package is a new high volume
power package exibiting the same footprint as the
industry standard TO-220, but designed to
accomodate much larger silicon chips, normally
supplied in bigger packages. The increased die
capacity makes the device ideal to reduce
component count in multiple paralleled TO-220
designs and save board space with respect to
larger packages.
APPLICATIONS
■ HIGH CURRENT, HIGH SPE ED SWI TCHING
■ SWITC H MODE POWER SUPPLIES (SMPS)
■ DC-AC CONVE RTERS FOR WELDING
EQUIPMENT AND UNINTERRUPTIBLE
POWER SU PP LIE S (UPS)
3
2
1
Max220
TM
INTER NAL SCH E M ATI C DIAG RA M
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
V
V
IDM(•)Drain Current (pulsed)40.8A
P
T
(•) Pulse width limited by safe operating area
October 1997
DS
DGR
GS
I
D
I
D
tot
stg
T
j
Drain-source Voltage (VGS = 0)500V
Drain- gate Voltage (RGS = 20 kΩ)
500V
Gate-source Voltage± 30V
Drain Current (continuous) at Tc = 25 oC10.2A
Drain Current (continuous) at Tc = 100 oC6.4A
Total Dissipation at Tc = 25 oC145W
Derating Factor1.16W/oC
Storage Temperature-65 to 150
Max. Operating Junction Temperature150
o
C
o
C
1/5
Page 2
STU10NA50
THERMAL DATA
R
thj-case
Rthj-amb
R
thc-si n k
T
Thermal Resistance Junction-case Max
Thermal Resistance Junction-ambient Max
Thermal Resistance Case-sink Typ
Maximum Lead Temperature For Soldering Purpose
I
AVALANCHE CHARACTERI S TICS
SymbolParameterMax ValueUnit
I
AR
E
E
I
AR
Avalanche Current, Repetitive or Not-Repetitive
(pulse width limited by T
Single Pulse Avalanche Energy
AS
(starting T
Repetitive Avalanche Energy
AR
= 25 oC, ID = IAR, V
j
(pulse width limited by T
ma x, δ < 1%)
j
DD
ma x, δ < 1%)
j
Avalanche Current, Repetitive or Not-Repetitive
= 100 oC, pulse width limited by Tj max, δ < 1%)
(T
c
= 50 V)
0.86
30
0.1
300
10.2A
520mJ
24mJ
6.8A
o
C/W
o
C/W
o
C/W
o
C
ELECTRICAL CHARACTERISTICS (T
= 25 oC unless otherwise specified)
case
OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
(BR)DSS
Drain-source
I
= 250 µA V
D
GS
= 0
500V
Breakdown Voltage
I
DSS
I
GSS
Zero Gate Voltage
Drain Current (V
GS
Gate-body Leakage
Current (V
DS
= 0)
= 0)
= Max Rating
V
DS
V
= Max Rating x 0.8 Tc = 100 oC
DS
V
= ± 30 V
GS
250
1000µAµA
± 100nA
ON (∗)
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
GS(th)
Gate Threshold
V
= VGS ID = 250 µA
DS
2.2533.75V
Voltage
R
DS(on)
I
D(on)
Static Drain-source On
Resistance
VGS = 10 V ID = 5 A
V
= 10 V ID = 5 A Tc = 100oC
GS
On State Drain Current VDS > I
V
= 10 V
GS
D(on)
x R
DS(on)max
0.50.6
1.2
10.2A
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
gfs (∗)Forward
Transconductance
C
C
C
Input Capacitance
iss
Output Capacitance
oss
Reverse Transfer
rss
Capacitance
VDS > I
V
DS
x R
D(on)
DS(on)max
= 25 V f = 1 MHz V
ID = 5 A69S
= 01750
GS
250
80
2500
370
130
Ω
Ω
pF
pF
pF
2/5
Page 3
STU10NA50
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING O N
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
d(on)
(di/dt)
Turn-on Time
Rise Time
t
r
Turn-on Current Slope V
on
V
= 250 V ID =5 A
DD
RG = 4.7 Ω VGS = 10 V
= 400 V ID = 10 A
DD
= 47 Ω VGS = 10 V
R
G
20
32
28
45
190A/µs
ns
ns
Q
Q
Q
Total Gate Charge
g
Gate-Source Charge
gs
Gate-Drain Charge
gd
V
= 400 V ID = 10 A V
DD
= 10 V80
GS
12
37
110nC
SWITCHING O F F
SymbolParameterTest ConditionsMin.Typ.Max.Unit
t
r(Voff)
t
t
Off-voltage Rise Time
Fall Time
f
Cross-over Time
c
V
= 400 V ID = 10 A
DD
= 4.7 Ω VGS = 10 V
R
G
16
12
30
22
18
42
SOURCE DRAIN DIO DE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
I
SD
I
SDM
V
SD
t
Q
I
RRM
(∗) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safe operating area
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consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No
license is granted by implication or ot h erwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifi cations mentioned
in this publication are subject to change without notice. This publication sup ersedes and replaces all information previously supplied.
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written approval of SGS-THOMSON Microelectonics.