• For Complete Module Descriptions, See the
MSP430x2xx Family User’s Guide (SLAU144)
1.2Applications
•Power Management
•Sensor Interface
1.3Description
The TI MSP family of ultra-low-power microcontrollers consists of several devices that feature different
sets of peripherals targeted for various applications. The architecture, combined with five low-power
modes, is optimized to achieve extended battery life in portable measurement applications. The device
features a powerful 16-bit RISC CPU, 16-bit registers, and constant generators that contribute to
maximum code efficiency. The digitally controlled oscillator (DCO) allows the device to wake up from lowpower modes to active mode in less than 1 µs.
The MSP430G2x03 and MSP430G2x33 devices are ultra-low-power mixed-signal microcontrollers with
built-in 16-bit timers, up to 24 I/O capacitive-touch enabled pins, and built-in communication capability
using the USCI. In addition, the MSP430G2x33 family members have a 10-bit ADC. See Section 3 for
configuration details.
Typical applications include low-cost sensor systems that capture analog signals, convert them to digital
values, and then process the data for display or for transmission to a host system.
1
•Capacitive Touch
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
For information about other devices in this family of products or related products, see the following links.
Products for MSP 16-Bit and 32-Bit MCUs Low-power mixed-signal processors with smart analog and
digital peripherals for a wide range of industrial and consumer applications.
Products for Ultra-low Power MCUsMSP Ultra-Low-Power microcontrollers (MCUs) from Texas
Instruments (TI) offer the lowest power consumption and the perfect mix of integrated
peripherals for a wide range of low-power and portable applications.
Products for MSP430G2x/i2x Low-Cost Industrial MCUs MSP430G2x microcontrollers (MCUs) from
the MSP ultra-low-power MCU series, offers the low power and performance of 16-bit MSP
microcontrollers with a feature set targeted at cost sensitive applications.
Companion Products for MSP430G2533 Review products that are frequently purchased or used in
conjunction with this product.
Reference Designs for MSP430G2533 TI Designs Reference Design Library is a robust reference
design library that spans analog, embedded processor, and connectivity. Created by TI
experts to help you jump start your system design, all TI Designs include schematic or block
diagrams, BOMs, and design files to speed your time to market. Search and download
designs at ti.com/tidesigns.
P1.0/
TA0CLK/Timer0_A, clock signal TACLK input
ACLK/ACLK signal output
2231I/O
A0ADC10 analog input A0
P1.1/
TA0.0/Timer0_A, capture: CCI0A input, compare: Out0 output / BSL transmit
UCA0RXD/USCI_A0 receive data input in UART mode
331I/O
UCA0SOMI/USCI_A0 slave data out/master in SPI mode
A1ADC10 analog input A1
P1.2/
TA0.1/Timer0_A, capture: CCI1A input, compare: Out1 output
UCA0TXD/USCI_A0 transmit data output in UART mode
442I/O
UCA0SIMO/USCI_A0 slave data in/master out in SPI mode
A2ADC10 analog input A2
P1.3/
ADC10CLK/ADC10, conversion clock output
A3/ADC10 analog input A3
553I/O
VREF-/VEREF-ADC10 negative reference voltage
P1.4/
SMCLK/SMCLK signal output
UCB0STE/USCI_B0 slave transmit enable
UCA0CLK/USCI_A0 clock input/output
664I/O
A4/ADC10 analog input A4
VREF+/VEREF+ADC10 positive reference voltage
TCKJTAG test clock, input terminal for device programming and test
P1.5/
TA0.0/Timer0_A, compare: Out0 output / BSL receive
UCB0CLK/USCI_B0 clock input/output
UCA0STE/USCI_A0 slave transmit enable
775I/O
A5/ADC10 analog input A5
TMSJTAG test mode select, input terminal for device programming and test
P1.6/
TA0.1/Timer0_A, compare: Out1 output
A6/ADC10 analog input A6
UCB0SOMI/USCI_B0 slave out/master in SPI mode,
142221I/O
UCB0SCL/USCI_B0 SCL I2C clock in I2C mode
TDI/TCLKJTAG test data input or test clock input during programming and test
162423I
SBWTDIOSpy-Bi-Wire test data input/output during programming and test
I/ODESCRIPTION
General-purpose digital I/O pin
(1)
JTAG test data output terminal or test data input during programming and
(2)
test
General-purpose digital I/O pin
General-purpose digital I/O pin
General-purpose digital I/O pin
General-purpose digital I/O pin
General-purpose digital I/O pin
General-purpose digital I/O pin
Input terminal of crystal oscillator
Output terminal of crystal oscillator
(3)
General-purpose digital I/O pin
General-purpose digital I/O pin
General-purpose digital I/O pin
General-purpose digital I/O
General-purpose digital I/O
General-purpose digital I/O
General-purpose digital I/O
General-purpose digital I/O
Reset
(2) TDO or TDI is selected by JTAG instruction.
(3) If XOUT/P2.7 is used as an input, excess current flows until P2SEL.7 is cleared. This is due to the oscillator output driver connection to
TEST/
SBWTCKSpy-Bi-Wire test clock input during programming and test
AVCCNANA29NAAnalog supply voltage
DVCC1130NADigital supply voltage
DVSS202827, 28NAGround reference
NCNANA8, 32NANot connected
QFN PadNANAPadNAQFN package pad connection to VSS recommended.
PW20,
N20
172524I
PW28RHB32
I/ODESCRIPTION
Selects test mode for JTAG pins on Port 1. The device protection fuse is
connected to TEST.
over operating free-air temperature range (unless otherwise noted)
MINMAXUNIT
Voltage applied at VCCto V
Voltage applied to any pin
SS
(2)
–0.34.1V
–0.3VCC+ 0.3V
Diode current at any device pin±2mA
Storage temperature, T
(3)
stg
Unprogrammed device–55150
Programmed device–55150
°C
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended OperatingConditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages referenced to VSS. The JTAG fuse-blow voltage, VFB, is allowed to exceed the absolute maximum rating. The voltage is
applied to the TEST pin when blowing the JTAG fuse.
(3) Higher temperature may be applied during board soldering according to the current JEDEC J-STD-020 specification with peak reflow
temperatures not higher than classified on the device label on the shipping boxes or reels.
5.2ESD Ratings
VALUEUNIT
V
Electrostatic discharge
(ESD)
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001
Charged-device model (CDM), per JEDEC specification JESD22-C101
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. Pins listed as
±1000 V may actually have higher performance.
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. Pins listed as ±250 V
may actually have higher performance.
(1)
(2)
±1000
±250
V
5.3Recommended Operating Conditions
Typical values are specified at VCC= 3.3 V and TA= 25°C (unless otherwise noted)
Note:Minimum processor frequency is defined by system clock. Flash program or erase operations require a minimum V
of 2.2 V.
CC
Figure 5-1. Safe Operating Area
5.4Active Mode Supply Current Into VCCExcluding External Current
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
I
AM,1MHz
PARAMETERTEST CONDITIONSV
f
= f
Active mode (AM)
current at 1 MHz
MCLK
= 0 Hz,
= f
DCO
f
ACLK
Program executes in flash,
BCSCTL1 = CALBC1_1MHZ,
DCOCTL = CALDCO_1MHZ,
SMCLK
= 1 MHz,
CC
2.2 V230
3 V330420
CPUOFF = 0, SCG0 = 0, SCG1 = 0,
OSCOFF = 0
(1) All inputs are tied to 0 V or to VCC. Outputs do not source or sink any current.
(2) The currents are characterized with a Micro Crystal CC4V-T1A SMD crystal with a load capacitance of 9 pF. The internal and external
load capacitance is chosen to closely match the required 9 pF.
5.6Low-Power Mode Supply Currents (Into VCC) Excluding External Current
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
I
LPM0,1MHz
PARAMETERTEST CONDITIONST
f
= 0 MHz,
MCLK
f
= f
= 1 MHz,
DCO
= 32768 Hz,
Low-power mode 0
(LPM0) current
(3)
SMCLK
f
ACLK
BCSCTL1 = CALBC1_1MHZ,
DCOCTL = CALDCO_1MHZ,
A
25°C2.2 V56µA
CPUOFF = 1, SCG0 = 0, SCG1 = 0,
OSCOFF = 0
f
I
LPM2
Low-power mode 2
(LPM2) current
(4)
= f
MCLK
f
= 1 MHz,
DCO
f
= 32768 Hz,
ACLK
BCSCTL1 = CALBC1_1MHZ,
DCOCTL = CALDCO_1MHZ,
SMCLK
= 0 MHz,
25°C2.2 V22µA
CPUOFF = 1, SCG0 = 0, SCG1 = 1,
OSCOFF = 0
f
= f
I
LPM3,LFXT1
Low-power mode 3
(LPM3) current
(4)
DCO
f
ACLK
CPUOFF = 1, SCG0 = 1, SCG1 = 1,
= f
MCLK
= 32768 Hz,
SMCLK
= 0 MHz,
25°C2.2 V0.71.5µA
OSCOFF = 0
f
= f
I
LPM3,VLO
Low-power mode 3
current, (LPM3)
(4)
DCO
f
ACLK
CPUOFF = 1, SCG0 = 1, SCG1 = 1,
= f
MCLK
from internal LF oscillator (VLO),
SMCLK
= 0 MHz,
25°C2.2 V0.50.7µA
OSCOFF = 0
f
= f
I
LPM4
Low-power mode 4
(LPM4) current
(5)
MCLK
= 0 Hz,
= f
DCO
f
ACLK
CPUOFF = 1, SCG0 = 1, SCG1 = 1,
OSCOFF = 1
SMCLK
= 0 MHz,
25°C
85°C0.81.7
(1) All inputs are tied to 0 V or to VCC. Outputs do not source or sink any current.
(2) The currents are characterized with a Micro Crystal CC4V-T1A SMD crystal with a load capacitance of 9 pF. The internal and external
load capacitance is chosen to closely match the required 9 pF.
(3) Current for brownout and WDT clocked by SMCLK included.
(4) Current for brownout and WDT clocked by ACLK included.
(5) Current for brownout included.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
V
Positive-going input threshold voltage
IT+
V
Negative-going input threshold voltage
IT–
V
Input voltage hysteresis (V
hys
R
Pullup or pulldown resistor
Pull
C
Input capacitanceVIN= VSSor V
I
IT+
– V
)3 V0.31V
IT–
For pullup: VIN= V
For pulldown: VIN= V
SS
CC
CC
CC
3 V1.352.25
3 V0.751.65
3 V203550kΩ
MINTYPMAX UNIT
0.45 V
0.25 V
CC
CC
0.75 V
0.55 V
5pF
CC
CC
5.10 Leakage Current, Ports Px
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
I
lkg(Px.y)
PARAMETERTEST CONDITIONSV
High-impedance leakage currentSee
(1) (2)
CC
3 V±50nA
(1) The leakage current is measured with VSSor VCCapplied to the corresponding pins, unless otherwise noted.
(2) The leakage of the digital port pins is measured individually. The port pin is selected for input and the pullup/pulldown resistor is
disabled.
MINMAX UNIT
V
V
5.11 Outputs, Ports Px
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
V
V
High-level output voltageI
OH
Low-level output voltageI
OL
(1) The maximum total current, I
specified.
(OHmax)
and I
= –6 mA
(OHmax)
= 6 mA
(OLmax)
, for all outputs combined should not exceed ±48 mA to hold the maximum voltage drop
(OLmax)
(1)
(1)
CC
3 VVCC– 0.3V
3 VVSS+ 0.3V
MINTYPMAX UNIT
5.12 Output Frequency, Ports Px
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
f
Px.y
f
Port_CLK
PARAMETERTEST CONDITIONSV
Port output frequency (with load)Px.y, CL= 20 pF, RL= 1 kΩ
Clock output frequencyPx.y, CL= 20 pF
(2)
(1) (2)
CC
3 V12MHz
3 V16MHz
(1) A resistive divider with two 50-kΩ resistors between VCCand VSSis used as load. The output is connected to the center tap of the
divider.
(2) The output voltage reaches at least 10% and 90% VCCat the specified toggle frequency.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETER
V
CC(start)
V
(B_IT–)
V
hys(B_IT–)
t
d(BOR)
t
(reset)
See Figure 5-12dVCC/dt ≤ 3 V/s0.7 V
See Figure 5-12 through Figure 5-14dVCC/dt ≤ 3 V/s1.35V
See Figure 5-12dVCC/dt ≤ 3 V/s140mV
See Figure 5-122000µs
Pulse duration needed at RST/NMI pin to accepted
reset internally
(1) The current consumption of the brownout module is already included in the ICCcurrent consumption data. The voltage level V
V
hys(B_IT–)
(2) During power up, the CPU begins code execution following a period of t
must not be changed until VCC≥ V
is ≤ 1.8 V.
CC(min)
, where V
is the minimum supply voltage for the desired operating frequency.
CC(min)
TEST
CONDITIONS
d(BOR)
V
CC
MINTYPMAXUNIT
(B_IT--)
2.2 V2µs
after VCC= V
(B_IT–)
+ V
. The default DCO settings
hys(B_IT–)
(B_IT–)
V
+
Figure 5-12. POR and BOR vs Supply Voltage
Figure 5-13. V
CC(drop)
Level With a Square Voltage Drop to Generate a POR or BOR Signal
(1) To improve EMI on the XT1 oscillator, the following guidelines should be observed.
• Keep the trace between the device and the crystal as short as possible.
• Design a good ground plane around the oscillator pins.
• Prevent crosstalk from other clock or data lines into oscillator pins XIN and XOUT.
• Avoid running PCB traces underneath or adjacent to the XIN and XOUT pins.
• Use assembly materials and processes that avoid any parasitic load on the oscillator XIN and XOUT pins.
• If conformal coating is used, make sure that it does not induce capacitive or resistive leakage between the oscillator pins.
• Do not route the XOUT line to the JTAG header to support the serial programming adapter as shown in other documentation. This
signal is no longer required for the serial programming adapter.
(2) Includes parasitic bond and package capacitance (approximately 2 pF per pin).
Because the PCB adds additional capacitance, verify the correct load by measuring the ACLK frequency. For a correct setup, the
effective load capacitance should always match the specification of the used crystal.
(3) Frequencies below the MIN specification set the fault flag. Frequencies above the MAX specification do not set the fault flag.
Frequencies in between might set the flag.
(4) Measured with logic-level input frequency but also applies to operation with crystals.
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)
PARAMETERTEST CONDITIONSV
f
USCI
f
max,BITCLK
t
τ
USCI input clock frequencySMCLK, duty cycle = 50% ±10%f
Maximum BITCLK clock frequency
(equals baud rate in MBaud)
UART receive deglitch time
(1)
(2)
3 V2MHz
3 V50100600ns
(1) The DCO wake-up time must be considered in LPM3 and LPM4 for baud rates above 1 MHz.
(2) Pulses on the UART receive input (UCxRX) shorter than the UART receive deglitch time are suppressed. To ensure that pulses are
correctly recognized, their duration should exceed the maximum specification of the deglitch time.
MINTYPMAX UNIT
CC
SYSTEM
MHz
5.26 USCI (SPI Master Mode)
over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) (see Figure 5-16
and Figure 5-17)
f
USCI
t
SU,MI
t
HD,MI
t
VALID,MO
PARAMETERTEST CONDITIONSV
CC
USCI input clock frequencySMCLK, duty cycle = 50% ±10%f
SOMI input data setup time3 V75ns
SOMI input data hold time3 V0ns
SIMO output data valid timeUCLK edge to SIMO valid, CL= 20 pF3 V20ns