Siemens BC877, BC875, BC879 Datasheet

NPN Silicon Darlington Transistors BC 875
… BC 879
High current gain
Low collector-emitter saturation voltage
Complementary types: BC 876, BC 878
BC 880 (PNP)
Type Ordering CodeMarking
Pin Configuration
Package
1 2 3
BC 875 BC 877 BC 879
TO-92
C62702-C853 C62702-C854 C62702-C855
E C B
Maximum Ratings Parameter Symbol Values Unit
BC 875 BC 877
Collector-emitter voltage V Collector-base voltage VCB0 Emitter-base voltage V Collector current IC A Peak collector current ICM
CE0 V
45 60 60 80
EB0
5 1 2
BC 879
80 100
Base current IB mA100 Peak base current I Total power dissipation, T
C = 90 ˚C
BM 200
Ptot W
0.8 (1)
Junction temperature Tj ˚C Storage temperature range T
stg
150
– 65 … + 150
Thermal Resistance
Junction - ambient Junction - case
1)
For detailed information see chapter Package Outlines.
2)
If transistors with max. 4 mm lead length are fixed on PCBs with a min. 10 mm × 10 mm large copper area for the collector terminal, R
3)
Mounted on Al heat sink 15 mm × 25 mm × 0.5 mm.
thJA = 125 K/W and thus Ptot max = 1 W at TA = 25 ˚C.
Semiconductor Group 1
Rth JA 156 K/W Rth JC 75
5.91
Electrical Characteristics
A = 25 ˚C, unless otherwise specified.
at T
DC characteristics
BC 875
… BC 879
UnitValuesParameter Symbol
min. typ. max.
(BR)CE0
V
C = 50 mA
I
BC 875 BC 877 BC 879
Collector-base breakdown voltage
C = 100 µA
I
BC 875 BC 877 BC 879
(BR)CB0
V
45 60 80
60 80 100
– – –
– – –
– – –
– – –
Emitter-base breakdown voltage, IE = 100 µA V(BR)EB0 5––
ICE0 500
CE = 0.5 × VCEmax
V
Collector cutoff current
CB = VCBmax
V VCB = VCBmax, TA = 150 ˚C
I
CB0
– –
– –
100 20
DC current gain
C = 150 mA; VCE = 10 V
I IC = 500 mA; VCE = 10 V
Collector-emitter saturation voltage
IC = 500 mA, IB = 0.5 mA
C = 1 A, IB = 1 mA
I
Base-emitter saturation voltage
V
CEsat
BEsat 2.2
V
1000 2000––
– –
– –
– –
1.3
1.8
IC = 1 A; IB = 1 mA
VCollector-emitter breakdown voltage
nACollector cutoff current
nA
µA
nAEmitter cutoff current, VEB = 4 V IEB0 100 –hFE
V
AC characteristics
C = 200 mA, VCE = 5 V, f = 20 MHz
I
1)
Pulse test: t 300 µs, D 2%.
Semiconductor Group 2
f
T 150
MHzTransition frequency
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