Datasheet STPIC44L02PTR Datasheet (SGS Thomson Microelectronics)

1/21July 2003
4-CHANNEL S ERIAL-IN PARALLEL-IN LOW
SIDE PRE-FET DRIVER
DEVICES ARE CASCADABLE
INTERNAL 55V INDUCTIVE LOAD CLAMP
AND VGS PROTECTION CLAMP FOR EXTERNAL POWER FETS
SHORT-TO-BATTERY FAULT DETECTION ON ALL GATE TERMINALS
INDEPENDENT OFF-STATE OPEN-LOAD
FAULT SENSE
OVER-BATTERY-VOLTAGE LOCKOUT
PROTECTION AND FAULT REPORTING
UNDER-BATTERY VOLTAGE LOCKOUT
PROTECTION
ASYNCRONOUS OPEN-GATE FAULT FLAG
DEVICE OUTPUT CANBE WIREDOR WITH
MULTIPLE DEVICES
FAULT STATUS RETURNED THROUGH
SERIAL O UTPUT TERMINAL
INTERNAL GL OBA L POWER-ON RESET OF
DEVICE AND EXTERNAL RESET TERMINAL
HIGH IMPEDANCE CMOS COMPATIBLE
INPUTS WITH HYSTERESIS
TRANSITION FROM THE GATEOUTPUT TO
A LOW DUTY CY CLE PWM MODE WHEN A SHORTEDLOADFAULTOCCURS
DESCRIPTION
The STPIC44L02 is a low-side predriver that provides serial and parallel input interfaces to control four external FET power s w itches. It is mainly desi gned to provide low-frequency switching, inductive load applicati ons such as solenoids and relays. Fault status is available in a serial-data format. Each driver channel has independent off-state open-load detection and on-state shorted load short to battery detection. The STPIC44L02 offers a batteryover voltage and undervoltage detection and shutdown. If a fault occurs while using the STPIC44L02, the channel transitates into a low duty cycle , pulse width modulated (PWM) signal as long as the fault is present. These devices provide control of output channels through a serial input interface or a parallel input interface. A command to enable the output from
either interface enables the respective channels gate output to the external FET. The serial interface is recom mended when the number of signals between t he control device and the predriver are minimized and the speed of operation is not critical. In applications where the predriver must respond very quickly or asynchronously, the parallel input interface is recommended. For serial operation, the control device must transitate C S
from hi gh to low to activate the serial input interface. When this occurs, SDO, is enabled, fault data is latched into the serial interface, and the fault flag is refreshed. Data is clocked into the serial registers on low to high transitions of SCLK through SDI. Each string of data must con sist of at least four bits of data. In applications where multiple devices are cascaded together, t he string of data must c onsist of four bits for each device. A high data bit turns the respective output c hannel on and a low data bit turns it off. Fault data for the device is clocked out of SDO as serial input data is clocked into the device. Fault data consists of fault flags for shorted load and open load flags (bits 0-3) for each of the four output channels. Fault regist er bits are set or cleared asynchronously to ref lect the current state of the hardware. A fault must be present w hen CS
is transitated from high to low to be captured and reported in the serial fault data. New faults cannot be captured in the serial register when CS
is low. CS must be transitated high after all of the serial dat a has been clocked into the device. A low to high transition of CS transfers t he last four bits of serial data to t he
STPIC44L02
4 CHANNEL SERIAL AND PARALLEL
LOW SIDE PRE-FET DRIVER
SOP
STPIC44L02
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output buffer that puts SDO in a high im pedance state and clears and reenables the fault register. The STPIC44L02 was designed to allow the serial input interfaces of multiple devices to be cascated together to simplify the serial in terfac e of the controller. Serial input data flows through the device and is transferred out SDO following t he fault data in c as caded configurations. For parallel operation, data is transferred directly from the parallel input interface IN0-IN3 to the respective GATE(0-3) output asy nc hronous ly. SCLK or CS
is not required for parallel control. A 1 on the parallel input turns the respective channel on, where as a 0 turns it off. Note that either the serial input interface or the parallel input in terface can enable a channel. Under parallel operation, fault data must still be collected t hrough the serial data interface. The predriver monitors the drain voltage for each channel to detect shorted load or open load fault conditions, in t he on and off st ate respectively. These devices offer the option of using an internally genera ted fault reference voltage or an externally supplied fault reference voltage through V
COMP
for fault detection. The internal fault
reference is selected by c onnecting V
COMPEN
to GND and the external reference is selected by connecting V
COMPEN
to VCC. The drain voltage is compared to the fault reference when the channel is turned on to detect shorted load conditions and when t he channel is off to detect open lo ad conditions. If a fault occurs, the channel transitates into a low duty cycle , pulse width modulated (PWM) signal as long as the fault is present. Shorted load fault c onditions must be present for at least the shorted l oad deglicth time,
t
(STBDG)
, to be flagged as a fault. A fault flag is sent to the control device as well as the serial fault register bits. More detail on fault detection operation is presented in the device operation section of this datasheet.
The device provides prote ction from over battery voltage and under ba ttery voltage conditions irrespective of the state of the output channels. When the battery voltage is greater than the overvoltage threshold or les s than the undervotlage threshold, all channels are disabled and a fault flag is generated. Battery voltage f aults are not reported in the serial fault data. The outputs return to normal operation onc e the battery voltage fault has been corrected. When an over battery/under battery voltage condition occurs, the device reports the battery fault, but disables fault reporting for open and shorted load conditions. Fault reporting for open and shorted load conditions are reenabled after the battery fault condition has been corrected.
This device provides inductive transient protection on all channels. The drain voltage is clamped to protect the FET. The c lamp voltage is defined by the sum of V
CC
and turn on voltage of the external FET. The predriver also provides a gate to source voltage (V
GS
) clamp to protect the gate source terminals of the power FET from exceeding their rated voltages. An external active low RESET
is provided to clear all register and flags in the device. GATE(0-3) outputs are disabled after RESET has been pulled low.
The d ev ice provide pull-down resistors on all inputs except CS
and RESET. A pull-up resistor is
usedon CS
and RESET.
ORDERING CODES
Type Package Comments
STPIC44L02PTR SSOP24 (Tape & Reel) 1350 parts per reel
STPIC44L02
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Figure1 : Schematic Diagram
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PIN DESCRIPTION
PIN No SYMBOL I/O NAME AND FUNCTION
1FLT
I Fault Flag. FLT is a logic level open-drain output that provides a real time fault flag for
shorted-load, open-load, over-battery voltage, under-battery voltage faults. The device can be ORed with FLT terminals on other devices for interrupt handling. FLT requires an external pull-up resistor.
2 VCOMPEN I Fault reference voltage select. VCOMPEN selects the internally generated fault
reference voltage (0) or an external fault reference (1) to be used in the shorted and open load fault detection circuitry.
3 VCOMP I Fault reference voltage. VCOMP provides an external fault reference voltage for the
shorted-load and open load fault detection circuitry.
4 5 6 7
IN0 IN1 IN2 IN3
I Parallel gate driver. IN0 trough In3 are real-time controls for the gate pre drive
circuitry. They are CMOS compatible with hysteresis.
8CS
I Chip select. A high to low transition on CS enables SDO, latches fault data into the
serial interface, and refreshes FLT. When CS is high, the fault register can change fault status. On the falling edge of CS
, fault data is latched into the serial output
register and transferred using SDO and SCLK. On a low to high transition of CS
,
serial data is latched in to the output control register.
9 SDO O Serial data output. SDO is a 3-state output that transfers fault data to the controlling
device. It also passes serial input data to the next stage for cascaded operation. SDO is taken to a high-impedance state when CS
is in a high state.
10 SDI I Serial data input. Output control data is clocked into the serial register through SDI. A
1 on SDI commands a particular gate output on and a 0 turns it off.
11 SCLK I Serial clock. SCLK clocks the shift register. Serial data is clocked into SDI and serial
fault data is clocked out of SDO on the falling edge of the serial clock.
12 V
CC
I Logic Supply Voltage
13 GND I Ground 14
16 19 21
DRAIN0 DRAIN1 DRAIN2 DRAIN3
I FET drain inputs. DRAIN0 through DRAIN3 are used for both open load and short
circuit fault detection at the drain of the external FETs. They are also used for inductive transient protection.
15 17 18 20
GATE0 GATE1 GATE2 GATE3
O Gate drive output. GATE0 through GATE3 outputs are derived from the V
BAT
supply
voltage. Internal clamps prevent voltages on these nodes from exceeding the VGS rating of most FETs.
22 RESET
I Reset. A high-to low transition of RESET clears all registers and flags. Gate outputs
turn off and the FLT
flag is cleared. 23 NC Not Connected 24 V
BAT
I Battery Supply Voltage
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Figure2 : Pin Configuration
ABSOLUTE MAXIMUM RATING S
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these condition is not implied.
Note 1: All voltage value are with respect to GND
RECOMMENDED OPERATING CONDITIONS
Symbol Parameter Value Unit
V
CC
Logic Supply Voltage (See Note 1)
-0.3 to 7 V
V
BAT
Battery Supply Voltage
-0.3 to 60 V
V
I
Logic Input Voltage Range
-0.3 to 7 V
V
O
Output Voltage (SDO and FLT)
-0.3 to 7 V
V
O
Output Voltage
-0.3 to 15 V
V
I
Logic Input Voltage Range
-0.3 to 7 V
V
DS
Drain to Source Voltage
-0.3 to 60 V
T
C
Operating Case Temperature Range
-40 to +125 °C
T
J
Maximum Junction Temperature
150 °C
T
stg
Storage Temperature Range
-40 to +150 °C
Symbol Parameter Min. Min. Max. Unit
V
CC
Logic Supply Voltage 4.5 5 5.5 V
V
BAT
Battery Supply Voltage 8 24 V
V
IH
High Level Input Voltage 0.85V
CC
V
CC
V
V
IL
Low Level Input Voltage 0 0.15V
CC
V
t
s
Set-up Time, SDI High Before SCLK 10 ns
t
h
Hold Time, SDI High After SCLK 10 ns
T
C
Operating Case Temperature -40 125 °C
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ELECTRICAL CHARACTERISTICS OVER RECOMMENDED OPERATING F REE-AIR TEMPERATURE RANGE (unless otherwise specified.)
Symbol Parameter Test Conditions Min. Typ. Max. Unit
I
BAT
Supply Current All Outputs OFF, V
BAT
= 12V 50 150 250 µA
I
CC
Supply Current All Outputs OFF, V
BAT
= 5.5V 0.5 1.5 3 mA
V
(ovsd)
Over Battery Voltage Shutdown
Gate Disabled (see figure 21) 32 34 36 V
V
hys(ov)
Over Battery Voltage Reset Hysteresys
0.1 0.3 0.5 V
V
(uvsd)
Under Battery Voltage Shutdown
Gate Disabled (see figure 20) 4.1 4.8 5.4 V
V
hys(uv)
Under Battery Voltage Reset Hysteresys
50 150 300 mV
V
G
Gate Drive Voltage V
BAT
=8to24V IO=100µA 7 13.5 V
V
BAT
= 5.5 to 8V IO=100µA5 8V
I
O(H)
Maximum Current Output For Drive Terminal Pull-Up
VO= GND 0.5 1.8 2.5 mA
I
O(L)
Maximum Current Output For Drive Terminal Pull-Down
V
O
= 7V 0.5 1.2 2.5 mA
V
(stb)
Short to Battery, Shorted Load, Open Load Detection Voltage
V
COMPEN
= L 1.1 1.25 1.4 V
V
hys(stb)
Short to Battery Hysteresys 30 mV
V
D(open)
Open Load OFF State Detection Voltage Threshold
V
COMPEN
= L 1.1 1.25 1.4 V
V
hys(open)
Open Load Hysteresys 60 mV
I
I(open)
Open Load Off State Detection Current
V
DRAIN=VREF
= 1.25V 30 60 80 µA
V
DRAIN
= 24V (see figure 24) 250 µA
I
I(PU)
Input Pull-up Current VCC=5V VI=0 10 µA
I
I(PD)
Input Pull-down Current VCC=5V VI=5V 10 µA
V
hys
Input Voltage Hysteresys VCC= 5V 0.6 0.85 1.1 V
V
O(SH)
High Level Serial Output Voltage
IO= 1mA 0.8V
CC
V
V
O(SL)
Low Level Serial Output Voltage
IO= 1mA 0.1 0.4 V
I
OZ(SD)
3-State Current Serial Data Output
VCC= 0 to 5.5V -10 1 10 µA
V
O(CFLT)
Fault Interrupt Output Voltage
IO= 1mA 0.1 0.5 V
V
I(COMP)
Fault External Reference Voltage
V
COMPEN
=H 1 3 V
V
C
Output Clamp Voltage dc < 1% tW=100µs 475563V
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SWITCHING CHARACTERISTICS (VCC=5V, V
BAT
=5V, TC= 25°C, unlessotherwise specified.)
Note 1: Thetd1is referred to the falling edge of the first clock after theCSfallsdown
Symbol Parameter Test Conditions Min. Typ. Max. Unit
t
(STBFM)
Short to Battery, Shorted Load, Open Load Fault Mask Time
(see figures 16, 17) 60 µs
t
(STBDG)
Short to Battery, Shorted Load, Deglitch Time
(see figures 16, 17) 12 µs
t
PLH
Propagation Turn-On Delay Time, CS
or IN0-IN3 to
Gate0-Gate3
C
(gate)
= 400pF 3.5 µs
t
PHL
Propagation Turn-Off Delay Time, CS
or IN0-IN3 to
Gate0-Gate3
C
(gate)
= 400pF 4 µs
t
r1
Rise Time, Gate0-Gate3 C
(gate)
= 400pF 1.5 µs
t
f1
Fall Time, Gate0-Gate3 C
(gate)
= 400pF 2 µs
f
(SCLK)
Serial Clock Frequency 10 MHz
t
rf(SB)
Refresh Time Short to Battery
(see figure 16) 10 ms
t
W)
Refresh pulse width Short to Battery
(see figure 16) 68 µs
t
su1
Setup Time CS to SCLK (see note 1) (see figure 4) 10 ns
t
pd1
Propagation Delay Time CS to SDO Valid
R
L
=10K CL= 200pF
(see figure 6)
40 ns
t
pd2
Propagation Delay Time SCLK to SDO Valid
20 ns
t
pd3
Propagation Delay Time CS to SDO 3-State
RL=10K CL= 50pF (see figure 6)
2 µs
t
r2
Rise Time, SDO 3-State to SDO Valid
RL=10KΩto GND CL= 200pF Over Battery Fault (see figure 7)
30 ns
t
f2
Fall Time, SDO 3-State to SDO Valid
RL=10KΩto GND CL= 200pF No Fault (see figure 8)
20 ns
t
r3
Rise Time, FLT RL=10K CL= 50pF
(see figure 9)
1.2 µs
t
f3
Rise Time, FLT RL=10K CL= 50pF
(see figure 9)
15 ns
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Figure3 : Switching Time
Figure4 : Setup Time CS
to SCLK ↓
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Figure5 : Propagation Delay Time
Figure6 : Propagation Delay Time
Figure7 : SDO Switching Time
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Figure8 : SDO Switching Time
Figure9 : FLT
Switching Time
PRINCIPLES OF OPERATION
SERIAL DATA OPERATION The STPIC44L02 offers serial input interface to the m icroc ontro ller to transfer cont rol data to the predriver and fault data back to the controller. The serial input interface consists of: SCLK - Serial C lock CS
- Chip Select SDI - Serial Data Input SDO - SeriaL Data Output Serial data is shifted into the least significant bit (LSB) of the SDI shift register on the rising edge of the first SCLK after CS
has t r ans it ated fro m 1 to 0.
The CS
must be transitated from 1 to 0 before the falling edge of t he first clock (see n ote 1). Four clock cycles must occur before CS transitates high for a proper control of the outputs. Less than four clock cycles result in fault data being latched into the output control buffer. Eight bits data can be shifted into the device, but the first 4 bits shifted out are always the fault dat a and the last 4 bits shifted in are always the output control data. A low-to-high transition on CS
latches the contents of the serial shift register into the output control register. A logic 0 input to SDI turns of f the corresponding parallel output and a logic 1 input t urns the output on (s ee figure 10). Data is shifted out of SDO on the falling edge of SCLK. The M SB of fault data is available after CS is transitated low. The rem aining 3 bits of fault data are shifted out in the following three clock cycles. Fault data is latched into the serial register when CS
is transitated low. A fault must be
present on the high to low transition of CS
to be
captured by the device. The CS
input mus t be transitated to a high state after t he last bit of serial data has been cloc k ed into the device. The rising edge of CS
inhibit SDI puts SDO into a high impedance s tate, latches the 4 bits of serial data into the output control register, and clears and reenables the serial fa ult regist ers (see figure 11). When a shorted load condit ion occurs, the device automatically retries the output and the fault clears after the fault condition has been corrected.
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Figure10 : Serial Programming Example
Figure11 : 8-Bit Serial Programming Example (single devi ce)
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Figure12 : 8-Bit S erial Programming Example (two predrivers cascated)
Figure13 : Fault Reading Example
PARALLEL INPUT DATA OPERATION In addition to th e serial interface the STPIC44L02 also provid es a pa rallel interface to the microcontroller. The output turns on when either the parallel or the serial interface make it turn on. The parallel data terminals are real t ime control inputs for t he outputs drivers. SCLK and CS
are not required to transfer parallel input data to the output buffer. Fault data must be read over the serial data bus as de scribed in the serial data operation section of this datasheet (see figure 13). The parallel input must be transitated low and then high to clear and reenable a gate output after it has been disabled due to a s horted load fault condition. CHIPSET PERFORMANCE UNDER FAULT CONDITIONS The STPIC44L02 and power FET arrays are designed for normal operation over a battery
voltage range of 8V to 24V with load fault detection from 4.8V to 34V. It offers onboard fault detection to handle a va riety of faults that may occur within a system. The circuits primary function is to prevent damage to the load and the power FETs in the event that a fault occurs.
Note that unused DRAIN0-DRAIN3 inputs must be connected to V
BAT
through a pull-up resistor to prevent false reporting of open load fault conditions. The circuitry detects the fault, shuts off the output to the FET and reports t he fault to the microcontroller. The primary faults under consideration are:
1) Shorted Load
2) Open Load
3) over battery voltage shutdown
4) Under battery voltage shutdown. SHORTED LOAD FAULT CONDITION
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The STPIC44L02 monitors the drai n voltage of each channel to detect shorted load conditions. The onboard deglitch timer starts runn ing when the gat e output to the power FET transitates from the off state to the on state. The timer provides a 60µs deglitch time, t
(STBFM)
,toallowthedrain voltage to stabilize after the power FET has been turned on (see figure 16 and 17). The deglitch delay time is only enabled for t he first 60µs after the FET has been turned on. After the deglitch delay time, the drain voltage is checked to verify that it is le ss th an the fault reference voltage. When it is greater than the reference voltage for at least the short to battery deglitch time, t
(STBDG)
FLT f lags the microcontroller that a fault condition exists and gate output is automatically shut off until the error condition has been corrected. An overheating condition on the FET occurs when the controller co ntinually tries to reenable the output under shorted load fault conditions. When a
shorted load fault is de tect ed, the gate output is transitated into a low duty cycle PWM signal to protect the FET f rom overheating. The PWM rate is defined as t
(SB)
and the pul s e width is defined
as t
W
. The gate output remains in this state until the f ault has been corrected or until the controller disables the gate output. The microcontroller can read the serial port on the predriver to isolate the channel that reported the fault condition. Fault bits 0-3 distingui sh faults for each of the output channels. W hen a shorted load occurs, the STPIC44L02 automatically retries the output and the fault clears after the f ault condition has been corrected. Figure 16 illustrates operation after a gate output has been t urned on. The gate to t he power FET is turned on and the deglitch timer starts running. Under normal operation, T1 turns on a nd the drain operates below the ref erence point set at U1. The output of U1 is low and a fault condition is not flagged.
Figure14 : Open Load Test Circuit
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Figure15 : Normal O perat ion
Figure16 : Shorted Load Condition (Deglitch Time)
OPEN LOAD The STPiC44L02 mo nitors the drain of each power FET for open circuit conditions that may exist. The 60µA current source is provided to monitor open load faul t conditions. Open-load faults are only detecte d when the power FET is turned o ff. When load impedance is open or substantially high, the 60µA current source has adequate drive to pull the drain of T1 below the fault reference thres hold on the detection circuit.
Unused DRAIN0-DRAIN3 inputs must be connectedtoV
BAT
through a pull-up resistor to prevent false reporting of open-load fault conditions. The on-board deglitch timer starts running when the STPiC44L 02, gate output to the power FET transitates to the off state. The timer provides a 60ms deglitch t ime, T
(STBFM)
,toallow the drain voltage to stabilize after the powerFET has been turned off. The deglitch time is only enabled for the f irst 60ms after the FET has been
STPIC44L02
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turned off. After the deglitch delay time, the drain is check ed to verify that it is greater than the fault reference voltage. When it is less than the reference voltage, a fault is f lagged to the microcontroller through FLAT that an open-load fault condition exists. The microcontroller can then read the serial port on the STPiC44L02 to isolate the channel that reported the fault condit ion. Fault bits 0-3 distinguish faults for each of the out put
channels. Figures 18 and 19 illustrate the operation of the open-load detection circuit. This feature provides useful information to the microcontrollerto isolatesystem failures and warn the operator that a problem exists. Examples of such applications woul d be a warning that a light bulb filament may be open, solenoid coils may be open, etc.
Figure17 : Open Load Short Circu it te st Circuitry
Figure18 : Normal Condition Driving Load
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Figure19 : Open Load ConditionTime
OVER-BATTERY-VOLTAGE SHUTDOW N The STPIC44L02 monitors the bat tery voltage to prevent the power FETs turning on in the event that the battery voltage is too high. This condition may occur due to voltage transients resulting from a loos e battery connection. The TPIC44L02 turns the power F ET off when the battery voltage is above 34V to prevent possible damage to the load and the FET. GATE(0-3) output goes back to normal operation after the overvoltage condition has been corrected. An ov er-battery-v oltage f ault is flagged to the controller through FLT
.The
over-battery-voltage fault is not reported in t he
serial fault word. When an over voltage condition occurs, the device reports the battery fault, but disables fault reporting for open and short ed-load conditions. Fault reporting for open and shorted-load conditions are re-ena bled after the battery fault c ondition has been corrected. When the f ault condition is removed before the CS
signal transitates low, the fault condition is not captured in the serial fault regis ter. The fault flag resets on a high-to-low transition of CS
providing that no other faults are present in the device. Figure 21 illustrates the operation of the over-b attery voltage detection circuit.
Figure20 : Under Battery Shutdown
UNDER-BATTERY-VOLTAGE SHUTDOWN The STPIC44L02 monitors the bat tery voltage to prevent the power FET s from being turned on in the event that the battery voltage is too l ow. When the battery voltage is below 4.8V, then
GATE0-GATE3 m ay not prov ide sufficient gate voltage to the power FETs to minimize the on-resistance t hat could result in a thermal stress on the FET. The output goes back to normal operation after the under voltage condition has
STPIC44L02
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been corrected. An under-battery-voltage fault is flagged to the c ontroller through FLT. The under-battery voltage fault is not reported in the serial fault word. When an under-battery-voltage condition occurs, the device reports the battery fault but di sables fault reporting for open and shorted load c onditions. When the fault condition
is removed before the CS
signal t rans itates low, the fault condition is not captured in the serial fault register. The fault flag resets on a high-to-low transition of CS
providing that no other fa ults are present in the device. Figure 21 illustrates the operation of t he under voltage detection circuit.
Figure21 : Over Battery Shutdown
INDUCTIVE VOLTAGE TRANSIENTS A typical application for the pre driver/power FET
circuit is to switch inductive loads. When an inductive load is switched off, a large voltage spike can occur. These spikes can exceed the maximum V
DS
rating for the external FET and damage the device when the proper protection is not in place. T he FET can be protected from these
transients through a varie ty of methods using external components. The STPIC44L02 offers that protection in the form of a zener diode stack connected between the DRAIN input and GATE output (see figure 22). Zener diode Z1 turns the FET on to dissipate the transient energy. GATE diode Z2 is provided to prevent the gate voltage from exceeding 13V during normal operation and transient protec tion.
Figure22 : Switching Time
EXTERNAL FAULT REF ERENCE INPUT The STPIC44L02 compares each channel drain voltage to a fault reference to det ec t shorted-load and open-load conditions. The us er has the option of using the internal generated 1.25V fault reference or providing an ext ernal reference
voltage through V
COMP
. The internal reference is
selected by connec ti ng V
COMPEN
to GND a nd
V
COMP
is selected by connecting V
COMPEN
to V
CC
(see Figure 23). Proper layout techniques should be used in the ground ing network for the V
COMP
circuit on the STPIC44L02. Th e ground for the
STPIC44L02
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predriver and V
COMP
network should be connected to a Kelvin ground if available; otherwise, they should make single-point contact
back to the power ground of the FET array. Improper grounding techniques can result in inaccuracies in detecting faults.
Figure23 : External Reference Selection
TYPICAL PERFORMANCE CHARACTE RISTICS (unless otherwise specified T
j
=25°C)
Figure24 : Open Load Off State Detection Current
V
REF
V
COMPEN
1.25V 0
V
COMP
1
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DIM.
mm. inch
MIN. TYP MAX. MIN. TYP. MAX.
A 2 0.079
A1 0.05 0.002
A2 1.65 1.75 1.85 0.065 0.069 0.073
b 0.22 0.38 0.009 0.015
c 0.09 0.25 0.004 0.010
D 7.9 8.2 8.5 0.311 0.323 0.335
E 7.4 7.8 8.2 0.291 0.307 0.323
E1 5.00 5.3 5.6 0.197 0.209 0.220
e 0.65 BSC 0.0256 BSC
K0˚ 8˚0˚ 8˚
L 0.55 0.75 0.95 0.022 0.030 0.037
SSOP24 MECHANICAL DATA
c
E
b
A2
A
E1
D
1
PIN 1 IDENTIFICATION
A1
L
K
e
0053237/C
STPIC44L02
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DIM.
mm. inch
MIN. TYP MAX. MIN. TYP. MAX.
A 330 12.992 C 12.8 13.2 0.504 0.519 D 20.2 0.795 N 60 2.362
T 22.4 0.882 Ao 8.4 8.6 0.331 0.339 Bo 8.7 8.9 0.343 0.351 Ko 2.9 3.1 0.114 0.122 Po 3.9 4.1 0.153 0.161
P 11.9 12.1 0.468 0.476
Tape & Reel SSOP24 MECHANICAL DATA
STPIC44L02
21/21
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