OPA333
OPA2333
SBOS351C – MARCH 2006 – REVISED MAY 2007
1.8V, microPOWER
CMOS OPERATIONAL AMPLIFIERS
Zerø-Drift Series
• LOW OFFSET VOLTAGE: 10 μ V (max)
The OPA333 series of CMOS operational amplifiers
uses a proprietary auto-calibration technique to
• ZERO DRIFT: 0.05 μ V/ ° C (max)
simultaneously provide very low offset voltage (10 μ V
• 0.01Hz to 10Hz NOISE: 1.1 μ V
PP
max) and near-zero drift over time and temperature.
• QUIESCENT CURRENT: 17 μ A
These miniature, high-precision, low quiescent
• SINGLE-SUPPLY OPERATION current amplifiers offer high-impedance inputs that
have a common-mode range 100mV beyond the rails
• SUPPLY VOLTAGE: 1.8V to 5.5V
and rail-to-rail output that swings within 50mV of the
• RAIL-TO-RAIL INPUT/OUTPUT
rails. Single or dual supplies as low as +1.8V ( ± 0.9V)
• microSIZE PACKAGES: SC70 and SOT23
and up to +5.5V ( ± 2.75V) may be used. They are
optimized for low-voltage, single-supply operation.
The OPA333 family offers excellent CMRR without
• TRANSDUCER APPLICATIONS
the crossover associated with traditional
• TEMPERATURE MEASUREMENTS complementary input stages. This design results in
superior performance for driving analog-to-digital
• ELECTRONIC SCALES
converters (ADCs) without degradation of differential
• MEDICAL INSTRUMENTATION
linearity.
• BATTERY-POWERED INSTRUMENTS
The OPA333 (single version) is available in the
• HANDHELD TEST EQUIPMENT
SC70-5, SOT23-5, and SO-8 packages. The
OPA2333 (dual version) is offered in DFN-8 (3mm ×
3mm), MSOP-8, and SO-8 packages. All versions
are specified for operation from –40 ° C to +125 ° C.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2006–2007, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.