The NTE955MC is a monolithic timing circuit in an 8–Lead DIP type package fabricated using CMOS
process. This timer is fully compatible with CMOS, TTL, and MOS logic and operates at frequencies
up to 2MHz. Because of its high impedance, this device uses smaller timing capacitors than those
used by the NE555. As a result, more accurate time delays and oscillations are possible. Power consumption is low across the full range of power supply voltage.
Like the NE555, the NTE955MC has a trigger level equal to approximately one–third of the supply
voltage and a threshold level equal to approximately two–thirds of the supply voltage. These levels
can be altered by use of the control voltage terminal (Pin5). When the trigger input (Pin2) falls below
the trigger level, the flip–flop is set and the output goes high. If Pin2 is above the trigger level and the
threshold input (Pin6) is above the threshold level, the flip–flop is reset and the output is low . The reset
input (Pin4) can override all other inputs and can be used to initiate a new timing cycle. If Pin4 is low ,
the flip–flop is reset and the output is low. Whenever the output is low, a low–impedance path is provided between the discharge terminal (Pin7) and GND. All unused inputs should be tied to an appropriate logic level to prevent false triggering.
While the CMOS output is capable of sinking over 100mA and sourcing over 10mA, the NTE955MC
exhibits greatly reduced supply–current spikes during output transitions. This minimizes the need for
the large decoupling capacitors required by the NE555.
Features:
DDirect Replacement for 555 Timers
DVery Low Power Consumption: 1mW Typ at V
DOperates in Both Astable and Monostable Modes
DCMOS Output Capable of Swinging Rail to Rail
DHigh Output Current Capability:
Sink 100mA Typ
Source 10mA Typ
DOutput Fully Compatible with CMOS, TTL, and MOS
DLow Supply Current Reduces Spikes During Output Transitions
DSingle Supply Operation from 2V to 15V
Note 1. Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent
damage to the device. These are stress ratings only and functional operation of the device
at these or any other conditions beyond those indicated under “Recommended Operating
Conditions” is not implied. Exposure to absolute–maximum–rated conditions for extended
periods may affect device reliability.
Note 2. All voltage values are with respect to network GND.
Recommended Operating Conditions:
ParameterSymbolTest ConditionsMinTypMaxUnit
Supply VoltageV
Operating Ambient Temperature RangeT