Analog Devices DAC16 Datasheet

16-Bit High Speed

SETTLING TIME – ns

0.1

0.01

0.001
0 100

PERCENT OF FULL-SCALE – %

200 300 400 500 600 700 800

V

LOGIC

= 0V

TURNING ON

V

LOGIC

= +5V

TURNING OFF

I

FS

= 4mA

T

A

= 258C

a

FEATURES
ⴞ1 LSB Differential Linearity (max)
Guaranteed Monotonic Over Temperature Range
ⴞ2 LSB Integral Linearity (max)
500 ns Settling Time
5 mA Full-Scale Output
TTL/CMOS Compatible
Low Power: 190 mW (typ)
Available in Die Form

APPLICATIONS
Communications
ATE
Data Acquisition Systems
High Resolution Displays

GENERAL DESCRIPTION

The DAC16 is a 16-bit high speed current-output digital-to­analog converter with a settling time of 500 ns. A unique com­bination of low distortion, high signal-to-noise ratio, and high
speed make the DAC16 ideally suited to performing waveform
synthesis and modulation in communications, instrumentation,
and ATE systems. Input reference current is buffered, with full­scale output current of 5 mA. The 16-bit parallel digital input
bus is TTL/CMOS compatible. Operating from +5 V and
–15 V supplies, the DAC16 consumes 190 mW (typ) and is
available in a 24-lead epoxy DIP, epoxy surface-mount small
outline (SOL), and in die form.

Current-Output DAC

FUNCTIONAL BLOCK DIAGRAM

I

REF

REF GND

V

AGND

V

DGND

BUFFER

CC

EE

DB0 (LSB)

DAC16

DAC

DB15 (MSB)

DAC16

C

COMP

I

OUT

REV. B

Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.

Figure 1. DAC16 Settling Time Accuracy vs. Percent of
Full Scale

One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: [phone] World Wide Web Site: http://www.analog.com
Fax: [phone] © Analog Devices, Inc., 1999

DAC16–SPECIFICATIONS

(@ VCC = +5.0 V, VEE = –15.0 V, I

ELECTRICAL CHARACTERISTICS

Parameter Conditions Min Typ Max Units

perature Range unless otherwise noted. See Note 1 for supply variations.)

= 0.5 mA, C

REF

= 47 ␮F, TA = Full Operating Tem-

COMP

Integral Linearity “G” INL T

= +25°C–2±1.2 +2 LSB

A

Integral Linearity “G” INL –4 ±1.6 +4 LSB

Differential Linearity “G” DNL T

= +25°C–1±0.5 +1 LSB

A

Differential Linearity “G” DNL –1 ±0.7 +1.5 LSB

Integral Linearity “F” INL T

= +25°C–4±1.4 +4 LSB

A

Integral Linearity “F” INL –6 ±2 +6 LSB

Differential Linearity “F” DNL T

= +25°C–1±0.5 +1.5 LSB

A

Differential Linearity “F” DNL –1.5 ±0.6 +2 LSB

Zero Scale Error ZSE 1 LSB
Zero Scale Drift TC

ZSE

0.025 ppm/°C

Gain Error GE ±0.225 % FS

Gain Drift TC

REFERENCE

Reference Input Current I

2

REF

GE

Note 2 350 625 µA

5 ppm/°C

OUTPUT CHARACTERISTICS

Output Current I
Output Capacitance C
Settling Time t

OUT

S

Note 2 2.8 5.0 mA

OUT

10 pF

0.003% of Full Scale 500 ns

LOGIC CHARACTERISTICS

T

Logic Input High Voltage V
Logic Input Low Voltage V
Logic Input Current I
Logic Input Current I
Logic Input Current I
Input Capacitance C

INH

INL

INH

INH

INL

IN

= +25°C 2.4 V

A

T

= +25°C 0.8 V

A

V

= 5.0 V, DB0–DB10 7.5 µA

IN

V

= 5.0 V, DB11–DB15 100 µA

IN

V

= 0 V, DB0–DB15 1 µA

IN

8pF

SUPPLY CHARACTERISTICS

Power Supply Sensitivity PSS V
Positive Supply Current I
Positive Supply Current I
Negative Supply Current I
Power Dissipation P

NOTES

1

All supplies can be varied ±5% and operation is guaranteed. Device is tested with nominal supplies.

2

Operation is guaranteed over this reference range, but linearity is neither tested not guaranteed (see Figures 7 and 8).

Specifications subject to change without notice.

CC

CC

EE

DISS

= 4.5 V to 5.5 V, VEE = –13 V to –17 V 20 ppm/V

CC

All Bits HIGH 15 22 mA
All Bits LOW 6 7.5 mA

7.5 10 mA
188 260 mW

WAFER TEST LIMITS

(@ VCC = +5.0 V, VEE = –15.0 V, I

= 0.5 mA, C

REF

= 47 ␮F, TA = +25ⴗC unless otherwise noted.)

COMP

DAC16G

Parameter Symbol Conditions Limit Units

Integral Nonlinearity INL ±3 LSB max
Differential Nonlinearity DNL ±1 LSB max
Zero Scale Error ZSE ±1 LSB max
Gain Error GE ±12 % FS max

Logic Input High Voltage V
Logic Input Low Voltage V
Logic Input Current I
Positive Supply Current I
Negative Supply Current I
Power Dissipation P

NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.

INH

INL

IN

CC

EE

DISS

–2–

2.4 V min

0.8 V max

75 µA max

20 mA max
10 mA max
250 mW max

REV. B

DAC16

ABSOLUTE MAXIMUM RATINGS

(T

= +25°C unless otherwise noted)

A

VCC to VEE . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +25.0 V

V

to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +7.0 V

CC

V

to AGND . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V, –18.0 V

EE

DGND to AGND . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +0.3 V

REF GND to AGND . . . . . . . . . . . . . . . . . . . –0.3 V, +1.0 V

. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 mA

I

REF

Analog Output Current . . . . . . . . . . . . . . . . . . . . . . . . . . 8 mA

Digital Input Voltage to DGND . . . . . . . . . . . . . . . . . . . ≤V

CC

Operating Temperature Range

FP, FS . . . . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C

GS . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to +70°C

Dice Junction Temperature . . . . . . . . . . . . . . . . . . . . . +150°C

Storage Temperature . . . . . . . . . . . . . . . . . . –65°C to +150°C

Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . 1000 mW

Lead Temperature (Soldering, 60 sec) . . . . . . . . . . . . +300°C

Package Type θ

1

JA

θ

JC

Units

24-Lead Plastic DIP (P) 62 32 °C/W
24-Lead Plastic SOL (S) 70 22 °C/W

NOTE

1

θJA is specified for worst case mounting conditions, i.e., θ

device in socket.

is specified for

JA

DICE CHARACTERISTICS

VCCDGND I

DB15 (MSB)

DB14

DB13

DB12

DB11

DB10

REF

C

COMP

I

OUT

AGND

DB4DB5DB6DB7DB8DB9

REF GND

V

EE

DB0 (LSB)

DB1
DB2

DB3

Die Size 0.129 x 0.153 inch, 19,737 sq. mils
(3.277 x 3.886 mm, 12.73 sq. mm)
The DAC16 Contains 330 Transistors.
Substrate is V

Polarity.

EE

CAUTION

1. Stresses above those listed under “Absolute Maximum Rat­ings” may cause permanent damage to the device. This is a
stress rating only and functional operation at or above this
specification is not implied. Exposure to the above maximum
rating conditions for extended periods may affect device
reliability.

2. Digital inputs and outputs are protected; however, perma­nent damage may occur on unprotected units from high en­ergy electrostatic fields. Keep units in conductive foam or
packaging at all times until ready to use. Use proper anti­static handling procedures.

3. Remove power before inserting or removing units from their
sockets.

PIN CONFIGURATION

24-Lead DIP (P, S)

I

REF

DGND

V

DB15 (MSB)

DB14
DB13
DB12
DB11
DB10

DB9
DB8
DB7

CC

1
2
3
4
5

DAC16

6

TOP VIEW

(Not to Scale)

7
8

9
10
11
12

24

C

23

I

22

AGND

21

REF GND

20

V

19

DB0 (LSB)

18

DB1

17

DB2

16

DB3

15

DB4

14

DB5

13

DB6

COMP

OUT

EE

PIN DESCRIPTION

Pin
(P, S) Name Description

1I

REF

Reference Current Input
2 DGND Digital Ground
3V

CC

+5 V Digital Supply
4–19 DB15–DB0 16-Bit Digital Input Bus. DB15 is the MSB.
20 V

EE

–15 V Analog Supply
21 REF GND Reference Current Return
22 AGND Analog Ground/Output Reference
23 I
24 C

OUT

COMP

Current Output

Current Ladder Compensation

ORDERING GUIDE

Model Grade DNL (max) Temperature Ranges Package Descriptions Package Options

DAC16GS ±10°C to +70°C 24-Lead SOL R-24
DAC16FP ±2 –40°C to +85°C 24-Lead PDIP N-24
DAC16FS ±2 –40°C to +85°C 24-Lead SOL R-24
DAC16GBC ±1 +25°CDie

REV. B

–3–

DAC16

+5V

10kV

1
2
3
4
5
6
7
8

9
10
11
12

24

NC

23
22
21
20
19
18
17
16
15
14
13

–15V

Figure 2. Burn-In Diagram

OPERATION
Novel DAC Architecture

The DAC16 was designed with a compound DAC architecture
to achieve high accuracy, excellent linearity, and low transition
errors. As shown in Figure 3, the DAC’s five most-significant
bits utilize 31 identical segmented current sources to obtain
optimal high speed settling at major code transitions. The lower
nine bits utilize an inverted R-2R ladder network which is laser­trimmed to ensure excellent differential nonlinearity. The middle
two bits (DB9 and DB10) arc binary-weighted and scaled from
the MSB segments. Note that the flow of output current is into
the DAC16—there is no signal inversion. As shown, the switches
for each current source are essentially diodes. It is for this rea­son that the output voltage compliance of the DAC16 is limited
to a few millivolts. The DAC16 was designed to operate with an
operational amplifier configured as an I–V converter; therefore,
the DAC16’s output must be connected to the sum node of an
operational amplifier for proper operation. Exceeding the output
voltage compliance of the DAC16 will introduce linearity errors.
The reference current buffer assures full accuracy and fast set­tling by controlling the MSB reference node. The 16-bit paral­lel digital input is TTL/CMOS compatible and unbuffered,

minimizing the deleterious effects of digital feedthrough
while allowing the user to tailor the digital interface to
the speed requirements and bus configuration of the
application.

Equivalent Circuit Analysis

An equivalent circuit for static operation of the DAC16 is
illustrated in Figure 4. I
DAC16 and is set externally to the device by V
R

The output capacitance of the DAC16 is approxi-

REF.

is the current applied to the

REF

REF

and

mately 10 pF and is code independent. Its output resis­tance R

where

is code dependent and is given by:

O

1

1

=

R

8 kΩ

O

DB9

+

288 kΩ

DB10

+

144 kΩ

+

72 kΩ

X

DB9 = State of Data Bit 9 = 0 or 1;

DB10 = State of Data Bit 10 = 0 or 1; and

X = Decimal representation of the 5 MSBs (DB11–DB15)

= 0 to 31.

I

OUT

I

DAC

R

O

C

O

I
RO = SEE TEXT

C

OUT

= 10pF

O

= 8 • I

65,535 Digital Code

REF

65,536

Figure 4. Equivalent Circuit for the DAC16

Table I provides the relationship between the input digital
code and the output resistance of the DAC16.

Table I. DAC16 Output Resistance vs. Digital Code

Hex Digital Code Scale Output Resistance

FFFF Zero 8 kΩ
BFFF 1/4 4.2 kΩ
7FFF 1/2 2.9 kΩ
3FFF 3/4 2.2 kΩ
0 Full – 1 LSB 1.8 kΩ

I

OUT

DB0 – DB8

DB11 – DB15

I

REF

18kV

C

COMP

SW

SW

31 CURRENT SOURCES

125mA EACH

DB10 DB9

SW10 SW9

62.5mA 31.25mA

4kV 4kV

SW8 SW7 SW6 SW0SW SW

9 CURRENT SOURCES

8kV8kV

4kV 4kV

15.63mA EACH

4kV

AGND

DB0 – DB15

SWITCH DETAIL

+5V

FROM
SWITCH
DECODER

Figure 3. DAC16 Architecture

–4–

REV. B