm;
11
(Po1+ 70 dB) [Po2+ 45 dB (minimum
P12= 45 dBm (minimum P
1dB
)
IP3 = P1+1⁄2× IM3 (dB); IP3 ≥−38 dBm
with level higher than 60 dBm (maximum P
P
)] 1 dB, where Po1, Po2 is the output
1dB
spur
)
power for test signals with P11 or P12, respectively
Notes
1. The power-down voltage V
alternates between operating mode ON (100 ms) and OFF (100 ms); see Fig.5.
PWD
2. Probe of spectrum analyzer connected to test point A.
3. Spectrum analyzer connected to the input of the test board.
1997 Aug 12 14
Page 15
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
handbook, full pagewidth
(1) For test circuit see Fig.11. (2) For BER test facility see Fig.10.
V
PWD
(V)
3.5
0
Fig.5 Timing diagram for pulsed power-down voltage.
GENERATOR 1
50
TEST CIRCUIT
(1)
500300 4002001000
BER TEST
FACILITY
MHA834
t (ms)
(2)
MED900
GENERATOR 1
GENERATOR 2
(1) For test circuit see Fig.11.
Fig.6 Test configuration A (single generator).
50
50
2-SIGNAL
POWER
COMBINER
50
TEST CIRCUIT
Fig.7 Test configuration B (IP3).
(1)
f
f f
f = 100 kHz
SPECTRUM
ANALYZER
WITH
PROBE
IM3
MED901
1997 Aug 12 15
Page 16
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
SPECTRUM
(1) For test circuit see Fig.11.
ANALYZER
INPUT IMPEDANCE
50
TEST CIRCUIT
Fig.8 Test configuration C (spurious radiation).
(1)
MED902
(1) For test circuit see Fig.11.
UNDER TEST
DEVICE
GENERATOR 1
50
TEST CIRCUIT
(1)
SPECTRUM ANALYZER
WITH
PROBE
MED903
Fig.9 Test configuration D (1 dB compression point).
SIGNAL
GENERATOR
MASTER
CLOCK
delayed TX data
TX data
BIT PATTERN GENERATOR
PRESET
DELAY
INTEGRATE
RX data
AND DUMP
Fig.10 BER test facility.
1997 Aug 12 16
DATA
COMPARATOR
BER TEST BOARD
to error counter
MED904
Page 17
Philips Semiconductors Preliminary specification
a
Frequency Shift Keying (FSK) receiver UAA3202M

APPLICATION INFORMATION

data
output
power-down
C17
BIAS
ref
V
150 k
150 k
BUFFER
MHA814
C13
C14
UAA3202M
30 k
C24
(1)
COMP
R2
Fig.11 Application diagram.
C22
SHIFT
50 k
PHASE
DETECTOR
LIMITER
AMPLIFIER
ref
V
RSSI
OSCILLATOR
R4
C23
ndbook, full pagewidth
C12
CC
V
A
test point
C25
C19
PHASE
CC
V
C10
1.5 k
PMA
C8 C9 C11
L2 L3
C20
C5 C4
L1 C6
1.4 k
20 19 18 17 16 15 14 13 12 11
1997 Aug 12 17
MIXER
1.5 k
V
CC
12 3 4 5 6 7 8 910
C7
C18
C16
L4
R3
L5
CC
V
SAWR
432.92 MHz
C2
C3
C1
(1) Stray inductance.
Page 18
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
Table 4 Application component list for Fig.11
COMPONENT VALUE TOLERANCE DESCRIPTION
R2 560 Ω±2% TC = 50 ppm/K R3 220 Ω±2% TC = 50 ppm/K R4 820 kΩ±2% TC = 50 ppm/K C1 4.7 µF ±20%
4
C2 150 pF ±10% TC = 0 ±30 ppm/K; tan δ≤10 × 10 C3 100 nF ±10% TC = 0 ±30 ppm/K; tan δ≤10 × 10 C4 100 pF ±10% TC = 0 ±30 ppm/K; tan δ≤10 × 10 C5 2.7 pF ±10% TC = 0 ±150 ppm/K; tan δ≤30 × 10 C6 3to10pF TC = 0 ±300 ppm/K; tan δ≤20 × 10 C7 56 pF ±10% TC = 0 ±30 ppm/K; tan δ≤10 × 10 C8 33 pF ±10% TC = 0 ±30 ppm/K; tan δ≤10 × 10
C9 100 pF ±10% TC = 0 ±30 ppm/K; tan δ≤10 × 10 C10 5.6 pF ±10% TC = 0 ±30 ppm/K; tan δ≤20 × 10 C11 100 pF ±10% TC = 0 ±30 ppm/K; tan δ≤10 × 10 C12 100 nF ±10% tan δ≤25 × 10 C13 2.2 nF ±10% tan δ≤25 × 10 C14 33 nF ±10% tan δ≤25 × 10
3
; f = 1 kHz
3
; f = 1 kHz
3
; f = 1 kHz C16 3.9 pF ±10% TC = 0 ±150 ppm/K; tan δ≤30 × 10 C17 10 nF ±10% tan δ≤25 × 10
3
; f = 1 kHz C18 1.8 pF ±10% TC = 0 ±150 ppm/K; tan δ≤30 × 10 C19 39 pF ±10% TC = 0 ±30 ppm/K; tan δ≤10 × 10 C20 3.3 pF ±10% TC = 0 ±150 ppm/K; tan δ≤30 × 10 C22 18 pF ±5% TC = 0 ±30 ppm/K; tan δ≤10 × 10
3
C23 47 nF ±10% tan δ≤25 × 10
; f = 1 kHz C24 22 pF ±5% TC = 0 ±30 ppm/K; tan δ≤10 × 10 C25 1 nF ±10% tan δ≤25 × 10
L1 10 nH ±10% Q L2 150 µH ±10% Q L3 220 µH ±10% Q L4 33 nH ±10% Q L5 470 µH ±10% Q
= 50 to 450 MHz; TC = 25 to 125 ppm/K
min
= 45 to 800 kHz; C
min
= 45 to 800 kHz; C
min
= 45 to 450 MHz; TC = 25 to 125 ppm/K
min
= 45 to 800 kHz; C
min
3
; f = 1 kHz
stray stray
stray
1pF1pF
1pF
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
4
; f = 1 MHz
Table 5 Surface Acoustic Wave Resonator (SAWR) data
DESCRIPTION SPECIFICATION
Type one-port Centre frequency 432.92 MHz ±75 kHz Maximum insertion loss 1.5 dB Typical loaded Q 1600 (50 load) Temperature drift 0.032 ppm/K
2
Turnover temperature 43 °C
1997 Aug 12 18
Page 19
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M

LAYOUT OF PRINTED-CIRCUIT BOARD FOR AC APPLICATION

handbook, full pagewidth
a. Copper side.
C5
L3
C6
C19
C10
C9
C20
V
CC
L5
C3
C1
SAWR
C11
C8
L2
C7
C2
L4
L1
C4
C12
C25
UAA3202M
C18
C24 C21
C16
R3
R2
R4
C23
C22
C13
C14
C17
DATA
POWER DOWN
COMP
MHA813
b. Component side.
Fig.12 Printed-circuit board layout.
1997 Aug 12 19
Page 20
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M

PACKAGE OUTLINE

SSOP20: plastic shrink small outline package; 20 leads; body width 5.3 mm
D
y
Z
20 11
pin 1 index
c
A
2
A
1
E
H
E

SOT339-1

A
X
v M
A
Q
(A )
L
p
L
A
3
θ
110
w M
b
e
DIMENSIONS (mm are the original dimensions)
UNIT A1A
Note
1. Plastic or metal protrusions of 0.20 mm maximum per side are not included.
A
max.
2.0
0.21
0.05
mm
OUTLINE VERSION
SOT339-1 MO-150AE
A3b
2
1.80
0.25
1.65
IEC JEDEC EIAJ
p
0.38
0.25
p
cD
0.20
7.4
0.09
7.0
REFERENCES
0 2.5 5 mm
scale
(1)E(1)
5.4
0.65
5.2
1997 Aug 12 20
detail X
eHELLpQ
7.9
7.6
1.03
0.63
0.9
0.7
PROJECTION
0.131.25 0.2 0.1
EUROPEAN
(1)
Zywv θ
0.9
0.5
ISSUE DATE
93-09-08 95-02-04
o
8
o
0
Page 21
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
SOLDERING Introduction
There is no soldering method that is ideal for all IC packages. Wave soldering is often preferred when through-hole and surface mounted components are mixed on one printed-circuit board. However, wave soldering is not always suitable for surface mounted ICs, or for printed-circuits with high population densities. In these situations reflow soldering is often used.
This text gives a very brief insight to a complex technology. A more in-depth account of soldering ICs can be found in our
“IC Package Databook”
Reflow soldering
Reflow soldering techniques are suitable for all SSOP packages.
Reflow soldering requires solder paste (a suspension of fine solder particles, flux and binding agent) to be applied to the printed-circuit board by screen printing, stencilling or pressure-syringe dispensing before package placement.
Several techniques exist for reflowing; for example, thermal conduction by heated belt. Dwell times vary between 50 and 300 seconds depending on heating method. Typical reflow temperatures range from 215 to 250 °C.
Preheating is necessary to dry the paste and evaporate the binding agent. Preheating duration: 45 minutes at 45 °C.
Wave soldering
Wave soldering is not recommended for SSOP packages. This is because of the likelihood of solder bridging due to closely-spaced leads and the possibility of incomplete solder penetration in multi-lead devices.
(order code 9398 652 90011).
If wave soldering cannot be avoided, the following conditions must be observed:
A double-wave (a turbulent wave with high upward
pressure followed by a smooth laminar wave) soldering technique should be used.
The longitudinal axis of the package footprint must
be parallel to the solder flow and must incorporate solder thieves at the downstream end.
Even with these conditions, only consider wave soldering SSOP packages that have a body width of
4.4 mm, that is SSOP16 (SOT369-1) or SSOP20 (SOT266-1).
During placement and before soldering, the package must be fixed with a droplet of adhesive. The adhesive can be applied by screen printing, pin transfer or syringe dispensing. The package can be soldered after the adhesive is cured.
Maximum permissible solder temperature is 260 °C, and maximum duration of package immersion in solder is 10 seconds, if cooled to less than 150 °C within 6 seconds. Typical dwell time is 4 seconds at 250 °C.
A mildly-activated flux will eliminate the need for removal of corrosive residues in most applications.
Repairing soldered joints
Fix the component by first soldering two diagonally­opposite end leads. Use only a low voltage soldering iron (less than 24 V) applied to the flat part of the lead. Contact time must be limited to 10 seconds at up to 300 °C. When using a dedicated tool, all other leads can be soldered in one operation within 2 to 5 seconds between 270 and 320 °C.
1997 Aug 12 21
Page 22
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M

DEFINITIONS

Data sheet status
Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.

LIFE SUPPORT APPLICATIONS

These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale.
1997 Aug 12 22
Page 23
Philips Semiconductors Preliminary specification
Frequency Shift Keying (FSK) receiver UAA3202M
NOTES
1997 Aug 12 23
Page 24
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© Philips Electronics N.V. 1997 SCA55 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license under patent- or other industrial or intellectual property rights.
Internet: http://www.semiconductors.philips.com
Printed in The Netherlands 547027/1200/01/pp24 Date of release: 1997 Aug 12 Document order number: 9397 750 02306
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