Analog Devices AD1674AR, AD1674AD, AD1674TD, AD1674KR, AD1674KN Datasheet

...
REF OUT
SHA
COMP
20k
10k
5k
2.5k
2.5k
5k
12
12
AGND
BIP OFF
REF IN
20V
IN
10V
IN
IDAC
12
CONTROL
CE
12/8
CS
R/C
A
0
5k
10k
SAR
CLOCK
A
10V REF
REGISTERS / 3-STATE OUTPUT BUFFERS
DAC
STS
DB11 (MSB) DB0 (LSB)
12-Bit 100 kSPS
a
FEATURES Complete Monolithic 12-Bit 10 ms Sampling ADC On-Board Sample-and-Hold Amplifier Industry Standard Pinout 8- and 16-Bit Microprocessor Interface AC and DC Specified and Tested Unipolar and Bipolar Inputs 65 V, 610 V, 0 V–10 V, 0 V–20 V Input Ranges Commercial, Industrial and Military Temperature
Range Grades
MIL-STD-883 and SMD Compliant Versions Available

PRODUCT DESCRIPTION

The AD1674 is a complete, multipurpose, 12-bit analog-to­digital converter, consisting of a user-transparent onboard sample-and-hold amplifier (SHA), 10 volt reference, clock and three-state output buffers for microprocessor interface.
The AD1674 is pin compatible with the industry standard AD574A and AD674A, but includes a sampling function while delivering a faster conversion rate. The on-chip SHA has a wide input bandwidth supporting 12-bit accuracy over the full Nyquist bandwidth of the converter.
The AD1674 is fully specified for ac parameters (such as S/(N+D) ratio, THD, and IMD) and dc parameters (offset, full-scale error, etc.). With both ac and dc specifications, the AD1674 is ideal for use in signal processing and traditional dc measure­ment applications.
The AD1674 design is implemented using Analog Devices’ BiMOS II process allowing high performance bipolar analog cir­cuitry to be combined on the same die with digital CMOS logic.
Five different temperature grades are available. The AD1674J and K grades are specified for operation over the 0°C to +70°C temperature range. The A and B grades are specified from –40°C to +85°C; the AD1674T grade is specified from –55°C to +125°C. The J and K grades are available in both 28-lead plastic DIP and SOIC. The A and B grade devices are available in 28-lead hermetically sealed ceramic DIP and 28-lead SOIC. The T grade is available in 28-lead hermetically sealed ceramic DIP.
*Protected by U. S. Patent Nos. 4,962,325; 4,250,445; 4,808,908; RE30586.
A/D Converter
AD1674*

FUNCTIONAL BLOCK DIAGRAM

PRODUCT HIGHLIGHTS

1. Industry Standard Pinout: The AD1674 utilizes the pinout established by the industry standard AD574A and AD674A.
2. Integrated SHA: The AD1674 has an integrated SHA which supports the full Nyquist bandwidth of the converter. The SHA function is transparent to the user; no wait-states are needed for SHA acquisition.
3. DC and AC Specified: In addition to traditional dc specifica­tions, the AD1674 is also fully specified for frequency do­main ac parameters such as total harmonic distortion, signal-to-noise ratio and input bandwidth. These parameters can be tested and guaranteed as a result of the onboard SHA.
4. Analog Operation: The precision, laser-trimmed scaling and bipolar offset resistors provide four calibrated ranges: 0 V to +10 V and 0 V to +20 V unipolar, –5 V to +5 V and –10 V to +10 V bipolar. The AD1674 operates on +5 V and ±12 V or ±15 V power supplies.
5. Flexible Digital Interface: On-chip multiple-mode three-state output buffers and interface logic allow direct connection to most microprocessors.
REV. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 617/329-4700 Fax: 617/326-8703
AD1674–SPECIFICA TIONS
(T
to T
, VCC = +15 V 6 10% or +12 V 6 5%, V
MAX

DC SPECIFICATIONS

MIN
–12 V 6 5% unless otherwise noted)
AD1674J AD1674K
Parameter Min Typ Max Min Typ Max Unit
RESOLUTION 12 12 Bits INTEGRAL NONLINEARITY (INL) ±1 ±1/2 LSB
DIFFERENTIAL NONLINEARITY (DNL)
(No Missing Codes) 12 12 Bits UNIPOLAR OFFSET1 @ +25°C ±3 ±2 LSB BIPOLAR OFFSET1 @ +25°C ±6 ±4 LSB FULL-SCALE ERROR
1, 2
@ +25°C
(with Fixed 50 Resistor from REF OUT to REF IN) 0.1 0.25 0.1 0.25 % of FSR TEMPERATURE RANGE 0 +70 0 +70 °C TEMPERATURE DRIFT
Unipolar Offset
Bipolar Offset
Full-Scale Error
2
2
2
3
POWER SUPPLY REJECTION
VCC = 15 V ± 1.5 V or 12 V ± 0.6 V ±2 ±1 LSB
V
= 5 V ± 0.5 V ±1/2 ±1/2 LSB
LOGIC
VEE = –15 V ± 1.5 V or –12 V ± 0.6 V ±2 ±1 LSB
= +5 V 6 10%, VEE = –15 V 6 10% or
LOGIC
±2 ±1 LSB ±2 ±1 LSB ±6 ±3 LSB
ANALOG INPUT
Input Ranges
Bipolar –5 +5 –5 +5 Volts
–10 +10 –10 +10 Volts
Unipolar 0 +10 0 +10 Volts
0 +20 0 +20 Volts
Input Impedance
10 Volt Span 357357 k 20 Volt Span 6 10 14 6 10 14 k
POWER SUPPLIES
Operating Voltages
V
LOGIC
V
CC
V
EE
+4.5 +5.5 +4.5 +5.5 Volts +11.4 +16.5 +11.4 +16.5 Volts –16.5 –11.4 –16.5 –11.4 Volts
Operating Current
I
LOGIC
I
CC
I
EE
58 58 mA 10 14 10 14 mA
14 18 14 18 mA POWER DISSIPATION 385 575 385 575 mW INTERNAL REFERENCE VOLTAGE 9.9 10.0 10.1 9.9 10.0 10.1 Volts
Output Current (Available for External Loads)
4
2.0 2.0 mA
(External Load Should Not Change During Conversion
NOTES
1
Adjustable to zero.
2
Includes internal voltage reference error.
3
Maximum change from 25°C value to the value at T
4
Reference should be buffered for ±12 V operation.
All min and max specifications are guaranteed. Specifications subject to change without notice.
MIN
or T
MAX
.
–2–
REV. C
AD1674
AD1674A AD1674B AD1674T
Parameter Min Typ Max Min Typ Max Min Typ Max Unit
RESOLUTION 12 12 12 Bits INTEGRAL NONLINEARITY (INL) ±1 ±1/2 ±1/2 LSB
±1 ±1/2 ±1 LSB
DIFFERENTIAL NONLINEARITY (DNL)
(No Missing Codes) 12 12 12 Bits UNIPOLAR OFFSET1 @ +25°C ±2 ±2 ±2 LSB BIPOLAR OFFSET1 @ +25°C ±6 ±3 ±3 LSB FULL-SCALE ERROR
(with Fixed 50 Resistor from REF OUT to REF IN) 0.1 0.25 0.1 0.125 0.1 0.125 % of FSR TEMPERATURE RANGE –40 +85 –40 +85 –55 +125 °C TEMPERATURE DRIFT
Unipolar Offset
Bipolar Offset
Full-Scale Error POWER SUPPLY REJECTION
VCC = 15 V ± 1.5 V or 12 V ± 0.6 V ±2 ±1 ±1 LSB
= 5 V ± 0.5 V ±1/2 ±1/2 ±1/2 LSB
V
LOGIC
VEE = –15 V ± 1.5 V or –12 V ± 0.6 V ±2 ±1 ±1 LSB
1, 2
@ +25°C
3
2
2
2
±2 ±1 ±1 LSB ±2 ±1 ±2 LSB ±8 ±5 ±7 LSB
ANALOG INPUT
Input Ranges
Bipolar –5 +5 –5 +5 –5 +5 Volts
–10 +10 –10 +10 –10 +10 Volts
Unipolar 0 +10 0 +10 0 +10 Volts
0 +20 0 +20 0 +20 Volts
Input Impedance
10 Volt Span 357357357 k 20 Volt Span 6 10 14 6 10 14 6 10 14 k
POWER SUPPLIES
Operating Voltages
V
LOGIC
V
CC
V
EE
+4.5 +5.5 +4.5 +5.5 +4.5 +5.5 Volts +11.4 +16.5 +11.4 +16.5 +11.4 +16.5 Volts –16.5 –11.4 –16.5 –11.4 –16.5 –11.4 Volts
Operating Current
I
LOGIC
I
CC
I
EE
58 58 58 mA 10 14 10 14 10 14 mA
14 18 14 18 14 18 mA POWER DISSIPATION 385 575 385 575 385 575 mW INTERNAL REFERENCE VOLTAGE 9.9 10.0 10.1 9.9 10.0 10.1 9.9 10.0 10.1 Volts
Output Current (Available for External Loads)
4
2.0 2.0 2.0 mA
(External Load Should Not Change During Conversion
REV. C
–3–
AD1674–SPECIFICATIONS
(T
to T
, with VCC = +15 V 6 10% or +12 V 6 5%, V
MAX
= 100 kSPS, fIN = 10 kHz, stand-alone mode unless otherwise noted)
SAMPLE

AC SPECIFICATIONS

MIN
–12 V 6 5%, f
AD1674J/A AD1674K/B/T
Parameter Min Typ Max Min Typ Max Units
Signal to Noise and Distortion (S/N+D) Ratio Total Harmonic Distortion (THD)
4
2, 3
69 70 70 71 dB
–90 –82 –90 –82 dB
Peak Spurious or Peak Harmonic Component –92 –82 –92 –82 dB Full Power Bandwidth 1 1 MHz
Full Linear Bandwidth 500 500 kHz Intermodulation Distortion (IMD)
5
Second Order Products –90 –80 –90 –80 dB Third Order Products –90 –80 –90 –80 dB
SHA (Specifications are Included in Overall Timing Specifications)
Aperture Delay 50 50 ns Aperture Jitter 250 250 ps Acquisition Time 1 1 µs
= +5 V 6 10%, VEE = –15 V 610% or
LOGIC
1
0.008 0.008 %

DIGITAL SPECIFICATIONS

(for all grades T VEE = –15 V 6 10% or –12 V 6 5%)
MIN
to T
, with VCC = +15 V 6 10% or +12 V 6 5%, V
MAX
= +5 V 6 10%,
LOGIC
Parameter Test Conditions Min Max Units
LOGIC INPUTS
V
IH
V
IL
I
IH
I
IL
C
IN
High Level Input Voltage +2.0 V
+0.5 V V
LOGIC
Low Level Input Voltage –0.5 +0.8 V High Level Input Current (VIN = 5 V) VIN = V
LOGIC
–10 +10 µA Low Level Input Current (VIN = 0 V) VIN = 0 V –10 +10 µA Input Capacitance 10 pF
LOGIC OUTPUTS
V
OH
V
OL
I
OZ
C
OZ
NOTES
1
fIN amplitude = –0.5 dB (9.44 V p-p) 10 V bipolar mode unless otherwise noted. All measurements referred to –0 dB (9.997 V p-p) input signal unless otherwise noted.
2
Specified at worst case temperatures and supplies after one minute warm-up.
3
See Figures 12 and 13 for other input frequencies and amplitudes.
4
See Figure 11.
5
fa = 9.08 kHz, fb = 9.58 kHz with f
All min and max specifications are guaranteed. Specifications subject to change without notice.
High Level Output Voltage IOH = 0.5 mA +2.4 V Low Level Output Voltage IOL = 1.6 mA +0.4 V High-Z Leakage Current VIN = 0 to V
LOGIC
–10 +10 µA High-Z Output Capacitance 10 pF
= 100 kHz. See Definition of Specifications section and Figure 15.
SAMPLE
–4–
REV. C
AD1674
HIGH
IMPEDANCE
CE
STS
DB11 – DB0
A
0
CS
__
R/C
_
t
HSR
t
SSRtHRR
t
SAR
t
HAR
t
DD
t
HL
HIGH IMP.
DATA
VALID
t
HD
t
HS
t
SSR
V
CP
D
OUT
C
OUT
I
OH
I
OL

SWITCHING SPECIFICATIONS

(for all grades T V
= +5 V 610%, VEE = –15 V 6 10% or –12 V 6 5%; VIL = 0.4 V,
LOGIC
VIH = 2.4 V unless otherwise noted)
MIN
to T
CONVERTER START TIMING (Figure 1)
Parameter Symbol Min Typ Max Min Typ Max Units
Conversion Time
8-Bit Cycle t
12-Bit Cycle t STS Delay from CE t CE Pulse Width t
CS to CE Setup t CS Low During CE High t
R/C to CE Setup t R/C Low During CE High t A0 to CE Setup t A
Valid During CE High t
0
J, K, A, B, Grades T Grade
C C DSC HEC SSC HSC SRC HRC SAC HAC
78 78µs 910 910µs
200 225 ns 50 50 ns 50 50 ns 50 50 ns 50 50 ns 50 50 ns 00ns 50 50 ns
READ TIMING—FULL CONTROL MODE (Figure 2)
J, K, A, B, Grades T Grade
Parameter Symbol Min Typ Max Min Typ Max Units
Access Time t Data Valid After CE Low t
Output Float Delay t CS to CE Setup t R/C to CE Setup t A
to CE Setup t
0
CS Valid After CE Low t R/C High After CE Low t
A
Valid After CE Low t
0
NOTES
1
tDD is measured with the load circuit of Figure 3 and is defined as the time required for an output to cross 0.4 V or 2.4 V.
2
0°C to T
3
At –40°C.
4
At –55°C.
5
tHL is defined as the time required for the data lines to change 0.5 V when
MAX
.
DD HD
HL SSR SRR SAR HSR HRR HAR
1
5
75 150 75 150 ns 25 20
2 3
25 15
2 4
ns ns
150 150 ns 50 50 ns 00ns 50 50 ns 00ns 00ns
50 50 ns
loaded with the circuit of Figure 3.
All min and max specifications are guaranteed. Specifications subject to change without notice.
Test V
CP
C
OUT
Access Time High Z to Logic Low 5 V 100 pF Float Time Logic High to High Z 0 V 10 pF Access Time High Z to Logic High 0 V 100 pF Float Time Logic Low to High Z 5 V 10 pF
with VCC = +15 V 6 10% or +12 V 6 5%,
MAX
CE
R/C
STS
DB11 – DB0
__
CS
_
t
A
SAC
0
t
SSC
t
SRCtHRC
t
HSC
t
Figure 1. Converter Start Timing
Figure 2. Read Timing
DSC
t
HEC
t
HAC
t
C
HIGH IMPEDANCE
REV. C
Figure 3. Load Circuit for Bus Timing Specifications
–5–
AD1674
DATA
VALID
HIGH-Z
HIGH-Z
STS
DB11 – DB0
R/C
_
t
HRH
t
DS
t
C
t
DDRtHDR
t
HL
TIMING—STAND-ALONE MODE (Figures 4a and 4b)
J, K, A, B Grades T Grade
Parameter Symbol Min Typ Max Min Typ Max Units
Data Access Time t Low R/
C Pulse Width t STS Delay from R/ Data Valid After R/
C t C Low t
STS Delay After Data Valid t High R/C Pulse Width t
NOTE All min and max specifications are guaranteed. Specifications subject to change without notice.
t
HRL
_
R/C
t
DS
STS
t
HDR
DB11 – DB0
DATA
VALID
Figure 4a. Stand-Alone Mode Timing Low Pulse for R/
DDR HRL DS HDR HS HRH
t
C
HIGH-Z
50 50 ns 25 25 ns
0.6 0.8 1.2 0.6 0.8 1.2 µs 150 150 ns
t
HS
DATA VALID
C
ABSOLUTE MAXIMUM RATINGS*
VCC to Digital Common . . . . . . . . . . . . . . . . . . . 0 to + 16.5 V
V
to Digital Common . . . . . . . . . . . . . . . . . . . . . 0 to –16.5 V
EE
V
to Digital Common . . . . . . . . . . . . . . . . . . 0 V to +7 V
LOGIC
Analog Common to Digital Common . . . . . . . . . . . . . . . ±1 V
Digital Inputs to Digital Common . . . –0.5 V to V
Analog Inputs to Analog Common . . . . . . . . . . . . V
LOGIC
EE
+0.5 V
to V
CC
20 VIN to Analog Common . . . . . . . . . . . . . . . . . VEE to +24 V
REF OUT . . . . . . . . . . . . . . . . . Indefinite Short to Common
150 150 ns 200 225 ns
Figure 4b. Stand-Alone Mode Timing High Pulse for R/
. . . . . . . . . . . . . . . . . . . . . . . . . . . Momentary Short to V
C
CC
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . +175°C
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . .825 mW
Lead Temperature, Soldering (10 sec) . . . . . . . +300°C, 10 sec
Storage Temperature . . . . . . . . . . . . . . . . . . .–65°C to +150°C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.

CAUTION

ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although
WARNING!
the AD1674 features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality.
ESD SENSITIVE DEVICE

ORDERING GUIDE

INL S/(N+D) Package Package
MIN
to T
)(T
MAX
MIN
to T
) Description Option
MAX
Model
1
Temperature Range (T
AD1674JN 0°C to +70°C ±1 LSB 69 dB Plastic DIP N-28 AD1674KN 0°C to +70°C ± 1/2 LSB 70 dB Plastic DIP N-28 AD1674JR 0°C to +70°C ±1 LSB 69 dB Plastic SOIC R-28 AD1674KR 0°C to +70°C ±1/2 LSB 70 dB Plastic SOIC R-28 AD1674AR –40°C to +85°C ±1 LSB 69 dB Plastic SOIC R-28 AD1674BR –40°C to +85°C ±1/2 LSB 70 dB Plastic SOIC R-28 AD1674AD –40°C to +85°C ±1 LSB 69 dB Ceramic DIP D-28 AD1674BD –40°C to +85°C ±1/2 LSB 70 dB Ceramic DIP D-28 AD1674TD –55°C to +125°C ±1 LSB 70 dB Ceramic DIP D-28
NOTES
1
For details on grade and package offerings screened in accordance with MIL-STD-883, refer to the Analog Devices Military Products Databook or current
AD1674/883B data sheet. SMD is also available.
2
N = Plastic DIP; D = Hermetic Ceramic DIP; R = Plastic SOIC.
–6–
REV. C
2
AD1674
A
A
A
A
A
TOP VIEW
(Not to Scale)
AD1674
18
28 27
24 23 22
26
25
21 20 19
17 16 15
13
1 2
5 6 7
3
4
8 9
10
12
14
V
LOGIC
CE
V
CC
A
0
REF OUT
AGND
REF IN
V
EE
BIP OFF
10V
IN
20V
IN
CS
12/8
R/C
STS
DB11(MSB)
DB8 DB7
DB6
DB10 DB9
DB5 DB4 DB3
DB2 DB1
DB0(LSB) DGND
11

PIN DESCRIPTION

Symbol Pin No. Type Name and Function
AGND 9 P Analog Ground (Common). A
0
BIP OFF 12 AI Bipolar Offset. Connect through a 50 resistor to REF OUT for bipolar operation or to Analog
CE 6 DI Chip Enable. Chip Enable is Active HIGH and is used to initiate a convert or read operation. CS 3 DI Chip Select. Chip Select is Active LOW. DB11–DB8 27–24 DO Data Bits 11 through 8. In the 12-bit format (see 12/
DB7–DB4 23–20 DO Data Bits 7 through 4. In the 12-bit format these pins provide the middle 4 bits of data. In the
DB3–DB0 19–16 DO Data Bits 3 through 0. In the 12-bit format these pins provide the lower 4 bits of data. In the
DGND 15 P Digital Ground (Common). REF OUT 8 AO +10 V Reference Output. R/
C 5 DI Read/Convert. In the full control mode R/C is Active HIGH for a read operation and Active LOW
REF IN 10 AI Reference Input is connected through a 50 resistor to +10 V Reference for normal operation. STS 28 DO Status is Active HIGH when a conversion is in progress and goes LOW when the conversion is
V
CC
V
EE
V
LOGIC
10 V
IN
20 V
IN
12/
8 2 DI The 12/8 pin determines whether the digital output data is to be organized as two 8-bit words
TYPE: AI = Analog Input
4 DI Byte Address/Short Cycle. If a conversion is started with A0 Active LOW, a full 12-bit conversion
cycle is initiated. If A results. During Read (R/ (DB4–DB11), and A
is Active HIGH during a convert start, a shorter 8-bit conversion cycle
0
C = 1) with 12/8 LOW, A0 = LOW enables the 8 most significant bits
= HIGH enables DB3–DB0 and sets DB7–DB4 = 0.
0
Common for unipolar operation.
8 and A0 pins), these pins provide the up- per 4 bits of data. In the 8-bit format, they provide the upper 4 bits when A disabled when A
is HIGH.
0
8-bit format they provide the middle 4 bits when Ao is LOW and all zeroes when A
8-bit format these pins provide the lower 4 bits of data when A when A
is LOW.
0
is HIGH, they are disabled
0
for a convert operation. In the stand-alone mode, the falling edge of R/
is LOW and are
0
is HIGH.
0
C initiates a conversion.
completed.
7 P +12 V/+15 V Analog Supply. 11 P –12 V/–15 V Analog Supply. 1 P +5 V Logic Supply. 13 AI 10 V Span Input, 0 V to +10 V unipolar mode or –5 V to +5 V bipolar mode. When using the
AD1674 in the 20 V Span 10 V
should not be connected.
IN
14 AI 20 V Span Input, 0 V to +20 V unipolar mode or –10 V to +10 V bipolar mode. When using
the AD1674 in the 10 V Span 20 V
should not be connected.
IN
(12/8 LOW) or a single 12-bit word (12/8 HIGH).
AO = Analog Output DI = Digital Input DO = Digital Output
P = Power
FUNCTIONAL BLOCK DIAGRAM
12/8
CS A
CE
R/C
0
CONTROL
PIN CONFIGURATION
STS
REV. C
REF OUT
AGND
REF IN
BIP OFF
20V
10V
10V
REF
20k
IN
5k
IN
2.5k
2.5k
CLOCK
5k
10k
10k
5k
SHA
COMP
IDAC
SAR
12
DAC
AD1674
12
DB11 (MSB) DB0 (LSB)
12
REGISTERS / 3-STATE OUTPUT BUFFERS
–7–
AD1674

DEFINITION OF SPECIFICATIONS

INTEGRAL NONLINEARITY (INL)
The ideal transfer function for an ADC is a straight line drawn between “zero” and “full scale.” The point used as “zero” occurs 1/2 LSB before the first code transition. “Full scale” is defined as a level 1 1/2 LSB beyond the last code transition. Integral nonlinearity is the worst-case deviation of a code from the straight line. The deviation of each code is measured from the middle of that code.
DIFFERENTIAL NONLINEARITY (DNL)
A specification which guarantees no missing codes requires that every code combination appear in a monotonic increasing sequence as the analog input level is increased. Thus every code must have a finite width. The AD1674 guarantees no missing codes to 12-bit resolution; all 4096 codes are present over the entire operating range.
UNIPOLAR OFFSET
The first transition should occur at a level 1/2 LSB above ana­log common. Unipolar offset is defined as the deviation of the actual transition from that point at 25°C. This offset can be adjusted as shown in Figure 11.
BIPOLAR OFFSET
In the bipolar mode the major carry transition (0111 1111 1111 to 1000 0000 0000) should occur for an analog value 1/2 LSB below analog common. The bipolar offset error specifies the deviation of the actual transition from that point at 25°C. This offset can be adjusted as shown in Figure 12.
FULL-SCALE ERROR
The last transition (from 1111 1111 1110 to 1111 1111 1111) should occur for an analog value 1 1/2 LSB below the nominal full scale (9.9963 volts for 10 volts full scale). The full-scale error is the deviation of the actual level of the last transition from the ideal level at 25°C. The full-scale error can be adjusted to zero as shown in Figures 11 and 12.
TEMPERATURE DRIFT
The temperature drifts for full-scale error, unipolar offset and bipolar offset specify the maximum change from the initial (25°C) value to the value at T
POWER SUPPLY REJECTION
MIN
or T
MAX
.
The effect of power supply error on the performance of the device will be a small change in full scale. The specifications show the maximum full-scale change from the initial value with the supplies at various limits.
FREQUENCY-DOMAIN TESTING
The AD1674 is tested dynamically using a sine wave input and a 2048 point Fast Fourier Transform (FFT) to analyze the resulting output. Coherent sampling is used, wherein the ADC sampling frequency and the analog input frequency are related to each other by a ratio of integers. This ensures that an integral multiple of input cycles is captured, allowing direct FFT pro­cessing without windowing or digital filtering which could mask some of the dynamic characteristics of the device. In addition, the frequencies are chosen to he “relatively prime” (no common factors) to maximize the number of different ADC codes that
are present in a sample sequence. The result, called Prime Coherent Sampling, is a highly accurate and repeatable measure of the actual frequency-domain response of the converter.
NYQUIST FREQUENCY
An implication of the Nyquist sampling theorem, the “Nyquist Frequency” of a converter is that input frequency which is one­half the sampling frequency of the converter.
SIGNAL-TO-NOISE AND DISTORTION (S/N+D) RATIO
S/(N+D) is the ratio of the rms value of the measured input sig­nal to the rms sum of all other spectral components below the Nyquist frequency, including harmonics but excluding dc. The value for S/(N+D) is expressed in decibels.
TOTAL HARMONIC DISTORTION (THD)
THD is the ratio of the rms sum of the first six harmonic com­ponents to the rms value of a full-scale input signal and is ex­pressed as a percentage or in decibels. For input signals or harmonics that are above the Nyquist frequency, the aliased component is used.
INTERMODULATION DISTORTION (IMD)
With inputs consisting of sine waves at two frequencies, fa and fb, any device with nonlinearities will create distortion products, of order (m+n), at sum and difference frequencies of mfa ± nfb,
where m, n = 0, 1, 2, 3. . . . Intermodulation terms are those for
which m or n is not equal to zero. For example, the second order terms are (fa + fb) and (fa – fb) and the third order terms are (2fa + fb), (2fa – fb), (fa + 2fb) and (fa – 2fb). The IMD products are expressed as the decibel ratio of the rms sum of the measured input signals to the rms sum of the distortion terms. The two signals are of equal amplitude and the peak value of their sums is –0.5 dB from full scale. The IMD products are normalized to a 0 dB input signal.
FULL-POWER BANDWIDTH
The full-power bandwidth is that input frequency at which the amplitude of the reconstructed fundamental is reduced by 3 dB for a full-scale input.
FULL-LINEAR BANDWIDTH
The full-linear bandwidth is the input frequency at which the slew rate limit of the sample-hold-amplifier (SHA) is reached. At this point, the amplitude of the reconstructed fundamental has degraded by less than –0.1 dB. Beyond this frequency, dis­tortion of the sampled input signal increases significantly.
APERTURE DELAY
Aperture delay is a measure of the SHA’s performance and is measured from the falling edge of Read/Convert (R/
C) to when
the input signal is held for conversion.
APERTURE JITTER
Aperture jitter is the variation in aperture delay for successive samples and is manifested as noise on the input to the A/D.
–8–
REV. C
T ypical Dynamic Performance–AD1674
f
= 100kSPS
SAMPLE
FULL-SCALE = +10V
0
–20
–40
–60
–80
AMPLITUDE – dB
–100
–120
101
INPUT FREQUENCY – kHz
THD
HARMONIC
2NDHARMONIC
100
1000
RD
3
10000
Figure 5. Harmonic Distortion vs. Input Frequency
0
–20
–40
–60
–80
AMPLITUDE – dB
–100
–120
–140
5
0
FREQUENCY – kHz
Figure 8. Nonaveraged 2048 Point FFT at 100 kSPS, f
= 25.049 kHz
IN
80
70
60
50
40
S/(N+D) – dB
30
20
10
0
0dB INPUT
–20dB INPUT
–60dB INPUT
100
101 INPUT FREQUENCY – kHz
Figure 6. S/(N+D) vs. Input Frequency and Amplitude
0 –10 –20 –30 –40 –50 –60 –70 –80 –90
AMPLITUDE – dB
–100 –110 –120 –130
50
4540353025201510
5
0
Figure 9. IMD Plot for fIN = 9.08 kHz (fa), 9.58 kHz (fb)

GENERAL CIRCUIT OPERATION

The AD1674 is a complete 12-bit, 10 µs sampling analog-to- digital converter. A block diagram of the AD1674 is shown on page 7.
When the control section is commanded to initiate a conversion (as described later), it places the sample-and-hold amplifier (SHA) in the hold mode, enables the clock, and resets the suc­cessive approximation register (SAR). Once a conversion cycle has begun, it cannot be stopped or restarted and data is not available from the output buffers. The SAR, timed by the inter­nal clock, will sequence through the conversion cycle and return an end-of-convert flag to the control section when the conver­sion has been completed. The control section will then disable the clock, switch the SHA to sample mode, and delay the STS LOW going edge to allow for acquisition to 12-bit accuracy. The control section will allow data read functions by external command anytime during the SHA acquisition interval.
During the conversion cycle, the internal 12-bit, 1 mA full-scale current output DAC is sequenced by the SAR from the most significant bit (MSB) to the least significant bit (LSB) to pro­vide an output that accurately balances the current through the 5 k resistor from the input signal voltage held by the SHA. The SHA’s input scaling resistors divide the input voltage by 2 for the 10 V input span and by 4 V for the 20 V input span, maintaining a 1 mA full-scale output current through the 5 k resistor for both ranges. The comparator determines whether the addition of each successively weighted bit current causes the
10000
1000
Figure 7. S/(N+D) vs. Input Amplitude
50
20 25 40
FREQUENCY – kHz
4535301510
DAC current sum to be greater than or less than the input cur­rent. If the sum is less, the bit is left on; if more, the bit is turned off. After testing all the bits, the SAR contains a 12-bit binary code which accurately represents the input signal to within ±1/2 LSB.

CONTROL LOGIC

The AD1674 may be operated in one of two modes, the full­control mode and the stand-alone mode. The full-control mode utilizes all the AD1674 control signals and is useful in systems that address decode multiple devices on a single data bus. The stand-alone mode is useful in systems with dedicated input ports available and thus not requiring full bus interface capability. Table I is a truth table for the AD1674, and Figure 10 illus­trates the internal logic circuitry.
Table I. AD1674A Truth Table
CE CS R/C 12/8 A0Operation
0 X X X X None X 1 X X X None
1 0 0 X 0 Initiate 12-Bit Conversion 1 0 0 X 1 Initiate 8-Bit Conversion
1 0 1 1 X Enable 12-Bit Parallel Output 1 0 1 0 0 Enable 8 Most Significant Bits
1 0 1 0 1 Enable 4 LSBs +4 Trailing Zeroes
REV. C
–9–
AD1674
D
READ
EN
Q
QB
–10–
Q
D
EN
R
Q
S
CE
CS
R/C
A
0
12/8
Figure 10. Equivalent Internal Logic Circuitry

FULL-CONTROL MODE

Chip Enable (CE), Chip Select (
CS) and Read/ Convert (R/C) are used to control Convert or Read modes of operation. Either CE or
CS may be used to initiate a conversion. The state of R/C when CE and Read (R/ should be LOW before both CE and
CS are both asserted determines whether a data
C = 1) or a Convert (R/C = 0) is in progress. R/C
CS are asserted; if R/C is
HIGH, a Read operation will momentarily occur, possibly resulting in system bus contention.

STAND-ALONE MODE

The AD1674 can be used in a “stand-alone” mode, which is useful in systems with dedicated input ports available and thus not requiring full bus interface capability. Stand-alone mode applications are generally able to issue conversion start com­mands more precisely than full-control mode. This improves ac performance by reducing the amount of control-induced aper­ture jitter.
In stand-alone mode, the control interface for the AD1674 and AD674A are identical. CE and 12/ A
are wired LOW, and conversion is controlled by R/C. The
0
three-state buffers are enabled when R/ version starts when R/
C goes LOW. This gives rise to two pos-
8 are wired HIGH, CS and
C is HIGH and a con-
sible control signals—a high pulse or a low pulse. Operation with a low pulse is shown in Figure 4a. In this case, the outputs are forced into the high impedance state in response to the fall­ing edge of R/
C and return to valid logic levels after the conver­sion cycle is completed. The STS line goes HIGH 200 ns after R/
C goes LOW and returns low 1 µs after data is valid.
If conversion is initiated by a high pulse as shown in Figure 4b, the data lines are enabled during the time when R/ The falling edge of R/
C starts the next conversion and the data
C is HIGH.
lines return to three-state (and remain three-state) until the next high pulse of R/
C.

CONVERSION TIMING

Once a conversion is started, the STS line goes HIGH. Convert start commands will be ignored until the conversion cycle is complete. The output data buffers will be enabled a minimum of 0.6 µs prior to STS going LOW. The STS line will return LOW at the end of the conversion cycle.
VALUE OF A0 AT LAST CONVERT COMMAND
EOC 12
EOC 8
S
R
The register control inputs, A length and data format. If a conversion is started with A a full 12-bit conversion cycle is initiated. If A
SAR RESET
Q
QB
NYBBLE A NYBBLE B
NYBBLE C NYBBLE B = 0
1µs DELAY-HOLD SETTLING
1µs DELAY-ACQUISITION
TO OUTPUT BUFFERS
and 12/8, control conversion
0
CLK ENABLE
STATUS
HOLD/SAMPLE
is HIGH during a
0
LOW,
0
convert start, a shorter 8-bit conversion cycle results. During data read operations, A
state buffers containing the 8 MSBs of the conversion result (A
determines whether the three-
0
0
= 0) or the 4 LSBs (A0 = 1) are enabled. The 12/8 pin deter­mines whether the output data is to be organized as two 8-bit words (12/ HIGH). In the 8-bit mode, the byte addressed when A
8 tied LOW) or a single 12-bit word (12/8 tied
is high
0
contains the 4 LSBs from the conversion followed by four trail­ing zeroes. This organization allows the data lines to be over­lapped for direct interface to 8-bit buses without the need for external three-state buffers.

INPUT CONNECTIONS AND CALIBRATION

The 10 V p-p and 20 V p-p full-scale input ranges of the AD1674 accept the majority of signal voltages without the need for external voltage divider networks which could deteriorate the accuracy of the ADC.
The AD1674 is factory trimmed to minimize offset, linearity, and full-scale errors. In many applications, no calibration trim­ming will be required and the AD1674 will exhibit the accuracy limits listed in the specification tables.
In some applications, offset and full-scale errors need to be trimmed out completely. The following sections describe the correct procedure for these various situations.

UNIPOLAR RANGE INPUTS

Figure 11 illustrates the external connections for the AD1674 in unipolar-input mode. The first output-code transition (from 0000 0000 0000 to 0000 0000 0001) should nominally occur for an input level of +1/2 LSB (1.22 mV above ground for a 10 V range; 2.44 mV for a 20 V range). To trim unipolar offset to this nominal value, apply a +1/2 LSB signal between Pin 13 and ground (10 V range) or Pin 14 and ground (20 V range) and ad­just R1 until the first transition is located. If the offset trim is not required, Pin 12 can be connected directly to Pin 9; the two resistors and trimmer for Pin 12 are then not needed.
REV. C
AD1674
–15V
100k
100
0 TO +10V
ANALOG
INPUTS
0 TO +20V
R1
100k
+15V
R2
100
2 12/8 3 CS
4 A
0
5 R/C 6 CE 10 REF IN 8 REF OUT 12 BIP OFF
13 10V 14 20V 9 ANA COM
AD1674
IN IN
STS 28
HIGH BITS
24-27
MIDDLE BITS
20-23
LOW BITS
16-19
+5V 1
+15V 7
–15V 11
DIG COM 15
Figure 11. Unipolar Input Connections with Gain and Offset Trims
The full-scale trim is done by applying a signal 1 1/2 LSB below the nominal full scale (9.9963 V for a 10 V range) and adjusting R2 until the last transition is located (1111 1111 1110 to 1111 1111 1111). If full-scale adjustment is not required, R2 should be replaced with a fixed 50 ±1% metal film resistor. If REF OUT is connected directly to REF IN, the additional full-scale error will be approximately 1%.

BIPOLAR RANGE INPUTS

The connections for the bipolar-input mode are shown in Figure
12. Either or both of the trimming potentiometers can be replaced with 50 ± 1% fixed resistors if the specified AD1674 accuracy limits are sufficient for the application. If the pins are shorted together, the additional offset and gain errors will be approximately 1%.
To trim bipolar offset to its nominal value, apply a signal 1/2 LSB below midrange (–1.22 mV for a ± 5 V range) and adjust R1 until the major carry transition is located (0111 1111 1111 to 1000 0000 0000). To trim the full-scale error, apply a signal 1 1/2 LSB below full scale (+4.9963 V for a ± 5 V range) and adjust R2 to give the last positive transition (1111 1111 1110 to 1111 1111 1111). These trims are interactive so several itera­tions may be necessary for convergence.
A single-pass calibration can be done by substituting a negative full-scale trim for the bipolar offset trim (error at midscale), using the same circuit. First, apply a signal 1/2 LSB above minus full scale (–4.9988 V for a ±5 V range) and adjust R1 until the minus full-scale transition is located (0000 0000 0001 to 0000 0000 0000). Then perform the gain error trim as outlined above.
ANALOG
INPUTS
±5V
±10V
R2
100
100
R1
2 12/8 3 CS
4 A
0
5 R/C
6 CE
10 REF IN
8 REF OUT
12 BIP OFF
13 10V 14 20V
9 ANA COM
AD1674
IN
IN
STS 28
HIGH BITS
24-27
MIDDLE BITS
20-23
LOW BITS
16-19
+5V 1
+15V 7
–15V 11
DIG COM 15
Figure 12. Bipolar Input Connections with Gain and Offset Trims

REFERENCE DECOUPLING

It is recommended that a 10 µF tantalum capacitor be con- nected between REF IN (Pin 10) and ground. This has the effect of improving the S/(N+D) ratio through filtering possible broad-band noise contributions from the voltage reference.

BOARD LAYOUT

Designing with high resolution data converters requires careful attention to board layout. Trace impedance is a significant issue. At the 12-bit level, a 5 mA current through a 0.5 trace will develop a voltage drop of 2.5 mV, which is 1 LSB for a 10 V full-scale range. In addition to ground drops, inductive and ca­pacitive coupling need to be considered, especially when high accuracy analog signals share the same board with digital sig­nals. Finally, power supplies should be decoupled in order to filter out ac noise.
The AD1674 has a wide bandwidth sampling front end. This means that the AD1674 will “see” high frequency noise at the input, which nonsampling (or limited-bandwidth sampling) ADCs would ignore. Therefore, it’s important to make an effort to eliminate such high frequency noise through decoupling or by using an anti-aliasing filter at the analog input of the AD1674.
Analog and digital signals should not share a common path. Each signal should have an appropriate analog or digital return routed close to it. Using this approach, signal loops enclose a small area, minimizing the inductive coupling of noise. Wide PC tracks, large gauge wire, and ground planes are highly recom­mended to provide low impedance signal paths. Separate analog and digital ground planes are also desirable, with a single inter­connection point to minimize ground loops. Analog signals should be routed as far as possible from digital signals and should cross them (if necessary) only at right angles.
The AD1674 incorporates several features to help the user’s lay­out. Analog pins are adjacent to help isolate analog from digital signals. Ground currents have been minimized by careful circuit architecture. Current through AGND is 2.2 mA, with little code-dependent variation. The current through DGND is domi­nated by the return current for DB11–DB0.

SUPPLY DECOUPLING

The AD1674 power supplies should be well filtered, well regu­lated, and free from high frequency noise. Switching power sup­plies are not recommended due to their tendency to generate spikes which can induce noise in the analog system.
Decoupling capacitors should be used in very close layout prox­imity between all power supply pins and ground. A 10 µF tanta- lum capacitor in parallel with a 0.1 µF disc ceramic capacitor provides adequate decoupling over a wide range of frequencies.
An effort should be made to minimize the trace length between the capacitor leads and the respective converter power supply and common pins. The circuit layout should attempt to locate the AD1674, associated analog input circuitry, and interconnec­tions as far as possible from logic circuitry. A solid analog ground plane around the AD1674 will isolate large switching ground currents. For these reasons, the use of wire-wrap circuit construction is not recommended; careful printed-circuit con­struction is preferred.
REV. C
–11–
AD1674
0.050 ±0.010 (1.27 ±0.254)
SEATING PLANE
1.42 (36.07)
1.40 (35.56)
0.047 ±0.007 (1.19 ±0.178)
0.1 (2.54)
0.017 ±0.003 (0.43 ±0.076)
0.145 ±0.02
(3.68 ±0.51)
0.125
(3.17)
MIN
0.6 (15.24)
0.010 ±0.002 (0.254 ±0.05)
0.095 (2.41)
0.085 (2.16)
0.59 ±0.01
(14.98 ±0.254)
14
15
PIN 1
1
28
0.505 (12.83)
PIN 1
0.2992 (7.60)
0.2914 (7.40)
0.4193 (10.65)
0.3937 (10.00)
1
28
15
14
0.0125 (0.32)
0.0091 (0.23)
0.0500 (1.27)
0.0157 (0.40)
8° 0°
0.0291 (0.74)
0.0098 (0.25)
x 45°
0.0192 (0.49)
0.0138 (0.35)
0.0500 (1.27) BSC
0.1043 (2.65)
0.0926 (2.35)
0.7125 (18.10)
0.6969 (17.70)
0.0118 (0.30)
0.0040 (0.10)

GROUNDING

If a single AD1674 is used with separate analog and digital ground planes, connect the analog ground plane to AGND and the digital ground plane to DGND keeping lead lengths as short as possible. Then connect AGND and DGND together at the AD1674. If multiple AD1674s are used or the AD1674 shares analog supplies with other components, connect the analog and digital returns together once at the power supplies rather than at each chip. This prevents large ground loops which inductively couple noise and allow digital currents to flow through the ana­log system.

GENERAL MICROPROCESSOR INTERFACE CONSIDERATIONS

A typical A/D converter interface routine involves several opera­tions. First, a write to the ADC address initiates a conversion. The processor must then wait for the conversion cycle to com­plete, since most ADCs take longer than one instruction cycle to complete a conversion. Valid data can, of course, only be read after the conversion is complete. The AD1674 provides an out­put signal (STS) which indicates when a conversion is in progress. This signal can be polled by the processor by reading it through an external three-state buffer (or other input port). The STS signal can also be used to generate an interrupt upon completion of a conversion, if the system timing requirements are critical (bear in mind that the maximum conversion time of the AD1674 is only 10 microseconds) and the processor has other tasks to perform during the ADC conversion cycle. An­other possible time-out method is to assume that the ADC will take 10 microseconds to convert, and insert a sufficient number of “no-op” instructions to ensure that 10 microseconds of pro­cessor time is consumed.
Once it is established that the conversion is finished, the data can be read. In the case of an ADC of 8-bit resolution (or less), a single data read operation is sufficient. In the case of convert­ers with more data bits than are available on the bus, a choice of data formats is required, and multiple read operations are needed. The AD1674 includes internal logic to permit direct in­terface to 8-bit or 16-bit data buses, selected by the 12/ In 16-bit bus applications (12/
8 HIGH) the data lines (DB11
8 input.
through DB0) may be connected to either the 12 most signifi­cant or 12 least significant hits of the data bus. The remaining four bits should be masked in software. The interface to an 8-bit data bus (12/ DB4). The odd address (A
8 LOW) contains the 8 MSBs (DB11 through
HIGH) contains the 4 LSBs (DB3
0
through DB0) in the upper half of the byte, followed by four trailing zeroes, thus eliminating bit masking instructions.
PIN 1
0.200
(5.080)
MAX
0.175 (4.45)
0.120 (3.05)

PACKAGE INFORMATION

Dimensions shown in inches and (mm).
28-Pin Ceramic DIP Package (D-28)
28-Lead Plastic DIP Package (N-28)
28
1
0.020 (0.508)
0.015 (0.381)
1.450 (38.83)
1.440 (35.576)
0.105 (2.67)
0.095 (2.41)
15
14
0.065 (1.65)
0.045 (1.14)
0.550 (13.97)
0.530 (13.462)
0.160 (4.06)
0.140 (3.56)
SEATING PLANE
0.606 (15.39)
0.594 (15.09)
15
°
0
°
28-Lead Wide-Body SO Package (R-28)
0.012 (0.305)
0.008 (0.203)
C1425b–10–3/94
AD1674 Data Format for 8-Bit Bus
–12–
PRINTED IN U.S.A.
REV. C
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