Texas Instruments CY74FCT2827CTQCT, CY74FCT2827CTQC, CY74FCT2827ATQCT, CY74FCT2827ATQC Datasheet

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CY74FCT2827T

SCCS045 - May 1994 - Revised March 2000

Data sheet acquired from Cypress Semiconductor Corporation.
Data sheet modified to remove devices not offered.

Copyright © 2000, Texas Instruments Incorporated

1CY74FCT2827T

Features

• Function and pinout compatible with FCT, F, and
AM29827 logic

• FCT-C speed at 5.0 ns max. (Com’l),
FCT-A speed at 8.0 ns max. (Com’l)

• 25Ωoutputseriesresistorstoreducetransmissionline
reflection noise

• Reduced V

OH

(typically = 3.3V) versions of equivalent

FCT functions

• Edge-rate control circuitry for significantly improved
noise characteristics

• Power-off disable feature

• ESD > 2000V

• Matched rise and fall times

• Fully compatible with TTL input and output logic levels

• Extended commercial temp. range of –40˚C to +85˚C

• Sink current 12 mA
Source current 15 mA

Functional Description

The FCT2827T 10-bit bus driver provides high-performance
bus interface buffering for wide data/address paths or buses
carrying parity. This 10-bit buffer has NAND-ed output enables for
maximum control flexibility. The FCT2827T is designed for
high-capacitance load drive capability, while providing low-capaci­tance bus loading at both inputs and outputs. All inputs have clamp
diodesandalloutputsaredesignedf orlow-capacitancebusloading
in the high impedance state. On-chip termination resistors have
been added to the outputs to reduce system noise caused by re­flections. The FCT2827T can be used to replace the FCT827T to
reduce noise in an existing design.

The outputs are designed with a power-off disable feature to
allow for live insertion of boards.

Logic Block Diagram

Pin Configurations

FCT2827T–3

Y

0

OE

1

Y1Y2Y3Y4Y

5

Y8Y

9

Y6Y

7

D0D1D2D3D4D

5

D8D

9

D6D

7

OE

2

1
2
3
4
5
6
7
8
9
10
11
12

16

17

18

19

20

24
23
22
21

13

14

V

CC

FCT2827T–2

15

SOIC/QSOP

Top View

OE

1

D

1

D

2

D

3

D

4

D

5

D

6

D

7

D

8

Y

1

Y

2

Y

3

Y

4

Y

5

Y

6

Y

7

Y

8

GND

D

0

D

9

Y

0

Y

9

OE

2

Function Table

[1]

Inputs Outputs

FunctionOE

1

OE

2

D Y

L
L

L
L

L
H

L

H

Transparent

H
X

X
H

X
X

Z
Z

Three-State

Note:

1. H = HIGH Voltage Level. L = LOW Voltage Level. X = Don’t Care.

CY74FCT2827T

2

Maximum Ratings

[2, 3]

(Above which the useful life may be impaired. For user guide­lines, not tested.)

Storage Temperature .................................–65°C to +150°C

Ambient Temperature with

Power Applied.............................................–65°C to +135°C

Supply Voltage to Ground Potential............... –0.5V to +7.0V

DC Input Voltage............................................–0.5V to +7.0V

DC Output Voltage......................................... –0.5V to +7.0V

DC Output Current (Maximum Sink Current/Pin) ......120 mA

Power Dissipation..........................................................0.5W

Static Discharge Voltage............................................>2001V

(per MIL-STD-883, Method 3015)

Operating Range

Range

Ambient

Temperature V

CC

Commercial –40°C to +85°C 5V ± 5%

Electrical Characteristics Over the Operating Range

Parameter Description Test Conditions Min. Typ.

[4]

Max. Unit

V

OH

Output HIGH Voltage VCC= Min., IOH= –15 mA 2.4 3.3 V

V

OL

Output LOW Voltage VCC= Min., IOL= 12 mA 0.3 0.55 V

R

OUT

Output Resistance VCC= Min., IOL= 12 mA 20 25 40 Ω

V

IH

Input HIGH Voltage 2.0 V

V

IL

Input LOW Voltage 0.8 V

V

H

Hysteresis

[5]

All inputs 0.2 V

V

IK

Input Clamp Diode Voltage VCC= Min., IIN= –18 mA –0.7 –1.2 V

I

I

Input HIGH Current VCC= Max., VIN= V

CC

5 µA

I

IH

Input HIGH Current VCC= Max., VIN= 2.7V ±1 µA

I

IL

Input LOW Current VCC= Max., VIN= 0.5V ±1 µA

I

OZH

Off State HIGH-Level Output
Current

VCC= Max., V

OUT

= 2.7V 10 µA

I

OZL

Off State LOW-Level
Output Current

VCC = Max., V

OUT

= 0.5V –10 µA

I

OS

Output Short Circuit Current

[6]

VCC= Max., V

OUT

= 0.0V –60 –120 –225 mA

I

OFF

Power-Off Disable VCC= 0V, V

OUT

= 4.5V ±1 µA

Capacitance

[5]

Parameter Description Typ.

[4]

Max. Unit

C

IN

Input Capacitance 5 10 pF

C

OUT

Output Capacitance 9 12 pF

Notes:

2. Unless otherwise noted, these limits are over the operating free-air temperature range.

3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V

CC

or ground.

4. Typical values are at V

CC

=5.0V, TA=+25˚C ambient.

5. This parameter is specified but not tested.

6. Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus and/or sample
and hold techniques are preferable in order to minimize internal chip heating and more accurately reflect operational values. Otherwise prolonged shorting of
a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parametric tests. In any sequence of parameter
tests, I

OS

tests should be performed last.