CY74FCT257T
2
Maximum Ratings
[2,3]
(Above which the useful life may be impaired. For user
guidelines, not tested.)
Storage Temperature .....................................−65°C to +150°C
Ambient Temperature with
Power Applied..................................................−65°C to +135°C
Supply Voltage to Ground Potential..................−0.5V to +7.0V
DC Input Voltage .................................................−0.5V to +7.0V
DC Output Voltage ..............................................−0.5V to +7.0V
DC Output Current (Maximum Sink Current/Pin) ......120 mA
Power Dissipation..........................................................0.5W
Static Discharge Voltage............................................>2001V
(per MIL-STD-883, Method 3015)
Operating Range
Range Range
Ambient
Temperature V
CC
Commercial All −40°C to +85°C 5V ± 5%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions Min. Typ.
[4]
Max. Unit
V
OH
Output HIGH Voltage VCC=Min., IOH=−32 mA 2.0 V
V
OL
Output LOW Voltage VCC=Min., IOL=64 mA 0.3 0.55 V
V
IH
Input HIGH Voltage 2.0 V
V
IL
Input LOW Voltage 0.8 V
V
H
Hysteresis
[5]
All inputs 0.2 V
V
IK
Input Clamp Diode Voltage VCC=Min., IIN=−18 mA −0.7 −1.2 V
I
I
Input HIGH Current VCC=Max., VIN=V
CC
5 µA
I
IH
Input HIGH Current VCC=Max., VIN=2.7V ±1 µA
I
IL
Input LOW Current VCC=Max., VIN=0.5V ±1 µA
I
OZH
Off State HIGH-Level Output Current VCC= Max., V
OUT
= 2.7V 10 µA
I
OZL
Off State LOW-Level
Output Current
VCC = Max., V
OUT
= 0.5V −10 µA
I
OS
Output Short Circuit Current
[6]
VCC=Max., V
OUT
=0.0V −60 −120 −225 mA
I
OFF
Power-Off Disable VCC=0V, V
OUT
=4.5V ±1 µA
Capacitance
[5]
Parameter Description Typ.
[4]
Max. Unit
C
IN
Input Capacitance 5 10 pF
C
OUT
Output Capacitance 9 12 pF
Notes:
2. Unless otherwise noted, these limits are over the operating free-air temperature range.
3. Unused inputs must always be connected to an appropriate logic voltage level, preferably either V
CC
or ground.
4. Typical values are at V
CC
=5.0V, TA=+25˚C ambient.
5. This parameter is specified but not tested.
6. Not morethanone output should beshorted ata time. Duration ofshort should notexceed one second. Theuse of high-speed test apparatusand/or sample
and holdtechniques are preferableinorder to minimize internalchipheating and more accuratelyreflect operational values.Otherwise prolonged shorting of
a high output mayraise the chip temperature well above normal and therebycauseinvalid readings in other parametric tests. In anysequence of parameter
tests, I
OS
tests should be performed last.