Note: x = MA for PDIP or MS for LIFETIME LITHIUM module.
5/99 E
1
Negative
Supply
Tolerance
bq4015/Y
Functional Description
When power is valid, the bq4015/Y operates as a stan
dard CMOS SRAM. During power-down and power-up
cycles, the bq4015/Y acts as a nonvolatile memory, auto
matically protecting and preserving the memory con
tents.
Power-down/power-up control circuitry constantly moni
tors the V
V
. The bq4015 monitors for V
PFD
use in systems with 5% supply tolerance. The bq4015Y
monitors for V
with 10% supply tolerance.
When V
automatically write-protects the data. All outputs be
come high impedance, and all inputs are treated as
“don’t care.” If a valid access is in process at the time of
power-fail detection, the memory cycle continues to com
pletion. If the memory cycle fails to terminate within
time t
WPT
supply for a power-fail-detect threshold
CC
= 4.37V typical for use in systems
PFD
falls below the V
CC
, write-protection takes place.
= 4.62V typical for
PFD
threshold, the SRAM
PFD
Block Diagram
As V
circuitry switches to the internal lithium backup supply,
which provides data retention until valid V
-
When V
cell voltage, the supply is switched back to V
V
continues for a time t
processor stabilization. Normal memory operation may
resume after this time.
The internal coin cells used by the bq4015/Y have an ex
tremely long shelf life and provide data retention for
more than 10 years in the absence of system power.
As shipped from Unitrode, the integral lithium cells of
the MT-type module are electrically isolated from the
memory. (Self-discharge in this condition is approxi
mately 0.5% per year.) Following the first application of
V
provides data retention on subsequent power-downs.
The LIFETIME LITHIUM package option is shipped as
two parts.
falls past V
CC
returns to a level above the internal backup
CC
ramps above the V
CC
, this isolation is broken, and the lithium backup
CC
and approaches 3V, the control
PFD
is applied.
CC
threshold, write-protection
PFD
(120ms maximum) to allow for
CER
. After
CC
-
-
OE
WE
Power
CE
1024K x 8
SRAM
Block
Power-Fail
Control
CE
CON
Lithium
Cell
2
A
0–A18
DQ0–DQ
V
CC
7
BD4015.eps
bq4015/Y
Truth Table
ModeCEWEOEI/O OperationPower
Not selectedHXXHigh ZStandby
Output disableLHHHigh ZActive
ReadLHLD
WriteLLXD
OUT
IN
Absolute Maximum Ratings
SymbolParameterValueUnitConditions
V
CC
V
T
T
OPR
T
STG
T
BIAS
T
SOLDER
Note:Permanent device damage may occur if Absolute Maximum Ratings are exceeded. Functional operation
DC voltage applied on VCCrelative to V
SS
DC voltage applied on any pin excluding V
relative to V
SS
Operating temperature
Storage temperature
Temperature under bias
CC
-0.3 to 7.0V
-0.3 to 7.0V
V
T
0 to +70°CCommercial
-40 to +85°CIndustrial “N”
-40 to +70°CCommercial
-40 to +85°CIndustrial “N”
-10 to +70°CCommercial
-40 to +85°CIndustrial “N”
Soldering temperature+260°CFor 10 seconds
should be limited to the Recommended DC Operating Conditions detailed in this data sheet. Exposure to con
ditions beyond the operational limits for extended periods of time may affect device reliability.
Active
Active
V
+ 0.3
≤
CC
-
3
bq4015/Y
Recommended DC Operating Conditions (T
= T
OPR
)
A
SymbolParameterMinimumTypicalMaximumUnitNotes
V
CC
V
SS
V
IL
V
IH
Supply voltage
Supply voltage000V
Input low voltage-0.3-0.8V
Input high voltage2.2-VCC+ 0.3V
4.55.05.5Vbq4015Y
4.755.05.5Vbq4015
Note:Typical values indicate operation at TA= 25°C.