The LF198/LF298/LF398 are monolithic sample-and-hold
circuits which utilize BI-FET technology to obtain ultra-high
dc accuracy with fast acquisition of signal and low droop
rate. Operating as a unity gain follower, dc gain accuracy is
0.002%typical and acquisition time is as low as 6 µs to
0.01%. A bipolar input stage is used to achieve low offset
voltage and wide bandwidth. Input offset adjust is accomplished with a single pin, and does not degrade input offset
drift. The widebandwidthallowstheLF198 to be included inside the feedback loop of 1 MHz op amps without having stability problems. Input impedance of 10
source impedances to be used without degrading accuracy.
P-channel junction FET’s are combined with bipolar devices
in the output amplifier to give droop rates as low as 5 mV/min
witha1µFhold capacitor. The JFET’s have much lower
noise than MOS devices used in previous designs and do
not exhibit high temperature instabilities. The overall design
guarantees no feed-through from input to output in the hold
mode, even for input signals equal to the supply voltages.
10
Ω allows high
Features
n Operates from±5V to±18V supplies
n Less than 10 µs acquisition time
n TTL, PMOS, CMOS compatible logic input
n 0.5 mV typical hold step at C
n Low input offset
n 0.002%gain accuracy
n Low output noise in hold mode
n Input characteristics do not change during hold mode
n High supply rejection ratio in sample or hold
n Wide bandwidth
n Space qualified
Logic inputs on the LF198 are fully differential with low input
current, allowing direct connection to TTL, PMOS, and
CMOS. Differential threshold is 1.4V. The LF198 will operate
±
from
5V to±18V supplies.
An “A” version is available with tightened electrical
specifications.
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage
Power Dissipation (Package
Limitation) (Note 2)500 mW
Operating Ambient Temperature Range
LF198/LF198A−55˚C to +125˚C
LF298−25˚C to +85˚C
LF398/LF398A0˚C to +70˚C
Storage Temperature Range−65˚C to +150˚C
Input VoltageEqual to Supply Voltage
Logic To Logic Reference
Differential Voltage (Note 3)+7V, −30V
Output Short Circuit DurationIndefinite
±
18V
Hold Capacitor Short
Circuit Duration10 sec
Lead Temperature (Note 4)
H package (Soldering, 10 sec.)260˚C
N package (Soldering, 10 sec.)260˚C
M package:
Full Temperature Range46Ω
“HOLD” Step, (Note 6)T
Supply Current, (Note 5)T
Logic and Logic Reference InputT
=
25˚C, C
j
≥25˚C4.55.54.56.5mA
j
=
25˚C210210µA
j
=
h
0.01µF, V
=
00.511.01mV
OUT
Current
Leakage Current into HoldT
=
25˚C, (Note 7)3010030100pA
j
Capacitor (Note 5)Hold Mode
Acquisition Time to 0.1
%
Hold Capacitor Charging CurrentV
Supply Voltage Rejection RatioV
Differential Logic ThresholdT
Note 1: “Absolute Maximum Ratings” indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits.
Note 2: The maximum power dissipation must be derated at elevated temperatures and is dictated by T
allowable power dissipation at any temperature is P
junction temperature, T
Note 3: Although the differential voltage may not exceed the limits given, the common-mode voltage on the logic pins may be equal to the supply voltages without
causing damage to the circuit. For proper logic operation, however, one of the logic pins must always be at least 2V below the positive supply and 3V above the negative supply.
Note 4: See AN-450 “Surface Mounting Methods and their effects on Product Reliability” for other methods of soldering surface mount devices.
Note 5: These parameters guaranteed over a supply voltage range of
Note 6: Hold step is sensitive to stray capacitive coupling between input logic signals and the hold capacitor. 1 pF,for instance, will create an additional 0.5 mV step
with a 5V logic swing and a 0.01µF hold capacitor. Magnitude of the hold step is inversely proportional to hold capacitor value.
Note 7: Leakage current is measured at a junction temperature of 25˚C. The effects of junction temperature rise due to power dissipation or elevated ambient can
be calculated by doubling the 25˚C value for each 11˚C increase in chip temperature. Leakage is guaranteed over full input signal range.
Note 8: Amilitary RETS electrical test specification is available on request. The LF198 may also be procured to Standard Military Drawing
MIL-STD-38510 part ID JM38510/12501SGA.
, for the LF198/LF198A is 150˚C; for the LF298, 115˚C; and for the LF398/LF398A, 100˚C.
JMAX
=
∆V
OUT
=
C
0.01 µF20252025µs
h
IN−VOUT
=
09011090110dB
OUT
=
25˚C0.81.42.40.81.42.4V
j
=
(T
D
=
10V, C
=
JMAX−TA
1000 pF4646µs
h
2V55mA
)/θJA, or the number given in the Absolute Maximum Ratings, whichever is lower. The maximum
±
5to±18V, and an input range of −VS+ 3.5V ≤ VIN≤ +VS− 3.5V.
=
−15V, T
S
10
, θJA, and the ambient temperature, TA. The maximum
JMAX
=
=
T
25˚C, C
A
j
10
=
h
10
#
5962-8760801GA or to
0.01 µF,
Ω
%
%
Typical Performance Characteristics
Aperture Time
(Note 9)
DS005692-17
Note 9: See Definition of Terms
Dielectric Absorption
Error in Hold Capacitor
DS005692-18
Dynamic Sampling Error
DS005692-19
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Typical Performance Characteristics (Continued)
Output Droop Rate
Leakage Current into Hold
Capacitor
DS005692-20
DS005692-23
Hold Step
Phase and Gain (Input to
Output, Small Signal)
DS005692-21
DS005692-24
“Hold” Settling Time
(Note 10)
DS005692-22
Gain Error
DS005692-25
Power Supply Rejection
DS005692-26
Note 10: See Definition
Output Short Circuit Current
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DS005692-27
Output Noise
DS005692-28
Typical Performance Characteristics (Continued)
Input Bias Current
Output Transient at Start
of Sample Mode
DS005692-29
Feedthrough Rejection Ratio
(Hold Mode)
Output Transient at Start
of Hold Mode
DS005692-12
Hold Step vs Input Voltage
DS005692-31
DS005692-30
DS005692-13
Logic Input Configurations
DS005692-33
Threshold=1.4V
3V ≤ V
TTL & CMOS
(Hi State) ≤ 7V
LOGIC
Threshold=1.4V
*
Select for 2.8V at pin 8
DS005692-34
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