SGS Thomson Microelectronics M48T513Y-70PL1, M48T513Y, M48T513V Datasheet

1/23June 2000
M48T513Y M48T513V
3.3V-5V 4 Mbit (512Kb x8) TIMEKEEPERSRAM
INTEGRATED ULTRA LOW POWER SRAM,
REAL TIME CLOCK, POWER-FAIL CONTROL CIRCUIT, BATTERY, andCRYSTAL
YEAR 2000 COMPLIANT
BCD CODED CENTURY, YEAR, MONTH,
DAY, DATE, HOURS, MINUTES, and SECONDS
BATTERY LOW WARNING FLAG
AUTOMATIC POWER-FAIL CHIP DESELECT
and WRITE PROTECTION
TWO WRITE PROTECT VOLTAGES:
(V
PFD
= Power-fail Deselect Voltage)
– M48T513Y: 4.2V V
PFD
4.5V
– M48T513V: 2.7V V
PFD
3.0V
CONVENTIONAL SRAM OPERATION;
UNLIMITED WRITE CYCLES
SOFTWARE CONTROLLED CLOCK
CALIBRATION for HIGH ACCURACY APPLICATIONS
10 YEARS of DATA RETENTION and CLOCK
OPERATION in the ABSENCE of POWER
SELF CONTAINED BATTERY and CRYSTAL
in DIP PACKAGE
MICROPROCESSOR POWER-ON RESET
(Valid even during battery back-up mode)
PROGRAMMABLE ALARM OUTPUT ACTIVE
in BATTERY BACK-UP MODE
SURFACE MOUNT CHIP SET PACKAGING
INCLUDES a 44-PIN SOIC and a 32-LEAD TSOP (SNAPHAT TOP TO BE ORDERED SEPARATELY)
SOIC PACKAGE PROVIDES DIRECT
CONNECTION for a SNAPHAT TOP WHICH CONTAINS the BATTERY and CRYSTAL
SNAPHAT
HOUSING (BATTERY/CRYSTAL)
IS REPLACEABLE
Figure 1. Logic Diagram
AI02308
19
A0-A18 DQ0-DQ7
V
CC
M48T513Y M48T513V
G
V
SS
8
E
W RST
IRQ/FT
RSTIN
WDI
32
1
SOH44
Surface Mount Chip Set Solution (CS)
SNAPHAT (SH)
Battery
PMDIP32(PM)
Module
32
1
TSOP II 32
(10 x 20mm)
M48T513Y, M48T513V
2/23
Figure 2. DIP Connections
V
SS
V
CC
AI02307
M48T513Y M48T513V
10
1 2
5 6 7 8 9
11 12 13
16 17 18
30 29
26 25 24 23 22 21 20 19
3 4
28 27
32 31
14 15
34 33
36 35
A1 A0
DQ0
A7
A4 A3 A2
A6 A5
A13
A10
A8 A9
DQ7
A15
A11 G
E
DQ5DQ1
DQ2
DQ3
DQ4
DQ6
A16
A18
A12
A14
W
A17
RSTIN
RST
IRQ/FT
WDI
Table 2. Absolute Maximum Ratings
(1)
Note: 1. Stresses greater than those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. Thisis a stress
rating only and functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to the absolute maximum rating conditions for extended periods of time may affect reliability.
2. Soldering temperature not to exceed 260°C for 10 seconds (total thermal budget not to exceed 150°C for longer than 30 seconds).
CAUTION: Negative undershoots below –0.3V are not allowed on any pin while in the Battery Back-up mode.
Symbol Parameter Value Unit
T
A
Ambient Operating Temperature 0 to 70 °C
T
STG
Storage Temperature (VCCOff, Oscillator Off)
–40 to 85 °C
V
IO
Input or Output Voltages –0.3 to VCC+0.3 V
V
CC
Supply Voltage
M48T513Y –0.3 to 7.0 V M48T513V –0.3 to 4.6 V
I
O
Output Current 20 mA
P
D
Power Dissipation 1 W
DESCRIPTION
The M48T513Y/VTIMEKEEPER RAM is a 512Kb x 8 non-volatile static RAM and real time clock, with programmable alarms and a watchdog timer. The special DIP package provides a fully integrat­ed battery back-up memoryand real time clock so­lution. TheM48T513Y/V directly replaces industry standard 512Kb x 8 SRAM. It also provides the non-volatility of Flash without any requirement for special write timing or limitations on the number of writes that can be performed.
Table 1. Signal Names
A0-A18 Address Inputs
DQ0-DQ7 Data Inputs / Outputs E Chip Enable Input
G Output Enable Input
W Write Enable Input
WDI Watchdog input
RST Reset Output (open drain)
RSTIN Reset Input
IRQ/FT
Interrupt / Frequency Test Output (open drain)
V
CC
Supply Voltage
V
SS
Ground
For surface mount environments ST provides a Chip Set solution consisting of a 44 pin 330mil SOIC TIMEKEEPER Supervisor (M48T201V/Y) and a 32 pin TSOP Type II (10 x 20mm) LPSRAM (M68Z512/W) packages.
The 44 pin 330mil SOIC provides sockets with gold plated contacts at both ends for direct con­nection to a separate SNAPHAT housing contain­ing the battery.
3/23
M48T513Y, M48T513V
Figure 3. Block Diagram
AI02584
LITHIUM
CELL
OSCILLATOR AND
CLOCK CHAIN
V
PFD
V
CC
V
SS
32,768
Hz
CRYSTAL
VOLTAGE SENSE
AND
SWITCHING
CIRCUITRY
16 x
8
TIMEKEEPER
REGISTERS
524,272 x
8
SRAM ARRAY
A0-A18
DQ0-DQ7
E W G
POWER
RST IRQ/FT
WDI RSTIN
The unique design allows the SNAPHAT battery package to be mounted on top of the SOIC pack­age after the completion of the surface mount pro­cess. Insertion of the SNAPHAT housing after reflow prevents potential battery damage due to the hightemperatures required for device surface­mounting. The SNAPHAT housing is keyed to pre­vent reverse insertion.
The SNAPHAT battery package is shipped sepa­rately in plastic anti-static tubes or in Tape & Reel form. The part number is ”M4Txx-BR12SH1”.
Figure 3 illustratesthestaticmemoryarray andthe quartz controlled clock oscillator. The clock loca­tions contain the century, year, month, date, day, hour, minute, and second in 24 hour BCD format. Corrections for 28, 29 (leap year), 30, and 31 day months are made automatically. The nine clock bytes (7FFFFh-7FFF9h and 7FFF1h) are not the actual clock counters, they are memory locations consisting of BiPORTread/write memory cells within the static RAM array.
The M48T513Y/V includes a clock control circuit which updates the clock bytes with current infor­mation once per second. The information can be accessed by the user in the same manner as any
other location in the static memory array. Byte 7FFF8his the clock control register.Thisbyte con­trols user access to the clock information and also stores the clock calibration setting.
Byte 7FFF7h contains the watchdog timer setting. The watchdog timer can generate either a reset or an interrupt, depending on the state of the Watch­dogSteering bit(WDS).Bytes 7FFF6h-7FFF2h in­clude bits that, when programmed, provide for clock alarm functionality. Alarms are activated when the register content matches the month, date, hours, minutes, and seconds of the clock registers. Byte 7FFF1h contains century informa­tion.Byte 7FFF0h contains additionalflaginforma­tion pertaining to the watchdog timer, the alarm condition and the battery status. The M48T513Y/V also has its own Power-Fail Detect circuit. This control circuitry constantly monitors the supply voltage for an out of tolerance condition. When VCCis out of tolerance, the circuit write protects the TIMEKEEPER register data and external SRAM, providing data security in the midst of un­predictable system operation. As VCCfalls, the control circuitry automatically switches to the bat­tery, maintaining data and clock operation until valid power is restored.
M48T513Y, M48T513V
4/23
Figure 4. Hardware Hookup for SMT Chip Set
(1)
Note: 1. For pin connections, see individual data sheets for M48T201Y/V and M68Z512/W atwww.st.com.
2. For 5V, M48T129Y (M48T201Y + M68Z512). For 3.3V, M48T129V (M48T201V + M68Z512W).
3. SNAPHAT Top ordered separately.
AI03633
32,768
Hz
CRYSTAL
LITHIUM
CELL
A0-A18
DQ0-DQ7
E
V
CC
W G WDI RSTIN1 RSTIN2 V
SS
E W G
V
CC
V
SS
A0-A18
DQ0-DQ7
0.1µF
0.1µF
5V
ECON
GCON
RST
IRQ/FT
SQW
M48T201Y/V
(2)
M68Z512/W
(2)
V
OUT
SNAPHAT
(3)
BATTERY/CRYSTAL
READ MODE
The M48T513Y/V is in the Read Mode whenever W (Write Enable) is high and E (Chip Enable) is low. The unique address specified by the 17 Ad­dress Inputs defines which one of the 524,272 bytes of data is to be accessed. Valid data will be available at the Data I/O pins within t
AVQV
(Ad­dress Access Time) after the last address input signal is stable, providing the E and G access times are also satisfied. If the E and G access times are not met, valid data will be available after the latterof the Chip Enable Access Times (t
ELQV
)
or Output Enable Access Time (t
GLQV
).
The state of the eight three-state Data I/O signals is controlled by E and G. If the outputs are activat­ed before t
AVQV
, the data lines will be driven to an
indeterminate state until t
AVQV
. If the Address In­puts are changed while E and G remain active, output data will remain valid for t
AXQX
(Output
Data Hold Time) but will go indeterminate until the next Address Access.
WRITE MODE
The M48T513Y/V is in the Write Mode whenever W (Write Enable) and E (Chip Enable) are low state after the address inputs are stable.
The start of a write is referencedfrom the latter oc­curring falling edgeof W orE. A write is terminated by the earlierrisingedge of W or E. The addresses must be held valid throughout the cycle. E or W must return high for a minimum of t
EHAX
fromChip
Enable or t
WHAX
from Write Enable prior to the ini­tiation of another read or write cycle. Data-in must be valid t
DVWH
prior to the end of write and remain
valid for t
WHDX
afterward. G should be kept high during write cycles to avoid bus contention; al­though, if the output bus has been activated by a low on E and G a low on Wwill disable the outputs t
WLQZ
after W falls.
5/23
M48T513Y, M48T513V
Table 3. Operating Modes
(1)
Note: 1. X = VIHor V
IL;VSO
= Battery Back-up Switchover Voltage.
2. See Table 7 for details.
Mode V
CC
E G W DQ0-DQ7 Power
Deselect
4.5V to 5.5V or
3.0V to 3.6V
V
IH
X X High Z Standby
Write V
IL
XVILD
IN
Active
Read
V
IL
V
IL
V
IH
D
OUT
Active
Read
V
IL
V
IH
V
IH
High Z Active
Deselect
V
SO
to V
PFD
(min)
(2)
X X X High Z CMOS Standby
Deselect
V
SO
(2)
X X X High Z Battery Back-up Mode
Table 4. AC Measurement Conditions
Note thatOutput Hi-Z is defined as the point wheredata is no longer driven.
Input Rise and Fall Times 5ns Input Pulse Voltages 0 to 3V Input and Output Timing Ref. Voltages 1.5V
referred to as BiPORT TIMEKEEPER cells). The external copies are independent of internal functions except that they are updated periodically by the simultaneous transfer of the incremented internal copy. TIMEKEEPER and Alarm Registers store data in BCD.
DATA RETENTION MODE
With valid VCCapplied, the M48T513Y/V operates as a conventional BYTEWIDE static RAM. Should the supply voltage decay, the RAM will automati­cally deselect, write protecting itself when V
CC
falls between V
PFD
(max), V
PFD
(min) window. All outputs become high impedance and all inputsare treated as ”don’t care”.
Note: Apower failureduring a write cycle may cor­rupt data at the current addressed location, but does not jeopardize the rest of the RAM’s content. At voltages below V
PFD
(min), the memory will be in a write protected state, provided the VCCfall time is not less than tF. The M48T513Y/V may re­spond to transient noise spikes on VCCthat cross into the deselect window during the time the de­vice issampling VCC. Therefore, decouplingof the power supply lines is recommended.
When VCCdrops below VSO, the control circuit switches power to the internal battery, preserving data and powering the clock. The internal energy source will maintain data in the M48T513Y/V for an accumulated period of at least 10 years atroom temperature. As system power rises above VSO, the battery is disconnected, and the power supply is switched to external VCC. Deselect continues for t
REC
after VCCreaches V
PFD
(max). For a further more detailed review of lifetime calculations, please see Application Note AN1012.
TIMEKEEPER REGISTERS
The M48T513Y/V offers 16 internal registers which contain TIMEKEEPER, Alarm, Watchdog, Interrupt, Flag, and Control data. These registers are memory locations which contain external (user accessible) andinternal copies ofthe data (usually
Figure 5. AC Testing Load Circuit
Note: Excluding open drain output pins.
AI01803C
CL= 100pF
CLincludes JIG capacitance
650
DEVICE UNDER
TEST
1.75V
M48T513Y, M48T513V
6/23
CLOCK OPERATIONS Reading the Clock
Updates to the TIMEKEEPER registers should be halted beforeclock data is read to prevent reading data in transition. Because the BiPORT TIME­KEEPER cellsin the RAM array are only data reg­isters, and not the actual clock counters, updating the registers can be halted without disturbing the clock itself.
Updating is halted when a ’1’ is written to the READ bit, D6 in the Control Register (7FFF8h). As long as a ’1’ remains in that position, updating is halted. After a halt is issued, the registers reflect the count;thatis,the day,date, and time that were current at the moment the halt command was is­sued. All ofthe TIMEKEEPER registers are updat­ed simultaneously. A halt will not interrupt an update in progress. Updating occurs 1 second af­ter the READ bit is reset to a’0’.
Setting the Clock
Bit D7 of the Control Register (7FFF8h) is the WRITE bit. Setting the WRITE bit to a ’1’, like the READ bit, halts updates to the TIMEKEEPER reg­isters. The user can then load them with the cor­rect day, date, and time data in 24 hour BCD format (see Table 11).
Resetting the WRITE bit to a ’0’then transfers the values of all time registers (7FFFFh-7FFF9h, 7FFF1h) to theactual TIMEKEEPER counters and allows normal operation to resume. After the WRITE bit isreset, thenextclockupdate willoccur approximately one second later.
Note: Upon power-up following a power failure, both the WRITE bit and the READ bit will be reset to ’0’.
Stopping and Starting the Oscillator
The oscillator may be stopped at any time. If the device is going to spend a significant amount of time on the shelf, the oscillator can be turned off to minimize current drain on the battery. The STOP bit is located at Bit D7 within 7FFF9h. Setting it to a ’1’ stops the oscillator. When reset to a ’0’, the M48T513Y/V oscillator starts within one second.
Note: It is not necessary to set the WRITE bit when setting orresetting the FREQUENCY TEST bit (FT) or the STOP bit (ST).
SETTING ALARM CLOCK
Registers 7FFF6h-7FFF2h contain the alarm set­tings. The alarm can be configured to go off at a prescribed time on a specific month, date, hour, minute, or second or repeat every month, day, hour, minute, or second. It can also be pro­grammed to go off while the M48T513Y/V is in the battery back-upto serveasa systemwake-upcall.
Bits RPT5-RPT1 putthe alarm in the repeat mode of operation. Table 12 shows the possible config­urations.Codes not listedin the tabledefaultto the once per second mode toquickly alert the user of an incorrect alarm setting.
Note: User must transition address (or toggleChip Enable) to see Flag Bit change.
When the clock information matches the alarm clock settings based on the match criteria defined by RPT5-RPT1, the AF (Alarm Flag)is set. If AFE (Alarm Flag Enable) is also set, the alarm condi­tion activates the IRQ/FT pin. To disable alarm, write ’0’ to the Alarm Date register and RPT1-4. The IRQ/FT output is cleared by a read to the Flags register as shown in Figure 12. A subse­quent read of the Flags register will reset the Alarm Flag (D6; Register 7FFF0h).
The IRQ/FT pin can also be activated in the bat­tery back-up mode. The IRQ/FT will go low if an alarm occurs and both ABE (Alarm in Battery Back-up Mode Enable)and AFE areset. The ABE and AFE bits are reset during power-up, therefore an alarm generated during power-up will only set AF. Theuser can read the Flag Register at system boot-up to determine if an alarm was generated while the M48T513Y/V was in the deselect mode during power-up. Figure 13 illustratesthe back-up mode alarm timing.
WATCHDOG TIMER
The watchdog timer can be used to detect an out­of-control microprocessor. The user programs the watchdog timer by setting the desired amount of time-out into the Watchdog Register, address 7FFF7h. BitsBMB4-BMB0 store abinarymultiplier and the two lower order bits RB1-RB0 select the resolution, where 00 = 1/16 second, 01 = 1/4 sec­ond, 10 = 1 second, and 11 = 4 seconds. The amount of time-out is then determined to be the multiplication of the five bit multiplier value with the resolution. (For example: writing 00001110 in the Watchdog Register = 3*1 or 3 seconds).
Note: Accuracy of timer is within ± the selected resolution.
7/23
M48T513Y, M48T513V
Table 5. Capacitance
(1)
(TA=25°C, f = 1 MHz)
Note: 1. Effective capacitance measured with power supply at 5V (M48T513Y) or 3.3V (M48T513V). Sampled only, not 100% tested.
2. Outputs deselected.
Table 6A. DC Characteristics - M48T513Y
(TA= 0 to 70 °C; VCC= 4.5V to 5.5V)
Note: 1. Outputs deselected.
Table 6B. DC Characteristics - M48T513V
(TA= 0 to 70 °C; VCC= 3.0V to 3.6V)
Note: 1. Outputs deselected.
Symbol Parameter Test Condition Min Max Unit
C
IN
Input Capacitance
V
IN
=0V
20 pF
C
IO
(2)
Input / Output Capacitance
V
OUT
=0V
20 pF
Symbol Parameter Test Condition Min Max Unit
I
LI
(1)
Input Leakage Current 0V VIN≤ V
CC
±2 µA
I
LO
(1)
Output Leakage Current
0V V
OUT
V
CC
±2 µA
I
CC
Supply Current Outputs open 115 mA
I
CC1
Supply Current (Standby) TTL
E=V
IH
8mA
I
CC2
Supply Current (Standby) CMOS
E=V
CC
– 0.2V
4mA
V
IL
Input Low Voltage –0.3 0.8 V
V
IH
Input High Voltage 2.2
V
CC
+ 0.3
V
V
OL
Output Low Voltage
I
OL
= 2.1mA
0.4 V
V
OH
Output High Voltage
I
OH
= –1mA
2.4 V
Symbol Parameter Test Condition Min Max Unit
I
LI
(1)
Input Leakage Current
0V V
IN
V
CC
±2 µA
I
LO
(1)
Output Leakage Current
0V V
OUT
V
CC
±2 µA
I
CC
Supply Current Outputs open 60 mA
I
CC1
Supply Current (Standby) TTL E = V
IH
4mA
I
CC2
Supply Current (Standby) CMOS
E=V
CC
– 0.2V
3mA
V
IL
Input Low Voltage –0.3 0.4 V
V
IH
Input High Voltage 2.2
V
CC
+ 0.3
V
V
OL
Output Low Voltage IOL= 2.1mA 0.4 V
V
OH
Output High Voltage
I
OH
= –1mA
2.2 V
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