NSC 5962-9673201QYA, 5962-9673201QXA, 100313FM-MLS Datasheet
100313
Low Power Quad Driver
General Description
The 100313 is a monolithic quad driver with two OR and two
NOR outputs and common enable. The common input is
buffered to minimize input loading. If the D inputs are not
used the Enable can be used to drive sixteen 50Ω lines. All
inputs have 50 kΩ pull-down resistors and all outputs are
buffered.
Features
n 50%power reduction of the 100113
n 2000V ESD protection
n Pin/function compatible with 100113 and 100112
n Voltage compensated operating range=−4.2V to −5.7V
n Standard Microcircuit Drawing
(SMD) 5962-9673201
Logic Symbol
Pin Names Description
D
a–Dd
Data Inputs
E Enable Input
O
na–Ond
Data Outputs
O
na–Ond
Complementary Data Outputs
Connection Diagrams
DS100297-3
24-Pin DIP
DS100297-1
24-Pin Flatpak
DS100297-2
August 1998
100313 Low Power Quad Driver
100313
© 1998 National Semiconductor Corporation DS100297 www.national.com
1
PrintDate=1998/08/31 PrintTime=07:05:03 45028 ds100297 Rev. No. 1 cmserv
Proof 1
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact theNationalSemiconductor Sales Office/
Distributors for availability and specifications.
Storage Temperature (T
STG
) −65˚C to +150˚C
Maximum Junction Temperature (T
J
)
Ceramic +175˚C
V
EE
Pin Potential to Ground Pin −7.0V to +0.5V
Input Voltage (DC) V
EE
to +0.5V
Output Current (DC Output HIGH) −50 mA
ESD (Note 2) ≥2000V
Recommended Operating
Conditions
Case Temperature (TC)
Military −55˚C to +125˚C
Supply Voltage (V
EE
) −5.7V to −4.2V
Note 1: Absolute maximum ratings are those values beyond which the device may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE
=
−4.2V to −5.7V, V
CC
=
V
CCA
=
GND, T
C
=
−55˚C to +125˚C
Symbol Parameter Min Max Units T
C
Conditions Notes
V
OH
Output HIGH Voltage −1025 −870 mV 0˚C to +125˚C
−1085 −870 mV −55˚C V
IN
=
V
IH (Max)
Loading with
(Notes 3, 4,
5)
V
OL
Output LOW Voltage −1830 −1620 mV 0˚C to +125˚C or V
IL(Min)
50Ω to −2.0V
−1830 −1555 mV −55˚C
V
OHC
Output HIGH Voltage −1035 mV 0˚C to +125˚C
−1085 mV −55˚C V
IN
=
V
IH (Min)
Loading with
(Notes 3, 4,
5)
V
OLC
Output LOW Voltage −1610 mV 0˚C to +125˚C or V
IL (Max)
50Ω to −2.0V
−1555 mV −55˚C
V
IH
Input HIGH Voltage −1165 −870 mV −55˚C to +125˚C Guaranteed HIGH Signal
(Notes 3, 4,
5, 6)
for All Inputs
V
IL
Input LOW Voltage −1830 −1475 mV −55˚C to +125˚C Guaranteed LOW Signal
(Notes 3, 4,
5, 6)
for All Inputs
I
IL
Input LOW Current 0.50 µA −55˚C to +125˚C V
EE
=
−4.2V
(Notes 3, 4,
5)
V
IN
=
V
IL (Min)
I
IH
Input HIGH Current
Data 350 µA 0˚C to +125˚C
Enable 240 V
EE
=
−5.7V
(Notes 3, 4,
5)
Data 500 µA −55˚C V
IN
=
V
IH (Max)
Enable 340
I
EE
Power Supply Current −65 −20 mA −55˚C to +125˚C Inputs Open (Notes 3, 4,
5)
Note 3: F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4: Screen tested 100%on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5: Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6: Guaranteed by applying specified input condition and testing V
OH/VOL
.
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PrintDate=1998/08/31 PrintTime=07:05:03 45028 ds100297 Rev. No. 1 cmserv Proof 2
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