This application specific Power MOSFET is the third
genaration of STMicro electronis unique "Single Feature
Size™" strip-based process. The resulting transistor
shows the best trade-off between on-resistance and gate
charge. When used as high and low side in buck
regulators, it gives the be st perfor manc e in terms of both
conduction and switching losses. This is extremely
important for motherboards where fast switching and
high efficiency are of paramount importance.
APPLICATIONS
■ SPECIFICALL Y D ESIGNED AND OP TIMISED
FOR HIGH EFFICIENCY CPU CORE DC/DC
CONVERTERS
3
1
D2PAK
TO-263
(Suffix “T4”)
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
SymbolParameterValueUnit
V
DS
V
DGR
V
GS
(#)Drain Current (continuous) at TC = 25°C
I
D
I
D
(
I
DM
P
tot
T
stg
T
j
Pulse wi dth limited by saf e operating area.
(•)
September 2002
This is preliminary information on a new product now in development or undergoing evaluation. Details are subject to change without notice.
Drain-source Voltage (VGS = 0)
Drain-gate Voltage (RGS = 20 kΩ)
30V
30V
Gate- source Voltage± 16V
80A
Drain Current (continuous) at TC = 100°C
•)
Drain Current (pulsed)320A
Total Dissipation at TC = 25°C
80A
200W
Derating Factor1.3W/°C
Storage Temperature
Max. Operating Junction Temperature
-55 to 175°C
(#) Value limited by wire bonding
1/7
Page 2
STB90NF3LL
THERMA L D ATA
Rthj-case
Rthj-amb
T
Thermal Resistance Junction-case
Thermal Resistance Junction-ambient
Maximum Lead Temperature For Soldering Purpose
l
Max
Max
0.75
62.5
300
°C/W
°C/W
°C
ELECTRICAL CHARACTERISTICS (T
= 25 °C UNLESS OTHERWISE SPECIFIED)
CASE
OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 250 µA, VGS = 0
V
(BR)DSS
Drain-source
I
D
30V
Breakdown Voltage
= Max Rating
V
DS
V
= Max Rating TC = 125°C
DS
V
= ± 16 V
GS
1
10
±100nA
ON
(*)
I
DSS
I
GSS
Zero Gate Voltage
Drain Current (V
GS
Gate-body Leakage
Current (V
DS
= 0)
= 0)
SymbolParameterTest ConditionsMin.Typ.Max.Unit
V
V
GS(th)
R
DS(on)
Gate Threshold Voltage
Static Drain-source On
Resistance
= VGS I
DS
= 10 V ID = 40 A
V
GS
V
= 4.5 V ID = 40 A
GS
= 250 µA
D
1V
0.0048
0.0070
0.0055
0.0090
DYNAMIC
SymbolParameterTest ConditionsMin.Typ.Max.Unit
(*)
g
fs
C
iss
C
oss
C
rss
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
V
= 15 V ID= 40 A
DS
= 25V f = 1 MHz VGS = 0
V
DS
TBDS
3000
950
190
µA
µA
Ω
Ω
pF
pF
pF
2/7
Page 3
STB90NF3LL
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 15 V ID = 40 A
t
d(on)
Turn-on Delay Time
t
r
Rise Time
V
DD
R
= 4.7 Ω VGS = 4.5 V
G
(Resistive Load, Figure 3)
Q
g
Q
gs
Q
gd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
= 24 V ID= 80 A VGS= 5 V
V
DD
SWITCHING OFF
SymbolParameterTest ConditionsMin.Typ.Max.Unit
= 15 VID = 40 A
t
d(off)
Turn-off Delay Time
t
f
Fall Time
V
DD
R
= 4.7Ω, V
G
GS
= 4.5 V
(Resistive Load, Figure 3)
SOURCE DRAIN DIODE
SymbolParameterTest ConditionsMin.Typ.Max.Unit
I
SD
I
SDM
V
SD
t
rr
Q
rr
I
RRM
(*)
Pulsed: P ul se duration = 300 µs, duty cycle 1.5 %.
(
Pulse widt h l i m i ted by safe operating area.
•)
Source-drain Current
(•)
Source-drain Current (pulsed)
(*)
Forward On Voltage
Reverse Recovery Time
Reverse Recovery Charge
Reverse Recovery Current
I
= 80 A VGS = 0
SD
= 80 Adi/dt = 100A/µs
I
SD
V
= 10 VTj = 150°C
DD
(see test circuit, Figure 5)
30
225
39
14
21
37
24
55
115
3.5
51nC
80
320
1.3V
ns
ns
nC
nC
ns
ns
A
A
ns
nC
A
3/7
Page 4
STB90NF3LL
Fig. 1: Unclamped Inductive Load Test CircuitFig. 1: Unclamped Inductive Load Test CircuitFig. 2: Unclamped Inductive Waveform
Fig. 3: Switching Times Test Circuits For Resistive
Load
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
Information furnished is believed to be ac curate and reli able. Howev er, STMicroel ectronics assumes no responsibilit y for the consequence s
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise under any patent or patent rights of STMi croelectr onics. Specifications mentioned in thi s publicati on are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as cri tical comp onents in life support dev i ces or systems wi t hout express written ap proval of STMi croelect ro nics.
The ST log o i s registered trademark of STMicroelectronics
2002 STMi croelectr oni cs - All Rights Reserved
All other names are the property of their respective owners.
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7/7
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