The INA217 is a low-noise, low-distortion, monolithic instrumentation amplifier. Current-feedback circuitry allows the
INA217 to achieve wide bandwidth and excellent dynamic
response over a wide range of gain. The INA217 is ideal for
low-level audio signals such as balanced low-impedance
microphones. Many industrial, instrumentation, and medical
applications also benefit from its low noise and wide bandwidth.
Unique distortion cancellation circuitry reduces distortion to
extremely low levels, even in high gain. The INA217 provides
near-theoretical noise performance for 200Ω source impedance. The INA217 features differential input, low noise, and
low distortion that provides superior performance in professional microphone amplifier applications.
The INA217 features wide supply voltage, excellent output
voltage swing, and high output current drive, making it an
optimal candidate for use in high-level audio stages.
The INA217 is available in the same DIP-8 and SOL-16 wide
body packages and pinouts as the SSM2017. For a smaller
package, see the INA163 in SO-14 narrow. The INA217 is
specified over the temperature range of –40°C to +85°C.
5kΩ
8
RG
2
3
VIN+
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Supply Voltage, V+ to V–.................................................................. ±18V
Signal Input Terminals, Voltage
Output Short-Circuit
Operating Temperature .................................................. –55°C to +125°C
Storage Temperature ..................................................... –55°C to +150°C
Junction Temperature .................................................................... +150°C
Lead Temperature (soldering, 10s)............................................... +300°C
NOTES: (1) Stresses above these ratings may cause permanent damage.
Exposure to absolute maximum conditions for extended periods may degrade
device reliability. (2) Input terminals are diode-clamped to the power-supply
rails. Input signals that can swing more than 0.5V beyond the supply rails
should be current limited to 10mA or less. (3) Short-circuit to ground, one
amplifier per package.
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling
and installation procedures can cause damage.
ESD damage can range from subtle performance degradation
to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric
changes could cause the device not to meet its published
specifications.
PACKAGE/ORDERING INFORMATION
PRODUCTPACKAGE-LEADDESIGNATORMARKING
INA217SOL-16DWINA217
INA217DIP-8PINA217
NOTES: (1) For the most current package and ordering information, see the
Package Option Addendum at the end of this document, or see the TI website
at www.ti.com.
(1)
PACKAGEPACKAGE
PIN CONFIGURATIONS
Top View
16
NC
15
RG
2
14
NC
13
V+
12
NC
11
V
OUT
10
REF
9
NC
RG
V
V
NC
NC
IN
IN
NC
V–
NC
1
2
1
3
4
–
5
+
6
7
8
RG
VIN–
V
IN
V–
1
1
2
3
+
4
DIP-8
8
RG
2
7
V+
6
V
OUT
5
REF
SOL-16
NC = No Internal Connection
2
www.ti.com
INA217
SBOS247B
ELECTRICAL CHARACTERISTICS: VS = ±15V
Boldface limits apply over the specified temperature range, TA = –40°C to +85°C.
TA = +25°C, RL = 2kΩ, VS = ±15V, unless otherwise noted.
INA217
PARAMETERCONDITIONSMINTYPMAXUNITS
GAIN EQUATIONG = 1 + 10k/R
Range1 to 10000V/V
Gain Error, G = 1±0.1±0.25%
G = 10±0.2±0.7%
G = 100±0.2%
G = 1000±0.5%
Gain Temp Drift Coefficient, G = 1
G > 10
Nonlinearity, G = 1±0.0003% of FS
G = 100±0.0006% of FS
INPUT STAGE NOISE
Voltage NoiseR
f
= 1kHz1.3nV/
O
fO = 100Hz1.5nV/
SOURCE
= 0Ω
fO = 10Hz3.5nV/
Current Noise
f
= 1kHz0.8pA/
O
OUTPUT STAGE NOISE
Voltage Noise, f
= 1kHz90nV/
O
INPUT OFFSET VOLTAGE
Input Offset VoltageV
vs TemperatureT
vs Power SupplyV
= V
CM
A
= ±4.5V to ±18V1 + 50/G3 + 200/GµV/V
S
= 0V50 + 2000/G250 + 5000/GµV
OUT
= T
MIN
to T
MAX
1 + 20/GµV/°C
INPUT VOLTAGE RANGE
Common-Mode Voltage RangeV
Common-Mode Rejection, G = 1V
G = 100100116dB
+ – VIN– = 0V(V+) – 4(V+) – 3V
IN
V
+ – VIN– = 0V(V–) + 4(V–) + 3V
IN
= ±11V, R
CM
= 0Ω7080dB
SRC
INPUT BIAS CURRENT
Initial Bias Current212µA
vs Temperature10nA/
Initial Offset Current0.11µA
vs Temperature0.5nA/
INPUT IMPEDANCE
Differential60 2MΩ pF
Common-Mode60 2MΩ pF
DYNAMIC RESPONSE
Bandwidth, Small Signal, –3dB, G = 13.4MHz
G = 100800kHz
Slew Rate15V/µs
THD+Noise, f = 1kHzG = 1000.004%
Settling Time, 0.1%G = 100, 10V Step2µs