Product specification
Supersedes data of 1990 Dec 01
2003 Jul 25
Philips SemiconductorsProduct specification
Quad 2-input AND gate74HC08; 74HCT08
FEATURES
• Complies with JEDEC standard no. 8-1A
• ESD protection:
HBM EIA/JESD22-A114-A exceeds 2000 V
MM EIA/JESD22-A115-A exceeds 200 V.
• Specified from −40 to +85 °C and −40 to +125 °C.
DESCRIPTION
The 74HC/HCT08 are high-speed Si-gateCMOS devices
and are pin compatible with low power Schottky TTL
(LSTTL). They are specified in compliance with JEDEC
standard no. 7A. The 74HC/HCT08 provide the 2-input
AND function.
QUICK REFERENCE DATA
GND = 0 V; T
=25°C; tr=tf= 6 ns.
amb
SYMBOLPARAMETERCONDITIONS
t
PHL/tPLH
C
I
C
PD
propagation delay nA, nB to nYCL= 15 pF; VCC= 5 V711ns
input capacitance3.53.5pF
power dissipation capacitance per gatenotes 1 and 21020pF
Notes
1. C
is used to determine the dynamic power dissipation (PDin µW).
PD
PD=CPD× V
2
× fi× N+Σ(CL× V
CC
2
× fo) where:
CC
fi= input frequency in MHz;
fo= output frequency in MHz;
= output load capacitance in pF;
C
L
VCC= supply voltage in Volts;
N = total load switching outputs;
Σ(CL× V
2
× fo) = sum of the outputs.
CC
2. For 74HC08: the condition is VI= GND to VCC.
For 74HCT08: the condition is VI= GND to VCC− 1.5 V.
TYPICAL
UNIT
74HC0874HCT08
FUNCTION TABLE
INPUTOUTPUT
nAnBnY
LLL
LHL
HLL
HHH
Note
1. H = HIGH voltage level;
L = LOW voltage level.
2003 Jul 252
Philips SemiconductorsProduct specification
Quad 2-input AND gate74HC08; 74HCT08
ORDERING INFORMATION
TYPE NUMBER
74HC08N−40 to +125 °C14DIP14plasticSOT27-1
74HCT08N−40 to +125 °C14DIP14plasticSOT27-1
74HC08D−40 to +125 °C14SO14plasticSOT108-1
74HCT08D−40 to +125 °C14SO14plasticSOT108-1
74HC08DB−40 to +125 °C14SSOP14plasticSOT337-1
74HCT08DB−40 to +125 °C14SSOP14plasticSOT337-1
74HC08PW−40 to +125 °C14TSSOP14plasticSOT402-1
74HCT08PW−40 to +125 °C14TSSOP14plasticSOT402-1
74HC08BQ−40 to +125 °C14DHVQFN14plasticSOT762-1
74HCT08BQ−40 to +125 °C14DHVQFN14plasticSOT762-1
In accordance with the Absolute Maximum Rating System (IEC 60134); voltages are referenced to GND (ground = 0 V).
SYMBOLPARAMETERCONDITIONSMIN.MAX.UNIT
V
CC
I
IK
I
OK
I
O
I
, I
CC
T
stg
P
tot
supply voltage−0.5+7.0V
input diode currentVI< −0.5 V or VI>VCC+ 0.5 V−±20mA
output diode currentVO< −0.5 V or VO>VCC+ 0.5 V−±20mA
output source or sink current−0.5V<VO<VCC+ 0.5 V−±25mA
GNDVCC
or GND current−±50mA
storage temperature−65+150°C
power dissipation
DIP14 packageT
other packagesT
= −40 to +125 °C; note 1−750mW
amb
= −40 to +125 °C; note 2−500mW
amb
Notes
1. For DIP14 packages: above 70 °C derate linearly with 12 mW/K.
2. For SO14 packages: above 70 °C derate linearly with 8 mW/K.
For SSOP14 and TSSOP14 packages: above 60 °C derate linearly with 5.5 mW/K.
For DHVQFN14 packages: above 60 °C derate linearly with 4.5 mW/K.
2003 Jul 255
Philips SemiconductorsProduct specification
Quad 2-input AND gate74HC08; 74HCT08
DC CHARACTERISTICS
Family 74HC08
At recommended operating conditions; voltages are referenced to GND (ground=0V).
SYMBOLPARAMETER
T
=25°C
amb
V
V
V
V
I
I
I
IH
IL
OH
OL
LI
OZ
CC
HIGH-level input voltage2.01.51.2−V
LOW-level input voltage2.0−0.80.5V
HIGH-level output voltageVI=VIHor V
LOW-level output voltageVI=VIHor V
input leakage currentVI=VCCor GND6.0−0.1±.0.1µA
3-state output OFF current VI=VIHor VIL;