Analog Devices AD7845 b Datasheet

LC2MOS
a
FEATURES 12-Bit CMOS MDAC with Output Amplifier 4-Quadrant Multiplication Guaranteed Monotonic (T Space-Saving 0.3" DIPs and 24- or 28-Terminal Surface
Mount Packages Application Resistors On Chip for Gain Ranging, etc. Low Power LC
APPLICATIONS Automatic Test Equipment Digital Attenuators Programmable Power Supplies Programmable Gain Amplifiers Digital-to-4–20 mA Converters
GENERAL DESCRIPTION
The AD7845 is the industry’s first 4-quadrant multiplying D/A converter with an on-chip amplifier. It is fabricated on the
2
MOS process, which allows precision linear components
LC and digital circuitry to be implemented on the same chip.
The 12 data inputs drive latches which are controlled by stan­dard CS and WR signals, making microprocessor interfacing simple. For stand-alone operation, the CS and WR inputs can be tied to ground, making all latches transparent. All digital inputs are TTL and 5 V CMOS compatible.
The output amplifier can supply ±10 V into a 2 k load. It is
internally compensated, and its input offset voltage is low due to laser trimming at wafer level. For normal operation, R to V scale the output voltage range.
, but the user may alternatively choose RA, RB or RC to
OUT
2
MOS
MIN
to T
MAX
)
is tied
FB
Complete 12-Bit Multiplying DAC
AD7845
FUNCTIONAL BLOCK DIAGRAM
PRODUCT HIGHLIGHTS
1. Voltage Output Multiplying DAC The AD7845 is the first DAC which has a full 4-quadrant multiplying capability and an output amplifier on chip. All specifications include amplifier performance.
2. Matched Application Resistors Three application resistors provide an easy facility for gain ranging, voltage offsetting, etc.
3. Space Saving The AD7845 saves space in two ways. The integration of the output amplifier on chip means that chip count is reduced. The part is housed in skinny 24-lead 0.3" DIP, 28-terminal LCC and PLCC and 24-terminal SOIC packages.
REV. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781/329-4700 World Wide Web Site: http://www.analog.com Fax: 781/326-8703 © Analog Devices, Inc., 1999
1
AD7845–SPECIFICATIONS
V
connected to RFB. V
OUT
load = 2 k, 100 pF. All specifications T
OUT
(VDD = +15 V, 5%, VSS = –15 V, 5%, V
to T
MIN
unless otherwise noted.)
MAX
Parameter J Version K Version A Version B Version S Version T Version Units Test Conditions/Comments
ACCURACY
Resolution 12 12 12 12 12 12 Bits 1 LSB = Relative Accuracy
at +25°C ±1 ±1/2 ±1 ±1/2 ±1 ±1/2 LSB max All Grades Are Guaranteed
to T
T
MIN
Differential Nonlinearity ±1 ±1 ±1 ±1 ±1 ±1 LSB max DAC Register Loaded with
MAX
±1 ±3/4 ±1 ±3/4 ±1 ±3/4 LSB max Monotonic over Temperature
Zero Code Offset Error All 0s.
at +25°C ±2 ±1 ±2 ±1 ±2 ±1mV max
to T
T
MIN
Offset Temperature Coefficient; Gain Error ±3 ±2 ±3 ±2 ±3 ±2 LSB max R
MAX
(Offset/Temperature)
±3 ±2 ±3 ±2 ±4 ±3mV max
2
±5 ±5 ±5 ±5 ±5 ±5 µV/°C typ ±6 ±6 ±6 ±6 ±6 ±6 LSB max R
±6 ±6 ±6 ±6 ±6 ±6 LSB max R ±7 ±7 ±7 ±7 ±7 ±7 LSB max R
Gain Temperature Coefficient;
(Gain/Temperature)
2
±2 ±2 ±2 ±2 ±2 ±2 ppm of FSR/°CR
REFERENCE INPUT
Input Resistance, Pin 17 8888 88 kΩ min Typical Input Resistance = 12 kΩ
16 16 16 16 16 16 k max
APPLICATION RESISTOR
RATIO MATCHING 0.5 0.5 0.5 0.5 0.5 0 5 % max Matching Between RA, RB, R
DIGITAL INPUTS
(Input High Voltage) 2.4 2.4 2.4 2.4 2.4 2.4 V min
V
IH
(Input Low Voltage) 0.8 0.8 0.8 0.8 0.8 0.8 V max
V
IL
(Input Current) ±1 ±1 ±1 ±1 ±1 ±1 µA max Digital Inputs at 0 V and V
I
IN
CIN (Input Capacitance)27777 77 pF max
POWER SUPPLY
4
VDD Range 14.25/15.75 14.25/15.75 14.25/15.75 14.25/15.75 14.25/15.75 14.25/15.75 V min/V max
Range –14.25/–15.75 –14.25/–15.75 –14.25/–15.75 –14.25/–15.75 –14.25/–15.75 –14.25/–15.75 V min/V max
V
SS
Power Supply Rejection
Gain/V
DD
Gain/V
I
DD
I
SS
SS
±0.01 ±0.01 ±0.01 ±0.01 ±0.01 ±0.01 % per % max VDD = +15 V ± 5%, V ±0.01 ±0.01 ±0.01 ±0.01 ±0.01 ±0.01 % per % max VSS = –15 V ± 5%.
6666 66 mA maxV 4444 44 mA maxV
= +10 V, AGND = DGND = O V,
REF
V
REF
2
, V
Connected
FB
OUT
, V
Connected, V
C
OUT
, V
Connected, V
B
OUT
, V
Connected, V
A
OUT
, V
Connected
FB
Unloaded
OUT
Unloaded
OUT
OUT
typ
12
= 2.4 mV
REF
REF
REF
REF
= +5 V = +5 V = +2.5 V
DD
= –10 V
C
AC PERFORMANCE CHARACTERISTICS
These characteristics are included for Design Guidance and are not subject to test.
DYNAMIC PERFORMANCE
Output Voltage Settling Time 5555 55 µs max To 0.01% of Full-Scale Range
Slew Rate 11 11 11 11 11 11 V/µs typ V Digital-to-Analog 55 55 55 55 55 55 nV–s typ Measured with V
Glitch Impulse DAC Register Alternately Loaded
Multiplying Feedthrough 5555 55 mV p-p typ V
3
Error
Unity Gain Small Signal
Bandwidth 600 600 600 600 600 600 kHz typ V
Full Power Bandwidth 175 175 175 175 175 175 kHz typ V
Total Harmonic Distortion –90 –90 –90 –90 –90 –90 dB typ V
OUTPUT CHARACTERISTICS
Open Loop Gain 85 85 85 85 85 85 dB min V
5
Output Voltage Swing ±10 ±10 ±10 ±10 ±10 ±10 V min R Output Resistance 0.2 0.2 0.2 0.2 0.2 0.2 typ R Short Circuit Current @ +25°C 11 11 11 11 11 11 mA typ V Output Noise Voltage Includes Noise Due to Output (0.1 Hz to 10 Hz) @ +25°C2222 22 µV rms typ Amplifier and Johnson Noise
f = 10 Hz 250 250 250 250 250 250 nV/Hz typ of R f = 100 Hz 100 100 100 100 100 100 nV/Hz typ f = 1 kHz 50 50 50 50 50 50 nV/Hz typ f = 10 kHz 50 50 50 50 50 50 nV/Hz typ f = 100 kHz 50 50 50 50 50 50 nV/Hz typ
NOTES
1
Temperature ranges are as follows: J, K Versions: 0°C to +70°C; A, B Versions: –40°C to +85°C; S, T Versions: –55°C to +125°C.
2
Guaranteed by design and characterization, not production tested.
3
The metal lid on the ceramic D-24A package is connected to Pin 12 (DGND).
4
The device is functional with a power supply of ±12 V.
5
Minimum specified load resistance is 2 kΩ.
Specifications subject to change without notice.
Load = 2 k, 100 pF.
V
OUT
DAC Register Alternately Loaded with All 0s and All 1s. Typically
2.5 µs at 25°C. Load = 2 k, 100 pF.
OUT
with All 0s and All 1s.
= ±10 V, 10 kHz Sine Wave
REF
DAC Register Loaded with All 0s.
, RFB Connected. DAC Loaded
OUT
with All 1s V Sine Wave.
, RFB Connected. DAC Loaded
OUT
with All 1s. V Sine Wave. R
= 6 V rms, 1 kHz Sine Wave.
REF
, RFB Not Connected
OUT
= ±10 V, RL = 2 k
V
OUT
= 2 k, C
L
, V
FB
OUT
Shorted to AGND
OUT
FB
= 0 V.
REF
= 100 mV p-p
REF
= 20 V p-p
REF
= 2 kΩ.
L
= 100 pF
L
Connected,
REV. B–2–
TIMING CHARACTERISTICS
CS
WR
DATA
5V
0V
5V
0V
5V
0V
NOTES
1. ALL INPUT SIGNAL RISE AND FALL TIMES MEASURED FROM 10% TO 90% OF +5V. t
R
= tF = 20ns.
2. TIMING MEASUREMENT REFERENCE LEVEL IS
V
IH
+ V
IL
2
t
CS
t
CH
t
WR
t
DStDH
WARNING!
ESD SENSITIVE DEVICE
1
(VDD = +15 V, 5%. VSS = –15 V, 5%. V
= +10 V. AGND = DGND = O V.)
REF
AD7845
Limit at T
MIN
to T
MAX
Parameter (All Versions) Units Test Conditions/Comments
t
CS
t
CH
t
WR
t
DS
t
DH
NOTES
1
Guaranteed by design and characterization, not production tested.
Specifications subject to change without notice.
ABSOLUTE MAXIMUM RATINGS
(T
= +25°C unless otherwise stated)
A
VDD to DGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +17 V
to DGND . . . . . . . . . . . . . . . . . . . . . . . .+0.3 V to –17 V
V
SS
to AGND . . . . . . . . . . . . . . . . VDD + 0.3 V, VSS – 0.3 V
V
REF
to AGND . . . . . . . . . . . . . . . . VDD + 0.3 V, VSS – 0.3 V
V
RFB
to AGND . . . . . . . . . . . . . . . . .VDD + 0.3 V, VSS – 0.3 V
V
RA
to AGND . . . . . . . . . . . . . . . . .VDD + 0.3 V, VSS – 0.3 V
V
RB
to AGND . . . . . . . . . . . . . . . . . VDD + 0.3 V, VSS – 0.3 V
V
RC
to AGND2 . . . . . . . . . . . . . . . VDD + 0.3 V, VSS – 0.3 V
V
OUT
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, V
Digital Input Voltage to DGND . . . . . –0.3 V to VDD + 0.3 V
Power Dissipation (Any Package)
To +75°C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 650 mW
30 ns min Chip Select to Write Setup Time 0 ns min Chip Select to Write Hold Time 30 ns min Write Pulsewidth 80 ns min Data Setup Time 0 ns min Data Hold Time
1
Operating Temperature Range
Commercial (J, K Versions) . . . . . . . . . . . . . 0°C to +70°C
Industrial (A, B Versions) . . . . . . . . . . . . –40°C to +85°C
Extended (S, T Versions) . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . +300°C
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause
permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in
DD
the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods of time may affect device reliability. Only one Absolute Maximum Rating may be applied at any one time.
2
V
may be shorted to AGND provided that the power dissipation of the
OUT
package is not exceeded.
Derates above +75°C . . . . . . . . . . . . . . . . . . . . . 10 mW/°C
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD7845 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
ORDERING GUIDE
Temperature Accuracy Package Range @ +25ⴗC Option
Model
2
AD7845JN 0°C to +70°C ±1 LSB N-24 AD7845KN 0°C to +70°C ±1/2 LSB N-24 AD7845JP 0°C to +70°C ±1 LSB P-28A AD7845KP 0°C to +70°C ±1/2 LSB P-28A AD7845JR 0°C to +70°C ±1 LSB R-24 AD7845KR 0°C to +70°C ±1/2 LSB R-24 AD7845AQ –40°C to +85°C ±1 LSB Q-24 AD7845BQ –40°C to +85°C ±1/2 LSB Q-24 AD7845AR –40°C to +85°C ±1 LSB R-24 AD7845BR –40°C to +85°C ±1/2 LSB R-24 AD7845SQ/883B –55°C to +125°C ±1 LSB Q-24 AD7845TQ/883B –55°C to +125°C ±1/2 LSB Q-24 AD7845SE/883B –55°C to +125°C ±1 LSB E-28A
NOTES
1
Analog Devices reserves the right to ship either ceramic (D-24A) or cerdip (Q-24) hermetic packages.
2
To order MIL-STD-883, Class B processed parts, add /883B to part number.
3
E = Leadless Ceramic Chip Carrier; N = Plastic DIP; P = Plastic Leaded Chip Carrier; Q = Cerdip; R = SOIC.
REV. B –3–
1
Relative
3
Figure 1. AD7845 Timing Diagram
AD7845
PIN CONFIGURATIONS
DIP, SOIC
LCC
TERMINOLOGY
LEAST SIGNIFICANT BIT
This is the analog weighting of 1 bit of the digital word in a
V
REF
DAC. For the AD7845, 1 LSB =
RELATIVE ACCURACY
.
12
2
Relative accuracy or endpoint nonlinearity is a measure of the maximum deviation from a straight line passing through the endpoints of the DAC transfer function. It is measured after adjusting for both endpoints (i.e., offset and gain error are ad­justed out) and is normally expressed in least significant bits or as a percentage of full-scale range.
DIFFERENTIAL NONLINEARITY
Differential nonlinearity is the difference between the measured change and the ideal 1 LSB change between any two adjacent codes. A specified differential nonlinearity of +1 LSB max over the operating temperature range ensures monotonicity.
GAIN ERROR
Gain error is a measure of the output error between an ideal DAC and the actual device output with all 1s loaded after offset error has been adjusted out. Gain error is adjustable to zero with an external potentiometer. See Figure 13.
ZERO CODE OFFSET ERROR
This is the error present at the device output with all 0s loaded in the DAC. It is due to the op amp input offset voltage and bias current and the DAC leakage current.
TOTAL HARMONIC DISTORTION
This is the ratio of the root-mean-square (rms) sum of the har­monics to the fundamental, expressed in dBs.
OUTPUT NOISE
This is the noise due to the white noise of the DAC and the input noise of the amplifier.
PLCC
DIGITAL-TO-ANALOG GLITCH IMPULSE
This is the amount of charge injected from the digital inputs to the analog output when the inputs change state. This is nor­mally specified as the area of the glitch in either pA-secs or nV-secs depending upon whether the glitch is measured as a current or voltage. The measurement takes place with V
REF
=
AGND.
DIGITAL FEEDTHROUGH
When the DAC is not selected (i.e., CS is high) high frequency logic activity on the device digital inputs is capacitively coupled through the device to show up as noise on the V
pin. This
OUT
noise is digital feedthrough.
MULTIPLYING FEEDTHROUGH ERROR
This is ac error due to capacitive feedthrough from the V terminal to V
OPEN-LOOP GAIN
when the DAC is loaded with all 0s.
OUT
REF
Open-loop gain is defined as the ratio of a change of output voltage to the voltage applied at the V
pin with all 1s loaded
REF
in the DAC. It is specified at dc.
UNITY GAIN SMALL SIGNAL BANDWIDTH
This is the frequency at which the magnitude of the small signal voltage gain of the output amplifier is 3 dB below unity. The device is operated as a closed-loop unity gain inverter (i.e., DAC is loaded with all 1s).
OUTPUT RESISTANCE
This is the effective output source resistance.
FULL POWER BANDWIDTH
Full power bandwidth is specified as the maximum frequency, at unity closed-loop gain, for which a sinusoidal input signal will produce full output at rated load without exceeding a distortion level of 3%.
–4–
REV. B
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