The M48T254V TIMEKEEPER
8 non-volatile static RAM and real time clock organized as 2,097,152 words by 8 bits. The special
BGA package provides a fully i ntegrated battery
back-up memory and real time clock solution. In
the event of power instability or absence, a selfcontained battery maintains the timekeeping operation and provides power for a CMOS static RAM.
Control circuitry monitors V
protection to prevent data corruption in the memory and RTC.
RAM is a 2Mbit x
and invokes write
CC
The clock keeps track of tenths/hundredths of seconds, seconds, minutes , hou rs, day, date, month,
and year information. The last day of the month is
automatically adjusted for months with less than
31 days, including leap year correction.
The clock operates in one of two formats:
– a 12-hour mode with an AM/PM indicator; or
– a 24-hour mode
The M48T254V is a 168-ball PBGA module that integrates the RTC, the battery, and SRAM in one
package.
Figure 3. Logic DiagramTable 1. Signal Names
A0 - A20Address Inputs
DQ0 - DQ7Data Input/Output
CE
WE
OE
BL
Note: Thi s di agram is TOP VI E W perspecti ve (view through package).
12
13
14
15
16
17
18
19
20
AI04216
4/24
Figure 5. Hardware Hookup
3.3V
CE
OE
WE
M41T315V
V
CC
CEI
OE
WE
CEO
D
Q
DQ0
V
A19
A20
3.3V
OUT
3.3V
M40Z300W
V
CC
E
THS
V
SS
M40Z300W
V
CC
E
A
B
THS
V
SS
E1
E2
E3
E4
V
V
OUT
RST
BL
OUT
CON
CON
CON
CON
RST
BL
A0-A18
19
V
CC
M68Z512W
E
G
3.3V
(Not Bonded)
To Battery Monitor Circuitry
A0-A18
19
V
CC
M68Z512W
E
G
8
W
8
W
DQ0-DQ7
.1µF
DQ0-DQ7
V
.1µF
E
A0-A18
19
V
CC
M68Z512W
E
E
G
A0-A18
19
CC
M68Z512W
G
M48T254V
DQ0-DQ7
8
W
WE
OE
DQ0-DQ7
8
W
WE
OE
AI04215
5/24
M48T254V
Figure 6. M4 8T2 54V PBGA Mod ul e So lu tion (Si de / Top)
AI04214b
MAXIMUM RATING
Stressing the device ab ove the rating listed in the
“Absolute Maximum Ratings” table may cause
permanent damage to the device. These are
stress ratings only and operation of the dev ice at
these or any other conditions above those indicat-
not implied. Exposure to Absol ute Maxim um Ra ting conditions for extended periods may affect device reliability. Refer also to the
STMicroelectronics SURE Program and other relevant quality documents.
ed in the Operating sections of this specification is
Table 2. Absolute Maximum Ratings
SymbolParameterValueUnit
T
T
V
T
STG
SLD
CC
V
I
P
A
IO
O
D
Operating Temperature0 to 70°C
Storage Temperature (VCC, Oscillator Off)
Lead Solder Temperature for 10 seconds260°C
Supply Voltage (on any pin relative to Ground)–0.3 to +4.6V
Input or Output Voltages
Output Current20mA
Power Dissipation1W
–40 to 85°C
–0.3 to V
CC
+ 0.3
V
CAUTION! Negative undershoots be l ow –0.3V are not al lowed on any pin while in the Battery Back-up Mode.
6/24
DC AND AC PARAMETERS
This section summarizes the operat ing and measurement conditions, as well as the DC and AC
characteristics of the device. The parameters in
the following DC and AC Characteristic tables are
ment Conditions listed in the rel evant tables. Designers should check that the operating conditions
in their projects match the measurement conditions when using the quoted parameters.
derived from tests performed under the M easure-
Table 3. DC and AC Measurement Conditions
ParameterM41T254V
V
Supply Voltage
CC
Ambient Operating Temperature0 to 70°C
Load Capacitance (C
Input Rise and Fall Times≤ 5ns
Input Pulse Voltages0 to 3V
Input and Output Timing Ref. Voltages1.5V
Note: Out put Hi-Z is defined as the poin t where data is no l onger driven.
)
L
3.0 to 3.6V
50pF
Figure 7. AC Testing Load Circuit
M48T254V
DEVICE
645Ω
UNDER
TEST
CL = 50 pF
1.75V
AI04644
Table 4. Capacitance
Symbol
C
IN
C
OUT
(3)
C
IO
Note: 1. Effective capacitance measure d wi th power supply at 3V. Sampled only; not 100% tested.
Note: 1. Valid fo r Ambient Operating Temperature: TA = 0 to 70°C; VCC = 3.0 to 3.6V (except where noted).
Input Low Voltage–0.30.6V
IL
(2)
Input High Voltage2.2
IH
Output Low Voltage (Open Drain)
(3)
OL
Output Low Voltage
V
Output High Voltage
OH
(2)
Power Fail Deselect2.802.97V
(2)
Battery Back-up Switchover
SO
2. All vol t ages are referenced to Ground.
3. For BL
pin (Open Drain).
0V ≤ V
0V ≤ V
OUT
CE
I
= 10mA
OL
= 2.0mA
I
OL
I
= –1.0mA
OH
IN
= V
CCI
≤ V
≤ V
IH
– 0.2
CC
CC
57mA
23mA
2.4V
2.5
±4µA
±4µA
V
+ 0.3
CC
0.4V
0.4V
V
V
8/24
OPERATION MODES
READ
A READ cycle executes whenever WRITE Enable
) is high and Chip Enable (CE) is low (see Fig-
(WE
ure 8, page 10). The distinct address defined by
the 21 address inputs (A0-A20) specifies which of
the 2M bytes of data is to be accessed. Valid data
will be ac cessed by t he eight data output drivers
within the specified Access Time (t
last address input signal is stable, the CE
) after the
ACC
and OE
access times, and their respective parameters are
satisfied. When CE
t
ACC
and OE t
are not sat-
ACC
isfied, then data access times must be measured
from the more recent CE
limiting parameter being t
OE
) instead of address access.
and OE signals, with the
(for CE) or tOE (for
CO
Table 6. Operating Modes
Mode
Deselect
WRITE
READ
READ
Deselect
Deselect
Note: X = VIH or VIL; VSO = Battery B ack-up Switchover Voltage
1. See Table 8, page 13 for details.
V
V
3.0V to 3.6V
to V
SO
PFD
≤ V
SO
CC
(min)
(1)
(1)
CEOEWEDQ7-DQ0Power
V
IH
V
IL
V
IL
V
IL
XXXHigh-ZCMOS Standby
XXXHigh-ZBa ttery Back -Up
M48T254V
WRITE
WRITE Mode occurs whenever CE
nals are low (after address inputs are stable, see
Figure 9, page 10 and Figure 10, page 11). The
most recent falling edge of CE
mine when the WRITE cycle begins (the earlier,
rising edge of CE
or WE determines cycle termination). All address inputs must be kept stable
throughout the WRITE cycle. WE
active) for a minimum recovery time (t
subsequent cycle is initiated. The OE
nal should be kept high (inactive) during the
WRITE cycles to avoid bus contention. If CE
Note: 1. OE = VIH or VIL. If OE = VIH during a WRI TE cycle, the output buffers remain in a high imp edance state.
is low or the WE low transition occurs prior to or simultaneously with the CE low transition, the output buffers remain in a high
2. If WE
impedance state during this period.
tODW
tDStDH2
DATA IN
STABLE
AI05656
11/24
M48T254V
Table 7. AC Electrical Characteristics
Symbol
t
AVAV
t
AVQV
t
ELQV
t
GLQV
t
ELQX
t
AXQX
t
EHQZt
t
GHQZt
t
WLQZt
t
AVAV
t
WLWH
t
ELEH
t
AVEL
t
WHAX
t
EHAX
t
WHQX
t
DVEH
t
DVWH
t
t
COE
OD
ODO
ODW
t
t
WP
t
t
t
t
OEW
t
RC
ACC
t
CO
t
OE
t
OH
WC
AW
AH1
AH2
t
DS
READ Cycle Time100ns
Access Time100ns
Chip Enable Low to Output Valid100ns
Output Enable Low to Output Valid55ns
(2)
Chip Enable or Output Enable Low to Output Transition5ns
Output Hold from Address Change5ns
(2)
Chip Enable High to Output Hi-Z35ns
(2)
Output Enable High to Output Hi-Z35ns
(2)
Output Hi-Z from WE35ns
WRITE Cycle Time100ns
(3)
WE, CE Pulse Width70ns
Address Setup Time0ns
Address Hold Time from WE5ns
Address Hold Time from CE25ns
(2)
Output Active from WE5ns
Data Setup Time40ns
Parameter
(1)
M48T254V
Unit
MinMax
t
WHDX
t
EHDXt
t
DH1
DH2
t
t
WR
Note: 1. Valid fo r Ambient Operating Temperature: TA = 0 to 70°C; VCC = 3.0 to 3.6V (except where noted).
2. These parameters are sampled wi th a 5 pF l oad are not 100% t est ed.
is specified as the logical AND of CE and WE. tWP is measured from the la tt er of CE or WE going low to the ea rlier of CE or
3. t
WP
going high .
WE
4. t
is a function of the latter occurring edge of WE or CE.
WR
Data Hold Time from WE0ns
Data Hold Time from CE20ns
READ Recovery (Clock Access Only)20ns
RR
(4)
WRITE Recovery (Clock Access Only)20ns
12/24
Data Retention Mode
PFD
CC
(the
is
Data can be read or written only when V
greater than V
. When VCC is below V
PFD
point at which write protection occurs), the clock
registers and the SRAM are bloc ked from any access. When V
Over threshold (V
V
to battery backup (V
CC
falls below the Battery Switch
CC
), the device is switched from
SO
). RTC operation and
BAT
SRAM data are maintained via battery backup until power is stable. All control, data, and address
signals must be powered down when V
is pow-
CC
ered down.
Figure 11. Power Down/Up Mode AC Waveforms
V
CC
V
V
PFD
PFD
(max)
(min)
V
SO
tF
M48T254V
The lithium power source is designed to provide
power for RTC activity as well as RTC and RAM
data retention when V
The capa bility of this sour ce is s uffic ien t to pow er
the device continuously for th e life of the equipment into which it has been installed. For specification purposes, life expectancy is ten (10) years
at 25°C with the intern al os cillator running without
V
. The actual life expectancy will be much long-
CC
er if no battery e nergy is used (e.g., wh en V
present).
is absent or unstable.
CC
tR
CC
is
tFB
tPD
CE
DON'T CARE
tDR
Table 8. Power Down/Up Trip Points DC Characteristics
Symbol
t
REC
t
F
t
FB
t
R
t
PD
(2)
t
DR
Note: 1. Valid fo r Ambient Operating Temperature: TA = 0 to 70°C; VCC = 3.0 to 3.6V (except where noted).
2. At 25°C, V
(Requires use of three M4 T 32-BR12SH SNA PHAT
V
(max) to CE low
PFD
V
(max) to V
PFD
V
(min) to VSO VCC Fall Time
PFD
V
(min) to V
PFD
CE High to Power-Fail0µs
Expected Data Retention Time10Years
= 0V; the expected tDR is defined as cumulative time in the absence of VCC with the clock oscillator running.
CC
Parameter
(min) VCC Fall Time
PFD
(max) VCC Rise Time
PFD
(1)
®
tops .)
MinMaxUnit
40120ms
300
10
0
tREC
AI05657
µs
µs
µs
13/24
M48T254V
PHANTOM CLOCK OPERATION
Communication with the Phantom Clock is established by pattern recogn ition of a serial bit-stream
of 64 bits which must be matched by executing 64
consecutive WRITE cycles containing the proper
data on DQ0.
All accesses which occur prior to recognition of the
64-bit pattern are directed to memory.
After recognition is established, the next 64 READ
or WRITE cycles either extract or update data in
the clock while disabling the memory.
Data transfer to and from the timekeeping function
is accomplished with a serial bit-stream under control of Chip Enable (CE
WRITE Enable (WE
the C E
and OE control of the clock starts the pa ttern recognition sequence by moving the pointer to
the first bit of the 64-bit comparison register (see
Figure 12, page 15).
Next, 64 consecutive WRITE cycles are execut ed
using the CE
and WE control of the device. These
64 WRITE cycles are used only to gain access to
the clock. Therefore, any addres s to the me mory
is acceptable. However, the WRITE cycles generated to gain access to the Phantom Clock are also
writing data to a location in the mated RAM. The
preferred way to manage this requirement is to set
), Output Enable (OE), and
). Initially , a READ cycle using
aside just one address location in RAM as a Phantom Clock scratch pad.
When the first WRITE cycle is executed, it is compared to Bit 1 of the 64-bit comparison register. If
a match is found, the pointer increments to the
next location of the comparison register and
awaits the next WRITE cycle.
If a match is not found, the pointer does not advance and all subsequent WRITE cycles are ignored. If a READ cycle occurs at any t ime during
pattern recognition, the present sequence is aborted and the comparison register pointer is reset.
Pattern recognition continues for a total of 64
WRITE cycles as described above until all of the
bits in the comparison register have been
matched. With a correct match for 64-bits, the
Phantom Clock is enabled and data t ransf er t o or
from the timekeeping registers can proceed. The
next 64 cycles will cause the Phantom Clock to either receive or transmit data on DQ0, depend ing
on the level of the OE
pin or the WE pin. Cycles to
other locations outside the memory block can be
interleaved with CE
cycles without interrupting the
pattern recognition sequence or dat a transfer sequence to the Phantom Clock.
14/24
Figure 12. Comparison Register Definition
65 432
1
0
BYTE 0
7
1
M48T254V
Hex
1
0
1
0
0
10
Value
C5
BYTE 1
BYTE 2
BYTE 3
BYTE 4
BYTE 5
BYTE 6
BYTE 7
0
1
0
1
0
1
0
0
0
1
1
0
0
1
1
1
0
0
1
1
0
1
0
1
0
1
0
1
0
0
1
1
0
0
1
1
1
0
0
1
1
0
01
10
01
10
01
10
01
3A
A3
5C
C5
3A
A3
5C
AI04262
Note: The odds of t his patter n being acc i dentally du pl i cated and sending aberrant ent ri es to the RTC is less than 1 in 1019. This pattern is
sent to the clock LSB to MSB.
15/24
M48T254V
Clock Register Information
Clock information is contained in eight registers of
8 bits, each of which is sequentially accessed one
(1) bit at a time after the 64-bit pattern recognition
sequence has been completed. When updating
the clock registers, each must be handled in
groups of 8 bits. Writing and reading individual bits
within a register could produce erroneous results.
These READ/WRITE registers are defined in the
clock register map (see Table 9).
Data contained in the clock regis ters is in Binary
Coded Decimal format (BCD). Reading and writing
the registers is always accom plished by stepping
through all eight registers, starting with Bit 0 of
Register 0 and ending with Bit 7 of Register 7.
AM-PM/12/2 4 Mo de
Bit 7 of the hours register is defined as the 12-hour
or 24-hour mode select bit. When it is high, the 12hour mode is selected. In the 12-hour mo de, Bit 5
is the AM/PM bit with the logic high being “PM.” In
the 24-hour mode, Bit 5 is the second 10-hour bit
(20-23 hours).
Oscillator Bit
Bit 5 controls the oscillat or. When set to logic '0 ,'
the oscillator turns on and the RTC/calendar begins to increment.
Zero Bits
Registers 1, 2, 3, 4, 5, and 6 contain one (1) or
more bits that will always read logic '0.' When writing to these locations, either a logic '1' or '0' is acceptable.
The M48T254V automatically performs battery
voltage monitoring upon power-up, and at factoryprogrammed time intervals of at least 24 hours.
The Battery Low (BL
battery voltage is f ound to be less than approximately 2.5V. The BL
until completion of battery replacement and subsequent battery low monitoring tests, either during
the next power-up sequence or the next scheduled
24-hour interval.
If a battery low is generated during a power-up sequence, this indicates that one of the batteries is
below 2.5V and may not be ab le to maintain data
integrity in the SRAM. Data should be considered
suspect, and verified as correct. All three
SNAPHAT
®
tops should be replaced.
If a battery low indication is generated during the
24-hour interval check, this indicates that one of
the batteries is near end of lif e. However, data is
) signal will be asserted if t he
signal will remain asserted
not compromised due to the fact that a nominal
is supplied. In order to insure data integrity
V
CC
during subsequent periods of battery back-up
mode, the batteries should be replaced. The
SNAPHAT top should be replaced with valid V
CC
applied to the device.
The M48T254V onl y monitors the b atteries when
a nominal V
is applied to the device. Thus appli-
CC
cations which require extensive durations in the
battery back-up mode should be powered-up periodically (at least once every few months) in order
for this technique to be beneficial. Additionally, if a
battery low is indicated, data integrity should be
verified upon power-up via a checksum or other
technique. The BL
signal is an open d rain output
and an appropriate pull-up resistor should be chosen to control the rise time.
Note: The BL
signal is available only for the exter-
nal SRAM, not for the Real-Time Clock.
18/24
M48T254V
PART NUMBERING
Table 10. Ordering Information Scheme
Example:M48T254V–10ZA1
Device Type
M48T
Supply Voltage and Write Protect Voltage
254V = V
Speed
–10 = 100ns
= 3.0 to 3.6V; V
CC
= 2.8 to 2.97V
PFD
Package
ZA = 42.5mm x 42.5mm
(1)
(2)
, 1.27mm Ball Pitch, BGA Module
Temperature Rang e
1 = 0 to 70°C
Note: 1. The SOIC packages (SO28/SO44) require the battery/crystal package (SNAPHAT) which is ordered separately under the part num-
ber “M4T3 2-B R12SH” in plastic tube or “M4T32-BR12SHTR” in Tape and Reel form.
2. Where “Z” is the symb ol for BGA packa ges and “A” denot es 1.27mm ball pitch
For a list of available options (e.g., Speed, Package) or for further information on any aspect of this device,
please contact the ST Sales Office nearest to you.
Information furnishe d is bel i eved to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implic ation or otherwise unde r any patent or patent rights of STMicroelectronics. Specifications me ntioned in th i s publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as crit i cal component s in l i fe support devi ces or systems wi t hout express written approv al of STMicroelec tronics.
The ST log o i s registered trademark of STM i croelectronics
All other names are the property of the i r respective owners.