FEATURES
Very Low-Noise, 5 nV/÷Hz@ 1 kHz Max
Excellent Input Offset Voltage, 0.4 mV Max
Low Offset Voltage Drift, 2 V/C Max
Very High Gain, 1000 V/mV Min
Outstanding CMR, 110 dB Min
Slew Rate, 2 V/s Typ
Gain-Bandwidth Product, 6 MHz Typ
Industry Standard Quad Pinouts
Available in Die Form
GENERAL DESCRIPTION
The OP470 is a high-performance monolithic quad operational
amplifier with exceptionally low voltage noise, 5 nV/X/ Hz at
1 kHz Max, offering comparable performance to ADI’s industry
standard OP27.
The OP470 features an input offset voltage below 0.4 mV,
excellent for a quad op amp, and an offset drift under 2 mV/∞C,
guaranteed over the full military temperature range. Open loop
gain of the OP470 is over 1,000,000 into a 10 kW load ensuring
excellent gain accuracy and linearity, even in high gain applications. Input bias current is under 25 nA, which reduces errors
due to signal source resistance. The OP470’s CMR of over
110 dB and PSRR of less than 1.8 mV/V significantly reduce
errors due to ground noise and power supply fluctuations.
Power consumption of the quad OP470 is half that of four
OP27s, a significant advantage for power conscious applications. The OP470 is unity-gain stable with a gain bandwidth
product of 6 MHz and a slew rate of 2 V/ms.
Operational Amplifier
OP470
The OP470 offers excellent amplifier matching which is important
for applications such as multiple gain blocks, low noise instrumentation amplifiers, quad buffers, and low noise active filters.
The OP470 conforms to the industry standard 14-pin DIP pinout.
It is pin compatible with the LM148/149, HA4741, HA5104,
and RM4156 quad op amps and can be used to upgrade systems
using these devices.
For higher speed applications, the OP471, with a slew rate of
8 V/ms, is recommended.
PIN CONNECTIONS
14–Lead Hermetic Dip
(Y–Suffix)
14–Lead Plastic Dip
(P–Suffix)
OUT A
–IN A
+IN A
+IN B
–IN B
OUT B
1
2
3
4
V+
OP470
5
6
7
14
13
12
11
10
9
8
OUT D
–IN D
+IN D
V–
+IN C
–IN C
OUT C
16–Lead SOIC Package
(R–Suffix)
1
OUT AOUT D
2
–IN A–IN D
3
+IN A+IN D
4
V+V–
OP470
5
+IN B+IN C
6
–IN B–IN C
7
OUT BOUT C
8
NCNC
NC = NO CONNECT
16
15
14
13
12
11
10
9
SIMPLIFIED SCHEMATIC
V+
BIAS
IN
+IN
V–
REV. A
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties that
may result from its use. No license is granted by implication or otherwise
under any patent or patent rights of Analog Devices.
POWER SUPPLY
REJECTION RATIOPSRRVS = ±4.5 V to ±18 V5.6mV/V MAX
SUPPLY CURRENT
(All Amplifiers)I
NOTE
*
Guaranteed by CMR test
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
Absolute Maximum Ratings apply to both DICE and packaged parts, unless
otherwise noted.
2
The OP470’s inputs are protected by back-to-back diodes. Current limiting
resistors are not used in order to achieve low noise performance. If differential
voltage exceeds ±1.0 V, the input current should be limited to ± 25 mA.
3
is specified for worst case mounting conditions, i.e., jA is specified for device
jA
in socket for TO, CerDIP, PDIP, packages; jA is specified for device soldered to
printed circuit board for SO packages.
–IN B
OUT B
OUT C
+IN B
–IN C
+IN CV–+IN D
DIE SIZE 0.163 0.106 INCH, 17,278 SQ. mm
(4.14 2.69 mm, 11.14 SQ. mm)
+IN AV+
–IN A
OUT A
OUT D
–IN D
Figure 1. Dice Characteristics
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although
the OP470 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high-energy electrostatic discharges. Therefore, proper ESD precautions are
recommended to avoid performance degradation or loss of functionality.
REV. A
–5–
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