Agilent Technologies 16760A User Manual

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Agilent Technologies 16760A Logic Analyzer

The Agilent Technologies 16760A 1500 Mb/s State/800 MHz Timing logic analyzer offers 64M deep memory with up to 170 channels on a single time base (5 cards, 34 channels per card). Differential probing captures input signals as low as 200 mV p-p.

“Getting Started” on page 13

“Probing and Selecting the Sampling Mode” on page 33

• “Probing and Sampling Mode Selection Steps” on page 15

• “Timing Mode or State Mode Steps” on page 22

• “Eye Scan Mode Steps” on page 26

• “Probing the Device Under Test” on page 35

• “Using the E5378A Single-Ended Probe” on page 35

• “Using the E5379A Differential Probe” on page 37

• “Using the E5380A Mictor-Compatible Probe” on page 39

• “Using the E5382A Single-ended Flying Lead Probe Set” on page 40

• “Using an Analysis Probe” on page 41

• “Choosing the Sampling Mode” on page 43

• “Selecting the Timing Mode (Asynchronous Sampling)” on page 43

• “Selecting the State Mode (Synchronous Sampling)” on page 46

• “In Either Timing Mode or State Mode” on page 53

• “Selecting the Eye Scan Mode” on page 55

• “Formatting Labels for Logic Analyzer Probes” on page 57

“Using the Logic Analyzer in Timing or State Mode” on page 67

• “Setting Up Triggers and Running Measurements” on page 69

• “Using Trigger Functions” on page 70

• “Using Other Trigger Features” on page 75

Agilent Technologies 16760A Logic Analyzer

• “Editing the Trigger Sequence (Timing or 200, 400 Mb/s State Only)” on page 78

• “Editing Advanced Trigger Functions (Timing or 200 Mb/s State Only)” on page 83

• “Saving/Recalling Trigger Setups” on page 90

• “Running Measurements” on page 91

• “Displaying Captured Data” on page 94

• “Using Symbols” on page 101

• “Printing/Exporting Captured Data” on page 110

• “Cross-Triggering” on page 112

• “Solving Logic Analysis Problems” on page 114

• “Saving and Loading Logic Analyzer Configurations” on page 116

“Using the Logic Analyzer in Eye Scan Mode” on page 117

“Reference” on page 153

“Concepts” on page 239

• “Setting Up and Running Eye Scan Measurements” on page 119

• “Displaying Captured Eye Scan Data” on page 133

• “Saving and Loading Captured Eye Scan Data” on page 152

• “The Sampling Tab” on page 155

• “The Format Tab” on page 174

• “The Trigger Tab” on page 176

• “The Symbols Tab” on page 193

• “The Eye Scan Tab” on page 204

• “The Calibration Tab” on page 210

• “Error Messages” on page 211

• “Specifications and Characteristics” on page 227

• “Understanding Logic Analyzer Triggering” on page 240

• “Understanding State Mode Sampling Positions” on page 256

• “Understanding Eye Scan Measurements” on page 259

Agilent Technologies 16760A Logic Analyzer

See Also Main System Help (see the Agilent Technologies 16700A/B-Series Logic

Analysis System help volume)

Glossary (see page 263)

Agilent Technologies 16760A Logic Analyzer

1 Getting Started

Probing and Sampling Mode Selection Steps 15

Step 1. Connect logic analyzer to the device under test 15 Step 2. Choose the sampling mode 16 Step 3. Format labels for the probed signals 19

Timing Mode or State Mode Steps 22

Step 4. Define the trigger condition 22 Step 5. Run the measurement 23 Step 6. Display the captured data 24

Eye Scan Mode Steps 26

Step 4. Select channels for the eye scan measurement 26 Step 5. Set the eye scan range and resolution 27 Step 6. Run the eye scan measurement 28 Step 7. Display the captured eye scan data 29

For More Information... 31

2 Probing and Selecting the Sampling Mode

Probing the Device Under Test 35

Using the E5378A Single-Ended Probe 35 Using the E5379A Differential Probe 37 Using the E5380A Mictor-Compatible Probe 39 Using the E5382A Single-ended Flying Lead Probe Set 40 Using an Analysis Probe 41

Contents

Choosing the Sampling Mode 43

Selecting the Timing Mode (Asynchronous Sampling) 43 Selecting the State Mode (Synchronous Sampling) 46 In Either Timing Mode or State Mode 53 Selecting the Eye Scan Mode 55

Formatting Labels for Logic Analyzer Probes 57

To assign pods to the analyzer 57 To set pod threshold voltages 58 To set clock threshold voltages 59 To assign probe channels to labels 60 To import label names and assignments from a netlist 62 To import label definitions from an ASCII file 63 To export label definitions to an ASCII file 64 To change the label polarity 64 To reorder bits in a label 65 To turn labels off or on 66

3 Using the Logic Analyzer in Timing or State Mode

Setting Up Triggers and Running Measurements 69

Using Trigger Functions 70 Using Other Trigger Features 75 Editing the Trigger Sequence (Timing or 200, 400 Mb/s State Only) 78 Editing Advanced Trigger Functions (Timing or 200 Mb/s State Only) 83 Saving/Recalling Trigger Setups 90 Running Measurements 91

Displaying Captured Data 94

To open Waveform or Listing displays 94 To use other display tools 95 If the captured data doesn't look correct 97 If there are filtered data holes in display memory 98 To display symbols for data values 99 To cancel the display processing of captured data 100

Contents

Using Symbols 101

To load object file symbols 102 To adjust symbol values for relocated code 103 To create user-defined symbols 104 To enter symbolic label values 105 To create an ASCII symbol file 106 To create a readers.ini file 107

Printing/Exporting Captured Data 110

Cross-Triggering 112

To cross-trigger with another instrument 112

Solving Logic Analysis Problems 114

To test the logic analyzer hardware 114

Saving and Loading Logic Analyzer Configurations 116

4 Using the Logic Analyzer in Eye Scan Mode

Setting Up and Running Eye Scan Measurements 119

To select channels for the eye scan 119 To set the eye scan range and resolution 120 To run an eye scan measurement 121 To set advanced eye scan options 121 To set up qualified eye scan measurements 122 To comment on the eye scan settings 132

Contents

Displaying Captured Eye Scan Data 133

To open the Eye Scan display 133 To select the channels displayed 134 To scale the Eye Scan display 135 To set Eye Scan display options 136 To make measurements on the eye scan data 142 To display information about the eye scan data 149 To comment on the eye scan data 151

Saving and Loading Captured Eye Scan Data 152

5 Reference

The Sampling Tab 155

Timing Mode 156 State Mode 158 Sampling Positions Dialog 159 Eye Scan Mode 172

The Format Tab 174

Pod Assignment Dialog 175

The Trigger Tab 176

Trigger Functions Subtab 177 Settings Subtab 188 Overview Subtab 189 Default Storing Subtab 190 Status Subtab 191 Save/Recall Subtab 191

The Symbols Tab 193

Symbols Selector Dialog 195 Symbol File Formats 197 General-Purpose ASCII (GPA) Symbol File Format 198

Contents

The Eye Scan Tab 204

Labels Subtab 204 Scan Settings Subtab 205 Advanced Subtab 206 Qualifier Subtab 208 Comments Subtab 209

The Calibration Tab 210

Error Messages 211

Analyzer armed from another module contains no "Arm in from IMB" event 212 Branch expression is too complex 212 Cannot specify range on label with clock bits that span pod pairs 217 Counter value checked as an event, but no increment action specified 218 Goto action specifies an undefined level 218 Hardware Initialization Failed 218 Maximum of 32 Channels Per Label 219 Must assign another pod pair to specify actions for flags 219 Must assign Pod 1 on the master card to specify actions for flags 219 No more Edge/Glitch resources available for this pod pair 219 No more Pattern resources available for this pod pair 220 No Trigger action found in the trace specification 221 Slow or Missing Clock 221 Timer value checked as an event, but no start action specified 222 Trigger function initialization failure 222 Trigger inhibited during timing prestore 223 Trigger Specification is too complex 223 Waiting for Trigger 225

Contents

Specifications and Characteristics 227

E5378A Single-Ended Probe Specifications and Characteristics 228 E5379A Differential Probe Specifications and Characteristics 228 E5380A MICTOR-Compatible Probe Specifications and Characteristics 229 1500 Mb/s Sampling Mode Specifications and Characteristics 230 1250 Mb/s Sampling Mode Specifications and Characteristics 231 800 Mb/s Sampling Mode Specifications and Characteristics 232 400 Mb/s Sampling Mode Specifications and Characteristics 233 200 Mb/s Sampling Mode Specifications and Characteristics 234 Conventional Timing Mode Specifications and Characteristics 235 Transitional Timing Mode Specifications and Characteristics 235 What is a Specification? 236 What is a Characteristic? 237

6 Concepts

Understanding Logic Analyzer Triggering 240

The Conveyor Belt Analogy 240 Summary of Triggering Capabilities 242 Sequence Levels 242 Boolean Expressions 245 Branches 246 Edges 246 Ranges 246 Flags 247 Occurrence Counters and Global Counters 247 Timers 248 Storage Qualification 249 Strategies for Setting Up Triggers 251 Conclusions 255

Understanding State Mode Sampling Positions 256

Understanding Eye Scan Measurements 259

Contents

Glossary

Index

Contents

Getting Started

After you have connected the logic analyzer probes to your device under test (see “Step 1. Connect logic analyzer to the device under test” on page 15), all measurements will have the following initial steps:

Chapter 1: Getting Started

• “Step 2. Choose the sampling mode” on page 16

• “Step 3. Format labels for the probed signals” on page 19

In the timing (asynchronous) or state (synchronous) sampling modes, measurements will have these steps:

• “Step 4. Define the trigger condition” on page 22

• “Step 5. Run the measurement” on page 23

• “Step 6. Display the captured data” on page 24

In the eye scan sampling mode, measurements will have these steps:

• “Step 4. Select channels for the eye scan measurement” on page 26

• “Step 5. Set the eye scan range and resolution” on page 27

• “Step 6. Run the eye scan measurement” on page 28

• “Step 7. Display the captured eye scan data” on page 29

If you have previously saved a logic analyzer setup to a configuration file, or if configuration files are included with an analysis probe, you can load the configuration file to set up the logic analyzer and the measurement.

Once you have made a logic analyzer measurement, the measurement can be refined by repeating the measurement set up, run, and display steps.

Next: “Step 1. Connect logic analyzer to the device under test” on page 15

Chapter 1: Getting Started

Probing and Sampling Mode Selection Steps

You will always take the following steps regardless of the sampling mode you plan to use.

• “Step 1. Connect logic analyzer to the device under test” on page 15

• “Step 2. Choose the sampling mode” on page 16

• “Step 3. Format labels for the probed signals” on page 19

Step 1. Connect logic analyzer to the device under test

Before you begin setting up the logic analyzer for a measurement, you need to physically connect the logic analyzer to your device under test.

There are four probing options available to connect your logic analyzer to the device under test:

• Single-ended probes with Samtec connectors (see page 35).

• Differential probes with Samtec connectors (see page 37).

• Single-ended probes with MICTOR connectors (see page 39).

•Use an analysis probe to connect to microprocessors and standard buses. When using an analysis probe, the Setup Assistant guides you through the connection and setup process for your particular logic analyzer and analysis probe.

Next: “Step 2. Choose the sampling mode” on page 16

Chapter 1: Getting Started

Probing and Sampling Mode Selection Steps

Step 2. Choose the sampling mode

There are three logic analyzer sampling modes to choose from: timing mode, state mode, and eye scan mode.

In timing mode, the logic analyzer samples asynchronously, based on an internally-generated sampling clock.

In state mode, the logic analyzer samples synchronously, based on a sampling clock signal from the device under test. Typically, the signal used for sampling in state mode is a state machine or microprocessor clock signal.

In eye scan mode, the logic analyzer samples small windows of time and voltage on data channels around a clock signal from the device under test. The resulting eye diagrams let you validate and characterize the data valid windows of signals latched on the clock.

To choose the sampling mode

1. In the Sampling tab, choose Timing Mode, State Mode, or Eye Scan Mode.

Chapter 1: Getting Started

Probing and Sampling Mode Selection Steps

If you chose Timing Mode

1. Select the timing analyzer conventional/transitional configuration.

In the transitional timing configuration, the logic analyzer can capture a greater period of execution because only transitions are stored in memory.

2. If you chose the transitional timing configuration, set the sample period.

To capture signal level changes reliably, the sample period should be less than half (many engineers prefer one-fourth) of the period of the fastest signal you want to measure.

If you chose State Mode

1. Select the state analyzer speed configuration.

There are trade-offs between high-speed sampling, the number of available channels, triggering capabilities, and other logic analyzer characteristics. For example, in the 1250 Mb/s configuration, a periodic clock input signal is required.

2. In the Clock Setup, specify which clock signal edges from the device under test will be used as the sampling clock.

Chapter 1: Getting Started

Probing and Sampling Mode Selection Steps

3. Specify the sampling position. Select the Sampling Positions... button, then select the Run Eye Finder button to locate the data valid window in relation to the sampling clock, and automatically set the sampling position of the logic analyzer.

See Also “To automatically adjust sampling positions” on page 49

In either Timing Mode or State Mode

1. Specify the trigger position.

The trigger is the event in the device under test that you want to capture data around.

Specify whether you want to look at data after the trigger (Start), before and after the trigger (Center), before the trigger (End), or use a percentage of the logic analyzer's memory for data after the trigger (User Defined).

2. Set the acquisition memory depth.

If you need less data and want measurements to run faster, you can limit the amount of trace memory that is filled with samples.

If you chose Eye Scan Mode

1. Select the eye scan mode speed configuration.

There are trade-offs between high-speed sampling, the number of available channels, and other logic analyzer characteristics.

2. In the Clock Setup, specify which clock signal edges from the device under test will be used as the reference clock for the eye scan measurement.

Next: “Step 3. Format labels for the probed signals” on page 19

Chapter 1: Getting Started

Probing and Sampling Mode Selection Steps

Step 3. Format labels for the probed signals

When a logic analyzer probes hundreds of signals in a device under test, you need to be able to give those channels more meaningful names than "pod 1, channel 1".

The Format tab is mainly used for assigning bus and signal names (from the device under test) to logic analyzer channels. These names are called labels. Labels are also used when setting up triggers and displaying captured data.

The Format tab also lets you do things like assign pods to the logic analyzer and specify the logic analyzer threshold voltage.

The Format tab has activity indicators that show whether the signal a channel is probing is above the threshold voltage (high), below the threshold voltage (low), or transitioning.

Chapter 1: Getting Started

Probing and Sampling Mode Selection Steps

To assign pods to the logic analyzer

1. In the Format tab, select the Pod Assignment button.

2. In the Pod Assignment dialog, drag a pod to the appropriate logic analyzer.

3. Select the Close button.

To specify threshold voltages

The threshold voltage is the voltage level that a signal must cross before the logic analyzer recognizes a change in logic levels.

1. In the Format tab, select the button under the pod name.

2. In the Pod threshold dialog, select a Standard, External Ref, Differential, or a User Defined threshold voltage.

3. Select the Close button.

4. Select the Clk Thresh button.

5. In the Clock Thresholds dialog, select the button of the clock whose threshold you wish to set.

6. In the J, K, etc., threshold dialog, select a Standard, Differential, or a User

Chapter 1: Getting Started

Probing and Sampling Mode Selection Steps

Defined threshold voltage.

7. Select the Close button.

8. Select the Close button.

To assign names to logic analyzer channels

1. Select a label button, and either:

• Choose the Rename command, enter the label name, and select the OK button.

• Or, choose the Insert before or Insert after command, enter the label name, and select the OK button.

2. In the label row, select the button of the pod that contains the channels you want to assign.

3. Either choose one of the standard channel assignments--dots (.) mean the channel is unassigned, asterisks (*) mean the channel is assigned--or choose Individual.

If you chose Individual:

a. In the "label - pod" dialog, select the channels you want to assign/

unassign.

b. Select the OK button.

• If you are using the logic analyzer in timing mode or in state mode, go to “Step 4. Define the trigger condition” on page 22.

• If you are using the logic analyzer in eye scan mode, go to “Step 4. Select channels for the eye scan measurement” on page 26.

Chapter 1: Getting Started

Timing Mode or State Mode Steps

When you have selected the timing or state sampling modes, you need to perform the following steps.

• “Step 4. Define the trigger condition” on page 22

• “Step 5. Run the measurement” on page 23

• “Step 6. Display the captured data” on page 24

Step 4. Define the trigger condition

The trigger is the event in the device under test that you want to capture data around.

1. In the Trigger tab, and in the Trigger Functions subtab, choose the type of trigger you want to specify, and select the Replace button.

Chapter 1: Getting Started

Timing Mode or State Mode Steps

2. In the Trigger Sequence portion of the Trigger tab, select the buttons to define the label values and/or other conditions you want to trigger on.

Next: “Step 5. Run the measurement” on page 23

Step 5. Run the measurement

Once the trigger condition has been defined, you can run the measurement.

1. Select the Run Single button .

When you run a measurement, the Stop button becomes available while the logic analyzer looks for the trigger condition.

Chapter 1: Getting Started

Timing Mode or State Mode Steps

Logic analyzers with deep acquisition memory take a noticeable amount of time to complete a run; however, messages like "Waiting in level 1" may indicate you need to stop the measurement and refine the trigger condition.

When the trigger condition is found, logic analyzer acquisition memory is filled, the captured data is processed to the display tools, and the Run Single button becomes available again.

Next: “Step 6. Display the captured data” on page 24

Step 6. Display the captured data

Once you have run a measurement and filled the logic analyzer's acquisition memory with captured data, you can display it with one of the display tools.

To open Waveform or Listing displays

Waveform displays are typically used when data is captured with the timing sampling mode, and Listing displays are used when data is captured with the state sampling mode.

1. From the Window menu, select your logic analyzer and choose the Waveform or Listing command.

Chapter 1: Getting Started

Timing Mode or State Mode Steps

To add display tools via the Workspace window

1. Select the Workspace button (or from the Window menu, select System and Workspace).

2. In the Workspace window, scroll down to the Display portion of the tool icon list.

3. Drag the display tool icon and drop it on the analyzer icon.

4. To open the display tool, select its icon and choose the Display command.

Next: “For More Information...” on page 31

Chapter 1: Getting Started

Eye Scan Mode Steps

When you have selected the eye scan sampling mode, you need to perform the following steps.

• “Step 4. Select channels for the eye scan measurement” on page 26

• “Step 5. Set the eye scan range and resolution” on page 27

• “Step 6. Run the eye scan measurement” on page 28

• “Step 7. Display the captured eye scan data” on page 29

Step 4. Select channels for the eye scan measurement

1. In the Eye Scan tab, Labels subtab, select the channels you want in the eye scan measurement.

Chapter 1: Getting Started

Eye Scan Mode Steps

Next: “Step 5. Set the eye scan range and resolution” on page 27

Step 5. Set the eye scan range and resolution

1. In the Eye Scan tab, Scan Settings subtab, select the settings for the eye scan measurement.

Chapter 1: Getting Started

Eye Scan Mode Steps

These settings define the number and size of the time and voltage windows used in the eye scan.

Measurements using the coarse settings run faster because there are fewer time and voltage windows to scan, but the resulting eye diagrams have less resolution.

Measurements using the fine settings result in eye diagrams with better resolution, but the measurements take longer to run because there are more time and voltage windows to scan.

Next: “Step 6. Run the eye scan measurement” on page 28

Step 6. Run the eye scan measurement

Chapter 1: Getting Started

Eye Scan Mode Steps

Once the eye scan settings have been selected, you can run the measurement.

1. Select the Run Single button .

The Eye Scan display window opens, and the captured measurement data begins to appear.

While the eye scan measurement runs, the Stop button becomes available.

The estimated time of the measurement is shown in the status field.

Next: “Step 7. Display the captured eye scan data” on page 29

Step 7. Display the captured eye scan data

Chapter 1: Getting Started

Eye Scan Mode Steps

In the Eye Scan display window, use the following subtabs:

• Scale to zoom in or out on the captured data.

• Display to change the display options.

• Measurements to use tools for displaying useful information about the data.

• Info to display textual information about the captured measurement data.

• Comments to save your comments with the data.

Next: “For More Information...” on page 31

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