Guaranteed monotonic
INL error: ±1 LSB max
On-chip 1.25 V/2.5 V, 10 ppm/°C reference
Temperature range: –40°C to +85°C
Rail-to-rail output amplifier
Power-down mode
Package type: 100-lead LQFP (14 mm × 14 mm)
User Interfaces
Parallel
Serial (SPI®-/QSPI™-/MICROWIRE™-/DSP-compatible,
featuring data readback)
2
C®-compatible
I
FUNCTIONAL BLOCK DIAGRAM
PD
SER/PAR
FIFO EN
CS/(SYNC/AD0)
WR/(DCEN/AD1)
SDO
DB11/(DIN/SDA)
DB10/(SCLK/SCL)
DB9/(SPI/I
REG 0
REG 1
RESET
MON_IN1
MON_IN2
MON_IN3
MON_IN4
2
DB8
DB0
BUSY
CLR
A4
A0
(×3)
DV
DD
DGND (×3)
AD5383
MACHINE
CONTROL
31
OUT
FIFO
+
STATE
+
LOGIC
C)
INTERFACE
CONTROL
LOGIC
POWER-ON
RESET
V
0………V
OUT
36-TO-1
MUX
AVDD (×4)
INPUT
REG 0
12
12
INPUT
REG 1
12
12
INPUT
REG 6
12
12
INPUT
REG 7
12
12
12-Bit, Voltage Output DAC
AD5383
INTEGRATED FUNCTIONS
Channel monitor
Simultaneous output update via
Clear function to user-programmable code
Amplifier boost mode to optimize slew rate
User programmable offset and gain adjust
Toggle mode enables square wave generation
Thermal monitor
APPLICATIONS
Variable optical attenuators (VOA)
Level setting (ATE)
Optical microelectro-mechanical systems (MEMS)
Control systems
Instrumentation
AGND (×4)DAC GND (×4)REFGNDREFOUT/REFIN SIGNAL GND (×4)
1.25V/2.5V
REFERENCE
12121212
m REG 0
c REG 0
m REG 1
c REG 1
m REG 6
c REG 6
m REG 7
c REG 7
×4
DAC
REG 0
DAC
REG 1
DAC
REG 6
DAC
REG 7
DAC 0
12121212
DAC 1
12121212
DAC 6
12121212
DAC 7
LDAC
R
R
R
R
R
R
R
R
V
0
OUT
V
1
OUT
V
2
OUT
V
3
OUT
V
4
OUT
V
5
OUT
V
6
OUT
V
7
OUT
V
8
OUT
V
31
OUT
MON_OUTLDAC
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
Figure 1.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
The AD5383 is a complete, single-supply, 32-channel, 12-bit
DAC available in a 100-lead LQFP package. All 32 channels
have an on-chip output amplifier with rail-to-rail operation.
The AD5383 includes a programmable internal 1.25 V/2.5 V,
10 ppm/°C reference; an on-chip channel monitor function that
multiplexes the analog outputs to a common MON_OUT pin
for external monitoring; and an output amplifier boost mode
that allows optimization of the amplifier slew rate. The AD5383
features
• Double-buffered parallel interface with a 20 ns
width.
WR
pulse
• SPI-/QSPI-/MICROWIRE-/DSP-compatible serial
interface with interface speeds in excess of 30 MHz.
2
• I
C-compatible interface that supports a 400 kHz data
transfer rate.
An input register followed by a DAC register provides double
buffering, allowing the DAC outputs to be updated independently or simultaneously using the
Each channel has a programmable gain and offset adjust
register that allows the user to fully calibrate any DAC channel.
With boost off, power consumption is typically 0.25 mA/channel.
Table 1 and Table 2 show additional products featuring high
channel count, low voltage, single-supply operation, and bipolar
voltage output operation.
LDAC
input.
Table 1. Other Hl noltDliigh Channe
AD5380BST-5 14 Bits 4.5 V to 5.5 V 40 ±4 100-Lead LQFP ST-100
AD5380BST-3 14 Bits 2.7 V to 3.6 V 40 ±4 100-Lead LQFP ST-100
AD5384BBC-5 14 Bits 4.5 V to 5.5 V 40 ±4 100-Lead CSPBGA BC-100
AD5384BBC-3 14 Bits 2.7 V to 3.6 V 40 ±4 100-Lead CSPBGA BC-100
AD5381BST-5 12 Bits 4.5 V to 5.5 V 40 ±1 100-Lead LQFP ST-100
AD5381BST-3 12 Bits 2.7 V to 3.6 V 40 ±1 100-Lead LQFP ST-100
AD5382BST-5 14 Bits 4.5 V to 5.5 V 32 ±4 100-Lead LQFP ST-100
AD5382BST-3 14 Bits 2.7 V to 3.6 V 32 ±4 100-Lead LQFP ST-100
AD5390BST-5 14 Bits 4.5 V to 5.5 V 16 ±3 52-Lead LQFP ST-52
AD5390BCP-5 14 Bits 4.5 V to 5.5 V 16 ±3 64-Lead LFCSP CP-64
AD5390BST-3 14 Bits 2.7 V to 3.6 V 16 ±4 52-Lead LQFP ST-52
AD5390BCP-3 14 Bits 2.7 V to 3.6 V 16 ±4 64-Lead LFCSP CP-64
AD5391BST-5 12 Bits 4.5 V to 5.5 V 16 ±1 52-Lead LQFP ST-52
AD5391BCP-5 12 Bits 4.5 V to 5.5 V 16 ±1 64-Lead LFCSP CP-64
AD5391BST-3 12 Bits 2.7 V to 3.6 V 16 ±1 52-Lead LQFP ST-52
AD5391BCP-3 12 Bits 2.7 V to 3.6 V 16 ±1 64-Lead LFCSP CP-64
AD5392BST-5 14 Bits 4.5 V to 5.5 V 8 ±3 52-Lead LQFP ST-52
AD5392BCP-5 14 Bits 4.5 V to 5.5 V 8 ±3 64-Lead LFCSP CP-64
AD5392BST-3 14 Bits 2.7 V to 3.6 V 8 ±4 52-Lead LQFP ST-52
AD5392BCP-3 14 Bits 2.7 V to 3.6 V 8 ±4 64-Lead LFCSP CP-64
Cou t, Low Vage, Single-Supply AC Products in Portfo
ion
arity Error (LSB)
o
ption Model ResolutAVDD Range Output Channels LinePackage DescriPackage Option
Table 2. 40-CharAannel, Bipol
AD5379ABC 14 Bits ±11.4 V to ±16.5 V 40 ±3 108-Lead CSPBGA BC-108
Voltage Output D C
ion
ls Model ResolutAnalog Supplies Output ChanneLinearity Error (LSB) Package Package Option
Rev. A | Page 3 of 40
AD5383
SPECIFICATIONS
AD5383-5 SPECIFICATIONS
AVDD = 4.5 V to 5.5 V; DVDD = 2.7 V to 5.5 V, AGND = DGND = 0 V; external REFIN = 2.5 V; all specifications T
otherwise noted.
Table 3.
Parameter AD5383-51 Unit Test Conditions/Comments
ACCURACY
Resolution 12 Bits
Relative Accuracy2 (INL) ±1 LSB max
Differential Nonlinearity (DNL) ±1 LSB max Guaranteed monotonic over temperature
Zero-Scale Error ±4 mV max
Offset Error ±4 mV max Measured at Code 32 in the linear region
Offset Error TC ±5 µV/°C typ
Gain Error ±0.024 % FSR max At 25°C
±0.06 % FSR max T
MIN
to T
MAX
Gain Temperature Coefficient3 2 ppm FSR/°C typ
DC Crosstalk3 0.5 LSB max
REFERENCE INPUT/OUTPUT
Reference Input3
Reference Input Voltage 2.5 V ±1% for specified performance, AVDD = 2 × REFIN + 50 mV
DC Input Impedance 1 MΩ min Typically 100 MΩ
Input Current ±10 µA max Typically ±30 nA
Reference Range 1 to VDD/2 V min/max
Reference Output4
Enabled via CR8 in the AD5383 control register,
CR10 selects the reference voltage
Output Voltage 2.495/2.505 V min/max At ambient; optimized for 2.5 V operation; CR10 = 1
1.22/1.28 V min/max 1.25 V reference selected; CR10 = 0
Reference TC ±10 ppm/°C max Temperature range: +25°C to +85°C
±15 ppm/°C max Temperature range: −40°C to +85°C
OUTPUT CHARACTERISTICS3
Output Voltage Range2 0/AVDD V min/max
Short-Circuit Current 40 mA max
Load Current ±1 mA max
Capacitive Load Stability
RL = ∞ 200 pF max
RL = 5 kΩ 1000 pF max
DC Output Impedance 0.5 Ω max
MONITOR PIN
Output Impedance 500 Ω typ
Three-State Leakage Current 100 nA typ
LOGIC INPUTS (EXCEPT SDA/SCL)3 DVDD = 2.7 V to 5.5 V
VIH, Input High Voltage 2 V min
VIL, Input Low Voltage 0.8 V max
Input Current ±10 µA max Total for all pins; TA = T
MIN
to T
Pin Capacitance 10 pF max
LOGIC INPUTS (SDA, SCL ONLY)
VIH, Input High Voltage 0.7 DVDD V min SMBus compatible at DVDD < 3.6 V
VIL, Input Low Voltage 0.3 DVDD V max SMBus compatible at DVDD < 3.6 V
IIN, Input Leakage Current ±1 µA max
V
, Input Hysteresis 0.05 DVDD V min
HYST
CIN, Input Capacitance 8 pF typ
Glitch Rejection 50 ns max Input filtering suppresses noise spikes of less than 50 ns
MAX
MIN
to T
MAX
, unless
Rev. A | Page 4 of 40
AD5383
Parameter AD5383-51 Unit Test Conditions/Comments
LOGIC OUTPUTS (
BUSY
, SDO)3
VOL, Output Low Voltage 0.4 V max DVDD = 5 V ± 10%, sinking 200 µA
VOH, Output High Voltage DVDD – 1 V min DVDD = 5 V ± 10%, sourcing 200 µA
VOL, Output Low Voltage 0.4 V max DVDD = 2.7 V to 3.6 V, sinking 200 µA
VOH, Output High Voltage DVDD – 0.5 V min DVDD = 2.7 V to 3.6 V, sourcing 200 µA
High Impedance Leakage Current ±1 µA max SDO only
High Impedance Output Capacitance 5 pF typ SDO only
LOGIC OUTPUT (SDA)3
VOL, Output Low Voltage 0.4 V max I
0.6 V max I
Three-State Leakage Current ±1 µA max
Three-State Output Capacitance 8 pF typ
POWER REQUIREMENTS
AVDD 4.5/5.5 V min/max
DVDD 2.7/5.5 V min/max
Power Supply Sensitivity3
∆Midscale/∆ΑVDD –85 dB typ
AIDD 0.375 mA/channel max Outputs unloaded, boost off; 0.25 mA/channel typ
0.475 mA/channel max Outputs unloaded, boost on; 0.325 mA/channel typ
DIDD 1 mA max VIH = DVDD, VIL = DGND
AIDD (Power-Down) 2 µA max Typically 200 nA
DIDD (Power-Down) 20 µA max Typically 3 µA
Power Dissipation 65 mW max Outputs unloaded, boost off, AVDD = DVDD = 5 V
1
AD5383-5 is calibrated using an external 2.5 V reference. Temperature range for all versions: –40°C to +85°C.
2
Accuracy guaranteed from V
3
Guaranteed by characterization, not production tested.
4
Default on the AD5383-5 is 2.5 V. Programmable to 1.25 V via CR10 in the AD5383 control register; operating the AD5383-5 with a 1.25 V reference leads to degraded
accuracy specifications.
= 10 mV to AVDD – 50 mV.
OUT
= 3 mA
SINK
= 6 mA
SINK
Rev. A | Page 5 of 40
AD5383
AD5383-3 SPECIFICATIONS
AVDD = 2.7 V to 3.6 V; DVDD = 2.7 V to 5.5 V, AGND = DGND = 0 V; external REFIN = 1.25 V; all specifications T
otherwise noted.
Table 4.
Parameter AD5383-31 Unit Test Conditions/Comments
ACCURACY
Resolution 12 Bits
Relative Accuracy2 (INL) ±1 LSB max
Differential Nonlinearity (DNL) ±1 LSB max Guaranteed monotonic over temperature
Zero-Scale Error 4 mV max
Offset Error ±4 mV max Measured at Code 64 in the linear region
Offset Error TC ±5 µV/°C typ
Gain Error ±0.024 % FSR max At 25°C
±0.1 % FSR max T
MIN
to T
MAX
Gain Temperature Coefficient3 2 ppm FSR/°C typ
DC Crosstalk3 0.5 LSB max
REFERENCE INPUT/OUTPUT
Reference Input3
Reference Input Voltage 1.25 V ±1% for specified performance
DC Input Impedance 1 MΩ min Typically 100 MΩ
Input Current ±10 µA max Typically ±30 nA
Reference Range 1 to AVDD/2 V min/max
Reference Output4
Enabled via CR8 in the AD5383 control register,
CR10 selects the reference voltage
Output Voltage 1.245/1.255 V min/max At ambient; optimized for 1.25 V operation; CR10 = 0
2.47/2.53 V min/max 2.5 V reference enabled; CR10 = 1
Reference TC ±10 ppm/°C typ Temperature range: +25°C to +85°C
±15 ppm/°C typ
Temperature range: −40°C to +85°C
OUTPUT CHARACTERISTICS3
Output Voltage Range2 0/AVDD V min/max
Short-Circuit Current 40 mA max
Load Current ±1 mA max
Capacitive Load Stability
RL = ∞ 200 pF max
RL = 5 kΩ 1000 pF max
DC Output Impedance 0.5 Ω max
MONITOR PIN
Output Impedance 500 Ω typ
Three-State Leakage Current 100 nA typ
LOGIC INPUTS (EXCEPT SDA/SCL)3 DVDD = 2.7 V to 3.6 V
VIH, Input High Voltage 2 V min
V
Input Low Voltage 0.8 V max
IL,
Input Current ±10 µA max Total for all pins; TA = T
MIN
to T
MAX
Pin Capacitance 10 pF max
LOGIC INPUTS (SDA, SCL ONLY)
VIH, Input High Voltage 0.7 DVDD V min SMBus-compatible at DVDD < 3.6 V
VIL, Input Low Voltage 0.3 DVDD V max SMBus-compatible at DVDD < 3.6 V
IIN, Input Leakage Current ±1 µA max
V
, Input Hysteresis 0.05 DVDD V min
HYST
CIN, Input Capacitance 8 pF typ
Glitch Rejection 50 ns max Input filtering suppresses noise spikes of less than 50 ns
MIN
to T
MAX
, unless
Rev. A | Page 6 of 40
AD5383
Parameter AD5383-31 Unit Test Conditions/Comments
LOGIC OUTPUTS (BUSY, SDO)3
VOL, Output Low Voltage 0.4 V max Sinking 200 µA
VOH, Output High Voltage DVDD – 0.5 V min Sourcing 200 µA
High Impedance Leakage Current ±1 µA max SDO only
High Impedance Output Capacitance 5 pF typ SDO only
LOGIC OUTPUT (SDA)3
VOL, Output Low Voltage 0.4 V max I
0.6 V max I
Three-State Leakage Current ±1 µA max
Three-State Output Capacitance 8 pF typ
POWER REQUIREMENTS
AVDD 2.7/3.6 V min/max
DVDD 2.7/5.5 V min/max
Power Supply Sensitivity3
∆Midscale/∆ΑVDD –85 dB typ
AIDD 0.375 mA/channel max Outputs unloaded, boost off; 0.25 mA/channel typ
0.475 mA/channel max Outputs unloaded, boost on; 0.325 mA/channel typ
DIDD 1 mA max VIH = DVDD, VIL = DGND.
AIDD (Power-Down) 2 µA max Typically 200 nA
DIDD (Power-Down) 20 µA max Typically 1 µA
Power Dissipation 39 mW max Outputs unloaded, boost off; AVDD = DVDD = 3 V
1
AD5383-3 is calibrated using an external 1.25 V reference. Temperature range is –40°C to +85°C.
2
Accuracy guaranteed from V
3
Guaranteed by characterization, not production tested.
4
Default on the AD5383-3 is 1.25 V. Programmable to 2.5 V via CR10 in the AD5383 control register; operating the AD5383-3 with a 2.5 V reference leads to degraded
accuracy specifications and limited input code range.
= 10 mV to AVDD – 50 mV.
OUT
= 3 mA
SINK
= 6 mA
SINK
AC CHARACTERISTICS1
AVDD = 4.5 V to 5.5 V or 2.7 V to 3.6 V; DVDD = 2.7 V to 5.5 V; AGND = DGND = 0 V.
Table 5.
Parameter All Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
Output Voltage Settling Time2 ¼ scale to ¾ scale change settling to ±1 LSB
6 µs typ
8 µs max
Slew Rate2 2 V/µs typ Boost mode off, CR9 = 0
3 V/µs typ Boost mode on, CR9 = 1
Digital-to-Analog Glitch Energy 12 nV-s typ
Glitch Impulse Peak Amplitude 15 mV typ
DAC-to-DAC Crosstalk 1 nV-s typ See Terminology section
Digital Crosstalk 0.8 nV-s typ
Digital Feedthrough 0.1 nV-s typ Effect of input bus activity on DAC output under test
Output Noise 0.1 Hz to 10 Hz 15 µV p-p typ External reference, midscale loaded to DAC
40 µV p-p typ Internal reference, midscale loaded to DAC
Output Noise Spectral Density
@ 1 kHz 150 nV/√Hz typ
@ 10 kHz 100 nV/√Hz typ
1
Guaranteed by design and characterization, not production tested.
2
The slew rate can be programmed via the current boost control bit (CR9) in the AD5383 control register.
Rev. A | Page 7 of 40
AD5383
T
TIMING CHARACTERISTICS
SERIAL INTERFACE TIMING
DVDD = 2.7 V to 5.5 V; AVDD = 4.5 V to 5.5 V or 2.7 V to 3.6 V; AGND = DGND = 0 V; all specifications T
noted.
MIN
to T
, unless otherwise
MAX
Table 6.
Parameter
1, 2, 3
Limit at T
MIN
, T
Unit Description
MAX
t1 33 ns min SCLK cycle time
t2 13 ns min SCLK high time
t3 13 ns min SCLK low time
t4 13 ns min
4
t
13 ns min
5
4
t
33 ns min
6
t7 10 ns min
t7A 50 ns min
SYNC
falling edge to SCLK falling edge setup time
SYNC
24th SCLK falling edge to
Minimum
Minimum
Minimum
SYNC low time
SYNC high time
SYNC high time in readback mode
falling edge
t8 5 ns min Data setup time
t9 4.5 ns min Data hold time
4
t
30 ns max
10
t11 670 ns max
4
t
20 ns min
12
t13 20 ns min
t14 100 ns max
t15 0 ns min
t16 100 ns min
t17 8 µs typ DAC output settling time, boost mode off
t18 20 ns min
t
35 µs max
19
5
t
20 ns max SCLK rising edge to SDO valid
20
5
t
5 ns min
21
5
t
8 ns min
22
t23 20 ns min
1
Guaranteed by design and characterization, not production tested.
2
All input signals are specified with t
3
See , F, and . Figure 2 igure 3 Figure 4,Figure 5
4
Standalone mode only.
5
Daisy-chain mode only.
= t
= 5 ns (10% to 90% of VCC) and are timed from a voltage level of 1.2 V.
r
f
CLR
pulse width low
CLR
pulse activation time
SCLK falling edge to
SYNC
rising edge to SCLK rising edge
SYNC
rising edge to
SYNC
LDAC
rising edge
falling edge
O OUTPUT PIN
C
L
50pF
200µA
200µA
I
OL
V
(MIN) OR
OH
V
(MAX)
OL
I
OH
03734-002
Figure 2. Load Circuit for SDO Timing Diagram
(Serial Interface, Daisy- Chain Mode)
Rev. A | Page 8 of 40
AD5383
t
1
SCLK
SYNC
BUSY
LDAC
V
OUT
LDAC
V
OUT
CLR
V
DIN
1
1
2
2
OUT
t
1
LDAC ACTIVE DURING BUSY
2
LDAC ACTIVE AFTER BUSY
Figure 3. Serial Interface Timing Diagram (Standalone Mode)
t
3
t
4
t
6
t8t
7
DB23
9
t
18
t
2
t
5
DB0
t
10
t
11
t
t
19
t
12
13
t
15
2424
t
17
t
14
t
13
t
17
t
16
03734-003
SYNC
DIN
SDO
SCLK
SYNC
DIN
SDO
2448SCLK
t
7A
DB23DB0DB23DB0
INPUT WORD SPECIFIES
REGISTER TO BE READ
UNDEFINED
DB23DB0
NOP CONDITION
SELECTED REGISTER
DATA CLOCKED OUT
Figure 4. Serial Interface Timing Diagram (Data Readback Mode)
t
1
t
t
7
t
4
t8t
DB23DB0DB0DB23
INPUT WORD FOR DAC NINPUT WORD FOR DAC N+1
t
9
2
3
t
20
DB23DB0
t
21
03734-004
4824
t
22
UNDEFINEDINPUT WORD FOR DAC N
LDAC
Figure 5. Serial Interface Timing Diagram (Daisy-Chain Mode)
t
13
t
23
03734-005
Rev. A | Page 9 of 40
AD5383
I2C SERIAL INTERFACE TIMING
DVDD = 2.7 V to 5.5 V; AVDD = 4.5 V to 5.5 V or 2.7 V to 3.6 V; AGND = DGND = 0 V; all specifications T
noted.
MIN
to T
, unless otherwise
MAX
Table 7.
Parameter
F
SCL
1, 2
Limit at T
, T
Unit Description
MIN
MAX
400 kHz max SCL clock frequency
t1 2.5 µs min SCL cycle time
t2 0.6 µs min t
t3 1.3 µs min t
t4 0.6 µs min t
t5 100 ns min t
3
t
0.9 µs max t
6
0 µs min t
t7 0.6 µs min t
t8 0.6 µs min t
t9 1.3 µs min t
, SCL high time
HIGH
, SCL low time
LOW
, start/repeated start condition hold time
HD,STA
, data setup time
SU,DAT
, data hold time
HD,DAT
, data hold time
HD,DAT
, setup time for repeated start
SU,STA
, stop condition setup time
SU,STO
, bus free time between a STOP and a START condition
BUF
t10 300 ns max tR, rise time of SCL and SDA when receiving
0 ns min tR, rise time of SCL and SDA when receiving (CMOS-compatible)
t11 300 ns max tF, fall time of SDA when transmitting
0 ns min tF, fall time of SDA when receiving (CMOS-compatible)
300 ns max tF, fall time of SCL and SDA when receiving
20 + 0.1 C
4
ns min tF, fall time of SCL and SDA when transmitting
b
Cb 400 pF max Capacitive load for each bus line
1
Guaranteed by design and characterization, not production tested.
2
See . Figure 6
3
A master device must provide a hold time of at least 300 ns for the SDA signal (referred to the V
falling edge.
4
Cb is the total capacitance, in pF, of one bus line. tR and tF are measured between 0.3 DVDD and 0.7 DVDD.
min of the SCL signal) in order to bridge the undefined region of SCL’s
IH
SDA
SCL
t
9
t
4
START
CONDITION
t
3
t
10
t
6
Figure 6. I
t
2
C-Compatible Serial Interface Timing Diagram
t
11
2
t
5
REPEATED
CONDITION
t
7
START
t
4
t
1
t
8
STOP
CONDITION
03734-006
Rev. A | Page 10 of 40
AD5383
PARALLEL INTERFACE TIMING
DVDD = 2.7 V to 5.5 V; AVDD = 4.5 V to 5.5 V or 2.7 V to 3.6 V; AGND = DGND = 0 V; all specifications T
noted.
MIN
to T
, unless otherwise
MAX
Table 8.
Parameter
t0 4.5 ns min
t1 4.5 ns min
t2 20 ns min
t3 20 ns min
t4 0 ns min
t5 0 ns min
t6 4.5 ns min
t7 4.5 ns min
t8 20 ns min
4
t
700 ns min
9
4
t
30 ns max
10
4, 5
t
11
t12 30 ns min
t13 20 ns min
t14 100 ns max
t15 20 ns min
t16 0 ns min
t17 100 ns min
1, 2, 3
Limit at T
MIN
, T
Unit Description
MAX
670 ns max
REG0, REG1, address to
REG0, REG1, address to
CS
pulse width low
WR
pulse width low
CS
to WR falling edge setup time
WR
to CS rising edge hold time
Data to WR rising edge setup time
WR
Data to
WR
Minimum
WR
BUSY
WR
LDAC
BUSY
LDAC
BUSY
LDAC
rising edge hold time
pulse width high
WR
cycle time (single-channel write)
rising edge to
BUSY
pulse width low (single-channel update)
rising edge to
LDAC
pulse width low
rising edge to DAC output response time
rising edge to WR rising edge
rising edge to
LDAC
falling edge to DAC output response time
t18 8 µs max DAC output settling time
t19 20 ns min
t20 35 µs max
1
Guaranteed by design and characterization, not production tested.
2
All input signals are specified with tR = tR = 5 ns (10% to 90% of DVDD) and timed from a voltage level of 1.2 V.
3
See . Figure 7
4
See . Figure 29
5
Measured with the load circuit of. Figure 2
CLR
pulse width low
CLR
pulse activation time
WR
rising edge setup time
WR
rising edge hold time
falling edge
falling edge
falling edge
Rev. A | Page 11 of 40
AD5383
t
t
0
1
REG0, REG1, A4..A0
CS
WR
DB11..DB0
BUSY
LDAC
V
OUT
LDAC
V
OUT
CLR
V
OUT
1
1
2
2
t
4
t
5
t
2
t
9
t
3
t
6
t
t
t
8
t
t
7
10
t
11
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LDAC ACTIVE DURING BUSY
2
LDAC ACTIVE AFTER BUSY
03734-007
Figure 7. Parallel Interface Timing Diagram
Rev. A | Page 12 of 40
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