Programmable Settling Time
– 2.5 µs in Fast Mode
– 12 µs in Slow Mode
D
Compatible With TMS320 and SPI Serial
Ports
D
Differential Nonlinearity <0.5 LSB Typ
D
Monotonic Over Temperature
D
Available in Q-Temp Automotive
HighRel Automotive Applications
Configuration Control / Print Support
Qualification to Automotive Standards
description
The TL V5618A is a dual 12-bit voltage output DAC
with a flexible 3-wire serial interface. The serial
interface is compatible with TMS320, SPI,
QSPI, and Microwire serial ports. It is
programmed with a 16-bit serial string containing
4 control and 12 data bits.
The resistor string output voltage is buffered by an
x2 gain rail-to-rail output buffer. The buffer
features a Class-AB output stage to improve
stability and reduce settling time. The programmable settling time of the DAC allows the designer
to optimize speed versus power dissipation.
applications
D
Digital Servo Control Loops
D
Digital Offset and Gain Adjustment
D
Industrial Process Control
D
Machine and Motion Control Devices
D
Mass Storage Devices
D OR JG PACKAGE
(TOP VIEW)
DIN
NC
SCLK
NC
CS
NC
SCLK
CS
OUTA
4
5
6
7
8
1
2
3
4
FK PACKAGE
(TOP VIEW)
NC
NC
DINNCV
NC
OUTA
8
7
6
5
AGND
DD
1920132
1312119 10
V
DD
OUTB
REF
AGND
NC
18
17
16
15
14
NC
NC
OUTB
NC
REF
NC
Implemented with a CMOS process, the device is designed for single supply operation from 2.7 V to 5.5 V. It
is available in an 8-pin SOIC package in standard commercial and industrial temperature ranges.
The TL V5618AC is characterized for operation from 0°C to 70°C. The TL V5618AI is characterized for operation
from –40°C to 85°C. The TLV5618AQ is characterized for operation from –40°C to 125°C. The TLV5618AM
is characterized for operation from –55°C to 125°C.
AVAILABLE OPTIONS
PACKAGE
T
A
0°C to 70°CTLV5618ACD——
–40°C to 85°CTLV5618AID——
–40°C to 125°C
–55°C to 125°C—TLV5618AMJGTLV5618AMFK
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SPI and QSPI are trademarks of Motorola, Inc.
Microwire is a trademark of National Semiconductor Corporation.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
SOIC
(D)
TLV5618AQD
TLV5618AQDR
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
CERAMIC DIP
(JG)
——
20 PAD LCCC
(FK)
Copyright 2000, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
1
TLV5618A
I/O/P
DESCRIPTION
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT
DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
functional block diagram
DIN
SCLK
CS
Power-On
Reset
Speed Control
Serial
Interface
and
Control
Power and
2
12
Buffer
REFAGNDV
1212
12
12-Bit
DAC A
Latch
12-Bit
DAC B
Latch
12
DD
x2
x2
OUTA
OUTB
Terminal Functions
TERMINAL
NAMENO.
AGND5PGround
CS3IChip select. Digital input active low, used to enable/disable inputs.
DIN1IDigital serial data input
OUTA4ODAC A analog voltage output
OUTB7ODAC B analog voltage output
REF6IAnalog reference voltage input
SCLK2IDigital serial clock input
V
DD
8PPositive power supply
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
PACKAGE
A
A
A
A
Suppl
oltage, V
Operating free-air temperature, T
°C
TLV5618A
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT
DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Lead temperature 1,6 mm (1/16 inch) from case for 10 seconds 260°C. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
This is the inverse of the traditional junction-to-ambient thermal resistance (RΘJA). Thermal resistances are not production tested and are for
informational purposes only.
‡
= 70°CT
POWER RATING
= 85°CT
POWER RATING
= 125°C
POWER RATING
recommended operating conditions
MINNOMMAXUNIT
pp
y v
Power on reset, POR0.552V
High-level digital input voltage, V
Low-level digital input voltage, V
Reference voltage, V
Reference voltage, V
Load resistance, R
Load capacitance, C
Clock frequency, f
p
NOTE 1: Due to the x2 output buffer, a reference input voltage ≥ (VDD–0.4 V)/2 causes clipping of the transfer function.
DD
IH
IL
to REF terminalVDD = 5 V (see Note 1)AGND2.048VDD–1.5V
ref
to REF terminalVDD = 3 V (see Note 1)AGND1.024 VDD–1.5V
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT
DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
electrical characteristics over recommended operating conditions (unless otherwise noted)
power supply
PARAMETERTEST CONDITIONSMINTYPMAX
No load,
ower supply curren
Power down supply current1µA
pp
NOTES: 2. Power supply rejection ratio at zero scale is measured by varying VDD and is given by:
PSRR = 20 log [(EZS(VDDmax) – EZS(VDDmin)/VDDmax]
3. Power supply rejection ratio at full scale is measured by varying VDD and is given by:
PSRR = 20 log [(EG(VDDmax) – EG(VDDmin)/VDDmax]
nputs =
Zero scale, See Note 2–65
Full scale, See Note 3–65
or V,
=
Fast1.82.3
Slow0.81
static DAC specifications
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
Resolution12bits
INLIntegral nonlinearitySee Note 4±2±4LSB
DNLDifferential nonlinearitySee Note 5±0.5±1LSB
E
ZS
EZS TCZero-scale-error temperature coefficientSee Note 73ppm/°C
E
G
EG T
NOTES: 4. The relative accuracy of integral nonlinearity (INL), sometimes referred to as linearity error , is the maximum deviation of the output
Zero-scale error (offset error at zero scale)See Note 6±12mV
Gain errorSee Note 8±0.6
Gain-error temperature coefficientSee Note 91ppm/°C
C
from the line between zero and full scale, excluding the effects of zero-code and full-scale errors.
5. The differential nonlinearity (DNL), sometimes referred to as differential error, is the difference between the measured and ideal
1-LSB amplitude change of any two adjacent codes.
6. Zero-scale error is the deviation from zero voltage output when the digital input code is zero.
7. Zero-scale-error temperature coefficient is given by: EZS TC = [EZS (T
8. Gain error is the deviation from the ideal output (2V
9. Gain temperature coefficient is given by: EG TC = [EG (T
– 1 LSB) with an output load of 10 kΩ.
ref
max) – Eg
(T
max) – EZS
min
)]/2V
(T
× 106/(T
ref
min
)]/2V
max
× 106/(T
ref
– T
min
– T
max
).
output specifications
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
V
O
Output voltage rangeRL = 10 kΩVDD–0.4V
Output load regulation accuracyVO = 4.096 V, 2.048 V RL = 2 kΩ±0.29% FS
min
UNIT
m
% full
scale V
).
reference input
VIInput voltage range0V
RIInput resistance10MΩ
CIInput capacitance5pF
Reference feedthroughREF = 1 Vpp at 1 kHz + 1.024 V dc (see Note 10)–80dB
NOTE 10: Reference feedthrough is measured at the DAC output with an input code = 0x000.
4
PARAMETERTEST CONDITIONSMINTYPMAXUNIT
DD–1.5
p
= 0.2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
pp
+ 1.
Fast1.3MHz
Slow525kHz
V
t
Output settling time, full scale
L
,
L
,
s
t
Output settling time, code to code
L
,
L
,
s
SR
Slew rate
L
,
L
,
V/µs
s
,
out
,
dB
TLV5618A
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT
DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
electrical characteristics over recommended operating conditions (unless otherwise noted)
(Continued)
NOTES: 11. Settling time is the time for the output signal to remain within ±0.5 LSB of the final measured value for a digital input code change
p
p
Glitch energy
of 0x020 to 0xFDF and 0xFDF to 0x020 respectively. Not tested, assured by design.
12. Settling time is the time for the output signal to remain within ± 0.5 LSB of the final measured value for a digital input code change
of one count. Not tested, assured by design.
13. Slew rate determines the time it takes for a change of the DAC output from 10% to 90% of full-scale voltage.
= 10 kΩ,C
See Note 11
R
= 10 kΩ,C
See Note 12
R
= 10 kΩ,C
See Note 13
DIN = 0 to 1,FCLK = 100 kHz,
CS
= V
DD
f
= 102 kSPS, f
RL = 10 kΩ,CL = 100 pF
= 100 pF,
= 100 pF,
= 100 pF,
= 1 kHz,
Fast2.5
Slow12
Fast1
Slow2
Fast3
Slow0.5
68
–68
1µA
µ
µ
5nV–s
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
5
TLV5618A
t
Setup time, data ready before SCLK falling edge
ns
2.7-V TO 5.5-V LOW-POWER DUAL 12-BIT
DIGITAL-TO-ANALOG CONVERTER WITH POWER DOWN
SLAS230D – JULY 1999 – REVISED MARCH 2000
digital input timing requirements
t
su(CS–CK)
t
su(C16-CS)
t
wH
t
wL
su(D)
t
h(D)
timing requirements
Setup time, CS low before first negative SCLK edge10ns
Setup time, 16th negative SCLK edge before CS rising edge10ns
SCLK pulse width high25ns
SCLK pulse width low25ns
p
Hold time, data held valid after SCLK falling edge5ns
t
t
wL
wH
C and I suffixes10
Q and M suffixes8
MINNOMMAXUNIT
SCLK
DIN
CS
X
t
1
t
su(D)th(D)
su(CS-CK)
2345 1516
D15D14D13D12D1D0XX
t
X
su(C16-CS)
Figure 1. Timing Diagram
6
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
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